DE60316575D1 - Verfahren und vorrichtung zum aufnehmen von halbleiterchips sowie dazu verwendbares saugung ablöswerkzeug - Google Patents
Verfahren und vorrichtung zum aufnehmen von halbleiterchips sowie dazu verwendbares saugung ablöswerkzeugInfo
- Publication number
- DE60316575D1 DE60316575D1 DE60316575T DE60316575T DE60316575D1 DE 60316575 D1 DE60316575 D1 DE 60316575D1 DE 60316575 T DE60316575 T DE 60316575T DE 60316575 T DE60316575 T DE 60316575T DE 60316575 D1 DE60316575 D1 DE 60316575D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor chips
- tool used
- suction tool
- receiving semiconductor
- used therefrom
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/976—Temporary protective layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1126—Using direct fluid current against work during delaminating
- Y10T156/1132—Using vacuum directly against work during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
- Y10T156/1944—Vacuum delaminating means [e.g., vacuum chamber, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002208382 | 2002-07-17 | ||
JP2002208382A JP3945331B2 (ja) | 2002-07-17 | 2002-07-17 | 半導体チップのピックアップ装置および吸着剥離ツール |
JP2002254310A JP4180329B2 (ja) | 2002-08-30 | 2002-08-30 | 半導体チップのピックアップ方法 |
JP2002254310 | 2002-08-30 | ||
PCT/JP2003/008733 WO2004008499A1 (en) | 2002-07-17 | 2003-07-09 | Method and apparatus for picking up semiconductor chip and suction and exfoliation tool up therefor |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60316575D1 true DE60316575D1 (de) | 2007-11-08 |
DE60316575T2 DE60316575T2 (de) | 2008-01-17 |
Family
ID=30117479
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60316575T Expired - Lifetime DE60316575T2 (de) | 2002-07-17 | 2003-07-09 | Verfahren und vorrichtung zum aufnehmen von halbleiterchips sowie dazu verwendbares saugung ablöswerkzeug |
Country Status (7)
Country | Link |
---|---|
US (1) | US7632374B2 (de) |
EP (1) | EP1535312B1 (de) |
CN (1) | CN1669119A (de) |
AU (1) | AU2003249592A1 (de) |
DE (1) | DE60316575T2 (de) |
TW (1) | TWI277166B (de) |
WO (1) | WO2004008499A1 (de) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6602726B1 (en) * | 2002-01-30 | 2003-08-05 | Texas Instruments Incorporated | Bond surface conditioning system for improved bondability |
US7306695B2 (en) | 2003-04-10 | 2007-12-11 | Matsushita Electric Industrial Co., Ltd. | Apparatus and method for picking up semiconductor chip |
JP4093930B2 (ja) * | 2003-07-17 | 2008-06-04 | 株式会社東京精密 | フレーム搬送プローバ |
JP2005223244A (ja) * | 2004-02-09 | 2005-08-18 | Tokyo Seimitsu Co Ltd | チップの飛び出し位置検出方法 |
EP3318928A1 (de) * | 2004-06-09 | 2018-05-09 | Nikon Corporation | Belichtungsvorrichtung und verfahren zur herstellung eines artikels |
JP4165467B2 (ja) * | 2004-07-12 | 2008-10-15 | セイコーエプソン株式会社 | ダイシングシート、半導体装置の製造方法 |
US7238258B2 (en) * | 2005-04-22 | 2007-07-03 | Stats Chippac Ltd. | System for peeling semiconductor chips from tape |
JP4721828B2 (ja) * | 2005-08-31 | 2011-07-13 | 東京応化工業株式会社 | サポートプレートの剥離方法 |
DE102006026331B4 (de) * | 2006-06-02 | 2019-09-26 | Erich Thallner | Transportable Einheit zum Transport von Wafern und Verwendung einer Gelfolie in einer transportablen Einheit |
DE102006031434B4 (de) * | 2006-07-07 | 2019-11-14 | Erich Thallner | Handhabungsvorrichtung sowie Handhabungsverfahren für Wafer |
DE102006035644A1 (de) * | 2006-07-31 | 2008-02-14 | Advanced Micro Devices, Inc., Sunnyvale | Verfahren zum Reduzieren der Kontamination durch Vorsehen einer zu entfernenden Polymerschutzschicht während der Bearbeitung von Mikrostrukturen |
JP2008103494A (ja) * | 2006-10-18 | 2008-05-01 | Lintec Corp | 固定ジグおよびチップのピックアップ方法並びにピックアップ装置 |
KR100817068B1 (ko) | 2006-10-24 | 2008-03-27 | 삼성전자주식회사 | 박형의 반도체 칩 픽업 장치 및 방법 |
JP5196838B2 (ja) * | 2007-04-17 | 2013-05-15 | リンテック株式会社 | 接着剤付きチップの製造方法 |
JP5074125B2 (ja) * | 2007-08-09 | 2012-11-14 | リンテック株式会社 | 固定治具並びにワークの処理方法 |
WO2009109447A2 (de) * | 2008-02-29 | 2009-09-11 | Oerlikon Assembly Equipment Ag, Steinhausen | Chip-auswerfer |
US8715457B2 (en) * | 2008-11-12 | 2014-05-06 | Esec Ag | Method for detaching and removing a semiconductor chip from a foil |
JP2010141208A (ja) * | 2008-12-12 | 2010-06-24 | Sumitomo Electric Ind Ltd | 半導体レーザチップ又は半導体レーザバーの外観検査装置及び外観検査方法 |
US9038264B2 (en) | 2011-02-28 | 2015-05-26 | Sandisk Semiconductor (Shanghai) Co., Ltd. | Non-uniform vacuum profile die attach tip |
JP5805411B2 (ja) * | 2011-03-23 | 2015-11-04 | ファスフォードテクノロジ株式会社 | ダイボンダのピックアップ方法およびダイボンダ |
JP5705052B2 (ja) * | 2011-07-26 | 2015-04-22 | 株式会社新川 | ダイボンディング装置 |
SG194239A1 (en) | 2012-04-09 | 2013-11-29 | Semiconductor Tech & Instr Inc | End handler |
US8752751B2 (en) * | 2012-07-13 | 2014-06-17 | Asm Technology Singapore Pte Ltd | Lead frame support plate and window clamp for wire bonding machines |
US9902092B2 (en) * | 2013-11-26 | 2018-02-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Vacuum carrier module, method of using and process of making the same |
US9196520B1 (en) * | 2014-08-01 | 2015-11-24 | Freescale Semiconductor, Inc. | Tape release systems and methods for semiconductor dies |
TWI560794B (en) * | 2015-04-23 | 2016-12-01 | Advanced Semiconductor Eng | Semiconductor element carrier, method for attaching a semiconductor element to a carrier, and semiconductor process |
US9917000B2 (en) | 2015-10-01 | 2018-03-13 | Infineon Technologies Ag | Wafer carrier, method for manufacturing the same and method for carrying a wafer |
US10699934B2 (en) | 2015-10-01 | 2020-06-30 | Infineon Technologies Ag | Substrate carrier, a processing arrangement and a method |
US20180015618A1 (en) * | 2016-07-15 | 2018-01-18 | Georgia Tech Research Corporation | Topologically and mechanically adaptive reversible attachment systems and methods |
JP6626027B2 (ja) * | 2017-03-16 | 2019-12-25 | Towa株式会社 | 製造装置および電子部品の製造方法 |
US10529600B2 (en) * | 2017-03-30 | 2020-01-07 | Intel Corporation | Decoupling systems |
CN109037124B (zh) * | 2018-09-30 | 2023-10-20 | 汕头大学 | 一种大尺寸超薄芯片阶段化高速剥离装置及其方法 |
KR102594542B1 (ko) * | 2018-10-31 | 2023-10-26 | 세메스 주식회사 | 다이 이젝팅 장치 |
US11764098B2 (en) * | 2021-04-16 | 2023-09-19 | Asmpt Singapore Pte. Ltd. | Detaching a die from an adhesive tape by air ejection |
CN114056933B (zh) * | 2021-12-17 | 2023-10-20 | 广东海拓创新精密设备科技有限公司 | 一种高分子量改性硅化聚氨酯橡胶物理粘附吸盘 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4778326A (en) * | 1983-05-24 | 1988-10-18 | Vichem Corporation | Method and means for handling semiconductor and similar electronic devices |
US4798645A (en) * | 1984-09-10 | 1989-01-17 | Pak Chong Il | Wafer segment separator and method |
JPH01235247A (ja) * | 1988-03-15 | 1989-09-20 | Fujitsu Ltd | チップの剥離方法 |
US5454051A (en) | 1991-08-05 | 1995-09-26 | Eastman Kodak Company | Method of reducing block artifacts created by block transform compression algorithms |
JPH05335405A (ja) | 1992-05-29 | 1993-12-17 | Toshiba Corp | ウエハ載置台および半導体装置製造装置 |
JPH0661347A (ja) | 1992-08-11 | 1994-03-04 | Fujitsu Ltd | チップ剥離の方法及び装置 |
JP3611962B2 (ja) | 1998-03-26 | 2005-01-19 | 松下電器産業株式会社 | チップの突き上げ装置 |
US6032997A (en) * | 1998-04-16 | 2000-03-07 | Excimer Laser Systems | Vacuum chuck |
JP2000195877A (ja) | 1998-12-25 | 2000-07-14 | Matsushita Electric Ind Co Ltd | ダイシングシ―ト上のチップの分離方法及び分離装置 |
JP3504543B2 (ja) * | 1999-03-03 | 2004-03-08 | 株式会社日立製作所 | 半導体素子の分離方法およびその装置並びに半導体素子の搭載方法 |
JP2000299297A (ja) * | 1999-04-16 | 2000-10-24 | Disco Abrasive Syst Ltd | ペレットのピックアップ用テーブル及びペレットの移し替え装置 |
JP2000353710A (ja) * | 1999-06-14 | 2000-12-19 | Toshiba Corp | ペレットピックアップ装置および半導体装置の製造方法 |
JP3209736B2 (ja) * | 1999-11-09 | 2001-09-17 | エヌイーシーマシナリー株式会社 | ペレットピックアップ装置 |
JP3748375B2 (ja) | 2000-11-24 | 2006-02-22 | シャープ株式会社 | 半導体チップのピックアップ装置 |
JP4021614B2 (ja) * | 2000-12-11 | 2007-12-12 | 株式会社東芝 | 半導体素子のピックアップ用治具、半導体素子のピックアップ装置、半導体素子のピックアップ方法、半導体装置の製造方法及び半導体装置の製造装置 |
JP2003124146A (ja) * | 2001-10-11 | 2003-04-25 | Lintec Corp | 保護シート剥離方法及び装置 |
-
2003
- 2003-07-09 WO PCT/JP2003/008733 patent/WO2004008499A1/en active IP Right Grant
- 2003-07-09 DE DE60316575T patent/DE60316575T2/de not_active Expired - Lifetime
- 2003-07-09 AU AU2003249592A patent/AU2003249592A1/en not_active Abandoned
- 2003-07-09 CN CN03816665.8A patent/CN1669119A/zh active Pending
- 2003-07-09 EP EP03764155A patent/EP1535312B1/de not_active Expired - Fee Related
- 2003-07-15 US US10/620,184 patent/US7632374B2/en not_active Expired - Fee Related
- 2003-07-15 TW TW092119230A patent/TWI277166B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2004008499A1 (en) | 2004-01-22 |
TWI277166B (en) | 2007-03-21 |
US7632374B2 (en) | 2009-12-15 |
AU2003249592A1 (en) | 2004-02-02 |
US20040038498A1 (en) | 2004-02-26 |
WO2004008499A8 (en) | 2004-11-11 |
TW200402828A (en) | 2004-02-16 |
AU2003249592A8 (en) | 2004-02-02 |
CN1669119A (zh) | 2005-09-14 |
EP1535312A1 (de) | 2005-06-01 |
DE60316575T2 (de) | 2008-01-17 |
EP1535312B1 (de) | 2007-09-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: PANASONIC CORP., KADOMA, OSAKA, JP |
|
8320 | Willingness to grant licences declared (paragraph 23) |