DE602006019198D1 - Probe- und haltevorrichtung - Google Patents

Probe- und haltevorrichtung

Info

Publication number
DE602006019198D1
DE602006019198D1 DE602006019198T DE602006019198T DE602006019198D1 DE 602006019198 D1 DE602006019198 D1 DE 602006019198D1 DE 602006019198 T DE602006019198 T DE 602006019198T DE 602006019198 T DE602006019198 T DE 602006019198T DE 602006019198 D1 DE602006019198 D1 DE 602006019198D1
Authority
DE
Germany
Prior art keywords
sample
holding device
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006019198T
Other languages
English (en)
Inventor
Robert J Brewer
Colin G Lyden
Michael C W Coln
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Publication of DE602006019198D1 publication Critical patent/DE602006019198D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
DE602006019198T 2005-01-26 2006-01-20 Probe- und haltevorrichtung Active DE602006019198D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/045,672 US7113116B2 (en) 2005-01-26 2005-01-26 Sample and hold apparatus
PCT/US2006/001940 WO2006081131A1 (en) 2005-01-26 2006-01-20 Sample and hold apparatus

Publications (1)

Publication Number Publication Date
DE602006019198D1 true DE602006019198D1 (de) 2011-02-10

Family

ID=36123246

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006019198T Active DE602006019198D1 (de) 2005-01-26 2006-01-20 Probe- und haltevorrichtung

Country Status (6)

Country Link
US (1) US7113116B2 (de)
EP (1) EP1842204B1 (de)
JP (1) JP5265200B2 (de)
CN (1) CN100543880C (de)
DE (1) DE602006019198D1 (de)
WO (1) WO2006081131A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7375664B2 (en) * 2006-06-07 2008-05-20 Texas Instruments Incorporated Systems and methods for providing anti-aliasing in a sample-and-hold circuit
KR100755681B1 (ko) * 2006-06-30 2007-09-05 삼성전자주식회사 아날로그 신호를 디지털 신호로 변환하기 위한 장치 및방법
JP4900065B2 (ja) * 2006-10-19 2012-03-21 株式会社デンソー マルチチャネルサンプルホールド回路およびマルチチャネルａ／ｄ変換器
US7400283B1 (en) 2006-12-19 2008-07-15 Actel Corporation Mixed signal system-on-a-chip integrated simultaneous multiple sample/hold circuits and embedded analog comparators
US7941471B2 (en) * 2007-01-29 2011-05-10 International Business Machines Corporation Differential approach to current-mode chaos based random number generator
US7683677B2 (en) * 2007-08-06 2010-03-23 Mediatek Inc. Sample-and-hold amplification circuits
US20090039924A1 (en) * 2007-08-09 2009-02-12 Alfio Zanchi Systems and methods for reducing distortion in semiconductor based sampling systems
JP5321126B2 (ja) * 2009-02-24 2013-10-23 富士通セミコンダクター株式会社 アナログスイッチ回路
JP5409122B2 (ja) * 2009-05-27 2014-02-05 株式会社エーシーティー・エルエスアイ 入力信号の移動平均を出力する平均化回路
GB2479594A (en) * 2010-04-16 2011-10-19 St Microelectronics A sample and hold circuit with internal averaging of samples
WO2011151671A1 (en) * 2010-06-02 2011-12-08 Indian Institute Of Technology Bombay Successive approximation register analog to digital converter circuit
EP2437268B1 (de) * 2010-09-30 2013-01-02 ST-Ericsson SA Pufferschaltung mit Einzeleingang und Differentialausgängen und Verfahren zur Koppelung mindestens eines an einem Einzeleingang anliegenden Analogsignals an eine Empfangsschaltung mit Differentialeingängen
US8581636B2 (en) 2011-12-24 2013-11-12 St-Ericsson Sa Sample-and-hold circuit arrangement
US8513982B1 (en) * 2012-03-19 2013-08-20 Freescale Semiconductor, Inc. Sample and hold circuit and differential sample and hold circuit
EP2847868B1 (de) * 2012-03-30 2018-09-12 Intel Corporation Auf inverter und schaltkondensator basierender rauschunterdrückungsdetektor und verfahren
JP5928130B2 (ja) * 2012-04-25 2016-06-01 富士通株式会社 補間回路および受信回路
WO2014023994A1 (en) * 2012-08-08 2014-02-13 Freescale Semiconductor, Inc. Sample-and-hold circuit, capacitive sensing device, and method of operating a sample-and-hold circuit
EP3576301B1 (de) * 2013-03-15 2024-02-28 Hae-Seung Lee Pufferverstärkerschaltung
TWI646782B (zh) * 2014-04-11 2019-01-01 日商半導體能源研究所股份有限公司 保持電路、保持電路的驅動方法以及包括保持電路的半導體裝置
CN104507105B (zh) * 2014-12-29 2019-03-01 上海大唐移动通信设备有限公司 一种参数自适应过滤方法及装置
US9438262B1 (en) * 2015-06-22 2016-09-06 Freescale Semiconductor, Inc. Method for testing differential analog-to-digital converter and system therefor
US9600707B1 (en) * 2015-11-30 2017-03-21 Fingerprint Cards Ab Analog sampling system and method for noise supression
KR101626876B1 (ko) 2015-12-17 2016-06-02 서울대학교 산학협력단 빔포밍 장치 및 이를 포함하는 시스템
US10050526B2 (en) 2016-08-09 2018-08-14 Nxp Usa, Inc. Switching power converter
US9741449B1 (en) * 2016-08-09 2017-08-22 Nxp Usa, Inc. Sample and hold circuit
US9680453B1 (en) 2016-08-09 2017-06-13 Nxp Usa, Inc. Oscillator circuit

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Publication number Priority date Publication date Assignee Title
US4325027A (en) * 1979-11-28 1982-04-13 Compass Electronics Metal detector for locating objects with full sensitivity in the presence of distributed mineral material
US4331894A (en) 1980-05-29 1982-05-25 American Microsystems, Inc. Switched-capacitor interolation filter
FI63635C (fi) * 1981-06-22 1983-07-11 Instrumentarium Oy Filtrationsarrangemang foer eliminering av naetstoerningar
JPS60124125A (ja) * 1983-12-08 1985-07-03 Ishida Scales Mfg Co Ltd 多入力信号高速アナログ・デジタル変換回路
US4591832A (en) * 1984-07-18 1986-05-27 Rca Corporation Digital-to-analog conversion system as for use in a digital TV receiver
US5162670A (en) * 1990-01-26 1992-11-10 Kabushiki Kaisha Toshiba Sample-and-hold circuit device
US5061865A (en) * 1990-07-23 1991-10-29 Grumman Aerospace Corporation Non-linear transimpedance amplifier
JPH04345277A (ja) 1991-05-23 1992-12-01 Matsushita Electric Ind Co Ltd 電圧ホールド回路
JPH0685670A (ja) 1992-09-03 1994-03-25 Hitachi Ltd サンプリング方法及びサンプリング・システム
US5541599A (en) * 1993-06-30 1996-07-30 Crystal Semiconductor Corporation Data independent loading of a reference in a discrete time system
US5408192A (en) * 1993-10-12 1995-04-18 International Business Machines Corporation Monolithic broadband phase shifting circuit for analog data signals
JP2708007B2 (ja) * 1995-03-31 1998-02-04 日本電気株式会社 サンプル・ホールド回路
US5689201A (en) * 1995-08-08 1997-11-18 Oregon State University Track-and-hold circuit utilizing a negative of the input signal for tracking
EP0825589B1 (de) 1996-08-07 2002-12-04 STMicroelectronics S.r.l. Präzisionsservodemodulator
US5872470A (en) * 1996-11-29 1999-02-16 Varian Associates, Inc. Pipelined sample and hold circuit with correlated double sampling
US6636084B2 (en) * 1999-12-22 2003-10-21 Texas Instruments Incorporated Sample and hold circuit
JP3479506B2 (ja) * 2000-10-18 2003-12-15 有限会社リニアセル・デザイン 加重平均値演算回路
US6529049B2 (en) * 2001-05-10 2003-03-04 National Semiconductor Corporation Pre-charged sample and hold
US6542017B2 (en) * 2001-06-13 2003-04-01 Texas Instruments Incorporated Feed-forward approach for timing skew in interleaved and double-sampled circuits
JP3497495B2 (ja) * 2001-11-21 2004-02-16 株式会社半導体理工学研究センター サンプルホールド回路
US7623171B2 (en) 2003-05-07 2009-11-24 Aptina Imaging Corporation Multiple crawbar switching in charge domain linear operations
US6992509B2 (en) * 2003-10-02 2006-01-31 Supertex, Inc. Switched-capacitor sample/hold having reduced amplifier slew-rate and settling time requirements

Also Published As

Publication number Publication date
EP1842204B1 (de) 2010-12-29
US7113116B2 (en) 2006-09-26
JP5265200B2 (ja) 2013-08-14
JP2008529415A (ja) 2008-07-31
CN101107675A (zh) 2008-01-16
US20060164279A1 (en) 2006-07-27
EP1842204A1 (de) 2007-10-10
CN100543880C (zh) 2009-09-23
WO2006081131A1 (en) 2006-08-03

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