DE602005006378D1 - Anschlusselemente für eine automatische Testeinrichtung zur Prüfung von integrierten Schaltungen - Google Patents
Anschlusselemente für eine automatische Testeinrichtung zur Prüfung von integrierten SchaltungenInfo
- Publication number
- DE602005006378D1 DE602005006378D1 DE602005006378T DE602005006378T DE602005006378D1 DE 602005006378 D1 DE602005006378 D1 DE 602005006378D1 DE 602005006378 T DE602005006378 T DE 602005006378T DE 602005006378 T DE602005006378 T DE 602005006378T DE 602005006378 D1 DE602005006378 D1 DE 602005006378D1
- Authority
- DE
- Germany
- Prior art keywords
- integrated circuits
- test device
- connection elements
- automatic test
- testing integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05101915A EP1701174B1 (de) | 2005-03-11 | 2005-03-11 | Anschlusselemente für eine automatische Testeinrichtung zur Prüfung von integrierten Schaltungen |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602005006378D1 true DE602005006378D1 (de) | 2008-06-12 |
DE602005006378T2 DE602005006378T2 (de) | 2009-06-04 |
Family
ID=34938953
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602005006378T Active DE602005006378T2 (de) | 2005-03-11 | 2005-03-11 | Anschlusselemente für eine automatische Testeinrichtung zur Prüfung von integrierten Schaltungen |
Country Status (4)
Country | Link |
---|---|
US (1) | US7397235B2 (de) |
EP (1) | EP1701174B1 (de) |
JP (1) | JP4624944B2 (de) |
DE (1) | DE602005006378T2 (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6965165B2 (en) * | 1998-12-21 | 2005-11-15 | Mou-Shiung Lin | Top layers of metal for high performance IC's |
JP4735976B2 (ja) * | 2006-05-24 | 2011-07-27 | 横河電機株式会社 | 電源装置およびこれを用いた半導体試験システム |
US20090063085A1 (en) * | 2007-09-05 | 2009-03-05 | Teradyne,Inc. | Pmu testing via a pe stage |
KR101414980B1 (ko) * | 2008-06-30 | 2014-07-09 | 삼성전자주식회사 | 테스트 시스템 |
IT1398937B1 (it) * | 2010-02-17 | 2013-03-28 | St Microelectronics Srl | Metodo per eseguire un testing elettrico di dispositivi elettronici |
US8779796B2 (en) * | 2010-09-29 | 2014-07-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for device parameter measurement |
CN102890231B (zh) * | 2011-07-20 | 2016-03-30 | 中国科学院微电子研究所 | 高精度集成电路器件测试设备 |
KR20130126337A (ko) * | 2012-05-11 | 2013-11-20 | 에스케이하이닉스 주식회사 | 반도체 장치의 테스트 장비, 반도체 장치의 테스트 시스템 및 반도체 장치의 테스트 방법 |
US8760180B1 (en) * | 2013-07-29 | 2014-06-24 | Analog Test Engines | Systems and methods mitigating temperature dependence of circuitry in electronic devices |
TWI567396B (zh) * | 2014-06-24 | 2017-01-21 | 偉詮電子股份有限公司 | 過電流偵測晶片,過電流調校電路及過電流偵測調校方法 |
CN105301483B (zh) * | 2014-07-23 | 2019-01-08 | 中芯国际集成电路制造(上海)有限公司 | 用于集成电路的检测电路和方法 |
US9933480B2 (en) * | 2014-09-19 | 2018-04-03 | Elevate Semiconductor, Inc. | Parametric pin measurement unit high voltage extension |
US10451653B2 (en) | 2014-12-19 | 2019-10-22 | Teradyne, Inc. | Controlling a per-pin measurement unit |
WO2017153847A1 (en) * | 2016-03-11 | 2017-09-14 | Analog Devices Global | Configurable hardware platform for measurement or control |
EP3270175B1 (de) | 2016-07-15 | 2020-12-16 | Nxp B.V. | Eingabe-/ausgabezelle |
KR102526757B1 (ko) * | 2017-08-30 | 2023-04-27 | 삼성전자주식회사 | 분광기용 집광 광학계 및 이를 포함하는 라만 분광 시스템 |
