DE69128674D1 - Integrierte Schaltung mit verringerter Empfindlichkeit für Spannungsübergänge - Google Patents
Integrierte Schaltung mit verringerter Empfindlichkeit für SpannungsübergängeInfo
- Publication number
- DE69128674D1 DE69128674D1 DE69128674T DE69128674T DE69128674D1 DE 69128674 D1 DE69128674 D1 DE 69128674D1 DE 69128674 T DE69128674 T DE 69128674T DE 69128674 T DE69128674 T DE 69128674T DE 69128674 D1 DE69128674 D1 DE 69128674D1
- Authority
- DE
- Germany
- Prior art keywords
- integrated circuit
- reduced sensitivity
- voltage transitions
- transitions
- sensitivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
- H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Networks Using Active Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/582,461 US5041741A (en) | 1990-09-14 | 1990-09-14 | Transient immune input buffer |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69128674D1 true DE69128674D1 (de) | 1998-02-19 |
DE69128674T2 DE69128674T2 (de) | 1998-08-27 |
Family
ID=24329247
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69128674T Expired - Lifetime DE69128674T2 (de) | 1990-09-14 | 1991-09-12 | Integrierte Schaltung mit verringerter Empfindlichkeit für Spannungsübergänge |
Country Status (4)
Country | Link |
---|---|
US (1) | US5041741A (de) |
EP (1) | EP0475757B1 (de) |
JP (1) | JPH06343023A (de) |
DE (1) | DE69128674T2 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2769653B2 (ja) * | 1991-11-06 | 1998-06-25 | 三菱電機株式会社 | 反転回路 |
EP0596637A1 (de) * | 1992-11-02 | 1994-05-11 | STMicroelectronics, Inc. | Eingangspufferschaltung |
JPH0746098A (ja) * | 1993-08-03 | 1995-02-14 | Nec Corp | 遅延回路 |
KR100392556B1 (ko) * | 1994-01-31 | 2003-11-12 | 주식회사 하이닉스반도체 | 시모스회로용입력버퍼 |
JP3537500B2 (ja) * | 1994-08-16 | 2004-06-14 | バー−ブラウン・コーポレーション | インバータ装置 |
US6452442B1 (en) * | 1995-12-04 | 2002-09-17 | Intel Corporation | Apparatus for obtaining noise immunity in electrical circuits |
US5896054A (en) * | 1996-12-05 | 1999-04-20 | Motorola, Inc. | Clock driver |
FR2767243B1 (fr) * | 1997-08-11 | 1999-10-08 | Matra Mhs | Dispositif adaptateur symetrique de commutation d'un signal logique |
KR20010033631A (ko) * | 1998-05-12 | 2001-04-25 | 인피니언 테크놀로지스 아게 | 전계-효과 트랜지스터를 전환하는 방법 및 장치 |
DE19825216A1 (de) * | 1998-06-05 | 1999-12-09 | Siemens Ag | Inverterschaltung |
JP3164066B2 (ja) * | 1998-07-09 | 2001-05-08 | 日本電気株式会社 | 半導体装置 |
EP1177628B1 (de) * | 1999-05-12 | 2003-08-06 | Infineon Technologies AG | Schaltungsanordnung zur erzeugung von strompulsen im versorgungsstrom integrierter schaltungen |
EP1091492A1 (de) * | 1999-10-08 | 2001-04-11 | STMicroelectronics S.r.l. | Ausgangspuffer für digitale Signale |
TW449842B (en) * | 2000-07-13 | 2001-08-11 | United Microelectronics Corp | SOI electrostatic discharge protection circuit |
JP3711257B2 (ja) * | 2001-10-30 | 2005-11-02 | 三菱電機株式会社 | 電力用半導体装置 |
US6753708B2 (en) * | 2002-06-13 | 2004-06-22 | Hewlett-Packard Development Company, L.P. | Driver circuit connected to pulse shaping circuitry and method of operating same |
US20030231038A1 (en) * | 2002-06-13 | 2003-12-18 | Kenneth Koch | Pulse shaping circuit and method |
US6759880B2 (en) | 2002-06-13 | 2004-07-06 | Hewlett-Packard Development Company, L.P. | Driver circuit connected to a switched capacitor and method of operating same |
US6756824B2 (en) * | 2002-11-12 | 2004-06-29 | Sun Microsystems, Inc. | Self-biased driver amplifiers for high-speed signaling interfaces |
DE602004010487T2 (de) * | 2004-03-31 | 2008-11-13 | Deutsche Thomson-Brandt Gmbh | Schaltungsanordnung für den Betrieb eines Schalttransistors |
KR100753032B1 (ko) | 2004-07-14 | 2007-08-30 | 주식회사 하이닉스반도체 | 입력단 회로 |
JP4893241B2 (ja) * | 2006-11-02 | 2012-03-07 | ミツミ電機株式会社 | リセット装置 |
US7771115B2 (en) * | 2007-08-16 | 2010-08-10 | Micron Technology, Inc. | Temperature sensor circuit, device, system, and method |
US8729954B2 (en) * | 2011-08-31 | 2014-05-20 | Freescale Semiconductor, Inc. | MOFSET mismatch characterization circuit |
US9111894B2 (en) | 2011-08-31 | 2015-08-18 | Freescale Semiconductor, Inc. | MOFSET mismatch characterization circuit |
US10033359B2 (en) * | 2015-10-23 | 2018-07-24 | Qualcomm Incorporated | Area efficient flip-flop with improved scan hold-margin |
US9966953B2 (en) | 2016-06-02 | 2018-05-08 | Qualcomm Incorporated | Low clock power data-gated flip-flop |
US20170358266A1 (en) * | 2016-06-13 | 2017-12-14 | Wuhan China Star Optoelectronics Technology Co., Ltd. | Goa circuit and liquid crystal display |
US10444778B2 (en) * | 2016-08-09 | 2019-10-15 | Nxp Usa, Inc. | Voltage regulator |
DE102020104129A1 (de) * | 2019-05-03 | 2020-11-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Logikpufferschaltung und verfahren |
US10979049B2 (en) * | 2019-05-03 | 2021-04-13 | Taiwan Semiconductor Manufacturing Company Ltd. | Logic buffer circuit and method |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2860260A (en) * | 1956-09-27 | 1958-11-11 | Sykes Langthorne | Transistor integrator |
US3751682A (en) * | 1971-12-17 | 1973-08-07 | Sperry Rand Corp | Pulsed voltage driver for capacitive load |
GB1434332A (en) * | 1973-02-15 | 1976-05-05 | Motorola Inc | Integrated circuit filtering circuit |
US3898482A (en) * | 1974-03-29 | 1975-08-05 | Fairchild Camera Instr Co | Noise suppression circuit |
US4209713A (en) * | 1975-07-18 | 1980-06-24 | Tokyo Shibaura Electric Co., Ltd. | Semiconductor integrated circuit device in which difficulties caused by parasitic transistors are eliminated |
JPS5931083B2 (ja) * | 1975-09-19 | 1984-07-31 | セイコーエプソン株式会社 | 半導体集積回路 |
DE2962107D1 (en) * | 1978-12-23 | 1982-03-18 | Fujitsu Ltd | Semiconductor integrated circuit device including a reference voltage generator feeding a plurality of loads |
JPS5737876A (en) * | 1980-08-20 | 1982-03-02 | Hitachi Ltd | Semiconductor integrated circuit apparatus |
JPS5780828A (en) * | 1980-11-07 | 1982-05-20 | Hitachi Ltd | Semiconductor integrated circuit device |
JPS583183A (ja) * | 1981-06-30 | 1983-01-08 | Fujitsu Ltd | 半導体装置の出力回路 |
US4477741A (en) * | 1982-03-29 | 1984-10-16 | International Business Machines Corporation | Dynamic output impedance for 3-state drivers |
JPS62159917A (ja) * | 1986-01-08 | 1987-07-15 | Toshiba Corp | 集積回路におけるインバ−タ回路 |
JPS62220026A (ja) * | 1986-03-20 | 1987-09-28 | Toshiba Corp | 出力バツフア回路 |
NL8601953A (nl) * | 1986-07-30 | 1988-02-16 | Philips Nv | Cmost-ingangsbuffer voor ttl-niveau ingangssignalen. |
JPH0810759B2 (ja) * | 1987-05-26 | 1996-01-31 | 富士ゼロックス株式会社 | 半導体集積回路装置 |
JPS648657A (en) * | 1987-06-30 | 1989-01-12 | Mitsubishi Electric Corp | Supplementary semiconductor integrated circuit device |
JPH0720058B2 (ja) * | 1987-10-09 | 1995-03-06 | 日本電気株式会社 | 集積回路 |
JPH01228319A (ja) * | 1988-03-09 | 1989-09-12 | Fuji Electric Co Ltd | 半導体集積回路 |
JPH024005A (ja) * | 1988-06-21 | 1990-01-09 | Mitsubishi Electric Corp | ノイズ除去回路 |
US4908528A (en) * | 1988-07-21 | 1990-03-13 | Vlsi Technology, Inc. | Input circuit having improved noise immunity |
-
1990
- 1990-09-14 US US07/582,461 patent/US5041741A/en not_active Expired - Lifetime
-
1991
- 1991-09-12 EP EP91308327A patent/EP0475757B1/de not_active Expired - Lifetime
- 1991-09-12 DE DE69128674T patent/DE69128674T2/de not_active Expired - Lifetime
- 1991-09-13 JP JP3261269A patent/JPH06343023A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPH06343023A (ja) | 1994-12-13 |
US5041741A (en) | 1991-08-20 |
DE69128674T2 (de) | 1998-08-27 |
EP0475757B1 (de) | 1998-01-14 |
EP0475757A3 (en) | 1993-01-13 |
EP0475757A2 (de) | 1992-03-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DELAWAR |
|
8328 | Change in the person/name/address of the agent |
Free format text: V. BEZOLD & SOZIEN, 80799 MUENCHEN |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: HYNIX SEMICONDUCTOR INC., ICHON, KYONGGI, KR Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DEL, US |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: MAGNACHIP SEMICONDUCTOR, LTD., CHEONGJU, KR Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DEL, US |