DE69023467T2 - Signalspielraumprüfsystem. - Google Patents
Signalspielraumprüfsystem.Info
- Publication number
- DE69023467T2 DE69023467T2 DE1990623467 DE69023467T DE69023467T2 DE 69023467 T2 DE69023467 T2 DE 69023467T2 DE 1990623467 DE1990623467 DE 1990623467 DE 69023467 T DE69023467 T DE 69023467T DE 69023467 T2 DE69023467 T2 DE 69023467T2
- Authority
- DE
- Germany
- Prior art keywords
- test system
- margin test
- signal margin
- signal
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5004—Voltage
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US46988589A | 1989-12-28 | 1989-12-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69023467D1 DE69023467D1 (de) | 1995-12-14 |
DE69023467T2 true DE69023467T2 (de) | 1996-06-20 |
Family
ID=23865423
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1990623467 Expired - Fee Related DE69023467T2 (de) | 1989-12-28 | 1990-09-03 | Signalspielraumprüfsystem. |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0434904B1 (de) |
JP (1) | JPH03201300A (de) |
DE (1) | DE69023467T2 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6067263A (en) * | 1999-04-07 | 2000-05-23 | Stmicroelectronics, Inc. | Dynamic random access memory circuit having a testing system and method to determine the sensitivity of a sense amplifier |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0059184A1 (de) * | 1980-09-08 | 1982-09-08 | Mostek Corporation | Funktionstest für halbleiterspeicher bei versorgungsspannungsgrenzwerten |
JPS5891594A (ja) * | 1981-11-27 | 1983-05-31 | Fujitsu Ltd | ダイナミツク型半導体記憶装置 |
DE3232215A1 (de) * | 1982-08-30 | 1984-03-01 | Siemens AG, 1000 Berlin und 8000 München | Monolithisch integrierte digitale halbleiterschaltung |
JPS6238592A (ja) * | 1985-08-14 | 1987-02-19 | Fujitsu Ltd | 相補型メモリの行選択線駆動回路 |
JPS63308793A (ja) * | 1988-02-12 | 1988-12-16 | Hitachi Ltd | メモリ装置 |
JPH01245499A (ja) * | 1988-03-25 | 1989-09-29 | Hitachi Ltd | 半導体集積回路装置 |
-
1990
- 1990-09-03 EP EP19900116851 patent/EP0434904B1/de not_active Expired - Lifetime
- 1990-09-03 DE DE1990623467 patent/DE69023467T2/de not_active Expired - Fee Related
- 1990-11-16 JP JP2309016A patent/JPH03201300A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE69023467D1 (de) | 1995-12-14 |
EP0434904A3 (en) | 1992-05-13 |
EP0434904A2 (de) | 1991-07-03 |
JPH03201300A (ja) | 1991-09-03 |
EP0434904B1 (de) | 1995-11-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |