DE60114260T2 - Aktive, schwingungsdämpfende Einrichtung und Beleuchtungseinrichtung - Google Patents
Aktive, schwingungsdämpfende Einrichtung und Beleuchtungseinrichtung Download PDFInfo
- Publication number
- DE60114260T2 DE60114260T2 DE60114260T DE60114260T DE60114260T2 DE 60114260 T2 DE60114260 T2 DE 60114260T2 DE 60114260 T DE60114260 T DE 60114260T DE 60114260 T DE60114260 T DE 60114260T DE 60114260 T2 DE60114260 T2 DE 60114260T2
- Authority
- DE
- Germany
- Prior art keywords
- compensation
- compensating
- vibration
- signal
- driving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
- F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
- F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
- F16F15/023—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using fluid means
- F16F15/027—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using fluid means comprising control arrangements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Mechanical Engineering (AREA)
- Aviation & Aerospace Engineering (AREA)
- Acoustics & Sound (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Vibration Prevention Devices (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000031342A JP4416250B2 (ja) | 2000-02-09 | 2000-02-09 | アクティブ除振装置及び露光装置 |
| JP2000031342 | 2000-02-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60114260D1 DE60114260D1 (de) | 2005-12-01 |
| DE60114260T2 true DE60114260T2 (de) | 2006-07-13 |
Family
ID=18556109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60114260T Expired - Fee Related DE60114260T2 (de) | 2000-02-09 | 2001-02-07 | Aktive, schwingungsdämpfende Einrichtung und Beleuchtungseinrichtung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6684132B2 (https=) |
| EP (1) | EP1124078B1 (https=) |
| JP (1) | JP4416250B2 (https=) |
| KR (1) | KR20010078795A (https=) |
| DE (1) | DE60114260T2 (https=) |
| TW (1) | TW535227B (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112013003048B4 (de) | 2012-06-26 | 2019-05-09 | Hitachi High-Technologies Corp. | Tischvorrichtung und Probenbetrachtungsvorrichtung |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3670575B2 (ja) * | 2000-01-12 | 2005-07-13 | Tdk株式会社 | コイル封入圧粉コアの製造方法およびコイル封入圧粉コア |
| JP2003202051A (ja) * | 2002-01-04 | 2003-07-18 | Canon Inc | 除振装置 |
| US7108497B2 (en) * | 2004-01-12 | 2006-09-19 | Omnimold, Llc | Interchangeable blow mold parison closing apparatus |
| JP2005282696A (ja) * | 2004-03-29 | 2005-10-13 | Canon Inc | 除振マウント装置、露光装置及びデバイス製造方法 |
| JP4290172B2 (ja) * | 2006-03-30 | 2009-07-01 | キヤノン株式会社 | 伝達特性算出装置及び伝達特性算出方法並びに露光装置 |
| JP4906416B2 (ja) * | 2006-07-11 | 2012-03-28 | 日本碍子株式会社 | 物体の通過検出装置 |
| JP4970904B2 (ja) * | 2006-11-06 | 2012-07-11 | 倉敷化工株式会社 | アクティブ除振装置 |
| EP2119938A1 (en) * | 2008-05-15 | 2009-11-18 | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO | A vibration sensor and a system to isolate vibrations. |
| US20140293251A1 (en) * | 2008-08-18 | 2014-10-02 | Asml Netherlands B.V. | Projection System, Lithographic Apparatus, Method of Projecting a Beam of Radiation onto a Target and Device Manufacturing Method |
| TWI391703B (zh) * | 2008-12-03 | 2013-04-01 | Asia Optical Co Inc | 光學防手震系統之增益調整裝置及其方法 |
| JP6151927B2 (ja) * | 2012-02-17 | 2017-06-21 | キヤノン株式会社 | アクティブ除振装置 |
| JP6152001B2 (ja) * | 2012-08-03 | 2017-06-21 | キヤノン株式会社 | アクティブ除振装置、除振方法、加工装置、検査装置、露光装置及びワークの製造方法 |
| EP2846062B1 (de) * | 2013-09-10 | 2017-05-31 | Integrated Dynamics Engineering GmbH | Schwingungsisolationssystem mit in Teilbereiche unterteilter Auflage sowie Verfahren zu dessen Regelung |
| JP6681982B2 (ja) * | 2015-11-23 | 2020-04-15 | エーエスエムエル ネザーランズ ビー.ブイ. | 位置決めデバイス、リソグラフィ装置、及びデバイス製造方法 |
| NL2017809A (en) * | 2015-12-21 | 2017-06-27 | Asml Netherlands Bv | Lithographic apparatus having an active base frame support |
| JP6556196B2 (ja) | 2017-07-27 | 2019-08-07 | 倉敷化工株式会社 | アクティブ除振装置 |
| NL2022752A (en) | 2018-04-25 | 2019-10-31 | Asml Netherlands Bv | Pneumatic support device and lithographic apparatus with pneumatic support device. |
| CN110566629B (zh) * | 2019-09-20 | 2020-06-26 | 乐清市芮易经济信息咨询有限公司 | 基于振动补偿的大型机器用共振消除装置 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3217522B2 (ja) | 1992-03-02 | 2001-10-09 | キヤノン株式会社 | 精密位置決め装置 |
| JP3184044B2 (ja) | 1994-05-24 | 2001-07-09 | キヤノン株式会社 | 微動位置決め制御装置 |
| JP3224489B2 (ja) | 1995-03-28 | 2001-10-29 | キヤノン株式会社 | 空気バネ式除振装置 |
| US5812420A (en) | 1995-09-05 | 1998-09-22 | Nikon Corporation | Vibration-preventive apparatus and exposure apparatus |
| JP3807516B2 (ja) | 1995-09-05 | 2006-08-09 | 株式会社ニコン | 除振装置、除振方法及び露光装置 |
| JPH09326362A (ja) | 1996-04-05 | 1997-12-16 | Nikon Corp | 除振装置及び露光装置 |
| JP3733174B2 (ja) | 1996-06-19 | 2006-01-11 | キヤノン株式会社 | 走査型投影露光装置 |
| JP3581499B2 (ja) | 1996-09-27 | 2004-10-27 | キヤノン株式会社 | 除振装置及びその制御方法 |
| US6128552A (en) * | 1996-11-08 | 2000-10-03 | Canon Kabushiki Kaisha | Anti-vibration apparatus and method |
| JPH10141428A (ja) | 1996-11-08 | 1998-05-29 | Canon Inc | 能動除振装置 |
| JP3286201B2 (ja) | 1997-03-07 | 2002-05-27 | キヤノン株式会社 | 能動的除振装置 |
| US6170622B1 (en) | 1997-03-07 | 2001-01-09 | Canon Kabushiki Kaisha | Anti-vibration apparatus and anti-vibration method thereof |
| JPH10261561A (ja) | 1997-03-18 | 1998-09-29 | Toshiba Corp | 露光制御方法及びその装置 |
| JPH10311364A (ja) | 1997-05-09 | 1998-11-24 | Canon Inc | 能動的除振制振装置 |
| ATE419789T1 (de) | 1997-05-23 | 2009-01-15 | Prorhythm Inc | Wegwerfbarer fokussierender ultraschallapplikator hoher intensität |
| JP4313865B2 (ja) | 1998-01-14 | 2009-08-12 | キヤノン株式会社 | 除振装置 |
| JP4109747B2 (ja) | 1998-05-07 | 2008-07-02 | キヤノン株式会社 | アクティブ除振装置および露光装置 |
-
2000
- 2000-02-09 JP JP2000031342A patent/JP4416250B2/ja not_active Expired - Fee Related
-
2001
- 2001-02-07 EP EP01301082A patent/EP1124078B1/en not_active Expired - Lifetime
- 2001-02-07 TW TW090102620A patent/TW535227B/zh not_active IP Right Cessation
- 2001-02-07 DE DE60114260T patent/DE60114260T2/de not_active Expired - Fee Related
- 2001-02-07 US US09/777,955 patent/US6684132B2/en not_active Expired - Lifetime
- 2001-02-09 KR KR1020010006294A patent/KR20010078795A/ko not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112013003048B4 (de) | 2012-06-26 | 2019-05-09 | Hitachi High-Technologies Corp. | Tischvorrichtung und Probenbetrachtungsvorrichtung |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001221278A (ja) | 2001-08-17 |
| DE60114260D1 (de) | 2005-12-01 |
| EP1124078A3 (en) | 2003-06-18 |
| EP1124078B1 (en) | 2005-10-26 |
| EP1124078A2 (en) | 2001-08-16 |
| JP4416250B2 (ja) | 2010-02-17 |
| US20010011697A1 (en) | 2001-08-09 |
| TW535227B (en) | 2003-06-01 |
| US6684132B2 (en) | 2004-01-27 |
| KR20010078795A (ko) | 2001-08-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |