DE60103361T2 - Bitfehlerratenmessung - Google Patents

Bitfehlerratenmessung Download PDF

Info

Publication number
DE60103361T2
DE60103361T2 DE60103361T DE60103361T DE60103361T2 DE 60103361 T2 DE60103361 T2 DE 60103361T2 DE 60103361 T DE60103361 T DE 60103361T DE 60103361 T DE60103361 T DE 60103361T DE 60103361 T2 DE60103361 T2 DE 60103361T2
Authority
DE
Germany
Prior art keywords
ber
dut
points
test
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60103361T
Other languages
German (de)
English (en)
Other versions
DE60103361D1 (de
Inventor
Michael Fleischer-Reumann
Peter Schinzel
Guenter Tietz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE60103361D1 publication Critical patent/DE60103361D1/de
Publication of DE60103361T2 publication Critical patent/DE60103361T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
DE60103361T 2001-03-16 2001-03-16 Bitfehlerratenmessung Expired - Fee Related DE60103361T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01106632A EP1241483B1 (en) 2001-03-16 2001-03-16 Bit error rate measurement

Publications (2)

Publication Number Publication Date
DE60103361D1 DE60103361D1 (de) 2004-06-24
DE60103361T2 true DE60103361T2 (de) 2005-06-09

Family

ID=8176813

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60103361T Expired - Fee Related DE60103361T2 (de) 2001-03-16 2001-03-16 Bitfehlerratenmessung

Country Status (4)

Country Link
US (1) US7389450B2 (https=)
EP (1) EP1241483B1 (https=)
JP (1) JP4046518B2 (https=)
DE (1) DE60103361T2 (https=)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6810346B2 (en) 2002-01-31 2004-10-26 Agilent Technologies, Inc. Composite eye diagrams
US6668235B2 (en) * 2002-03-28 2003-12-23 Agilent Technologies, Inc. Identification of channels and associated signal information contributing to a portion of a composite eye diagram
EP1502377B1 (en) * 2002-05-08 2012-08-08 Rohde & Schwarz GmbH & Co. KG Method for testing the error ratio of a device using a preliminary probability
EP1426779B1 (en) * 2002-07-25 2007-08-15 Agilent Technologies, Inc. BER tester with signal sampling with clock recovery
WO2005015248A1 (en) * 2003-08-06 2005-02-17 Agilent Technologies, Inc. Digital data signal testing using arbitrary test signal
EP1508813B1 (en) * 2003-08-20 2007-01-31 Agilent Technologies, Inc. Spectral jitter analysis allowing jitter modulation waveform analysis
US7174279B2 (en) * 2004-03-31 2007-02-06 Teradyne, Inc. Test system with differential signal measurement
US7668233B2 (en) * 2004-07-28 2010-02-23 Circadiant Systems, Inc. Method of determining jitter and apparatus for determining jitter
KR100630710B1 (ko) * 2004-11-04 2006-10-02 삼성전자주식회사 다수개의 페일 비트를 검출할 수 있는 반도체 메모리의페일 비트 검출 장치
CN101300599A (zh) * 2005-08-29 2008-11-05 特克特朗尼克公司 具有期望概率的视频峰抖动的测量和显示
US7610520B2 (en) 2006-02-06 2009-10-27 Agilent Technologies, Inc. Digital data signal testing using arbitrary test signal
JP4684961B2 (ja) * 2006-07-10 2011-05-18 アンリツ株式会社 試験信号検証装置
US8705603B2 (en) * 2008-02-05 2014-04-22 Vitesse Semiconductor Corporation Adaptive data recovery system with input signal equalization
US8284888B2 (en) * 2010-01-14 2012-10-09 Ian Kyles Frequency and phase acquisition of a clock and data recovery circuit without an external reference clock
US8537480B1 (en) * 2010-11-23 2013-09-17 Western Digital Technologies, Inc. Hard drive testing
US8515416B2 (en) * 2011-04-29 2013-08-20 Silicon Laboratories Inc Performing testing in a radio device
US10491342B1 (en) 2018-07-23 2019-11-26 Hewlett Packard Enterprise Development Lp Bit error ratio tests with two-sided bit error ratio frequentist intervals
JP2020047332A (ja) * 2018-09-18 2020-03-26 株式会社東芝 ライト回数の上限値の設定方法及び磁気ディスク装置
US11216325B2 (en) * 2019-06-28 2022-01-04 Arista Networks, Inc. Reducing cross talk among connector pins
CN114301544A (zh) * 2021-09-08 2022-04-08 深圳市星芯顶科技有限公司 具有眼图功能的误码仪
CN115542136B (zh) * 2022-09-29 2024-09-10 苏州工业园区慧鱼科技有限公司 基于fpga的线缆测试方法及设备

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4207523A (en) * 1977-09-01 1980-06-10 Honeywell Inc. Digital channel on-line pseudo error dispersion monitor
US4234954A (en) * 1979-01-24 1980-11-18 Ford Aerospace & Communications Corp. On-line bit error rate estimator
EP0020827B1 (en) * 1979-06-15 1982-12-01 The Post Office An arrangement for monitoring the performance of a digital transmission system
DE3012400C2 (de) * 1980-03-29 1986-03-06 ANT Nachrichtentechnik GmbH, 7150 Backnang Verfahren zur Überwachung der Bitfehlerrate
JP2604606B2 (ja) * 1987-11-24 1997-04-30 株式会社アドバンテスト 回路試験装置
US4920537A (en) * 1988-07-05 1990-04-24 Darling Andrew S Method and apparatus for non-intrusive bit error rate testing
WO1991009482A1 (en) * 1989-12-07 1991-06-27 The Commonwealth Of Australia Error rate monitor
US5228042A (en) * 1991-02-07 1993-07-13 Northern Telecom Limited Method and circuit for testing transmission paths
CA2056679C (en) * 1991-11-29 2002-02-12 Timothy Joseph Nohara Automatic monitoring of digital communication channel conditions using eye patterns
JPH07225263A (ja) * 1994-02-09 1995-08-22 Advantest Corp ビット誤り測定器
US5761216A (en) * 1995-02-24 1998-06-02 Advantest Corp. Bit error measurement system
US5831988A (en) * 1997-01-23 1998-11-03 Unisys Corporation Fault isolating to a block of ROM
US6169907B1 (en) * 1997-10-21 2001-01-02 Interwave Communications International Ltd. Power control of remote communication devices
US6249518B1 (en) * 1998-08-07 2001-06-19 Nortel Networks Limited TDMA single antenna co-channel interference cancellation
US6178213B1 (en) * 1998-08-25 2001-01-23 Vitesse Semiconductor Corporation Adaptive data recovery system and methods
US6292911B1 (en) * 1998-12-17 2001-09-18 Cirrus Logic, Inc. Error detection scheme for a high-speed data channel
GB2350531B (en) * 1999-05-26 2001-07-11 3Com Corp High speed parallel bit error rate tester
US6430715B1 (en) * 1999-09-17 2002-08-06 Digital Lightwave, Inc. Protocol and bit rate independent test system
US6583903B1 (en) * 2000-03-02 2003-06-24 Worldcom, Inc. Method and system for controlling polarization mode dispersion
US6950972B2 (en) * 2001-11-16 2005-09-27 Oplink Communications, Inc. Multi-purpose BER tester (MPBERT) for very high RZ and NRZ signals
US7149938B1 (en) * 2001-12-07 2006-12-12 Applied Micro Circuits Corporation Non-causal channel equalization

Also Published As

Publication number Publication date
US7389450B2 (en) 2008-06-17
US20020133763A1 (en) 2002-09-19
DE60103361D1 (de) 2004-06-24
EP1241483B1 (en) 2004-05-19
JP2002350515A (ja) 2002-12-04
EP1241483A1 (en) 2002-09-18
JP4046518B2 (ja) 2008-02-13

Similar Documents

Publication Publication Date Title
DE60103361T2 (de) Bitfehlerratenmessung
DE10116380B4 (de) Halbleiterprüfsystem
DE60132462T2 (de) Erfassung und auswertung von hochgeschwindigkeitsdatenströmen
DE19758077B4 (de) Einrichtung zum Steuern des Prüfens integrierter Schaltkreise und Verfahren zum Steuern des Prüfens integrierter Schaltkreise
DE68924744T2 (de) Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung.
DE102006006048B4 (de) Testgerät und Testverfahren
DE10120080B4 (de) Ereignisgestütztes Prüfsystem mit einer Einrichtung zur Erzeugung von Prüfabschluß-Mehrfachsignalen
DE60311576T2 (de) Spektrale Jitter-Analyse mit Jitter-Modulation-Wellenform-Analyse
DE19937232B4 (de) Entwicklungs- und Bewertungssystem für integrierte Halbleiterschaltungen
DE3702408C2 (https=)
DE19700513C2 (de) Mit CAD-Daten verknüpftes Halbleiterprüfsystem
DE60200707T2 (de) Zitterhistogrammnäherungsverfahren
DE10316568A1 (de) Jitter-Messschaltung
DE102007031866B4 (de) Prüfvorrichtung, Verschiebungsbetrag-Messvorrichtung, Verschiebungsbetrag-Messverfahren und diagnostisches Verfahren
DE10392202T5 (de) Testvorrichtung für einen LSI-Prüfling, Jitteranalysator und Phasendifferenzdetektor
DE112008001350T5 (de) Kalibrieren von Phasenschwankungen
DE602005002931T2 (de) Prüfung eines Testobjekts mit Abtastung vom Taktsignal und vom Datensignal
DE10393845T5 (de) Halbleitertestgerät
DE69215090T2 (de) Verfahren und System zum Testen eines integrierten Schaltkreises mit Abfragedesign
DE19908882B4 (de) Vergleicherschaltung für ein Halbleiter-Prüfsystem
DE2615787A1 (de) Schaltungsanordnung zur pruefung der wechselstromeigenschaften von monolithisch integrierten halbleiterschaltungen
DE60216328T2 (de) Jitter-spektrum-analyse
DE60303168T2 (de) Verfahren zur langlaufenden Analyse eines Schaltkreisentwurfs
DE19930273A1 (de) Hochgeschwindigkeitsvorrichtung zur Prüfmusterbewertung
DE60310886T2 (de) Polynomiale Anpassung für Zittertrennung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee