DE69320522D1 - Verfahren zur Herstellung einer nichtflüchtigen grabenförmigen Speicheranordnung - Google Patents
Verfahren zur Herstellung einer nichtflüchtigen grabenförmigen SpeicheranordnungInfo
- Publication number
- DE69320522D1 DE69320522D1 DE69320522T DE69320522T DE69320522D1 DE 69320522 D1 DE69320522 D1 DE 69320522D1 DE 69320522 T DE69320522 T DE 69320522T DE 69320522 T DE69320522 T DE 69320522T DE 69320522 D1 DE69320522 D1 DE 69320522D1
- Authority
- DE
- Germany
- Prior art keywords
- producing
- storage device
- shaped storage
- trench
- volatile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/20—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels
- H10B41/23—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
- H10B41/27—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/867,595 US5229312A (en) | 1992-04-13 | 1992-04-13 | Nonvolatile trench memory device and self-aligned method for making such a device |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69320522D1 true DE69320522D1 (de) | 1998-10-01 |
DE69320522T2 DE69320522T2 (de) | 1999-03-25 |
Family
ID=25350101
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69320522T Expired - Fee Related DE69320522T2 (de) | 1992-04-13 | 1993-04-06 | Verfahren zur Herstellung einer nichtflüchtigen grabenförmigen Speicheranordnung |
Country Status (5)
Country | Link |
---|---|
US (1) | US5229312A (de) |
EP (1) | EP0566187B1 (de) |
JP (1) | JP2545193B2 (de) |
KR (1) | KR100281375B1 (de) |
DE (1) | DE69320522T2 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69416274T2 (de) * | 1993-06-16 | 1999-06-24 | Nissha Printing Co., Ltd., Kyoto | Druckzylinder und elastische druckplatte für diesen druckzylinder |
US20070004134A1 (en) * | 1996-05-29 | 2007-01-04 | Vora Madhukar B | Vertically integrated flash EPROM for greater density and lower cost |
JPH1117034A (ja) * | 1997-06-24 | 1999-01-22 | Matsushita Electron Corp | 半導体記憶装置およびその製造方法 |
US6013551A (en) * | 1997-09-26 | 2000-01-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of manufacture of self-aligned floating gate, flash memory cell and device manufactured thereby |
US5854114A (en) * | 1997-10-09 | 1998-12-29 | Advanced Micro Devices, Inc. | Data retention of EEPROM cell with shallow trench isolation using thicker liner oxide |
US6127226A (en) * | 1997-12-22 | 2000-10-03 | Taiwan Semiconductor Manufacturing Company | Method for forming vertical channel flash memory cell using P/N junction isolation |
US6204123B1 (en) * | 1998-10-30 | 2001-03-20 | Sony Corporation | Vertical floating gate transistor with epitaxial channel |
US6870220B2 (en) * | 2002-08-23 | 2005-03-22 | Fairchild Semiconductor Corporation | Method and apparatus for improved MOS gating to reduce miller capacitance and switching losses |
US6417048B1 (en) * | 2001-11-19 | 2002-07-09 | Vanguard International Semiconductor Corporation | Method for fabricating flash memory with recessed floating gates |
DE10162261B4 (de) * | 2001-12-18 | 2005-09-15 | Infineon Technologies Ag | Speicherzelle mit Grabentransistor |
US6661053B2 (en) | 2001-12-18 | 2003-12-09 | Infineon Technologies Ag | Memory cell with trench transistor |
DE10229065A1 (de) * | 2002-06-28 | 2004-01-29 | Infineon Technologies Ag | Verfahren zur Herstellung eines NROM-Speicherzellenfeldes |
DE10321742A1 (de) * | 2003-05-14 | 2004-12-09 | Infineon Technologies Ag | Integrierte Schaltungsanordnung mit Isoliergraben und Feldeffekttransistor sowie Herstellungsverfahren |
JP2008171872A (ja) * | 2007-01-09 | 2008-07-24 | Elpida Memory Inc | 半導体装置及びその製造方法 |
JP2009004510A (ja) * | 2007-06-20 | 2009-01-08 | Toshiba Corp | 不揮発性半導体記憶装置 |
US8081515B2 (en) | 2008-04-04 | 2011-12-20 | Trom | Trench monos memory cell and array |
US7915124B2 (en) * | 2008-07-09 | 2011-03-29 | Sandisk Corporation | Method of forming dielectric layer above floating gate for reducing leakage current |
US7919809B2 (en) * | 2008-07-09 | 2011-04-05 | Sandisk Corporation | Dielectric layer above floating gate for reducing leakage current |
US8207036B2 (en) * | 2008-09-30 | 2012-06-26 | Sandisk Technologies Inc. | Method for forming self-aligned dielectric cap above floating gate |
JP5364128B2 (ja) * | 2011-05-30 | 2013-12-11 | 日油技研工業株式会社 | 滅菌インジケータの退色及び転写の抑制材、及びそれを用いた滅菌バッグ |
TWI470790B (zh) * | 2012-07-13 | 2015-01-21 | Ubiq Semiconductor Corp | 溝渠式閘極金氧半場效電晶體 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4774556A (en) * | 1985-07-25 | 1988-09-27 | Nippondenso Co., Ltd. | Non-volatile semiconductor memory device |
JPH07120717B2 (ja) * | 1986-05-19 | 1995-12-20 | 日本電気株式会社 | 半導体記憶装置の製造方法 |
JPS63168053A (ja) * | 1986-12-27 | 1988-07-12 | Toshiba Corp | 不揮発性半導体記憶装置およびその製造方法 |
JPH0640588B2 (ja) * | 1987-03-13 | 1994-05-25 | 株式会社東芝 | 半導体記憶装置 |
DE68926793T2 (de) * | 1988-03-15 | 1997-01-09 | Toshiba Kawasaki Kk | Dynamischer RAM |
JPH01245539A (ja) * | 1988-03-28 | 1989-09-29 | Seiko Epson Corp | 半導体装置の製造方法 |
JPH07105477B2 (ja) * | 1988-05-28 | 1995-11-13 | 富士通株式会社 | 半導体装置及びその製造方法 |
JPH0748553B2 (ja) * | 1989-03-14 | 1995-05-24 | シャープ株式会社 | 半導体装置 |
US5126807A (en) * | 1990-06-13 | 1992-06-30 | Kabushiki Kaisha Toshiba | Vertical MOS transistor and its production method |
US5071782A (en) * | 1990-06-28 | 1991-12-10 | Texas Instruments Incorporated | Vertical memory cell array and method of fabrication |
US5146426A (en) * | 1990-11-08 | 1992-09-08 | North American Philips Corp. | Electrically erasable and programmable read only memory with trench structure |
-
1992
- 1992-04-13 US US07/867,595 patent/US5229312A/en not_active Expired - Fee Related
-
1993
- 1993-04-06 DE DE69320522T patent/DE69320522T2/de not_active Expired - Fee Related
- 1993-04-06 EP EP93201004A patent/EP0566187B1/de not_active Expired - Lifetime
- 1993-04-09 KR KR1019930005929A patent/KR100281375B1/ko not_active IP Right Cessation
- 1993-04-13 JP JP5086271A patent/JP2545193B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0566187A3 (de) | 1994-08-31 |
EP0566187B1 (de) | 1998-08-26 |
KR100281375B1 (ko) | 2001-02-01 |
US5229312A (en) | 1993-07-20 |
EP0566187A2 (de) | 1993-10-20 |
KR930022566A (ko) | 1993-11-24 |
JP2545193B2 (ja) | 1996-10-16 |
JPH0629546A (ja) | 1994-02-04 |
DE69320522T2 (de) | 1999-03-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |