DE60009776D1 - Halbleiter-Festwertspeicher mit Einrichtung zum Ersetzen defekter Speicherzellen - Google Patents

Halbleiter-Festwertspeicher mit Einrichtung zum Ersetzen defekter Speicherzellen

Info

Publication number
DE60009776D1
DE60009776D1 DE60009776T DE60009776T DE60009776D1 DE 60009776 D1 DE60009776 D1 DE 60009776D1 DE 60009776 T DE60009776 T DE 60009776T DE 60009776 T DE60009776 T DE 60009776T DE 60009776 D1 DE60009776 D1 DE 60009776D1
Authority
DE
Germany
Prior art keywords
memory
replacing defective
semiconductor read
memory cells
defective memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60009776T
Other languages
English (en)
Other versions
DE60009776T2 (de
Inventor
Hidekazu Takata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of DE60009776D1 publication Critical patent/DE60009776D1/de
Application granted granted Critical
Publication of DE60009776T2 publication Critical patent/DE60009776T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/60—Software deployment
    • G06F8/65—Updates
    • G06F8/66—Updates of program code stored in read-only memory [ROM]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

Landscapes

  • Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Stored Programmes (AREA)
  • Memory System (AREA)
DE60009776T 1999-03-26 2000-02-14 Halbleiter-Festwertspeicher mit Einrichtung zum Ersetzen defekter Speicherzellen Expired - Lifetime DE60009776T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8277999 1999-03-26
JP8277999A JP3948692B2 (ja) 1999-03-26 1999-03-26 半導体記憶装置

Publications (2)

Publication Number Publication Date
DE60009776D1 true DE60009776D1 (de) 2004-05-19
DE60009776T2 DE60009776T2 (de) 2005-03-24

Family

ID=13783916

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60009776T Expired - Lifetime DE60009776T2 (de) 1999-03-26 2000-02-14 Halbleiter-Festwertspeicher mit Einrichtung zum Ersetzen defekter Speicherzellen

Country Status (6)

Country Link
US (1) US6594777B1 (de)
EP (1) EP1039385B1 (de)
JP (1) JP3948692B2 (de)
KR (1) KR100334201B1 (de)
DE (1) DE60009776T2 (de)
TW (1) TW459241B (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7089427B1 (en) * 2000-11-28 2006-08-08 Nintendo Co., Ltd. Security system method and apparatus for preventing application program unauthorized use
JP2003208359A (ja) * 2002-01-16 2003-07-25 Mitsubishi Electric Corp マイクロコンピュータ
US6957295B1 (en) * 2002-01-18 2005-10-18 Lexar Media, Inc. File management of one-time-programmable nonvolatile memory devices
JP4982883B2 (ja) * 2006-09-14 2012-07-25 株式会社メガチップス 記憶装置及びデータ出力回路
JP6107682B2 (ja) * 2014-01-23 2017-04-05 富士通株式会社 半導体記憶装置及び半導体記憶装置の制御方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542453A (en) * 1982-02-19 1985-09-17 Texas Instruments Incorporated Program patching in microcomputer
JPH0291749A (ja) * 1988-09-29 1990-03-30 Toshiba Corp 不揮発型半導体メモリ装置
US5179536A (en) * 1989-01-31 1993-01-12 Fujitsu Limited Semiconductor memory device having means for replacing defective memory cells
EP0686980B1 (de) * 1989-01-31 1998-12-16 Fujitsu Limited Halbleiterspeicher mit Einrichtung zum Ersetzen defekter Speicherzellen
JPH06103056A (ja) 1991-09-20 1994-04-15 Nec Home Electron Ltd アドレス制御装置
JP3575811B2 (ja) * 1992-05-07 2004-10-13 株式会社日立製作所 記憶装置
JPH06318261A (ja) * 1992-09-18 1994-11-15 Sony Corp 電子装置
JPH07129397A (ja) 1993-09-09 1995-05-19 Mitsubishi Electric Corp データ処理装置及びデータ処理システム
JP3561002B2 (ja) * 1994-05-18 2004-09-02 富士通株式会社 ディスク装置
JP3553138B2 (ja) * 1994-07-14 2004-08-11 株式会社ルネサステクノロジ 半導体記憶装置
US5680640A (en) * 1995-09-01 1997-10-21 Emc Corporation System for migrating data by selecting a first or second transfer means based on the status of a data element map initialized to a predetermined state
US5758056A (en) * 1996-02-08 1998-05-26 Barr; Robert C. Memory system having defective address identification and replacement
US6158018A (en) * 1997-11-25 2000-12-05 Philips Semiconductor, Inc. Integrated circuit including patching circuitry to bypass portions of an internally flawed read only memory and a method therefore

Also Published As

Publication number Publication date
KR100334201B1 (ko) 2002-05-02
EP1039385B1 (de) 2004-04-14
DE60009776T2 (de) 2005-03-24
KR20010014523A (ko) 2001-02-26
TW459241B (en) 2001-10-11
US6594777B1 (en) 2003-07-15
EP1039385A1 (de) 2000-09-27
JP2000276349A (ja) 2000-10-06
JP3948692B2 (ja) 2007-07-25

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