DE60108023D1 - Halbleiteranordnung mit eingebauter Schaltung zum Detektieren einer kleinen Ladung - Google Patents

Halbleiteranordnung mit eingebauter Schaltung zum Detektieren einer kleinen Ladung

Info

Publication number
DE60108023D1
DE60108023D1 DE60108023T DE60108023T DE60108023D1 DE 60108023 D1 DE60108023 D1 DE 60108023D1 DE 60108023 T DE60108023 T DE 60108023T DE 60108023 T DE60108023 T DE 60108023T DE 60108023 D1 DE60108023 D1 DE 60108023D1
Authority
DE
Germany
Prior art keywords
built
detecting
circuit
semiconductor arrangement
small charge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60108023T
Other languages
English (en)
Other versions
DE60108023T2 (de
Inventor
Masaaki Yamadate
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of DE60108023D1 publication Critical patent/DE60108023D1/de
Application granted granted Critical
Publication of DE60108023T2 publication Critical patent/DE60108023T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Amplifiers (AREA)
DE60108023T 2000-09-18 2001-09-17 Halbleiteranordnung mit eingebauter Schaltung zum Detektieren einer kleinen Ladung Expired - Lifetime DE60108023T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000281720 2000-09-18
JP2000281720A JP3584205B2 (ja) 2000-09-18 2000-09-18 半導体装置

Publications (2)

Publication Number Publication Date
DE60108023D1 true DE60108023D1 (de) 2005-02-03
DE60108023T2 DE60108023T2 (de) 2005-12-15

Family

ID=18766334

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60108023T Expired - Lifetime DE60108023T2 (de) 2000-09-18 2001-09-17 Halbleiteranordnung mit eingebauter Schaltung zum Detektieren einer kleinen Ladung

Country Status (4)

Country Link
US (1) US6365914B1 (de)
EP (1) EP1189067B1 (de)
JP (1) JP3584205B2 (de)
DE (1) DE60108023T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4420156B2 (ja) * 2000-06-14 2010-02-24 日本電気株式会社 半導体装置
GB2420458B (en) * 2004-11-19 2008-09-17 Matsushita Electric Ind Co Ltd Envelope detector circuit
US8154275B2 (en) * 2009-07-15 2012-04-10 Apple Inc. Apparatus and method for testing sense amplifier thresholds on an integrated circuit

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4532442A (en) * 1981-10-23 1985-07-30 Black Ian A Noise reduction in electronic measuring circuits
JPS5885479A (ja) 1981-11-17 1983-05-21 株式会社東芝 路線表示装置
JPH0738545B2 (ja) * 1988-05-12 1995-04-26 株式会社村田製作所 電荷発生型検知素子の信号処理回路
US5206500A (en) * 1992-05-28 1993-04-27 Cincinnati Microwave, Inc. Pulsed-laser detection with pulse stretcher and noise averaging
US5543728A (en) * 1993-06-15 1996-08-06 Grace; James W. Low leakage diode switches for a tester circuit for integrated circuits
DE19506134B4 (de) * 1994-03-04 2005-08-25 Volkswagen Ag Ladungsverstärker
JP3171373B2 (ja) * 1995-10-12 2001-05-28 アルプス電気株式会社 微小電流検出回路およびこれを利用した座標入力装置
DK0834992T3 (da) * 1996-10-02 1999-09-13 Kavlico Corp Monolitisk MOS-switched-capacitor-kredsløb med on-chip oscillator
US5838241A (en) * 1996-12-18 1998-11-17 Robertshaw Controls Company Liquid level transmitter
JP4042069B2 (ja) * 1996-12-26 2008-02-06 聯華電子股▲分▼有限公司 積分入力型入力回路およびそのテスト方法

Also Published As

Publication number Publication date
JP2002090430A (ja) 2002-03-27
EP1189067A3 (de) 2003-09-17
JP3584205B2 (ja) 2004-11-04
EP1189067B1 (de) 2004-12-29
US20020033482A1 (en) 2002-03-21
US6365914B1 (en) 2002-04-02
DE60108023T2 (de) 2005-12-15
EP1189067A2 (de) 2002-03-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition