DE69321642D1 - MOS-kontrollierter Thyristor - Google Patents

MOS-kontrollierter Thyristor

Info

Publication number
DE69321642D1
DE69321642D1 DE69321642T DE69321642T DE69321642D1 DE 69321642 D1 DE69321642 D1 DE 69321642D1 DE 69321642 T DE69321642 T DE 69321642T DE 69321642 T DE69321642 T DE 69321642T DE 69321642 D1 DE69321642 D1 DE 69321642D1
Authority
DE
Germany
Prior art keywords
controlled thyristor
mos controlled
mos
thyristor
controlled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69321642T
Other languages
English (en)
Other versions
DE69321642T2 (de
Inventor
Kimihiro Muraoka
Takashige Tamamushi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
Tamamushi Takashige
Toyo Electric Manufacturing Ltd
Toyo Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP4114139A external-priority patent/JPH0793425B2/ja
Priority claimed from JP4129678A external-priority patent/JPH0685433B2/ja
Application filed by Tamamushi Takashige, Toyo Electric Manufacturing Ltd, Toyo Electric Manufacturing Co Ltd filed Critical Tamamushi Takashige
Application granted granted Critical
Publication of DE69321642D1 publication Critical patent/DE69321642D1/de
Publication of DE69321642T2 publication Critical patent/DE69321642T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
    • H01L29/749—Thyristor-type devices, e.g. having four-zone regenerative action with turn-on by field effect
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1012—Base regions of thyristors
    • H01L29/1016—Anode base regions of thyristors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1012—Base regions of thyristors
    • H01L29/102—Cathode base regions of thyristors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
    • H01L29/744—Gate-turn-off devices
    • H01L29/745—Gate-turn-off devices with turn-off by field effect
    • H01L29/7455—Gate-turn-off devices with turn-off by field effect produced by an insulated gate structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thyristors (AREA)
DE69321642T 1992-04-07 1993-04-07 MOS-kontrollierter Thyristor Expired - Fee Related DE69321642T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP4114139A JPH0793425B2 (ja) 1992-04-07 1992-04-07 プレーナ構造のｍｏｓ制御サイリスタ
JP4129678A JPH0685433B2 (ja) 1992-04-22 1992-04-22 縦型構造のｍｏｓ制御サイリスタ

Publications (2)

Publication Number Publication Date
DE69321642D1 true DE69321642D1 (de) 1998-11-26
DE69321642T2 DE69321642T2 (de) 1999-03-18

Family

ID=26452968

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69321642T Expired - Fee Related DE69321642T2 (de) 1992-04-07 1993-04-07 MOS-kontrollierter Thyristor

Country Status (3)

Country Link
US (1) US5324966A (de)
EP (1) EP0565349B1 (de)
DE (1) DE69321642T2 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2987040B2 (ja) * 1993-11-05 1999-12-06 三菱電機株式会社 絶縁ゲート型半導体装置
JP3396553B2 (ja) * 1994-02-04 2003-04-14 三菱電機株式会社 半導体装置の製造方法及び半導体装置
US5682044A (en) * 1995-01-31 1997-10-28 Takashige Tamamushi Reverse conducting thyristor with a planar-gate, buried-gate, or recessed-gate structure
US5757037A (en) * 1995-02-01 1998-05-26 Silicon Power Corporation Power thyristor with MOS gated turn-off and MOS-assised turn-on
EP0736909A3 (de) * 1995-04-05 1997-10-08 Fuji Electric Co Ltd Thyristor mit isoliertem Gate
US6693310B1 (en) 1995-07-19 2004-02-17 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and manufacturing method thereof
JP3850054B2 (ja) * 1995-07-19 2006-11-29 三菱電機株式会社 半導体装置
JP3938964B2 (ja) * 1997-02-10 2007-06-27 三菱電機株式会社 高耐圧半導体装置およびその製造方法
GB2327295A (en) * 1997-07-11 1999-01-20 Plessey Semiconductors Ltd MOS controllable power semiconductor device
US6229161B1 (en) 1998-06-05 2001-05-08 Stanford University Semiconductor capacitively-coupled NDR device and its applications in high-density high-speed memories and in power switches
KR100275756B1 (ko) * 1998-08-27 2000-12-15 김덕중 트렌치 절연 게이트 바이폴라 트랜지스터
JP2002532885A (ja) * 1998-12-04 2002-10-02 インフィネオン テクノロジース アクチエンゲゼルシャフト 出力半導体回路
US6690038B1 (en) 1999-06-05 2004-02-10 T-Ram, Inc. Thyristor-based device over substrate surface
JP2001352079A (ja) * 2000-06-07 2001-12-21 Nec Corp ダイオードおよびその製造方法
US6713791B2 (en) * 2001-01-26 2004-03-30 Ibm Corporation T-RAM array having a planar cell structure and method for fabricating the same
US6458632B1 (en) * 2001-03-14 2002-10-01 Chartered Semiconductor Manufacturing Ltd. UMOS-like gate-controlled thyristor structure for ESD protection
US7456439B1 (en) 2001-03-22 2008-11-25 T-Ram Semiconductor, Inc. Vertical thyristor-based memory with trench isolation and its method of fabrication
US6727528B1 (en) 2001-03-22 2004-04-27 T-Ram, Inc. Thyristor-based device including trench dielectric isolation for thyristor-body regions
US6804162B1 (en) 2001-04-05 2004-10-12 T-Ram, Inc. Read-modify-write memory using read-or-write banks
US6583452B1 (en) 2001-12-17 2003-06-24 T-Ram, Inc. Thyristor-based device having extended capacitive coupling
US6832300B2 (en) 2002-03-20 2004-12-14 Hewlett-Packard Development Company, L.P. Methods and apparatus for control of asynchronous cache
US6965129B1 (en) 2002-11-06 2005-11-15 T-Ram, Inc. Thyristor-based device having dual control ports
US7781797B2 (en) * 2006-06-29 2010-08-24 International Business Machines Corporation One-transistor static random access memory with integrated vertical PNPN device
DE102007006827B3 (de) * 2007-02-07 2008-03-06 Oliver Bartels Halbleiterschalter für Hochspannungen
WO2008156070A1 (ja) * 2007-06-18 2008-12-24 Rohm Co., Ltd. 半導体装置
US8035126B2 (en) * 2007-10-29 2011-10-11 International Business Machines Corporation One-transistor static random access memory with integrated vertical PNPN device
US8232579B2 (en) * 2009-03-11 2012-07-31 Infineon Technologies Austria Ag Semiconductor device and method for producing a semiconductor device
JP2013168564A (ja) * 2012-02-16 2013-08-29 Ngk Insulators Ltd 半導体装置及びその製造方法
FR3001085A1 (fr) * 2013-01-15 2014-07-18 St Microelectronics Sa Dispositif semiconducteur bidirectionnel de protection contre les decharges electrostatiques, utilisable sans circuit de declenchement
DE102017114289A1 (de) 2017-06-27 2018-12-27 Healthfactories GmbH Halbleiterschalter für Hochspannungen mit neuartiger resonanter Übertragerkette
CN109087946B (zh) * 2018-08-27 2021-03-16 电子科技大学 一种沟槽栅mos控制晶闸管及其制作方法
CN111933715A (zh) * 2020-09-25 2020-11-13 电子科技大学 一种碳化硅mosfet器件

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57141959A (en) * 1981-02-27 1982-09-02 Hitachi Ltd Electrostatic induction thyristor
US5034785A (en) * 1986-03-24 1991-07-23 Siliconix Incorporated Planar vertical channel DMOS structure
JP2673891B2 (ja) * 1988-04-30 1997-11-05 財団法人 半導体研究振興会 静電誘導サイリスタの駆動回路
JPH06103745B2 (ja) * 1989-10-06 1994-12-14 株式会社東芝 集積回路素子
GB2243021A (en) * 1990-04-09 1991-10-16 Philips Electronic Associated Mos- gated thyristor
JPH03292770A (ja) * 1990-04-10 1991-12-24 Semiconductor Res Found 静電誘導サイリスタ
JPH03292769A (ja) * 1990-04-10 1991-12-24 Semiconductor Res Found 絶縁制御ｓｉサイリスタの製造方法
US5381026A (en) * 1990-09-17 1995-01-10 Kabushiki Kaisha Toshiba Insulated-gate thyristor

Also Published As

Publication number Publication date
DE69321642T2 (de) 1999-03-18
EP0565349A3 (de) 1994-12-14
EP0565349B1 (de) 1998-10-21
EP0565349A2 (de) 1993-10-13
US5324966A (en) 1994-06-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NGK INSULATORS, LTD., NAGOYA, AICHI, JP TAMAMUSHI,

8339 Ceased/non-payment of the annual fee