DE3883504T2 - Integrierte Halbleiterschaltung mit einer Gleichstromprüfungsfunktion. - Google Patents

Integrierte Halbleiterschaltung mit einer Gleichstromprüfungsfunktion.

Info

Publication number
DE3883504T2
DE3883504T2 DE88311498T DE3883504T DE3883504T2 DE 3883504 T2 DE3883504 T2 DE 3883504T2 DE 88311498 T DE88311498 T DE 88311498T DE 3883504 T DE3883504 T DE 3883504T DE 3883504 T2 DE3883504 T2 DE 3883504T2
Authority
DE
Germany
Prior art keywords
signal
circuit
output
reset
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88311498T
Other languages
German (de)
English (en)
Other versions
DE3883504D1 (de
Inventor
Hidenori Hida
Hideyuki Iino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Fujitsu Electronics Inc
Original Assignee
Fujitsu Ltd
Fujitsu Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Fujitsu Electronics Inc filed Critical Fujitsu Ltd
Publication of DE3883504D1 publication Critical patent/DE3883504D1/de
Application granted granted Critical
Publication of DE3883504T2 publication Critical patent/DE3883504T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE88311498T 1987-12-04 1988-12-05 Integrierte Halbleiterschaltung mit einer Gleichstromprüfungsfunktion. Expired - Fee Related DE3883504T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62307930A JP2579327B2 (ja) 1987-12-04 1987-12-04 半導体集積回路

Publications (2)

Publication Number Publication Date
DE3883504D1 DE3883504D1 (de) 1993-09-30
DE3883504T2 true DE3883504T2 (de) 1993-12-09

Family

ID=17974881

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88311498T Expired - Fee Related DE3883504T2 (de) 1987-12-04 1988-12-05 Integrierte Halbleiterschaltung mit einer Gleichstromprüfungsfunktion.

Country Status (5)

Country Link
US (1) US4904883A (Direct)
EP (1) EP0321133B1 (Direct)
JP (1) JP2579327B2 (Direct)
KR (1) KR910007411B1 (Direct)
DE (1) DE3883504T2 (Direct)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0537144B1 (en) * 1989-07-13 1995-06-21 Curtis Instruments, Inc. Data encodement and reading method and apparatus
US5095267A (en) * 1990-03-19 1992-03-10 National Semiconductor Corporation Method of screening A.C. performance characteristics during D.C. parametric test operation
US5070296A (en) * 1990-06-22 1991-12-03 Honeywell Inc. Integrated circuit interconnections testing
US5181203A (en) * 1990-12-21 1993-01-19 Vlsi Technology, Inc. Testable power-on-reset circuit
US5260950A (en) * 1991-09-17 1993-11-09 Ncr Corporation Boundary-scan input circuit for a reset pin
US5841965A (en) * 1994-05-16 1998-11-24 Ricoh Company, Ltd. System and method for automatically determining test point for DC parametric test
CN1439101A (zh) * 1998-06-16 2003-08-27 因芬尼昂技术股份公司 用于测量和分析集成电路块的电信号的装置
US6370675B1 (en) * 1998-08-18 2002-04-09 Advantest Corp. Semiconductor integrated circuit design and evaluation system using cycle base timing
JP3942765B2 (ja) * 1999-03-15 2007-07-11 株式会社アドバンテスト 半導体デバイスシミュレート装置及びそれを用いた半導体試験用プログラムデバッグ装置
JP3719654B2 (ja) * 2001-05-10 2005-11-24 松下電器産業株式会社 Ｌｓｉテスト方法
DE10255665B4 (de) * 2002-11-28 2008-05-08 Qimonda Ag Schaltung und Verfahren zur Bestimmung wenigstens eines Spannungs-, Strom- und/oder Leistungswerts einer integrierten Schaltung
JP2009025054A (ja) * 2007-07-18 2009-02-05 Panasonic Corp 半導体検査回路、および半導体検査方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410991A (en) * 1981-06-03 1983-10-18 Gte Laboratories Incorporated Supervisory control apparatus
EP0096531B1 (en) * 1982-06-09 1987-09-16 Fujitsu Limited One-chip semiconductor device incorporating a power-supply-potential detecting circuit with reset function
US4546472A (en) * 1983-01-27 1985-10-08 Intel Corporation Method and means for testing integrated circuits
US4583041A (en) * 1983-05-31 1986-04-15 Takeda Riken Co., Ltd. Logic circuit test system
US4803682A (en) * 1985-03-04 1989-02-07 Sanyo Electric Co., Ltd. Resetting system
JPS61265829A (ja) * 1985-05-20 1986-11-25 Fujitsu Ltd 半導体集積回路
JPS62239221A (ja) * 1986-04-10 1987-10-20 Toshiba Corp ワ−ドプロセツサ
KR900002770B1 (ko) * 1986-08-04 1990-04-30 미쓰비시 뎅끼 가부시끼가이샤 반도체 집적회로장치

Also Published As

Publication number Publication date
KR910007411B1 (ko) 1991-09-25
JP2579327B2 (ja) 1997-02-05
DE3883504D1 (de) 1993-09-30
KR890010922A (ko) 1989-08-11
EP0321133B1 (en) 1993-08-25
EP0321133A1 (en) 1989-06-21
US4904883A (en) 1990-02-27
US4904883B1 (Direct) 1993-02-02
JPH01149447A (ja) 1989-06-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee