DE69009719D1 - Verfahren zur Züchtung von Antimon-dotierten Silizium-Einkristallen. - Google Patents
Verfahren zur Züchtung von Antimon-dotierten Silizium-Einkristallen.Info
- Publication number
- DE69009719D1 DE69009719D1 DE69009719T DE69009719T DE69009719D1 DE 69009719 D1 DE69009719 D1 DE 69009719D1 DE 69009719 T DE69009719 T DE 69009719T DE 69009719 T DE69009719 T DE 69009719T DE 69009719 D1 DE69009719 D1 DE 69009719D1
- Authority
- DE
- Germany
- Prior art keywords
- antimony
- growing
- silicon single
- doped silicon
- single crystals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1305091A JPH0777999B2 (ja) | 1989-11-24 | 1989-11-24 | アンチモンドープ単結晶シリコンの育成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69009719D1 true DE69009719D1 (de) | 1994-07-14 |
DE69009719T2 DE69009719T2 (de) | 1995-01-19 |
Family
ID=17940997
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69009719T Expired - Fee Related DE69009719T2 (de) | 1989-11-24 | 1990-11-16 | Verfahren zur Züchtung von Antimon-dotierten Silizium-Einkristallen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5423283A (de) |
EP (1) | EP0435440B1 (de) |
JP (1) | JPH0777999B2 (de) |
DE (1) | DE69009719T2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2795030B2 (ja) * | 1992-01-29 | 1998-09-10 | 信越半導体株式会社 | 単結晶シリコン棒の製造方法 |
JP2760932B2 (ja) * | 1993-03-29 | 1998-06-04 | 科学技術振興事業団 | 単結晶引上げ用Si融液の酸素濃度制御方法 |
EP0625595B1 (de) * | 1993-03-29 | 2001-09-19 | Research Development Corporation Of Japan | Regulierung der Sauerstoffkonzentration in einem Einkristall, der aus einer ein Gruppe V Element enthaltenden Schmelze gezogenen wird. |
US5477805A (en) * | 1993-12-28 | 1995-12-26 | Research Development Corporation Of Japan | Preparation of silicon melt for use in pull method of manufacturing single crystal |
EP0733726A3 (de) * | 1995-03-24 | 1997-05-02 | Koji Izunome | Züchtung von Silizium-Einkristall mit einer einheitlichen Verteilung der Dotierung in der Längs- oder Radialrichtung |
US5904768A (en) * | 1996-10-15 | 1999-05-18 | Memc Electronic Materials, Inc. | Process for controlling the oxygen content in silicon wafers heavily doped with antimony or arsenic |
US6013872A (en) * | 1997-04-25 | 2000-01-11 | Bayer Ag | Directionally solidified, multicrystalline silicon, a process for the production thereof and its use, and solar cells containing this silicon and a process for the production thereof |
US6019838A (en) * | 1998-01-05 | 2000-02-01 | Memc Electronic Materials, Inc. | Crystal growing apparatus with melt-doping facility |
TW538445B (en) * | 1998-04-07 | 2003-06-21 | Shinetsu Handotai Kk | Silicon seed crystal and method for producing silicon single crystal |
JP4755740B2 (ja) * | 1998-08-18 | 2011-08-24 | 株式会社Sumco | シリコン単結晶の育成方法 |
US6491752B1 (en) * | 1999-07-16 | 2002-12-10 | Sumco Oregon Corporation | Enhanced n-type silicon material for epitaxial wafer substrate and method of making same |
US6488768B1 (en) | 2001-07-17 | 2002-12-03 | Seh America, Inc. | Method and apparatus for treating discharge gas from a Czochralski crystal growing chamber utilizing water spray |
CN109576779B (zh) * | 2019-02-18 | 2024-07-02 | 衢州晶哲电子材料有限公司 | 一种提高重掺锑硅单晶氧含量的生产工艺及其生产设备 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1544292C3 (de) * | 1966-06-13 | 1976-01-08 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren zum Herstellen stabförmiger Siliciumeinkristalle mit über die gesamte Stablänge homogener Antimondotierung |
US4040895A (en) * | 1975-10-22 | 1977-08-09 | International Business Machines Corporation | Control of oxygen in silicon crystals |
DE2548046C3 (de) * | 1975-10-27 | 1982-12-02 | Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen | Verfahren zum Ziehen einkristalliner Siliciumstäbe |
DE2638303A1 (de) * | 1976-08-25 | 1978-03-02 | Wacker Chemitronic | Verfahren zur herstellung reinster einkristalle, hochschmelzender, oxidischer substanzen nach dem czochralski-tiegelziehverfahren |
DE2758888C2 (de) * | 1977-12-30 | 1983-09-22 | Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen | Verfahren zur Herstellung reinster Siliciumeinkristalle |
EP0042901B1 (de) * | 1980-06-26 | 1984-10-31 | International Business Machines Corporation | Verfahren zum Kontrollieren des Sauerstoffgehaltes von Siliziumstäben, die nach dem Czochralski-Verfahren hergestellt worden sind |
US4659421A (en) * | 1981-10-02 | 1987-04-21 | Energy Materials Corporation | System for growth of single crystal materials with extreme uniformity in their structural and electrical properties |
JPS5983996A (ja) * | 1982-11-05 | 1984-05-15 | Nec Corp | 引上げ法によるシリコン単結晶インゴツトの製造方法 |
JPS59232995A (ja) * | 1983-06-10 | 1984-12-27 | Sumitomo Electric Ind Ltd | 引上単結晶の冷却方法 |
JPS61227986A (ja) * | 1985-03-30 | 1986-10-11 | Shin Etsu Handotai Co Ltd | 単結晶シリコン棒の製造方法 |
JPS63242991A (ja) * | 1987-03-31 | 1988-10-07 | Shin Etsu Handotai Co Ltd | 結晶径制御方法 |
JPS63260891A (ja) * | 1987-04-17 | 1988-10-27 | Hitachi Ltd | シリコン単結晶の製造方法 |
-
1989
- 1989-11-24 JP JP1305091A patent/JPH0777999B2/ja not_active Expired - Lifetime
-
1990
- 1990-11-14 US US07/613,343 patent/US5423283A/en not_active Expired - Fee Related
- 1990-11-16 DE DE69009719T patent/DE69009719T2/de not_active Expired - Fee Related
- 1990-11-16 EP EP90312510A patent/EP0435440B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH03164495A (ja) | 1991-07-16 |
JPH0777999B2 (ja) | 1995-08-23 |
DE69009719T2 (de) | 1995-01-19 |
EP0435440A1 (de) | 1991-07-03 |
EP0435440B1 (de) | 1994-06-08 |
US5423283A (en) | 1995-06-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |