DE60133162D1 - Inertial-Drehratensensor und -verfahren mit eingebauter Prüfung - Google Patents

Inertial-Drehratensensor und -verfahren mit eingebauter Prüfung

Info

Publication number
DE60133162D1
DE60133162D1 DE60133162T DE60133162T DE60133162D1 DE 60133162 D1 DE60133162 D1 DE 60133162D1 DE 60133162 T DE60133162 T DE 60133162T DE 60133162 T DE60133162 T DE 60133162T DE 60133162 D1 DE60133162 D1 DE 60133162D1
Authority
DE
Germany
Prior art keywords
built
test
rate sensor
rotation rate
inertial rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60133162T
Other languages
English (en)
Other versions
DE60133162T2 (de
Inventor
Larry P Hobbs
Pradeep Bhardwaj
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Custom Sensors and Technologies Inc
Original Assignee
Custom Sensors and Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Custom Sensors and Technologies Inc filed Critical Custom Sensors and Technologies Inc
Publication of DE60133162D1 publication Critical patent/DE60133162D1/de
Application granted granted Critical
Publication of DE60133162T2 publication Critical patent/DE60133162T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5607—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Gyroscopes (AREA)
DE60133162T 2000-09-15 2001-08-17 Inertial-Drehratensensor und -verfahren mit eingebauter Prüfung Expired - Lifetime DE60133162T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/663,740 US6497146B1 (en) 2000-09-15 2000-09-15 Inertial rate sensor and method with built-in testing
US663740 2000-09-15

Publications (2)

Publication Number Publication Date
DE60133162D1 true DE60133162D1 (de) 2008-04-24
DE60133162T2 DE60133162T2 (de) 2009-03-19

Family

ID=24663086

Family Applications (2)

Application Number Title Priority Date Filing Date
DE1189025T Pending DE1189025T1 (de) 2000-09-15 2001-08-17 Inertial-Drehratensensor und -verfahren mit eingebauter Prüfung
DE60133162T Expired - Lifetime DE60133162T2 (de) 2000-09-15 2001-08-17 Inertial-Drehratensensor und -verfahren mit eingebauter Prüfung

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE1189025T Pending DE1189025T1 (de) 2000-09-15 2001-08-17 Inertial-Drehratensensor und -verfahren mit eingebauter Prüfung

Country Status (4)

Country Link
US (1) US6497146B1 (de)
EP (2) EP1921418A2 (de)
JP (1) JP4309082B2 (de)
DE (2) DE1189025T1 (de)

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DE102008031609B4 (de) * 2008-07-07 2010-06-02 Albert-Ludwigs-Universität Freiburg Messvorrichtung mit einem mikroelektromechanischen kapazitiven Sensor
JP5360362B2 (ja) 2008-07-17 2013-12-04 セイコーエプソン株式会社 角速度検出装置用回路、角速度検出装置及び故障判定システム
JP5360361B2 (ja) 2008-07-17 2013-12-04 セイコーエプソン株式会社 角速度検出装置用回路、角速度検出装置及び故障判定システム
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JP5765544B2 (ja) * 2013-12-17 2015-08-19 セイコーエプソン株式会社 物理量検出装置、物理量検出装置の異常診断システム及び物理量検出装置の異常診断方法
CN103822643B (zh) * 2014-01-10 2018-02-02 中国人民解放军63680部队 惯性导航设备板卡故障检测仪
DE102014003640A1 (de) 2014-03-14 2015-09-17 Northrop Grumman Litef Gmbh Verfahren zum optimieren der einschaltzeit eines corioliskreisels sowie dafür geeigneter corioliskreisel
JP6301859B2 (ja) 2014-03-28 2018-03-28 甲神電機株式会社 センサユニットとホスト装置およびそのデータ通信方法
FI127069B (en) 2015-01-12 2017-10-31 Murata Manufacturing Co Continuous self-testing of capacitive sensor
CN111256729B (zh) * 2020-02-21 2021-07-30 中国海洋大学 一种差分带通式调频mems陀螺仪速率解析装置及方法
JP2021144553A (ja) * 2020-03-13 2021-09-24 日立Astemo株式会社 センサ装置
TWI830662B (zh) * 2023-05-01 2024-01-21 神雲科技股份有限公司 監測電源訊號的邏輯裝置及其方法

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Also Published As

Publication number Publication date
JP2002174521A (ja) 2002-06-21
EP1189025A2 (de) 2002-03-20
DE1189025T1 (de) 2003-05-28
EP1189025A3 (de) 2005-04-27
EP1921418A2 (de) 2008-05-14
US6497146B1 (en) 2002-12-24
EP1189025B1 (de) 2008-03-12
DE60133162T2 (de) 2009-03-19
JP4309082B2 (ja) 2009-08-05

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