DE3610165C2 - - Google Patents

Info

Publication number
DE3610165C2
DE3610165C2 DE3610165A DE3610165A DE3610165C2 DE 3610165 C2 DE3610165 C2 DE 3610165C2 DE 3610165 A DE3610165 A DE 3610165A DE 3610165 A DE3610165 A DE 3610165A DE 3610165 C2 DE3610165 C2 DE 3610165C2
Authority
DE
Germany
Prior art keywords
light
optical
detector
lens
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3610165A
Other languages
German (de)
English (en)
Other versions
DE3610165A1 (de
Inventor
Yoshiaki Hachiouji Tokio/Tokyo Jp Horkawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP60062262A external-priority patent/JP2524574B2/ja
Priority claimed from JP6226485A external-priority patent/JPS6236624A/ja
Priority claimed from JP6226385A external-priority patent/JPS61219920A/ja
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE3610165A1 publication Critical patent/DE3610165A1/de
Application granted granted Critical
Publication of DE3610165C2 publication Critical patent/DE3610165C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
DE19863610165 1985-03-27 1986-03-26 Optisches abtastmikroskop Granted DE3610165A1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP60062262A JP2524574B2 (ja) 1985-03-27 1985-03-27 走査型光学顕微鏡
JP6226485A JPS6236624A (ja) 1985-03-27 1985-03-27 走査型光学顕微鏡
JP6226385A JPS61219920A (ja) 1985-03-27 1985-03-27 走査型光学顕微鏡

Publications (2)

Publication Number Publication Date
DE3610165A1 DE3610165A1 (de) 1986-10-02
DE3610165C2 true DE3610165C2 (OSRAM) 1991-01-03

Family

ID=27297785

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19863610165 Granted DE3610165A1 (de) 1985-03-27 1986-03-26 Optisches abtastmikroskop

Country Status (2)

Country Link
US (1) US4734578A (OSRAM)
DE (1) DE3610165A1 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4113279A1 (de) * 1991-04-24 1992-10-29 Miodrag Dipl Phys Milicev Verfahren und vorrichtung zum abbilden eines objektes

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US4927254A (en) * 1987-03-27 1990-05-22 The Board Of Trustees Of The Leland Stanford Junior University Scanning confocal optical microscope including an angled apertured rotating disc placed between a pinhole and an objective lens
FR2626383B1 (fr) * 1988-01-27 1991-10-25 Commissariat Energie Atomique Procede de microscopie optique confocale a balayage et en profondeur de champ etendue et dispositifs pour la mise en oeuvre du procede
JPH083481B2 (ja) * 1989-06-07 1996-01-17 日立ソフトウェアエンジニアリング株式会社 蛍光式電気泳動パターン読み取り装置
JP2561160B2 (ja) * 1989-11-06 1996-12-04 富士写真フイルム株式会社 走査型顕微鏡
US5034613A (en) * 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US5274240A (en) * 1990-01-12 1993-12-28 The Regents Of The University Of California Capillary array confocal fluorescence scanner and method
US5091652A (en) * 1990-01-12 1992-02-25 The Regents Of The University Of California Laser excited confocal microscope fluorescence scanner and method
US5168157A (en) * 1990-11-20 1992-12-01 Fuji Photo Film Co., Ltd. Scanning microscope with means for detecting a first and second polarized light beams along first and second optical receiving paths
US5334830A (en) * 1991-05-29 1994-08-02 Olympus Optical Co., Ltd. Scanning optical microscope having a compact confocal optical system for adjusting position of aperture
US5184012A (en) * 1991-12-26 1993-02-02 Olympus Optical Co., Ltd. Optical scanning apparatus with axis deviation correction
JPH07117647B2 (ja) * 1992-05-25 1995-12-18 シーメンス アクチエンゲゼルシヤフト 走査対物レンズ
US5831738A (en) * 1994-01-11 1998-11-03 Hine Design Inc. Apparatus and methods for viewing identification marks on semiconductor wafers
JPH08160305A (ja) * 1994-12-08 1996-06-21 Nikon Corp レーザー走査顕微鏡
US5880880A (en) * 1995-01-13 1999-03-09 The General Hospital Corp. Three-dimensional scanning confocal laser microscope
FI98765C (fi) * 1995-01-16 1997-08-11 Erkki Soini Virtaussytometrinen menetelmä ja laite
AU700560B2 (en) 1995-09-19 1999-01-07 Cornell Research Foundation Inc. Multi-photon laser microscopy
JP3917731B2 (ja) * 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
DE19654208C2 (de) * 1996-12-24 2001-05-10 Leica Microsystems Mikroskop
US5969372A (en) * 1997-10-14 1999-10-19 Hewlett-Packard Company Film scanner with dust and scratch correction by use of dark-field illumination
JP3361735B2 (ja) * 1997-12-01 2003-01-07 セイコーインスツルメンツ株式会社 表面分析装置
RU2140661C1 (ru) * 1999-03-19 1999-10-27 Левин Геннадий Генрихович Способ конфокальной сканирующей трехмерной микроскопии и конфокальный сканирующий томографический микроскоп
US6495812B1 (en) 2000-08-02 2002-12-17 Li-Cor, Inc. Apparatus and method for analyzing an object of interest having a pivotably movable source and detector
JP4241038B2 (ja) 2000-10-30 2009-03-18 ザ ジェネラル ホスピタル コーポレーション 組織分析のための光学的な方法及びシステム
US9295391B1 (en) 2000-11-10 2016-03-29 The General Hospital Corporation Spectrally encoded miniature endoscopic imaging probe
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DE10148679A1 (de) * 2001-10-02 2003-04-10 Zeiss Carl Jena Gmbh Vorrichtung zur Strahlabschaltung bei einem Laser Scanning Mikroskop
DE10155142C2 (de) * 2001-11-12 2003-09-04 Friz Biochem Gmbh Dunkelfeld-Abbildungsvorrichtung zur ortsaufgelösten Dunkelfeldabbildung einer flächigen Probe
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
US7355716B2 (en) 2002-01-24 2008-04-08 The General Hospital Corporation Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
DE10206020A1 (de) * 2002-02-14 2003-08-28 Zeiss Carl Jena Gmbh Optisches Nahfeldmikroskop
WO2004088361A2 (en) 2003-03-31 2004-10-14 The General Hospital Corporation Speckle reduction in optical coherence tomography by path length encoded angular compounding
US8054468B2 (en) * 2003-01-24 2011-11-08 The General Hospital Corporation Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
CN1741768A (zh) * 2003-01-24 2006-03-01 通用医疗有限公司 利用低相干干涉测量法识别组织的系统和方法
US20040202357A1 (en) 2003-04-11 2004-10-14 Perz Cynthia B. Silhouette image acquisition
EP2280257B1 (en) 2003-06-06 2017-04-05 The General Hospital Corporation Process and apparatus for a wavelength tuned light source
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DE10357584B4 (de) * 2003-12-08 2006-06-14 Leica Microsystems Cms Gmbh Verfahren zum Trennen unterschiedlicher Emissionswellenlängen in einem Scanmikroskop
WO2005117534A2 (en) * 2004-05-29 2005-12-15 The General Hospital Corporation Process, system and software arrangement for a chromatic dispersion compensation using reflective layers in optical coherence tomography (oct) imaging
WO2006014392A1 (en) 2004-07-02 2006-02-09 The General Hospital Corporation Endoscopic imaging probe comprising dual clad fibre
DE102004034991A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop
DE102004034951A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Verfahren zur bildlichen Erfassung von Objekten mittels eines Lichtrastermikrokopes mit linienförmiger Abtastung
DE102004034990A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102004034989A1 (de) * 2004-07-16 2006-02-09 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung und Verwendung
DE102004034974A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Verfahren zur bildlichen Erfassung von Objekten mittels eines Lichtrastermikroskopes mit punktförmiger Lichtquellenverteilung
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JP5334415B2 (ja) * 2004-08-24 2013-11-06 ザ ジェネラル ホスピタル コーポレイション 試料の機械的歪み及び弾性的性質を測定するプロセス、システム及びソフトウェア
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JP5684452B2 (ja) * 2005-04-28 2015-03-11 ザ ジェネラル ホスピタル コーポレイション 光干渉測定法により解剖学的構造に関連する情報を評価するためのシステム、方法及びソフトウエア装置
JP5702049B2 (ja) 2005-06-01 2015-04-15 ザ ジェネラル ホスピタル コーポレイション 位相分解光学周波数領域画像化を行うための装置、方法及びシステム
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Publication number Priority date Publication date Assignee Title
DE4113279A1 (de) * 1991-04-24 1992-10-29 Miodrag Dipl Phys Milicev Verfahren und vorrichtung zum abbilden eines objektes

Also Published As

Publication number Publication date
US4734578A (en) 1988-03-29
DE3610165A1 (de) 1986-10-02

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