DE3781631D1 - Halbleiterspeichervorrichtung mit verbesserter zellenanordnung. - Google Patents

Halbleiterspeichervorrichtung mit verbesserter zellenanordnung.

Info

Publication number
DE3781631D1
DE3781631D1 DE8787114337T DE3781631T DE3781631D1 DE 3781631 D1 DE3781631 D1 DE 3781631D1 DE 8787114337 T DE8787114337 T DE 8787114337T DE 3781631 T DE3781631 T DE 3781631T DE 3781631 D1 DE3781631 D1 DE 3781631D1
Authority
DE
Germany
Prior art keywords
storage device
semiconductor storage
cell arrangement
improved cell
improved
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787114337T
Other languages
English (en)
Other versions
DE3781631T2 (de
Inventor
Takahiko C O Nec Corporat Urai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=16978489&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3781631(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE3781631D1 publication Critical patent/DE3781631D1/de
Application granted granted Critical
Publication of DE3781631T2 publication Critical patent/DE3781631T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
    • G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
    • G11C17/12—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/40—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the peripheral circuit region
    • H10B41/42—Simultaneous manufacture of periphery and memory cells
    • H10B41/49—Simultaneous manufacture of periphery and memory cells comprising different types of peripheral transistor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE8787114337T 1986-10-01 1987-10-01 Halbleiterspeichervorrichtung mit verbesserter zellenanordnung. Expired - Lifetime DE3781631T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61234929A JPS6390096A (ja) 1986-10-01 1986-10-01 半導体記憶装置

Publications (2)

Publication Number Publication Date
DE3781631D1 true DE3781631D1 (de) 1992-10-15
DE3781631T2 DE3781631T2 (de) 1993-03-25

Family

ID=16978489

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787114337T Expired - Lifetime DE3781631T2 (de) 1986-10-01 1987-10-01 Halbleiterspeichervorrichtung mit verbesserter zellenanordnung.

Country Status (4)

Country Link
US (1) US4855956A (de)
EP (1) EP0262675B1 (de)
JP (1) JPS6390096A (de)
DE (1) DE3781631T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5287315A (en) * 1991-01-31 1994-02-15 Texas Instruments Incorporated Skewed reference to improve ones and zeros in EPROM arrays
US5251168A (en) * 1991-07-31 1993-10-05 Texas Instruments Incorporated Boundary cells for improving retention time in memory devices
DE19703611A1 (de) * 1997-01-31 1998-08-06 Siemens Ag Anwendungsspezifisches integriertes Halbleiterprodukt mit Dummy-Elementen
JP3506025B2 (ja) * 1998-11-30 2004-03-15 セイコーエプソン株式会社 半導体記憶装置及びその製造方法
KR20000066217A (ko) * 1999-04-14 2000-11-15 윤종용 더미셀을 갖는 플래시 메모리장치
JP2001068635A (ja) 1999-08-27 2001-03-16 Mitsubishi Electric Corp 半導体装置
US6407953B1 (en) 2001-02-02 2002-06-18 Matrix Semiconductor, Inc. Memory array organization and related test method particularly well suited for integrated circuits having write-once memory arrays
JP2003308700A (ja) * 2002-04-10 2003-10-31 Oki Electric Ind Co Ltd 半導体記憶装置
US20040062123A1 (en) * 2002-09-27 2004-04-01 Oki Electric Industry Co., Ltd. Nonvolatile semiconductor memory device able to detect test mode
US7183792B2 (en) * 2003-04-01 2007-02-27 Micron Technology, Inc. Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same
JP2006059481A (ja) * 2004-08-23 2006-03-02 Renesas Technology Corp 半導体記憶装置
US9436845B2 (en) * 2014-03-25 2016-09-06 Globalfoundries Inc. Physically unclonable fuse using a NOR type memory array

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4393474A (en) * 1979-10-26 1983-07-12 Texas Instruments Incorporated EPROM and RAM cell layout with equal pitch for use in fault tolerant memory device or the like
JPS59168992A (ja) * 1983-03-15 1984-09-22 Sanyo Electric Co Ltd 不揮発性メモリ及びそのアドレス方式
JPS60125998A (ja) * 1983-12-12 1985-07-05 Fujitsu Ltd 半導体記憶装置

Also Published As

Publication number Publication date
US4855956A (en) 1989-08-08
DE3781631T2 (de) 1993-03-25
JPS6390096A (ja) 1988-04-20
EP0262675B1 (de) 1992-09-09
EP0262675A1 (de) 1988-04-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC CORP., TOKIO/TOKYO, JP

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8327 Change in the person/name/address of the patent owner

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP