DE60021505D1 - Hochleistungshalbleiterlaser mit Strombegrenzung und indexgeführter Struktur - Google Patents

Hochleistungshalbleiterlaser mit Strombegrenzung und indexgeführter Struktur

Info

Publication number
DE60021505D1
DE60021505D1 DE60021505T DE60021505T DE60021505D1 DE 60021505 D1 DE60021505 D1 DE 60021505D1 DE 60021505 T DE60021505 T DE 60021505T DE 60021505 T DE60021505 T DE 60021505T DE 60021505 D1 DE60021505 D1 DE 60021505D1
Authority
DE
Germany
Prior art keywords
index
semiconductor laser
power semiconductor
current limitation
guided structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60021505T
Other languages
English (en)
Other versions
DE60021505T2 (de
Inventor
Toshiaki Fukunaga
Mitsugu Wada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP32986699A external-priority patent/JP2001148541A/ja
Priority claimed from JP2000031733A external-priority patent/JP2001223436A/ja
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Application granted granted Critical
Publication of DE60021505D1 publication Critical patent/DE60021505D1/de
Publication of DE60021505T2 publication Critical patent/DE60021505T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/223—Buried stripe structure
    • H01S5/2231—Buried stripe structure with inner confining structure only between the active layer and the upper electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2206—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on III-V materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2218—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties
    • H01S5/222—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties having a refractive index lower than that of the cladding layers or outer guiding layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/3201—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures incorporating bulkstrain effects, e.g. strain compensation, strain related to polarisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/3235—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000 nm, e.g. InP-based 1300 nm and 1500 nm lasers
    • H01S5/32391—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000 nm, e.g. InP-based 1300 nm and 1500 nm lasers based on In(Ga)(As)P

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)
DE60021505T 1999-11-19 2000-11-14 Hochleistungshalbleiterlaser mit Strombegrenzung und indexgeführter Struktur Expired - Lifetime DE60021505T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP32986699 1999-11-19
JP32986699A JP2001148541A (ja) 1999-11-19 1999-11-19 半導体発光装置およびその半導体発光装置を励起光源に用いた固体レーザ装置
JP2000031733 2000-02-09
JP2000031733A JP2001223436A (ja) 2000-02-09 2000-02-09 半導体レーザ装置

Publications (2)

Publication Number Publication Date
DE60021505D1 true DE60021505D1 (de) 2005-09-01
DE60021505T2 DE60021505T2 (de) 2006-06-01

Family

ID=26573359

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60021505T Expired - Lifetime DE60021505T2 (de) 1999-11-19 2000-11-14 Hochleistungshalbleiterlaser mit Strombegrenzung und indexgeführter Struktur

Country Status (3)

Country Link
US (1) US6516016B1 (de)
EP (1) EP1104057B1 (de)
DE (1) DE60021505T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6822990B2 (en) * 2000-09-08 2004-11-23 Mitsui Chemicals, Inc. Semiconductor laser device
JP4033626B2 (ja) * 2000-10-06 2008-01-16 日本オプネクスト株式会社 半導体レーザ装置の製造方法
EP1583187B1 (de) * 2000-10-12 2007-07-04 FUJIFILM Corporation Halbleiterlaser mit Gebiet ohne Stromzuführung in der Nähe einer Resonatorendfläche
JP2002299765A (ja) * 2001-04-03 2002-10-11 Sony Corp 半導体レーザ素子及びその作製方法
US6954477B2 (en) * 2001-04-03 2005-10-11 Sony Corporation Semiconductor laser device and fabrication method thereof
JP2002305352A (ja) * 2001-04-05 2002-10-18 Fuji Photo Film Co Ltd 半導体レーザ素子
JP2003069148A (ja) 2001-08-27 2003-03-07 Fuji Photo Film Co Ltd 半導体レーザ素子
JP4408185B2 (ja) * 2001-06-22 2010-02-03 富士フイルム株式会社 半導体レーザ装置
CN1259760C (zh) 2001-08-31 2006-06-14 三井化学株式会社 半导体激光元件
JP2003289175A (ja) 2002-01-28 2003-10-10 Sharp Corp 半導体レーザ素子
US20030235225A1 (en) * 2002-06-22 2003-12-25 Rick Glew Guided self-aligned laser structure with integral current blocking layer
US7801194B2 (en) * 2002-07-01 2010-09-21 Sharp Kabushiki Kaisha Semiconductor laser device and optical disk unit using the same
JP4317357B2 (ja) * 2002-11-18 2009-08-19 シャープ株式会社 半導体レーザ素子およびその製造方法
DE102014016889A1 (de) * 2014-11-15 2016-05-19 Mbda Deutschland Gmbh Überwachungsvorrichtung für einen Laserstrahl
US9755403B2 (en) * 2015-06-24 2017-09-05 King Abdullah University Of Science And Technology Controlling the emission wavelength in group III-V semiconductor laser diodes
US10084282B1 (en) 2017-08-14 2018-09-25 The United States Of America As Represented By The Secretary Of The Air Force Fundamental mode operation in broad area quantum cascade lasers
US11031753B1 (en) 2017-11-13 2021-06-08 The Government Of The United States Of America As Represented By The Secretary Of The Air Force Extracting the fundamental mode in broad area quantum cascade lasers

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5212704A (en) * 1991-11-27 1993-05-18 At&T Bell Laboratories Article comprising a strained layer quantum well laser
JPH0750445A (ja) * 1993-06-02 1995-02-21 Rohm Co Ltd 半導体レーザの製法
JP2914093B2 (ja) * 1993-06-04 1999-06-28 住友電気工業株式会社 半導体レーザ
US5379312A (en) * 1993-10-25 1995-01-03 Xerox Corporation Semiconductor laser with tensile-strained etch-stop layer
EP0695007B1 (de) * 1994-07-04 2000-06-14 Mitsubishi Chemical Corporation Halbleitervorrichtung und Herstellungsverfahren
JPH0888439A (ja) * 1994-09-16 1996-04-02 Rohm Co Ltd 半導体レーザおよびその製法
JPH10504142A (ja) * 1995-06-16 1998-04-14 フィリップス エレクトロニクス ネムローゼ フェンノートシャップ 半導体ダイオードレーザ及びその製造方法
JPH09162470A (ja) * 1995-12-13 1997-06-20 Nec Corp ２波長レーザ発振器
US6055255A (en) * 1996-02-01 2000-04-25 Sharp Kabushiki Kaisha Semiconductor laser device and method for producing the same
CN1129218C (zh) * 1996-03-01 2003-11-26 松下电器产业株式会社 半导体激光器及劈开方法
EP0814548B1 (de) * 1996-06-17 2003-10-29 Fuji Photo Film Co., Ltd. Halbleiterlaser
JP3888487B2 (ja) 1997-08-29 2007-03-07 富士フイルムホールディングス株式会社 半導体レーザおよび該半導体レーザを用いたレーザ発光装置
JPH11274635A (ja) * 1998-03-19 1999-10-08 Hitachi Ltd 半導体発光装置

Also Published As

Publication number Publication date
DE60021505T2 (de) 2006-06-01
US6516016B1 (en) 2003-02-04
EP1104057B1 (de) 2005-07-27
EP1104057A2 (de) 2001-05-30
EP1104057A3 (de) 2003-11-26

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Owner name: FUJIFILM CORP., TOKIO/TOKYO, JP

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