DE10085145T1 - Spin-Ventil-Sensor - Google Patents

Spin-Ventil-Sensor

Info

Publication number
DE10085145T1
DE10085145T1 DE10085145T DE10085145T DE10085145T1 DE 10085145 T1 DE10085145 T1 DE 10085145T1 DE 10085145 T DE10085145 T DE 10085145T DE 10085145 T DE10085145 T DE 10085145T DE 10085145 T1 DE10085145 T1 DE 10085145T1
Authority
DE
Germany
Prior art keywords
spin valve
valve sensor
sensor
spin
valve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE10085145T
Other languages
English (en)
Inventor
Sining Mao
Zheng Gao
Jian Chen
Edward Stephens Murdock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seagate Technology LLC
Original Assignee
Seagate Technology LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seagate Technology LLC filed Critical Seagate Technology LLC
Publication of DE10085145T1 publication Critical patent/DE10085145T1/de
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • G11B5/398Specially shaped layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3268Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
    • H01F10/3272Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn by use of anti-parallel coupled [APC] ferromagnetic layers, e.g. artificial ferrimagnets [AFI], artificial [AAF] or synthetic [SAF] anti-ferromagnets
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • G01R33/093Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/62Record carriers characterised by the selection of the material
    • G11B5/68Record carriers characterised by the selection of the material comprising one or more layers of magnetisable material homogeneously mixed with a bonding agent
    • G11B5/70Record carriers characterised by the selection of the material comprising one or more layers of magnetisable material homogeneously mixed with a bonding agent on a base layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3254Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3254Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
    • H01F10/3259Spin-exchange-coupled multilayers comprising at least a nanooxide layer [NOL], e.g. with a NOL spacer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3268Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B2005/3996Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00Thin magnetic films, e.g. of one-domain structure
    • H01F10/32Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3263Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being symmetric, e.g. for dual spin valve, e.g. NiO/Co/Cu/Co/Cu/Co/NiO

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nanotechnology (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Hall/Mr Elements (AREA)
  • Magnetic Heads (AREA)
  • Thin Magnetic Films (AREA)
DE10085145T 1999-10-28 2000-10-25 Spin-Ventil-Sensor Ceased DE10085145T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16243899P 1999-10-28 1999-10-28
US09/558,253 US6556390B1 (en) 1999-10-28 2000-04-25 Spin valve sensors with an oxide layer utilizing electron specular scattering effect
PCT/US2000/029408 WO2001031357A1 (en) 1999-10-28 2000-10-25 Spin-valve sensor

Publications (1)

Publication Number Publication Date
DE10085145T1 true DE10085145T1 (de) 2003-02-20

Family

ID=26858766

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10085145T Ceased DE10085145T1 (de) 1999-10-28 2000-10-25 Spin-Ventil-Sensor

Country Status (7)

Country Link
US (1) US6556390B1 (de)
JP (1) JP2003513435A (de)
KR (1) KR20020043250A (de)
CN (1) CN1164953C (de)
DE (1) DE10085145T1 (de)
GB (1) GB2371874B (de)
WO (1) WO2001031357A1 (de)

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4572434B2 (ja) * 1999-03-23 2010-11-04 パナソニック株式会社 磁気抵抗効果素子、磁気抵抗効果型ヘッド、及びメモリ−素子
US7004970B2 (en) 1999-10-20 2006-02-28 Anulex Technologies, Inc. Methods and devices for spinal disc annulus reconstruction and repair
US6392853B1 (en) * 2000-01-24 2002-05-21 Headway Technologies, Inc. Spin valve structure design with laminated free layer
JP2001308413A (ja) * 2000-02-18 2001-11-02 Sony Corp 磁気抵抗効果薄膜、磁気抵抗効果素子及び磁気抵抗効果型磁気ヘッド
US6700753B2 (en) * 2000-04-12 2004-03-02 Seagate Technology Llc Spin valve structures with specular reflection layers
US6853520B2 (en) * 2000-09-05 2005-02-08 Kabushiki Kaisha Toshiba Magnetoresistance effect element
JP4693292B2 (ja) * 2000-09-11 2011-06-01 株式会社東芝 強磁性トンネル接合素子およびその製造方法
US6937446B2 (en) * 2000-10-20 2005-08-30 Kabushiki Kaisha Toshiba Magnetoresistance effect element, magnetic head and magnetic recording and/or reproducing system
US6683761B2 (en) * 2000-11-09 2004-01-27 Seagate Technology Llc Magnetoresistive sensor with laminate electrical interconnect
US6728078B2 (en) * 2001-06-20 2004-04-27 Hitachi Global Storage Technologies Netherlands B.V. High resistance dual antiparallel (AP) pinned spin valve sensor
US6655006B2 (en) * 2001-06-28 2003-12-02 International Business Machines Corporation Method of making a tunnel junction sensor with a smooth interface between a pinned or free layer and a barrier layer
US6636389B2 (en) * 2001-08-03 2003-10-21 International Business Machines Corporation GMR magnetic transducer with nano-oxide exchange coupled free layers
JP2003110168A (ja) * 2001-10-01 2003-04-11 Alps Electric Co Ltd 磁気検出素子及びその製造方法
KR100448990B1 (ko) * 2001-10-10 2004-09-18 한국과학기술연구원 열적 특성이 우수한 듀얼 스핀밸브 자기저항 박막 및 그제조방법
KR100448989B1 (ko) * 2001-10-10 2004-09-18 한국과학기술연구원 열적 특성이 향상된 탑형 및 바톰형 스핀밸브 자기저항박막 및 그 제조방법
US6581272B1 (en) * 2002-01-04 2003-06-24 Headway Technologies, Inc. Method for forming a bottom spin valve magnetoresistive sensor element
US6773515B2 (en) * 2002-01-16 2004-08-10 Headway Technologies, Inc. FeTa nano-oxide layer as a capping layer for enhancement of giant magnetoresistance in bottom spin valve structures
DE10203466A1 (de) * 2002-01-28 2003-08-14 Forschungszentrum Juelich Gmbh GMR-Sensoranordnung und synthetischer Anti-Ferromagnet dafür
US20050259365A1 (en) * 2002-03-08 2005-11-24 Seagate Technology Llc Magnetoresistive sensor with a specular scattering layer formed by deposition from an oxide target
JP4382333B2 (ja) * 2002-03-28 2009-12-09 株式会社東芝 磁気抵抗効果素子、磁気ヘッド及び磁気再生装置
US6822838B2 (en) * 2002-04-02 2004-11-23 International Business Machines Corporation Dual magnetic tunnel junction sensor with a longitudinal bias stack
US6831816B2 (en) * 2002-07-15 2004-12-14 International Business Machines Corporation CPP sensor with in-stack biased free layer
DE10236983A1 (de) * 2002-08-13 2004-03-04 Robert Bosch Gmbh Magnetsensoranordnung
JP2004178659A (ja) * 2002-11-26 2004-06-24 Fujitsu Ltd スピンバルブヘッドおよび磁気記録装置
US7428127B2 (en) * 2002-12-24 2008-09-23 Fujitsu Limited CPP magnetoresistive effect element and magnetic storage device having a CPP magnetoresistive effect element
JP4204385B2 (ja) * 2003-05-27 2009-01-07 Tdk株式会社 薄膜磁気ヘッド
US7158353B2 (en) * 2003-11-06 2007-01-02 Seagate Technology Llc Magnetoresistive sensor having specular sidewall layers
JP4309772B2 (ja) * 2004-01-15 2009-08-05 アルプス電気株式会社 磁気検出素子
GB2435346B (en) * 2004-01-15 2008-01-02 Alps Electric Co Ltd A magnetic sensor
CN100340697C (zh) * 2004-10-28 2007-10-03 复旦大学 一种可提高巨磁电阻效应的自旋阀制备方法
CN100368820C (zh) * 2004-11-10 2008-02-13 中国科学院物理研究所 自旋阀型数字式磁场传感器及其制作方法
US7417832B1 (en) 2005-04-26 2008-08-26 Western Digital (Fremont), Llc Magnetoresistive structure having a novel specular and filter layer combination
JP4786331B2 (ja) 2005-12-21 2011-10-05 株式会社東芝 磁気抵抗効果素子の製造方法
US7684160B1 (en) 2006-02-06 2010-03-23 Western Digital (Fremont), Llc Magnetoresistive structure having a novel specular and barrier layer combination
JP4514721B2 (ja) * 2006-02-09 2010-07-28 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気抵抗効果ヘッド、磁気記録再生装置及び磁気記憶装置
JP2007299880A (ja) * 2006-04-28 2007-11-15 Toshiba Corp 磁気抵抗効果素子,および磁気抵抗効果素子の製造方法
JP4550777B2 (ja) 2006-07-07 2010-09-22 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッド、磁気記録再生装置及び磁気メモリ
JP5044157B2 (ja) * 2006-07-11 2012-10-10 株式会社東芝 磁気抵抗効果素子,磁気ヘッド,および磁気再生装置
JP2008085202A (ja) 2006-09-28 2008-04-10 Toshiba Corp 磁気抵抗効果素子、磁気メモリ、磁気ヘッド、および磁気記録再生装置
JP4388093B2 (ja) 2007-03-27 2009-12-24 株式会社東芝 磁気抵抗効果素子、磁気ヘッド、磁気記録再生装置
JP5150284B2 (ja) 2008-01-30 2013-02-20 株式会社東芝 磁気抵抗効果素子およびその製造方法
JP5361201B2 (ja) 2008-01-30 2013-12-04 株式会社東芝 磁気抵抗効果素子の製造方法
JP5039007B2 (ja) 2008-09-26 2012-10-03 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置
JP5039006B2 (ja) 2008-09-26 2012-10-03 株式会社東芝 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置
JP2010080839A (ja) 2008-09-29 2010-04-08 Toshiba Corp 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリおよび磁気記録再生装置
CN101710528B (zh) * 2009-12-15 2011-08-10 山东大学 纳米复合物有机自旋阀
WO2012082998A1 (en) * 2010-12-15 2012-06-21 Seagate Technology Llc Magnetic sensor seed layer with magnetic and nonmagnetic layers
US8493695B1 (en) 2011-06-28 2013-07-23 Western Digital (Fremont), Llc Method and system for providing a magnetic read transducer having an improved signal to noise ratio
US9664572B2 (en) * 2012-11-28 2017-05-30 Seagate Technology Llc Thin films having large temperature coefficient of resistance and methods of fabricating same
US9529060B2 (en) 2014-01-09 2016-12-27 Allegro Microsystems, Llc Magnetoresistance element with improved response to magnetic fields
JP6763887B2 (ja) 2015-06-05 2020-09-30 アレグロ・マイクロシステムズ・エルエルシー 磁界に対する応答が改善されたスピンバルブ磁気抵抗効果素子
US11022661B2 (en) 2017-05-19 2021-06-01 Allegro Microsystems, Llc Magnetoresistance element with increased operational range
US10620279B2 (en) 2017-05-19 2020-04-14 Allegro Microsystems, Llc Magnetoresistance element with increased operational range

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5764056A (en) 1996-05-16 1998-06-09 Seagate Technology, Inc. Nickel-manganese as a pinning layer in spin valve/GMR magnetic sensors
JP3137580B2 (ja) * 1996-06-14 2001-02-26 ティーディーケイ株式会社 磁性多層膜、磁気抵抗効果素子および磁気変換素子
EP0814519B1 (de) * 1996-06-17 2004-01-21 Sharp Kabushiki Kaisha Element mit magnetoresistivem Effekt, sein Herstellungsverfahren und Magnetkopf daraus
DE19720197C2 (de) * 1997-05-14 2001-11-15 Siemens Ag Dünnschichtenaufbau eines magnetfeldempfindlichen Sensors mit einem einen erhöhten magnetoresistiven Effekt zeigenden Magnetschichtensystem
JP2000517484A (ja) * 1997-07-01 2000-12-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 磁界センサ
US5993566A (en) 1997-09-03 1999-11-30 International Business Machines Corporation Fabrication process of Ni-Mn spin valve sensor
EP0917161B1 (de) * 1997-11-17 2003-02-19 Matsushita Electronics Corporation Dünnschicht mit Wechselkupplung, magnetoresistives Element, magnetoresistiver Kopf und Herstellungsverfahren
JPH11296823A (ja) * 1998-04-09 1999-10-29 Nec Corp 磁気抵抗効果素子およびその製造方法、ならびに磁気抵抗効果センサ,磁気記録システム
US6191926B1 (en) * 1998-05-07 2001-02-20 Seagate Technology Llc Spin valve magnetoresistive sensor using permanent magnet biased artificial antiferromagnet layer
US6327122B1 (en) * 1998-12-04 2001-12-04 International Business Machines Corporation Spin valve sensor having antiparallel (AP) pinned layer with high resistance and low coercivity
US6348274B1 (en) * 1998-12-28 2002-02-19 Kabushiki Kaisha Toshiba Magnetoresistive element and magnetic recording apparatus
US6185080B1 (en) * 1999-03-29 2001-02-06 International Business Machines Corporation Dual tunnel junction sensor with a single antiferromagnetic layer
US6208492B1 (en) * 1999-05-13 2001-03-27 International Business Machines Corporation Seed layer structure for spin valve sensor
US6219208B1 (en) * 1999-06-25 2001-04-17 International Business Machines Corporation Dual spin valve sensor with self-pinned layer specular reflector
US6317298B1 (en) * 1999-06-25 2001-11-13 International Business Machines Corporation Spin valve read sensor with specular reflector structure between a free layer structure and a keeper layer
US6275362B1 (en) * 1999-07-30 2001-08-14 International Business Machines Corporation Magnetic read head having spin valve sensor with improved seed layer for a free layer
US6262869B1 (en) * 1999-08-02 2001-07-17 International Business Machines Corporation Spin valve sensor with encapsulated keeper layer and method of making
US6388847B1 (en) * 2000-02-01 2002-05-14 Headway Technologies, Inc. Specular spin valve with robust pinned layer
US6407890B1 (en) * 2000-02-08 2002-06-18 International Business Machines Corporation Dual spin valve sensor read head with a specular reflector film embedded in each antiparallel (AP) pinned layer next to a spacer layer
US6473278B1 (en) * 2000-07-31 2002-10-29 International Business Machines Corporation Giant magnetoresistive sensor with a high resistivity free layer

Also Published As

Publication number Publication date
JP2003513435A (ja) 2003-04-08
CN1382261A (zh) 2002-11-27
GB2371874B (en) 2004-05-26
WO2001031357A1 (en) 2001-05-03
CN1164953C (zh) 2004-09-01
US6556390B1 (en) 2003-04-29
GB0208890D0 (en) 2002-05-29
GB2371874A (en) 2002-08-07
KR20020043250A (ko) 2002-06-08

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