DE10085145T1 - Spin-Ventil-Sensor - Google Patents
Spin-Ventil-SensorInfo
- Publication number
- DE10085145T1 DE10085145T1 DE10085145T DE10085145T DE10085145T1 DE 10085145 T1 DE10085145 T1 DE 10085145T1 DE 10085145 T DE10085145 T DE 10085145T DE 10085145 T DE10085145 T DE 10085145T DE 10085145 T1 DE10085145 T1 DE 10085145T1
- Authority
- DE
- Germany
- Prior art keywords
- spin valve
- valve sensor
- sensor
- spin
- valve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/398—Specially shaped layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
- H01F10/3272—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn by use of anti-parallel coupled [APC] ferromagnetic layers, e.g. artificial ferrimagnets [AFI], artificial [AAF] or synthetic [SAF] anti-ferromagnets
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/68—Record carriers characterised by the selection of the material comprising one or more layers of magnetisable material homogeneously mixed with a bonding agent
- G11B5/70—Record carriers characterised by the selection of the material comprising one or more layers of magnetisable material homogeneously mixed with a bonding agent on a base layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
- H01F10/3259—Spin-exchange-coupled multilayers comprising at least a nanooxide layer [NOL], e.g. with a NOL spacer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3263—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being symmetric, e.g. for dual spin valve, e.g. NiO/Co/Cu/Co/Cu/Co/NiO
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Hall/Mr Elements (AREA)
- Magnetic Heads (AREA)
- Thin Magnetic Films (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16243899P | 1999-10-28 | 1999-10-28 | |
US09/558,253 US6556390B1 (en) | 1999-10-28 | 2000-04-25 | Spin valve sensors with an oxide layer utilizing electron specular scattering effect |
PCT/US2000/029408 WO2001031357A1 (en) | 1999-10-28 | 2000-10-25 | Spin-valve sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10085145T1 true DE10085145T1 (de) | 2003-02-20 |
Family
ID=26858766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10085145T Ceased DE10085145T1 (de) | 1999-10-28 | 2000-10-25 | Spin-Ventil-Sensor |
Country Status (7)
Country | Link |
---|---|
US (1) | US6556390B1 (de) |
JP (1) | JP2003513435A (de) |
KR (1) | KR20020043250A (de) |
CN (1) | CN1164953C (de) |
DE (1) | DE10085145T1 (de) |
GB (1) | GB2371874B (de) |
WO (1) | WO2001031357A1 (de) |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4572434B2 (ja) * | 1999-03-23 | 2010-11-04 | パナソニック株式会社 | 磁気抵抗効果素子、磁気抵抗効果型ヘッド、及びメモリ−素子 |
US7004970B2 (en) | 1999-10-20 | 2006-02-28 | Anulex Technologies, Inc. | Methods and devices for spinal disc annulus reconstruction and repair |
US6392853B1 (en) * | 2000-01-24 | 2002-05-21 | Headway Technologies, Inc. | Spin valve structure design with laminated free layer |
JP2001308413A (ja) * | 2000-02-18 | 2001-11-02 | Sony Corp | 磁気抵抗効果薄膜、磁気抵抗効果素子及び磁気抵抗効果型磁気ヘッド |
US6700753B2 (en) * | 2000-04-12 | 2004-03-02 | Seagate Technology Llc | Spin valve structures with specular reflection layers |
US6853520B2 (en) * | 2000-09-05 | 2005-02-08 | Kabushiki Kaisha Toshiba | Magnetoresistance effect element |
JP4693292B2 (ja) * | 2000-09-11 | 2011-06-01 | 株式会社東芝 | 強磁性トンネル接合素子およびその製造方法 |
US6937446B2 (en) * | 2000-10-20 | 2005-08-30 | Kabushiki Kaisha Toshiba | Magnetoresistance effect element, magnetic head and magnetic recording and/or reproducing system |
US6683761B2 (en) * | 2000-11-09 | 2004-01-27 | Seagate Technology Llc | Magnetoresistive sensor with laminate electrical interconnect |
US6728078B2 (en) * | 2001-06-20 | 2004-04-27 | Hitachi Global Storage Technologies Netherlands B.V. | High resistance dual antiparallel (AP) pinned spin valve sensor |
US6655006B2 (en) * | 2001-06-28 | 2003-12-02 | International Business Machines Corporation | Method of making a tunnel junction sensor with a smooth interface between a pinned or free layer and a barrier layer |
US6636389B2 (en) * | 2001-08-03 | 2003-10-21 | International Business Machines Corporation | GMR magnetic transducer with nano-oxide exchange coupled free layers |
JP2003110168A (ja) * | 2001-10-01 | 2003-04-11 | Alps Electric Co Ltd | 磁気検出素子及びその製造方法 |
KR100448990B1 (ko) * | 2001-10-10 | 2004-09-18 | 한국과학기술연구원 | 열적 특성이 우수한 듀얼 스핀밸브 자기저항 박막 및 그제조방법 |
KR100448989B1 (ko) * | 2001-10-10 | 2004-09-18 | 한국과학기술연구원 | 열적 특성이 향상된 탑형 및 바톰형 스핀밸브 자기저항박막 및 그 제조방법 |
US6581272B1 (en) * | 2002-01-04 | 2003-06-24 | Headway Technologies, Inc. | Method for forming a bottom spin valve magnetoresistive sensor element |
US6773515B2 (en) * | 2002-01-16 | 2004-08-10 | Headway Technologies, Inc. | FeTa nano-oxide layer as a capping layer for enhancement of giant magnetoresistance in bottom spin valve structures |
DE10203466A1 (de) * | 2002-01-28 | 2003-08-14 | Forschungszentrum Juelich Gmbh | GMR-Sensoranordnung und synthetischer Anti-Ferromagnet dafür |
US20050259365A1 (en) * | 2002-03-08 | 2005-11-24 | Seagate Technology Llc | Magnetoresistive sensor with a specular scattering layer formed by deposition from an oxide target |
JP4382333B2 (ja) * | 2002-03-28 | 2009-12-09 | 株式会社東芝 | 磁気抵抗効果素子、磁気ヘッド及び磁気再生装置 |
US6822838B2 (en) * | 2002-04-02 | 2004-11-23 | International Business Machines Corporation | Dual magnetic tunnel junction sensor with a longitudinal bias stack |
US6831816B2 (en) * | 2002-07-15 | 2004-12-14 | International Business Machines Corporation | CPP sensor with in-stack biased free layer |
DE10236983A1 (de) * | 2002-08-13 | 2004-03-04 | Robert Bosch Gmbh | Magnetsensoranordnung |
JP2004178659A (ja) * | 2002-11-26 | 2004-06-24 | Fujitsu Ltd | スピンバルブヘッドおよび磁気記録装置 |
US7428127B2 (en) * | 2002-12-24 | 2008-09-23 | Fujitsu Limited | CPP magnetoresistive effect element and magnetic storage device having a CPP magnetoresistive effect element |
JP4204385B2 (ja) * | 2003-05-27 | 2009-01-07 | Tdk株式会社 | 薄膜磁気ヘッド |
US7158353B2 (en) * | 2003-11-06 | 2007-01-02 | Seagate Technology Llc | Magnetoresistive sensor having specular sidewall layers |
JP4309772B2 (ja) * | 2004-01-15 | 2009-08-05 | アルプス電気株式会社 | 磁気検出素子 |
GB2435346B (en) * | 2004-01-15 | 2008-01-02 | Alps Electric Co Ltd | A magnetic sensor |
CN100340697C (zh) * | 2004-10-28 | 2007-10-03 | 复旦大学 | 一种可提高巨磁电阻效应的自旋阀制备方法 |
CN100368820C (zh) * | 2004-11-10 | 2008-02-13 | 中国科学院物理研究所 | 自旋阀型数字式磁场传感器及其制作方法 |
US7417832B1 (en) | 2005-04-26 | 2008-08-26 | Western Digital (Fremont), Llc | Magnetoresistive structure having a novel specular and filter layer combination |
JP4786331B2 (ja) | 2005-12-21 | 2011-10-05 | 株式会社東芝 | 磁気抵抗効果素子の製造方法 |
US7684160B1 (en) | 2006-02-06 | 2010-03-23 | Western Digital (Fremont), Llc | Magnetoresistive structure having a novel specular and barrier layer combination |
JP4514721B2 (ja) * | 2006-02-09 | 2010-07-28 | 株式会社東芝 | 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気抵抗効果ヘッド、磁気記録再生装置及び磁気記憶装置 |
JP2007299880A (ja) * | 2006-04-28 | 2007-11-15 | Toshiba Corp | 磁気抵抗効果素子,および磁気抵抗効果素子の製造方法 |
JP4550777B2 (ja) | 2006-07-07 | 2010-09-22 | 株式会社東芝 | 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッド、磁気記録再生装置及び磁気メモリ |
JP5044157B2 (ja) * | 2006-07-11 | 2012-10-10 | 株式会社東芝 | 磁気抵抗効果素子,磁気ヘッド,および磁気再生装置 |
JP2008085202A (ja) | 2006-09-28 | 2008-04-10 | Toshiba Corp | 磁気抵抗効果素子、磁気メモリ、磁気ヘッド、および磁気記録再生装置 |
JP4388093B2 (ja) | 2007-03-27 | 2009-12-24 | 株式会社東芝 | 磁気抵抗効果素子、磁気ヘッド、磁気記録再生装置 |
JP5150284B2 (ja) | 2008-01-30 | 2013-02-20 | 株式会社東芝 | 磁気抵抗効果素子およびその製造方法 |
JP5361201B2 (ja) | 2008-01-30 | 2013-12-04 | 株式会社東芝 | 磁気抵抗効果素子の製造方法 |
JP5039007B2 (ja) | 2008-09-26 | 2012-10-03 | 株式会社東芝 | 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置 |
JP5039006B2 (ja) | 2008-09-26 | 2012-10-03 | 株式会社東芝 | 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリ及び磁気記録再生装置 |
JP2010080839A (ja) | 2008-09-29 | 2010-04-08 | Toshiba Corp | 磁気抵抗効果素子の製造方法、磁気抵抗効果素子、磁気ヘッドアセンブリおよび磁気記録再生装置 |
CN101710528B (zh) * | 2009-12-15 | 2011-08-10 | 山东大学 | 纳米复合物有机自旋阀 |
WO2012082998A1 (en) * | 2010-12-15 | 2012-06-21 | Seagate Technology Llc | Magnetic sensor seed layer with magnetic and nonmagnetic layers |
US8493695B1 (en) | 2011-06-28 | 2013-07-23 | Western Digital (Fremont), Llc | Method and system for providing a magnetic read transducer having an improved signal to noise ratio |
US9664572B2 (en) * | 2012-11-28 | 2017-05-30 | Seagate Technology Llc | Thin films having large temperature coefficient of resistance and methods of fabricating same |
US9529060B2 (en) | 2014-01-09 | 2016-12-27 | Allegro Microsystems, Llc | Magnetoresistance element with improved response to magnetic fields |
JP6763887B2 (ja) | 2015-06-05 | 2020-09-30 | アレグロ・マイクロシステムズ・エルエルシー | 磁界に対する応答が改善されたスピンバルブ磁気抵抗効果素子 |
US11022661B2 (en) | 2017-05-19 | 2021-06-01 | Allegro Microsystems, Llc | Magnetoresistance element with increased operational range |
US10620279B2 (en) | 2017-05-19 | 2020-04-14 | Allegro Microsystems, Llc | Magnetoresistance element with increased operational range |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5764056A (en) | 1996-05-16 | 1998-06-09 | Seagate Technology, Inc. | Nickel-manganese as a pinning layer in spin valve/GMR magnetic sensors |
JP3137580B2 (ja) * | 1996-06-14 | 2001-02-26 | ティーディーケイ株式会社 | 磁性多層膜、磁気抵抗効果素子および磁気変換素子 |
EP0814519B1 (de) * | 1996-06-17 | 2004-01-21 | Sharp Kabushiki Kaisha | Element mit magnetoresistivem Effekt, sein Herstellungsverfahren und Magnetkopf daraus |
DE19720197C2 (de) * | 1997-05-14 | 2001-11-15 | Siemens Ag | Dünnschichtenaufbau eines magnetfeldempfindlichen Sensors mit einem einen erhöhten magnetoresistiven Effekt zeigenden Magnetschichtensystem |
JP2000517484A (ja) * | 1997-07-01 | 2000-12-26 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 磁界センサ |
US5993566A (en) | 1997-09-03 | 1999-11-30 | International Business Machines Corporation | Fabrication process of Ni-Mn spin valve sensor |
EP0917161B1 (de) * | 1997-11-17 | 2003-02-19 | Matsushita Electronics Corporation | Dünnschicht mit Wechselkupplung, magnetoresistives Element, magnetoresistiver Kopf und Herstellungsverfahren |
JPH11296823A (ja) * | 1998-04-09 | 1999-10-29 | Nec Corp | 磁気抵抗効果素子およびその製造方法、ならびに磁気抵抗効果センサ,磁気記録システム |
US6191926B1 (en) * | 1998-05-07 | 2001-02-20 | Seagate Technology Llc | Spin valve magnetoresistive sensor using permanent magnet biased artificial antiferromagnet layer |
US6327122B1 (en) * | 1998-12-04 | 2001-12-04 | International Business Machines Corporation | Spin valve sensor having antiparallel (AP) pinned layer with high resistance and low coercivity |
US6348274B1 (en) * | 1998-12-28 | 2002-02-19 | Kabushiki Kaisha Toshiba | Magnetoresistive element and magnetic recording apparatus |
US6185080B1 (en) * | 1999-03-29 | 2001-02-06 | International Business Machines Corporation | Dual tunnel junction sensor with a single antiferromagnetic layer |
US6208492B1 (en) * | 1999-05-13 | 2001-03-27 | International Business Machines Corporation | Seed layer structure for spin valve sensor |
US6219208B1 (en) * | 1999-06-25 | 2001-04-17 | International Business Machines Corporation | Dual spin valve sensor with self-pinned layer specular reflector |
US6317298B1 (en) * | 1999-06-25 | 2001-11-13 | International Business Machines Corporation | Spin valve read sensor with specular reflector structure between a free layer structure and a keeper layer |
US6275362B1 (en) * | 1999-07-30 | 2001-08-14 | International Business Machines Corporation | Magnetic read head having spin valve sensor with improved seed layer for a free layer |
US6262869B1 (en) * | 1999-08-02 | 2001-07-17 | International Business Machines Corporation | Spin valve sensor with encapsulated keeper layer and method of making |
US6388847B1 (en) * | 2000-02-01 | 2002-05-14 | Headway Technologies, Inc. | Specular spin valve with robust pinned layer |
US6407890B1 (en) * | 2000-02-08 | 2002-06-18 | International Business Machines Corporation | Dual spin valve sensor read head with a specular reflector film embedded in each antiparallel (AP) pinned layer next to a spacer layer |
US6473278B1 (en) * | 2000-07-31 | 2002-10-29 | International Business Machines Corporation | Giant magnetoresistive sensor with a high resistivity free layer |
-
2000
- 2000-04-25 US US09/558,253 patent/US6556390B1/en not_active Expired - Lifetime
- 2000-10-25 CN CNB008148139A patent/CN1164953C/zh not_active Expired - Fee Related
- 2000-10-25 JP JP2001533442A patent/JP2003513435A/ja active Pending
- 2000-10-25 KR KR1020027005371A patent/KR20020043250A/ko not_active Application Discontinuation
- 2000-10-25 WO PCT/US2000/029408 patent/WO2001031357A1/en not_active Application Discontinuation
- 2000-10-25 DE DE10085145T patent/DE10085145T1/de not_active Ceased
- 2000-10-25 GB GB0208890A patent/GB2371874B/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2003513435A (ja) | 2003-04-08 |
CN1382261A (zh) | 2002-11-27 |
GB2371874B (en) | 2004-05-26 |
WO2001031357A1 (en) | 2001-05-03 |
CN1164953C (zh) | 2004-09-01 |
US6556390B1 (en) | 2003-04-29 |
GB0208890D0 (en) | 2002-05-29 |
GB2371874A (en) | 2002-08-07 |
KR20020043250A (ko) | 2002-06-08 |
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