DE602004001679D1 - Speichersystem mit sequenziell ausgeführten schnellen und langsamen lesezugriffen - Google Patents
Speichersystem mit sequenziell ausgeführten schnellen und langsamen lesezugriffenInfo
- Publication number
- DE602004001679D1 DE602004001679D1 DE200460001679 DE602004001679T DE602004001679D1 DE 602004001679 D1 DE602004001679 D1 DE 602004001679D1 DE 200460001679 DE200460001679 DE 200460001679 DE 602004001679 T DE602004001679 T DE 602004001679T DE 602004001679 D1 DE602004001679 D1 DE 602004001679D1
- Authority
- DE
- Germany
- Prior art keywords
- sequencelally
- storage system
- slow reading
- quick
- executed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/30—Arrangements for executing machine instructions, e.g. instruction decode
- G06F9/38—Concurrent instruction execution, e.g. pipeline, look ahead
- G06F9/3867—Concurrent instruction execution, e.g. pipeline, look ahead using instruction pipelines
- G06F9/3869—Implementation aspects, e.g. pipeline latches; pipeline synchronisation and clocking
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/14—Error detection or correction of the data by redundancy in operation
- G06F11/1402—Saving, restoring, recovering or retrying
- G06F11/1405—Saving, restoring, recovering or retrying at machine instruction level
- G06F11/141—Saving, restoring, recovering or retrying at machine instruction level for bus or memory accesses
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/30—Arrangements for executing machine instructions, e.g. instruction decode
- G06F9/38—Concurrent instruction execution, e.g. pipeline, look ahead
- G06F9/3861—Recovery, e.g. branch miss-prediction, exception handling
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1039—Read-write modes for single port memories, i.e. having either a random port or a serial port using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1045—Read-write mode select circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2281—Timing of a read operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Dram (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US392382 | 2003-03-20 | ||
US10/392,382 US7278080B2 (en) | 2003-03-20 | 2003-03-20 | Error detection and recovery within processing stages of an integrated circuit |
US779809 | 2004-02-18 | ||
US10/779,809 US6944067B2 (en) | 2003-03-20 | 2004-02-18 | Memory system having fast and slow data reading mechanisms |
PCT/GB2004/001137 WO2004084233A1 (en) | 2003-03-20 | 2004-03-17 | Momory system having fast and slow data reading mechanisms |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602004001679D1 true DE602004001679D1 (de) | 2006-09-07 |
DE602004001679T2 DE602004001679T2 (de) | 2007-08-02 |
Family
ID=33032649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE200460001679 Expired - Lifetime DE602004001679T2 (de) | 2003-03-20 | 2004-03-17 | Speichersystem mit sequenziell ausgeführten schnellen und langsamen lesezugriffen |
Country Status (7)
Country | Link |
---|---|
US (1) | US7072229B2 (de) |
EP (1) | EP1604371B1 (de) |
JP (1) | JP4279874B2 (de) |
KR (1) | KR100955285B1 (de) |
DE (1) | DE602004001679T2 (de) |
RU (1) | RU2005129281A (de) |
WO (1) | WO2004084233A1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100582391B1 (ko) * | 2004-04-08 | 2006-05-22 | 주식회사 하이닉스반도체 | 반도체 소자에서의 지연 요소의 지연 검출 장치 및 방법 |
US7840875B2 (en) * | 2006-05-15 | 2010-11-23 | Sandisk Corporation | Convolutional coding methods for nonvolatile memory |
US20070266296A1 (en) * | 2006-05-15 | 2007-11-15 | Conley Kevin M | Nonvolatile Memory with Convolutional Coding |
TWI397822B (zh) * | 2006-11-13 | 2013-06-01 | Via Tech Inc | 串列週邊介面控制裝置及串列週邊介面系統以及串列週邊介面裝置之判斷方法 |
US9280419B2 (en) * | 2013-12-16 | 2016-03-08 | International Business Machines Corporation | Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age |
US10565048B2 (en) | 2017-12-01 | 2020-02-18 | Arista Networks, Inc. | Logic buffer for hitless single event upset handling |
KR20210058566A (ko) | 2019-11-14 | 2021-05-24 | 삼성전자주식회사 | 전자 시스템, 그것의 결함 검출 방법, 시스템 온 칩 및 버스 시스템 |
KR20210062278A (ko) * | 2019-11-21 | 2021-05-31 | 주식회사 메타씨앤아이 | 메모리 장치 |
US11967360B2 (en) * | 2021-09-22 | 2024-04-23 | Arm Limited | Dynamically adjustable pipeline for memory access |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US618861A (en) * | 1899-02-07 | Process of and apparatus for manufacturing sheet-glass | ||
SU809350A1 (ru) * | 1979-05-31 | 1981-02-28 | Московский Ордена Трудовогокрасного Знамени Текстильныйинститут | Запоминающее устройство |
JPS6020398A (ja) * | 1983-07-14 | 1985-02-01 | Nec Corp | メモリ装置 |
JPS6224498A (ja) * | 1985-07-24 | 1987-02-02 | Nippon Telegr & Teleph Corp <Ntt> | メモリ読出し方式 |
US4994993A (en) | 1988-10-26 | 1991-02-19 | Advanced Micro Devices, Inc. | System for detecting and correcting errors generated by arithmetic logic units |
US4926374A (en) | 1988-11-23 | 1990-05-15 | International Business Machines Corporation | Residue checking apparatus for detecting errors in add, subtract, multiply, divide and square root operations |
JPH03142629A (ja) * | 1989-10-30 | 1991-06-18 | Toshiba Corp | マイクロコントローラ |
US5203003A (en) * | 1991-03-28 | 1993-04-13 | Echelon Corporation | Computer architecture for conserving power by using shared resources and method for suspending processor execution in pipeline |
EP0653708B1 (de) | 1993-10-15 | 2000-08-16 | Hitachi, Ltd. | Logischer Schaltkreis mit Fehlernachweisfunktion, Verfahren zum Verwalten von Betriebsmitteln und fehlertolerantes System zu seiner Anwendung |
US5734585A (en) * | 1994-11-07 | 1998-03-31 | Norand Corporation | Method and apparatus for sequencing power delivery in mixed supply computer systems |
US5615263A (en) * | 1995-01-06 | 1997-03-25 | Vlsi Technology, Inc. | Dual purpose security architecture with protected internal operating system |
JP3494849B2 (ja) * | 1997-05-29 | 2004-02-09 | 富士通株式会社 | 半導体記憶装置のデータ読み出し方法、半導体記憶装置及び半導体記憶装置の制御装置 |
US6247151B1 (en) * | 1998-06-30 | 2001-06-12 | Intel Corporation | Method and apparatus for verifying that data stored in a memory has not been corrupted |
JP2000228094A (ja) * | 1999-02-04 | 2000-08-15 | Toshiba Corp | 不揮発性半導体記憶装置 |
FR2790887B1 (fr) | 1999-03-09 | 2003-01-03 | Univ Joseph Fourier | Circuit logique protege contre des perturbations transitoires |
JP2003518287A (ja) | 1999-12-23 | 2003-06-03 | ジェネラル・インスツルメント・コーポレイション | デュアルモードプロセッサ |
JP3450814B2 (ja) * | 2000-09-26 | 2003-09-29 | 松下電器産業株式会社 | 情報処理装置 |
FR2815197B1 (fr) * | 2000-10-06 | 2003-01-03 | St Microelectronics Sa | Circuit asynchrone pour la detection et la correction de l'erreur induite et procede de mise en oeuvre |
-
2004
- 2004-03-17 JP JP2006505973A patent/JP4279874B2/ja not_active Expired - Lifetime
- 2004-03-17 WO PCT/GB2004/001137 patent/WO2004084233A1/en active IP Right Grant
- 2004-03-17 DE DE200460001679 patent/DE602004001679T2/de not_active Expired - Lifetime
- 2004-03-17 EP EP20040721230 patent/EP1604371B1/de not_active Expired - Lifetime
- 2004-03-17 RU RU2005129281/09A patent/RU2005129281A/ru not_active Application Discontinuation
- 2004-03-17 KR KR20057017135A patent/KR100955285B1/ko active IP Right Grant
-
2005
- 2005-06-13 US US11/150,585 patent/US7072229B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
RU2005129281A (ru) | 2006-01-27 |
EP1604371A1 (de) | 2005-12-14 |
DE602004001679T2 (de) | 2007-08-02 |
KR100955285B1 (ko) | 2010-04-30 |
JP2006520953A (ja) | 2006-09-14 |
US7072229B2 (en) | 2006-07-04 |
KR20060009236A (ko) | 2006-01-31 |
WO2004084233A1 (en) | 2004-09-30 |
US20060018171A1 (en) | 2006-01-26 |
JP4279874B2 (ja) | 2009-06-17 |
EP1604371B1 (de) | 2006-07-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE602005000972D1 (de) | Speichersystem und Datenverarbeitungssystem | |
DE602005004226D1 (de) | Speichervorrichtung und Informationsverarbeitungssystem | |
DE602004011467D1 (de) | Speichersteuerungssystem und -verfahren | |
DE60315102D1 (de) | Speichersystem | |
DE502004000356D1 (de) | Regalbediengerät | |
DE602005017731D1 (de) | Speichersystem und Speicherverwaltungsverfahren | |
DE60323902D1 (de) | Gesichertes Speichersystem | |
DE60321264D1 (de) | Antriebsstranglagerung | |
DE602006019923D1 (de) | Sensor und Aufzeichnungsgerät mit demselben | |
DK2341147T3 (da) | Præprimitive stribe- og mesendodermceller | |
DE602004019792D1 (de) | USB Speichereinheit und Steuergerät | |
ATE423117T1 (de) | Heterocyclische 7-aminoalkylidenylchinolone und - naphthyridone | |
DE60334181D1 (de) | Radsupport mit Lageranordnung | |
DE602004007884D1 (de) | Speichersteuerungssystem und -Verfahren | |
DE60320649D1 (de) | Datenspeicher mit beschränktem Zugang | |
DE60323806D1 (de) | Speichersystem | |
DE502004003369D1 (de) | Lagersystem und Lagerverfahren | |
NO20042510L (no) | Oppbevarings- og serveringsbeholder | |
DE602004012987D1 (de) | Datenspeichersystem | |
DE602004001679D1 (de) | Speichersystem mit sequenziell ausgeführten schnellen und langsamen lesezugriffen | |
DE60300360D1 (de) | Informationsspeichervorrichtung | |
FI20045505A0 (fi) | Laitteen muistiin tallennettavan tiedon suojaaminen | |
DE602004009281D1 (de) | Speichersystem und Rechnersystem | |
DE60210170D1 (de) | Speichersystem | |
DE602004012813D1 (de) | Magnetoresistives Element, magnetische Speicherzelle und magnetische Speicheranordnung |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |