DE3704685C2 - - Google Patents

Info

Publication number
DE3704685C2
DE3704685C2 DE3704685A DE3704685A DE3704685C2 DE 3704685 C2 DE3704685 C2 DE 3704685C2 DE 3704685 A DE3704685 A DE 3704685A DE 3704685 A DE3704685 A DE 3704685A DE 3704685 C2 DE3704685 C2 DE 3704685C2
Authority
DE
Germany
Prior art keywords
radiation
function
image
distribution
equation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3704685A
Other languages
German (de)
English (en)
Other versions
DE3704685A1 (de
Inventor
Michitaka Tochigi Jp Honda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE3704685A1 publication Critical patent/DE3704685A1/de
Application granted granted Critical
Publication of DE3704685C2 publication Critical patent/DE3704685C2/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • A61B6/5282Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise due to scatter
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58Testing, adjusting or calibrating thereof
    • A61B6/582Calibration
    • A61B6/583Calibration using calibration phantoms
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/32Transforming X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Public Health (AREA)
  • Optics & Photonics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Veterinary Medicine (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE19873704685 1986-02-18 1987-02-14 Anordnung und verfahren zur korrektur bzw. kompensation von streustrahlung durch adaptive filterung Granted DE3704685A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61033553A JPS62191972A (ja) 1986-02-18 1986-02-18 X線画像処理装置

Publications (2)

Publication Number Publication Date
DE3704685A1 DE3704685A1 (de) 1987-10-08
DE3704685C2 true DE3704685C2 (sv) 1992-12-17

Family

ID=12389744

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19873704685 Granted DE3704685A1 (de) 1986-02-18 1987-02-14 Anordnung und verfahren zur korrektur bzw. kompensation von streustrahlung durch adaptive filterung

Country Status (3)

Country Link
US (1) US4918713A (sv)
JP (1) JPS62191972A (sv)
DE (1) DE3704685A1 (sv)

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JP2627098B2 (ja) * 1990-04-27 1997-07-02 富士写真フイルム株式会社 骨塩定量分析方法および装置
DE69308350T2 (de) * 1992-04-08 1997-08-21 Philips Electronics Nv Vorrichtung zur Röntgenuntersuchung mit Korrektur der Streustrahlungseffekte in einem Röntgenbild
US5440647A (en) * 1993-04-22 1995-08-08 Duke University X-ray procedure for removing scattered radiation and enhancing signal-to-noise ratio (SNR)
US5561297A (en) * 1993-07-12 1996-10-01 Sopha Medical Systems, Inc. Scatter correcting gamma-ray camera
JP3408848B2 (ja) * 1993-11-02 2003-05-19 株式会社日立メディコ 散乱x線補正法及びx線ct装置並びに多チャンネルx線検出器
EP0660599B2 (en) * 1993-12-24 2002-08-14 Agfa-Gevaert Partially-transparent-shield-method for scattered radiation compensation in x-ray imaging
US5481584A (en) * 1994-11-23 1996-01-02 Tang; Jihong Device for material separation using nondestructive inspection imaging
US5661818A (en) * 1995-01-27 1997-08-26 Eastman Kodak Company Method and system for detecting grids in a digital image
JP3423828B2 (ja) * 1995-11-30 2003-07-07 株式会社日立メディコ X線画像作成方法およびその装置
US5878108A (en) * 1995-11-30 1999-03-02 Hitachi Medical Corporation Method for generating X-ray image and apparatus therefor
JP3459745B2 (ja) * 1997-03-27 2003-10-27 キヤノン株式会社 画像処理装置、放射線撮影装置及び画像処理方法
US5954310A (en) * 1997-10-03 1999-09-21 Autonomous Effects, Inc. Apparatus and method for positioning a payload about multiple axes
US6879715B2 (en) * 2001-12-05 2005-04-12 General Electric Company Iterative X-ray scatter correction method and apparatus
US6633626B2 (en) 2002-02-01 2003-10-14 General Electric Company Methods and apparatus for correcting scatter
US6748047B2 (en) * 2002-05-15 2004-06-08 General Electric Company Scatter correction method for non-stationary X-ray acquisitions
US20040120457A1 (en) * 2002-12-20 2004-06-24 University Of Massachusetts Medical Center Scatter reducing device for imaging
JP4334244B2 (ja) * 2003-02-13 2009-09-30 株式会社東芝 バイプレーンx線撮影装置
US7352887B2 (en) * 2003-04-11 2008-04-01 Hologic, Inc. Scatter rejection for composite medical imaging systems
JP3950855B2 (ja) * 2004-01-07 2007-08-01 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 散乱測定方法、散乱補正方法およびx線ct装置
DE102004029009A1 (de) * 2004-06-16 2006-01-19 Siemens Ag Vorrichtung und Verfahren für die Streustrahlungskorrektur in der Computer-Tomographie
US7463712B2 (en) * 2006-05-18 2008-12-09 The Board Of Trustees Of The Leland Stanford Junior University Scatter correction for x-ray imaging using modulation of primary x-ray spatial spectrum
DE102006045722B4 (de) * 2006-09-27 2014-11-27 Siemens Aktiengesellschaft Verfahren zur Korrektur der Streustrahlung in der Projektionsradiographie und der Comupter-Tomographie und Apparat hierfür
FR2966716B1 (fr) 2010-10-29 2012-12-21 Gen Electric Methode d'estimation et de correction de la diffusion en mammographie.
US8433154B2 (en) 2010-12-13 2013-04-30 Carestream Health, Inc. Enhanced contrast for scatter compensation in X-ray imaging
JP6392058B2 (ja) * 2014-09-30 2018-09-19 富士フイルム株式会社 放射線画像処理装置および方法並びにプログラム
US9375192B2 (en) 2014-10-14 2016-06-28 Carestream Health, Inc. Reconstruction of a cone beam scanned object
JP6392391B2 (ja) * 2017-03-08 2018-09-19 富士フイルム株式会社 放射線画像処理装置および方法並びにプログラム

Family Cites Families (26)

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Publication number Priority date Publication date Assignee Title
US2336026A (en) * 1938-02-08 1943-12-07 Richardson Co X-ray grid and the like
US2679008A (en) * 1950-06-23 1954-05-18 Emery D Hall X-ray grid
US3860821A (en) * 1970-10-02 1975-01-14 Raytheon Co Imaging system
DE2452166A1 (de) * 1974-11-02 1976-05-13 Philips Patentverwaltung Anordnung zum verringern des streustrahleneinflusses
DE2459890B2 (de) * 1974-11-09 1978-04-27 Medicor Muevek, Budapest Schaltungsanordnung zur Erleichterung der Auswertung von Aufnahmen, insbesondere Röntgenaufnahmen
DE2454537A1 (de) * 1974-11-16 1976-05-20 Philips Patentverwaltung Verfahren zur reduzierung des einflusses von streustrahlung und anordnung zur durchfuehrung des verfahrens
NL183160C (nl) * 1974-11-26 1988-08-01 Optische Ind De Oude Delft Nv Stelsel voor het vormen van een videorepresentatie van een roentgenschaduwbeeld.
GB1571800A (en) * 1976-01-15 1980-07-16 Emi Ltd Radiography
GB1569413A (en) * 1976-02-05 1980-06-18 Emi Ltd Radography
FR2405696A1 (fr) * 1977-10-11 1979-05-11 Radiologie Cie Gle Procede et appareil de tomographie axiale transverse
DE2821083A1 (de) * 1978-05-13 1979-11-22 Philips Patentverwaltung Anordnung zur ermittlung der raeumlichen absorptionsverteilung in einem ebenen untersuchungsbereich
DE2939146A1 (de) * 1979-09-27 1981-04-16 Philips Patentverwaltung Gmbh, 2000 Hamburg Verfahren zur untersuchung eines koerpers mit durchdringender strahlung
EP0037722A1 (en) * 1980-04-08 1981-10-14 Technicare Corporation Dynamic image enhancement method and apparatus therefor
DE3023401A1 (de) * 1980-06-23 1982-01-07 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikanlage mit einer aufnahmeeinheit mit einer roentgenroehre, die ein faecherfoermiges strahlenbuendel aussendet
US4399547A (en) * 1981-11-02 1983-08-16 General Electric Co. Receiver of pulsed phase modulated signals
FR2526575A1 (fr) * 1982-05-04 1983-11-10 Thomson Csf Procede de traitement d'image radiologique en vue de corriger ladite image des defauts dus au rayonnement diffuse
US4549307A (en) * 1982-09-07 1985-10-22 The Board Of Trustees Of The Leland Stanford, Junior University X-Ray imaging system having radiation scatter compensation and method
EP0105618B1 (en) * 1982-09-07 1989-10-25 The Board Of Trustees Of The Leland Stanford Junior University X-ray imaging system having radiation scatter compensation and method
DE3304213A1 (de) * 1983-02-08 1984-08-09 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikanlage mit mitteln zur unterdrueckung der streustrahlung
JPS59151939A (ja) * 1983-02-08 1984-08-30 株式会社東芝 X線診断装置
JPS59151940A (ja) * 1983-02-18 1984-08-30 株式会社東芝 X線診断装置
DE3469666D1 (en) * 1983-04-25 1988-04-07 Toshiba Kk X-ray diagnostic apparatus
US4497062A (en) * 1983-06-06 1985-01-29 Wisconsin Alumni Research Foundation Digitally controlled X-ray beam attenuation method and apparatus
US4571635A (en) * 1984-02-17 1986-02-18 Minnesota Mining And Manufacturing Company Method of image enhancement by raster scanning
JPS60210087A (ja) * 1984-04-03 1985-10-22 Toshiba Corp X線診断装置
JPS61249452A (ja) * 1985-04-30 1986-11-06 株式会社東芝 X線診断装置

Also Published As

Publication number Publication date
DE3704685A1 (de) 1987-10-08
JPS62191972A (ja) 1987-08-22
US4918713A (en) 1990-04-17

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee