DE602005012359D1 - Testgerät und Verfahren - Google Patents

Testgerät und Verfahren

Info

Publication number
DE602005012359D1
DE602005012359D1 DE602005012359T DE602005012359T DE602005012359D1 DE 602005012359 D1 DE602005012359 D1 DE 602005012359D1 DE 602005012359 T DE602005012359 T DE 602005012359T DE 602005012359 T DE602005012359 T DE 602005012359T DE 602005012359 D1 DE602005012359 D1 DE 602005012359D1
Authority
DE
Germany
Prior art keywords
procedure
test device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005012359T
Other languages
English (en)
Inventor
Shinichi Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602005012359D1 publication Critical patent/DE602005012359D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE602005012359T 2005-01-19 2005-11-18 Testgerät und Verfahren Active DE602005012359D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/039,394 US7213182B2 (en) 2005-01-19 2005-01-19 Test apparatus and test method

Publications (1)

Publication Number Publication Date
DE602005012359D1 true DE602005012359D1 (de) 2009-03-05

Family

ID=35985190

Family Applications (2)

Application Number Title Priority Date Filing Date
DE602005012359T Active DE602005012359D1 (de) 2005-01-19 2005-11-18 Testgerät und Verfahren
DE602005013583T Active DE602005013583D1 (de) 2005-01-19 2005-11-18 Testgerät und Testverfahren

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE602005013583T Active DE602005013583D1 (de) 2005-01-19 2005-11-18 Testgerät und Testverfahren

Country Status (8)

Country Link
US (1) US7213182B2 (de)
EP (2) EP1684082B1 (de)
JP (1) JP4288284B2 (de)
KR (1) KR101160358B1 (de)
CN (1) CN100582803C (de)
DE (2) DE602005012359D1 (de)
TW (1) TW200627923A (de)
WO (1) WO2006077685A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8352400B2 (en) 1991-12-23 2013-01-08 Hoffberg Steven M Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore
US7966078B2 (en) 1999-02-01 2011-06-21 Steven Hoffberg Network media appliance system and method
GB2383240B (en) * 2001-12-17 2005-02-16 Micron Technology Inc DVi link with parallel test data
GB2383137B (en) * 2001-12-17 2005-06-29 Micron Technology Inc DVI link with circuit and method for test
JP4279751B2 (ja) * 2004-08-23 2009-06-17 株式会社アドバンテスト デバイスの試験装置及び試験方法
US9652637B2 (en) 2005-05-23 2017-05-16 Avago Technologies General Ip (Singapore) Pte. Ltd. Method and system for allowing no code download in a code download scheme
US7913289B2 (en) * 2005-05-23 2011-03-22 Broadcom Corporation Method and apparatus for security policy and enforcing mechanism for a set-top box security processor
US7844996B2 (en) * 2005-05-23 2010-11-30 Broadcom Corporation Method and apparatus for constructing an access control matrix for a set-top box security processor
US9904809B2 (en) 2006-02-27 2018-02-27 Avago Technologies General Ip (Singapore) Pte. Ltd. Method and system for multi-level security initialization and configuration
US9177176B2 (en) 2006-02-27 2015-11-03 Broadcom Corporation Method and system for secure system-on-a-chip architecture for multimedia data processing
US9489318B2 (en) 2006-06-19 2016-11-08 Broadcom Corporation Method and system for accessing protected memory
US7725782B2 (en) * 2007-01-04 2010-05-25 Gm Global Technology Operations, Inc. Linked random access memory (RAM) interleaved pattern persistence strategy
US8027825B2 (en) * 2007-01-09 2011-09-27 International Business Machines Corporation Structure for testing an operation of integrated circuitry
US8006155B2 (en) * 2007-01-09 2011-08-23 International Business Machines Corporation Testing an operation of integrated circuitry
WO2008099239A1 (en) * 2007-02-16 2008-08-21 Freescale Semiconductor, Inc. System, computer program product and method for testing a logic circuit
JP5429727B2 (ja) * 2007-08-24 2014-02-26 ワイアイケー株式会社 半導体試験装置
JPWO2009150819A1 (ja) * 2008-06-10 2011-11-10 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
KR101213164B1 (ko) * 2008-09-04 2012-12-24 가부시키가이샤 어드밴티스트 시험 장치 및 시험 방법
WO2010035447A1 (ja) * 2008-09-26 2010-04-01 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
WO2010035450A1 (ja) * 2008-09-26 2010-04-01 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
US8693351B2 (en) * 2011-07-26 2014-04-08 Litepoint Corporation System and method for deterministic testing of packet error rate in electronic devices
US10235279B2 (en) * 2013-07-01 2019-03-19 Hcl Technologies Limited Automation testing of GUI for non-standard displays
US11281530B2 (en) * 2020-08-10 2022-03-22 Samsung Electronics Co., Ltd. Method and system for validating a memory device
CN114281609A (zh) * 2020-09-27 2022-04-05 长鑫存储技术有限公司 参数设置方法、装置、系统以及存储介质

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07209389A (ja) 1994-01-21 1995-08-11 Advantest Corp 高速パターン発生器
US5673271A (en) 1994-08-19 1997-09-30 Advantest Corporation High speed pattern generator
DE19680782C2 (de) 1995-07-26 2002-11-21 Advantest Corp Hochgeschwindigkeits- Mustergenerierungsverfahren und unter Verwendung dieses Verfahrens arbeitender Hochgeschwindigkeits-Mustergenerator
JPH09222465A (ja) 1996-02-19 1997-08-26 Dainippon Printing Co Ltd Ｌｓｉテスタ用テストパターンのパターンデータアドレス検索表示装置
JP3150611B2 (ja) 1996-03-29 2001-03-26 株式会社東芝 パターン発生装置
JPH10171676A (ja) 1996-12-10 1998-06-26 Toshiba Corp マイクロプロセッサのテスト容易化回路
JP4488595B2 (ja) * 2000-06-08 2010-06-23 株式会社アドバンテスト テストパターン生成方法
JP2002022811A (ja) 2000-07-04 2002-01-23 Advantest Corp 半導体試験装置
JP2002062340A (ja) 2000-08-23 2002-02-28 Toshiba Corp 半導体試験装置
JP2002093193A (ja) 2000-09-13 2002-03-29 Advantest Corp メモリ試験方法・メモリ試験装置
US6862682B2 (en) * 2002-05-01 2005-03-01 Testquest, Inc. Method and apparatus for making and using wireless test verbs
JP4511880B2 (ja) 2004-06-17 2010-07-28 株式会社アドバンテスト 試験装置及び試験方法

Also Published As

Publication number Publication date
US20060161829A1 (en) 2006-07-20
JPWO2006077685A1 (ja) 2008-06-19
WO2006077685A1 (ja) 2006-07-27
US7213182B2 (en) 2007-05-01
DE602005013583D1 (de) 2009-05-07
JP4288284B2 (ja) 2009-07-01
EP1873538A1 (de) 2008-01-02
EP1684082A1 (de) 2006-07-26
TW200627923A (en) 2006-08-01
KR20060084354A (ko) 2006-07-24
KR101160358B1 (ko) 2012-06-26
CN1808160A (zh) 2006-07-26
CN100582803C (zh) 2010-01-20
EP1684082B1 (de) 2009-01-14
EP1873538B1 (de) 2009-03-25

Similar Documents

Publication Publication Date Title
DE602005012359D1 (de) Testgerät und Verfahren
DE602006008682D1 (de) Bildgebungsanordnung und Prüfverfahren
DE602006007752D1 (de) Relais-Prüfvorrichtung und-verfahren
DE602007002032D1 (de) Messvorrichtung und Messverfahren
DE602006003491D1 (de) Beobachtungsvorrichtung und Beobachtungsverfahren
DE602006016186D1 (de) Anzeigevorrichtung und Anzeigeverfahren
DE602005020197D1 (de) Testgerät und Testverfahren
DE602006005034D1 (de) Distanzmessverfahren und Distanzmessvorrichtung
DE602005015463D1 (de) Testvorrichtung & -verfahren
DE602006011600D1 (de) Audiocodierungseinrichtung und audiocodierungsverfahren
DE602004016973D1 (de) Testeinrichtung und testverfahren
DE602006019198D1 (de) Probe- und haltevorrichtung
DE602005003526D1 (de) Biopsiegerät und Biopsieverfahren
DE602006019900D1 (de) Injektionsverfahren und gerät
DE602006014957D1 (de) Audiocodierungseinrichtung und audiocodierungsverfahren
BRPI0615288A2 (pt) dispositivo e método de medida de distância
DE602006016666D1 (de) Kommunikationsvorrichtung und Verfahren
DE602008000065D1 (de) Substrattestvorrichtung und entsprechendes Verfahren
DE602006001275D1 (de) Gassack und Gassackeinrichtung
DE602006009191D1 (de) Bildaufnahmegerät und -verfahren
DE602006011234D1 (de) Airbag und Airbagvorrichtung
DE602006000627D1 (de) Dreidimensionales Messverfahren und dreidimensionale Messvorrichtung
DE602006021341D1 (de) Rauchgasnassentschwefelungsvorrichtung und verfahren zur rauchgasnassentschwefelung
DE602006005104D1 (de) Luftsack und Luftsackvorrichtung
DE602006002000D1 (de) Gassack und Gassackeinrichtung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition