DE69413162D1 - Piezoelektrischer Schwingungssensor mit eingebauter Prüfschaltung - Google Patents

Piezoelektrischer Schwingungssensor mit eingebauter Prüfschaltung

Info

Publication number
DE69413162D1
DE69413162D1 DE69413162T DE69413162T DE69413162D1 DE 69413162 D1 DE69413162 D1 DE 69413162D1 DE 69413162 T DE69413162 T DE 69413162T DE 69413162 T DE69413162 T DE 69413162T DE 69413162 D1 DE69413162 D1 DE 69413162D1
Authority
DE
Germany
Prior art keywords
built
vibration sensor
test circuit
piezoelectric vibration
piezoelectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69413162T
Other languages
English (en)
Other versions
DE69413162T2 (de
Inventor
Alvin V Florida
Piyush K Gupta
David F Macy
Harold D Morris
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
New SD Inc
Original Assignee
New SD Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New SD Inc filed Critical New SD Inc
Application granted granted Critical
Publication of DE69413162D1 publication Critical patent/DE69413162D1/de
Publication of DE69413162T2 publication Critical patent/DE69413162T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5607Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P21/00Testing or calibrating of apparatus or devices covered by the preceding groups

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Gyroscopes (AREA)
DE69413162T 1993-08-02 1994-07-07 Piezoelektrischer Schwingungssensor mit eingebauter Prüfschaltung Expired - Fee Related DE69413162T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/100,759 US5426970A (en) 1993-08-02 1993-08-02 Rotation rate sensor with built in test circuit

Publications (2)

Publication Number Publication Date
DE69413162D1 true DE69413162D1 (de) 1998-10-15
DE69413162T2 DE69413162T2 (de) 1999-03-11

Family

ID=22281391

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69413162T Expired - Fee Related DE69413162T2 (de) 1993-08-02 1994-07-07 Piezoelektrischer Schwingungssensor mit eingebauter Prüfschaltung

Country Status (4)

Country Link
US (1) US5426970A (de)
EP (1) EP0638782B1 (de)
JP (1) JP2935810B2 (de)
DE (1) DE69413162T2 (de)

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JP3191742B2 (ja) * 1997-09-25 2001-07-23 株式会社村田製作所 振動ジャイロ
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JP4843855B2 (ja) * 2001-03-09 2011-12-21 パナソニック株式会社 角速度センサ
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US6858972B2 (en) * 2002-06-21 2005-02-22 Ngk Insulators, Ltd. Vibrator, vibratory gyroscope, and vibration adjusting method
KR20060017648A (ko) * 2003-06-30 2006-02-24 지멘스 악티엔게젤샤프트 회전 속도 센서 모니터링 방법
JP4352975B2 (ja) * 2003-07-25 2009-10-28 セイコーエプソン株式会社 圧電振動片、圧電振動片の支持構造、圧電振動子及び振動型圧電ジャイロスコープ
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JP4529444B2 (ja) * 2004-01-13 2010-08-25 パナソニック株式会社 角速度センサ
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US7237169B2 (en) * 2004-07-26 2007-06-26 Bei Technologies, Inc. Cross-monitoring sensor system and method
DE102005043560A1 (de) * 2005-09-12 2007-03-15 Siemens Ag Verfahren zum Betrieb eines Vibrationskreisels und Sensoranordnung
DE102005043592A1 (de) * 2005-09-12 2007-03-15 Siemens Ag Verfahren zum Betrieb eines Vibrationskreisels und Sensoranordnung
DE102005043559A1 (de) * 2005-09-12 2007-03-15 Siemens Ag Verfahren und Anordnung zur Überwachung einer Sensoranordnung
JP4830488B2 (ja) * 2005-12-28 2011-12-07 パナソニック株式会社 角速度センサ
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JP5016652B2 (ja) * 2009-10-14 2012-09-05 日本航空電子工業株式会社 音叉型振動ジャイロ
JP5671699B2 (ja) * 2010-01-18 2015-02-18 パナソニックIpマネジメント株式会社 角速度センサ装置
DE112010005045T5 (de) * 2010-02-17 2012-10-25 Asahi Kasei Microdevices Corp. Oszillationstyp-Trägheitskraftsensor
US9278846B2 (en) 2010-09-18 2016-03-08 Fairchild Semiconductor Corporation Micromachined monolithic 6-axis inertial sensor
KR101352827B1 (ko) 2010-09-18 2014-01-17 페어차일드 세미컨덕터 코포레이션 단일 프루프 매스를 가진 미세기계화 3축 가속도계
US9156673B2 (en) 2010-09-18 2015-10-13 Fairchild Semiconductor Corporation Packaging to reduce stress on microelectromechanical systems
EP2619536B1 (de) 2010-09-20 2016-11-02 Fairchild Semiconductor Corporation Mikroelektromechanischer drucksensor mit einem bezugskondensator
KR20120133899A (ko) * 2011-06-01 2012-12-11 삼성전기주식회사 관성센서의 구동제어모듈 및 구동제어방법
KR101319712B1 (ko) * 2011-12-26 2013-10-17 삼성전기주식회사 자이로센서 구동회로, 자이로센서 시스템 및 자이로센서 구동 방법
US8978475B2 (en) 2012-02-01 2015-03-17 Fairchild Semiconductor Corporation MEMS proof mass with split z-axis portions
US9488693B2 (en) 2012-04-04 2016-11-08 Fairchild Semiconductor Corporation Self test of MEMS accelerometer with ASICS integrated capacitors
EP2648334B1 (de) 2012-04-05 2020-06-10 Fairchild Semiconductor Corporation Front-end-Ladungsverstärker einer MEMS-Vorrichtung
EP2647955B8 (de) 2012-04-05 2018-12-19 Fairchild Semiconductor Corporation MEMS-Vorrichtung mit Quadraturphasenverschiebungsauslöschung
US9069006B2 (en) * 2012-04-05 2015-06-30 Fairchild Semiconductor Corporation Self test of MEMS gyroscope with ASICs integrated capacitors
EP2647952B1 (de) 2012-04-05 2017-11-15 Fairchild Semiconductor Corporation Automatische Verstärkungsregelungsschleife einer MEMS-Vorrichtung für mechanischen Amplitudenantrieb
US9625272B2 (en) 2012-04-12 2017-04-18 Fairchild Semiconductor Corporation MEMS quadrature cancellation and signal demodulation
DE102013014881B4 (de) 2012-09-12 2023-05-04 Fairchild Semiconductor Corporation Verbesserte Silizium-Durchkontaktierung mit einer Füllung aus mehreren Materialien
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CN111190029B (zh) * 2019-12-20 2022-02-18 福建福清核电有限公司 一种核电厂汽动泵转速传感器交叉比较的系统及方法

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Also Published As

Publication number Publication date
EP0638782A1 (de) 1995-02-15
US5426970A (en) 1995-06-27
JP2935810B2 (ja) 1999-08-16
DE69413162T2 (de) 1999-03-11
JPH0777538A (ja) 1995-03-20
EP0638782B1 (de) 1998-09-09

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee