DE3873570D1 - Konfokales laserabtastmikroskop. - Google Patents

Konfokales laserabtastmikroskop.

Info

Publication number
DE3873570D1
DE3873570D1 DE8888200452T DE3873570T DE3873570D1 DE 3873570 D1 DE3873570 D1 DE 3873570D1 DE 8888200452 T DE8888200452 T DE 8888200452T DE 3873570 T DE3873570 T DE 3873570T DE 3873570 D1 DE3873570 D1 DE 3873570D1
Authority
DE
Germany
Prior art keywords
scanning
point
frame
focused
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888200452T
Other languages
English (en)
Other versions
DE3873570T2 (de
Inventor
Pieter Marcus Houpt
Arie Draaijer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Visitech International Ltd
Original Assignee
Nederlandse Organisatie voor Toegepast Natuurwetenschappelijk Onderzoek TNO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nederlandse Organisatie voor Toegepast Natuurwetenschappelijk Onderzoek TNO filed Critical Nederlandse Organisatie voor Toegepast Natuurwetenschappelijk Onderzoek TNO
Publication of DE3873570D1 publication Critical patent/DE3873570D1/de
Application granted granted Critical
Publication of DE3873570T2 publication Critical patent/DE3873570T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE88200452T 1987-03-13 1988-03-09 Konfokales Laserabtastmikroskop. Expired - Lifetime DE3873570T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8700612A NL8700612A (nl) 1987-03-13 1987-03-13 Confocale laserscanning microscoop.

Publications (2)

Publication Number Publication Date
DE3873570D1 true DE3873570D1 (de) 1992-09-17
DE3873570T2 DE3873570T2 (de) 1994-01-05

Family

ID=19849704

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88200452T Expired - Lifetime DE3873570T2 (de) 1987-03-13 1988-03-09 Konfokales Laserabtastmikroskop.

Country Status (7)

Country Link
US (1) US4863226A (de)
EP (1) EP0284136B1 (de)
JP (2) JPS63298211A (de)
AT (1) ATE79476T1 (de)
DE (1) DE3873570T2 (de)
ES (1) ES2034154T3 (de)
NL (1) NL8700612A (de)

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US5200838A (en) * 1988-05-27 1993-04-06 The University Of Connecticut Lateral effect imaging system
JP2525893B2 (ja) * 1989-04-07 1996-08-21 浜松ホトニクス株式会社 螢光特性検査装置
US5225924A (en) * 1989-04-07 1993-07-06 Dainippon Screen Mfg. Co., Ltd. Optical beam scanning system
JP2525894B2 (ja) * 1989-04-07 1996-08-21 浜松ホトニクス株式会社 半導体試料の螢光特性検査装置
US5002348A (en) * 1989-05-24 1991-03-26 E. I. Du Pont De Nemours And Company Scanning beam optical signal processor
EP0418928B1 (de) * 1989-09-22 1996-05-01 Fuji Photo Film Co., Ltd. Rastermikroskop und Rastermechanismus dafür
US5034613A (en) * 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US5386112A (en) * 1990-06-29 1995-01-31 Dixon; Arthur E. Apparatus and method for transmitted-light and reflected-light imaging
EP0579724B2 (de) * 1991-04-10 2010-04-28 Mayo Foundation For Medical Education And Research Konfokales abbildungssystem für sichtbares und uv-licht
US5260578A (en) * 1991-04-10 1993-11-09 Mayo Foundation For Medical Education And Research Confocal imaging system for visible and ultraviolet light
US5306902A (en) * 1992-09-01 1994-04-26 International Business Machines Corporation Confocal method and apparatus for focusing in projection lithography
JP3343276B2 (ja) * 1993-04-15 2002-11-11 興和株式会社 レーザー走査型光学顕微鏡
US5479252A (en) * 1993-06-17 1995-12-26 Ultrapointe Corporation Laser imaging system for inspection and analysis of sub-micron particles
US5923430A (en) * 1993-06-17 1999-07-13 Ultrapointe Corporation Method for characterizing defects on semiconductor wafers
USH1530H (en) * 1993-06-17 1996-05-07 Ultrapointe Corporation Surface extraction from a three-dimensional data set
EP0646768A3 (de) * 1993-09-29 1997-05-14 Ushio Electric Inc Optisches Konfokalmikroskop und Messeinrichtung zur Benutzung dieses Mikroskops.
US5923466A (en) * 1993-10-20 1999-07-13 Biophysica Technologies, Inc. Light modulated confocal optical instruments and method
US5587832A (en) * 1993-10-20 1996-12-24 Biophysica Technologies, Inc. Spatially light modulated confocal microscope and method
GB9408688D0 (en) * 1994-04-30 1994-06-22 Medical Res Council Scanning confocal optical microscope
US5561611A (en) * 1994-10-04 1996-10-01 Noran Instruments, Inc. Method and apparatus for signal restoration without knowledge of the impulse response function of the signal acquisition system
DE19510102C1 (de) * 1995-03-20 1996-10-02 Rainer Dr Uhl Konfokales Fluoreszenzmikroskop
NZ318277A (en) 1995-09-19 1999-02-25 Cornell Res Foundation Inc Multi-photon laser microscopy
US6148114A (en) * 1996-11-27 2000-11-14 Ultrapointe Corporation Ring dilation and erosion techniques for digital image processing
DE19758748C2 (de) * 1997-01-27 2003-07-31 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
US6771417B1 (en) * 1997-08-01 2004-08-03 Carl Zeiss Jena Gmbh Applications of adaptive optics in microscopy
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
US6366357B1 (en) 1998-03-05 2002-04-02 General Scanning, Inc. Method and system for high speed measuring of microscopic targets
US6098031A (en) * 1998-03-05 2000-08-01 Gsi Lumonics, Inc. Versatile method and system for high speed, 3D imaging of microscopic targets
US5936728A (en) * 1998-04-14 1999-08-10 Noran Instruments, Inc. Flash photolysis method and apparatus
US6720547B1 (en) * 1999-03-18 2004-04-13 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
AU4012500A (en) * 1999-03-18 2000-10-04 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
US6548796B1 (en) 1999-06-23 2003-04-15 Regents Of The University Of Minnesota Confocal macroscope
US6449039B1 (en) 1999-07-28 2002-09-10 Thermo Noran Inc. Laser scanning fluorescence microscopy with compensation for spatial dispersion of fast laser pulses
DE10050529B4 (de) * 2000-10-11 2016-06-09 Leica Microsystems Cms Gmbh Verfahren zur Strahlsteuerung in einem Scanmikroskop, Anordnung zur Strahlsteuerung in einem Scanmikroskop und Scanmikroskop
US7139122B1 (en) 2000-10-17 2006-11-21 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
AU2002245119A1 (en) 2000-12-15 2002-07-30 Sloan-Kettering Institute For Cancer Research Beam-steering of multi-chromatic light using acousto-optical deflectors and dispersion-compensatory optics
DE10107210C1 (de) 2001-02-16 2002-10-10 Evotec Ag Mikroskop
US6750974B2 (en) 2002-04-02 2004-06-15 Gsi Lumonics Corporation Method and system for 3D imaging of target regions
EP1570411A4 (de) * 2002-10-22 2007-05-30 Univ Rice William M Schnelles direktzugriffs-confocalmikroskop
GB0308072D0 (en) * 2003-04-08 2003-05-14 Visitech Internat Ltd Fast multi-line laser confocal scanning microscope
JP4987233B2 (ja) * 2005-01-06 2012-07-25 オリンパス株式会社 レーザ走査型顕微鏡
US9055867B2 (en) * 2005-05-12 2015-06-16 Caliber Imaging & Diagnostics, Inc. Confocal scanning microscope having optical and scanning systems which provide a handheld imaging head
DE102007021378A1 (de) * 2007-05-04 2008-11-06 Ape Angewandte Physik Und Elektronik Gmbh Verfahren und optische Anordnung zum Erzeugen eines nicht-linearen optischen Signals an einem durch ein Anregungsfeld angeregten Material sowie Verwendung des Verfahrens und der optischen Anordnung
KR101119381B1 (ko) * 2009-06-18 2012-03-07 한국과학기술원 세포 특성 측정 장치 및 시스템과 이를 이용한 세포 특성 측정 방법
CN101904735B (zh) * 2010-07-20 2013-05-08 苏州微清医疗器械有限公司 基于快速倾斜镜的宽视场共焦扫描显微镜
CN102885612A (zh) * 2012-02-14 2013-01-23 苏州微清医疗器械有限公司 一种用于临床诊断的眼底成像设备
CN105486638B (zh) * 2015-11-30 2019-02-05 哈尔滨工业大学 一种超分辨阵列扫描结构光照明成像装置及其成像方法
CN106442335B (zh) * 2016-12-16 2024-04-09 中国科学院工程热物理研究所 一种显微可视化抽运探测热反射系统
CN108519329B (zh) * 2018-03-26 2021-01-15 华中科技大学 一种多路扫描与探测的线共聚焦成像装置
CN112261253B (zh) * 2020-10-15 2022-05-03 浙江大华技术股份有限公司 共焦补偿滤片的控制方法、装置、存储介质以及电子装置
WO2023193480A1 (zh) * 2022-04-08 2023-10-12 南京博视医疗科技有限公司 一种视网膜成像装置及其成像方法

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JPS5118136B1 (de) * 1970-11-25 1976-06-08
US4044363A (en) * 1974-12-23 1977-08-23 Dymo Industries, Inc. Laser photocomposition system and method
US4634880A (en) * 1982-04-19 1987-01-06 Siscan Systems, Inc. Confocal optical imaging system with improved signal-to-noise ratio
GB2152697B (en) * 1983-10-25 1987-03-25 Atomic Energy Authority Uk Improvements in or relating to scanning optical microscopes
DE3427611A1 (de) * 1984-07-26 1988-06-09 Bille Josef Laserstrahl-lithograph
US4640626A (en) * 1984-09-13 1987-02-03 Siemens Aktiengesellschaft Method and apparatus for localizing weak points within an electrical circuit
JPS61121022A (ja) * 1984-11-19 1986-06-09 Nippon Jido Seigyo Kk 走査型顕微鏡撮像装置
JPS61118710A (ja) * 1984-11-15 1986-06-06 Nippon Jido Seigyo Kk 走査型顕微鏡撮像装置
JPS61140914A (ja) * 1984-12-14 1986-06-28 Hitachi Ltd 共焦点顕微鏡
JP2524574B2 (ja) * 1985-03-27 1996-08-14 オリンパス光学工業株式会社 走査型光学顕微鏡

Also Published As

Publication number Publication date
ATE79476T1 (de) 1992-08-15
EP0284136B1 (de) 1992-08-12
DE3873570T2 (de) 1994-01-05
JP2607804Y2 (ja) 2003-03-31
US4863226A (en) 1989-09-05
EP0284136A1 (de) 1988-09-28
JPS63298211A (ja) 1988-12-06
JPH11135U (ja) 1999-11-09
NL8700612A (nl) 1988-10-03
ES2034154T3 (es) 1993-04-01

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Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication related to discontinuation of the patent is to be deleted
8327 Change in the person/name/address of the patent owner

Owner name: VISITECH INTERNATIONAL LTD., SUNDERLAND, GB

8328 Change in the person/name/address of the agent

Representative=s name: HENKEL, FEILER & HAENZEL, 81675 MUENCHEN