US10972063B2 (en) * | 2018-10-17 | 2021-04-06 | Analog Devices Global Unlimited Company | Amplifier systems for measuring a wide range of current |
US11165434B2 (en) * | 2019-03-15 | 2021-11-02 | Analog Devices International Unlimited Company | Leakage reduction for multi-function configurable circuit |
US11105843B2 (en) | 2019-10-10 | 2021-08-31 | Analog Devices International Unlimited Company | Robust architecture for mode switching of a force and measure apparatus |
US11531064B2 (en) * | 2020-11-04 | 2022-12-20 | Stmicroelectronics S.R.L. | Method for testing a digital electronic circuit to be tested, corresponding test system and computer program product |
CN112698240B (zh) * | 2020-11-23 | 2024-08-02 | 苏州华兴源创科技股份有限公司 | 开短路测试装置 |
EP4177618A1 (de) * | 2021-11-04 | 2023-05-10 | Mettler-Toledo GmbH | Schaltung zur impedanzmessung |
CN113960456B (zh) * | 2021-12-20 | 2022-03-29 | 深圳市永达电子信息股份有限公司 | 电路接口微损伤自动检测方法 |
WO2023193319A1 (en) * | 2022-04-05 | 2023-10-12 | National Instruments Corporation | Digital architecture for continuity test |
CN117111576B (zh) * | 2023-08-16 | 2024-06-18 | 深圳市新力川电气有限公司 | 驱动器测试设备及使用其进行的驱动器测试方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4445111A (en) * | 1980-09-15 | 1984-04-24 | John Fluke Mfg. Co., Inc. | Bi-polar electronic signal converters with single polarity accurate reference source |
US5059889A (en) * | 1990-03-08 | 1991-10-22 | Texas Instruments Incorporated | Parametric measurement unit/device power supply for semiconductor test system |
JP3119335B2 (ja) * | 1994-03-08 | 2000-12-18 | 横河電機株式会社 | Ic試験装置 |
US5773990A (en) * | 1995-09-29 | 1998-06-30 | Megatest Corporation | Integrated circuit test power supply |
JPH1164436A (ja) * | 1997-08-21 | 1999-03-05 | Advantest Corp | 半導体試験装置 |
US6275023B1 (en) * | 1999-02-03 | 2001-08-14 | Hitachi Electronics Engineering Co., Ltd. | Semiconductor device tester and method for testing semiconductor device |
US6377065B1 (en) * | 2000-04-13 | 2002-04-23 | Advantest Corp. | Glitch detection for semiconductor test system |
JP2001311758A (ja) * | 2000-04-28 | 2001-11-09 | Ando Electric Co Ltd | 半導体集積回路試験装置 |
JP4627924B2 (ja) * | 2001-05-30 | 2011-02-09 | 株式会社アドバンテスト | 半導体デバイス試験装置 |
JP2003185716A (ja) * | 2001-10-12 | 2003-07-03 | Hitachi Electronics Eng Co Ltd | 半導体試験装置のデバイス用電源制御方法及びデバイス用電源装置 |
US6750797B1 (en) * | 2003-01-31 | 2004-06-15 | Inovys Corporation | Programmable precision current controlling apparatus |
JP3978672B2 (ja) * | 2003-03-26 | 2007-09-19 | 横河電機株式会社 | 電圧印加電流測定器 |
-
2005
- 2005-03-11 EP EP05101915A patent/EP1701174B1/de not_active Not-in-force
- 2005-03-11 DE DE602005006378T patent/DE602005006378T2/de active Active
-
2006
- 2006-03-01 US US11/365,010 patent/US7397235B2/en active Active
- 2006-03-13 JP JP2006067886A patent/JP4624944B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
DE602005006378T2 (de) | 2009-06-04 |
US7397235B2 (en) | 2008-07-08 |
US20060202707A1 (en) | 2006-09-14 |
EP1701174B1 (de) | 2008-04-30 |
JP2006250941A (ja) | 2006-09-21 |
EP1701174A1 (de) | 2006-09-13 |
JP4624944B2 (ja) | 2011-02-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
R082 | Change of representative |
Ref document number: 1701174 Country of ref document: EP Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER & PARTNER |