DE3610165A1 - Optisches abtastmikroskop - Google Patents

Optisches abtastmikroskop

Info

Publication number
DE3610165A1
DE3610165A1 DE19863610165 DE3610165A DE3610165A1 DE 3610165 A1 DE3610165 A1 DE 3610165A1 DE 19863610165 DE19863610165 DE 19863610165 DE 3610165 A DE3610165 A DE 3610165A DE 3610165 A1 DE3610165 A1 DE 3610165A1
Authority
DE
Germany
Prior art keywords
light
optical microscope
microscope according
detector
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19863610165
Other languages
German (de)
English (en)
Other versions
DE3610165C2 (enExample
Inventor
Yoshiaki Hachiouji Tokio/Tokyo Horkawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6226385A external-priority patent/JPS61219920A/ja
Priority claimed from JP60062262A external-priority patent/JP2524574B2/ja
Priority claimed from JP6226485A external-priority patent/JPS6236624A/ja
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE3610165A1 publication Critical patent/DE3610165A1/de
Application granted granted Critical
Publication of DE3610165C2 publication Critical patent/DE3610165C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
DE19863610165 1985-03-27 1986-03-26 Optisches abtastmikroskop Granted DE3610165A1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP6226385A JPS61219920A (ja) 1985-03-27 1985-03-27 走査型光学顕微鏡
JP60062262A JP2524574B2 (ja) 1985-03-27 1985-03-27 走査型光学顕微鏡
JP6226485A JPS6236624A (ja) 1985-03-27 1985-03-27 走査型光学顕微鏡

Publications (2)

Publication Number Publication Date
DE3610165A1 true DE3610165A1 (de) 1986-10-02
DE3610165C2 DE3610165C2 (enExample) 1991-01-03

Family

ID=27297785

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19863610165 Granted DE3610165A1 (de) 1985-03-27 1986-03-26 Optisches abtastmikroskop

Country Status (2)

Country Link
US (1) US4734578A (enExample)
DE (1) DE3610165A1 (enExample)

Cited By (6)

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FR2626383A1 (fr) * 1988-01-27 1989-07-28 Commissariat Energie Atomique Procede de microscopie optique confocale a balayage et en profondeur de champ etendue et dispositifs pour la mise en oeuvre du procede
EP0716327A1 (en) * 1994-12-08 1996-06-12 Nikon Corporation Laser scanning microscope
US5608564A (en) * 1992-05-25 1997-03-04 Siemens Aktiengesellschaft Scanning objective
RU2140661C1 (ru) * 1999-03-19 1999-10-27 Левин Геннадий Генрихович Способ конфокальной сканирующей трехмерной микроскопии и конфокальный сканирующий томографический микроскоп
DE10206020A1 (de) * 2002-02-14 2003-08-28 Zeiss Carl Jena Gmbh Optisches Nahfeldmikroskop
DE102015213897A1 (de) * 2015-07-23 2017-01-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Anordnung und Verfahren zur verzeichnungsfreien zweidimensionalen Ablenkung von räumlich ausgedehnten Intensitätsverteilungen

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US4927254A (en) * 1987-03-27 1990-05-22 The Board Of Trustees Of The Leland Stanford Junior University Scanning confocal optical microscope including an angled apertured rotating disc placed between a pinhole and an objective lens
JPH083481B2 (ja) * 1989-06-07 1996-01-17 日立ソフトウェアエンジニアリング株式会社 蛍光式電気泳動パターン読み取り装置
JP2561160B2 (ja) * 1989-11-06 1996-12-04 富士写真フイルム株式会社 走査型顕微鏡
US5034613A (en) * 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US5274240A (en) * 1990-01-12 1993-12-28 The Regents Of The University Of California Capillary array confocal fluorescence scanner and method
US5091652A (en) * 1990-01-12 1992-02-25 The Regents Of The University Of California Laser excited confocal microscope fluorescence scanner and method
US5168157A (en) * 1990-11-20 1992-12-01 Fuji Photo Film Co., Ltd. Scanning microscope with means for detecting a first and second polarized light beams along first and second optical receiving paths
DE4113279C2 (de) * 1991-04-24 1996-08-29 Miodrag Dipl Phys Milicev Konfokales optisches Rastermikroskop
US5334830A (en) * 1991-05-29 1994-08-02 Olympus Optical Co., Ltd. Scanning optical microscope having a compact confocal optical system for adjusting position of aperture
US5184012A (en) * 1991-12-26 1993-02-02 Olympus Optical Co., Ltd. Optical scanning apparatus with axis deviation correction
US5831738A (en) * 1994-01-11 1998-11-03 Hine Design Inc. Apparatus and methods for viewing identification marks on semiconductor wafers
US5880880A (en) * 1995-01-13 1999-03-09 The General Hospital Corp. Three-dimensional scanning confocal laser microscope
FI98765C (fi) * 1995-01-16 1997-08-11 Erkki Soini Virtaussytometrinen menetelmä ja laite
EP0852716B1 (en) 1995-09-19 2005-11-30 Cornell Research Foundation, Inc. Multi-photon laser microscopy
JP3917731B2 (ja) * 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
DE19654208C2 (de) * 1996-12-24 2001-05-10 Leica Microsystems Mikroskop
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JP3361735B2 (ja) * 1997-12-01 2003-01-07 セイコーインスツルメンツ株式会社 表面分析装置
US6495812B1 (en) 2000-08-02 2002-12-17 Li-Cor, Inc. Apparatus and method for analyzing an object of interest having a pivotably movable source and detector
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DE10148679A1 (de) * 2001-10-02 2003-04-10 Zeiss Carl Jena Gmbh Vorrichtung zur Strahlabschaltung bei einem Laser Scanning Mikroskop
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US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
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US20040202357A1 (en) 2003-04-11 2004-10-14 Perz Cynthia B. Silhouette image acquisition
JP2007526620A (ja) 2003-06-06 2007-09-13 ザ・ジェネラル・ホスピタル・コーポレイション 波長同調発信源装置及びその方法
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DE10357584B4 (de) * 2003-12-08 2006-06-14 Leica Microsystems Cms Gmbh Verfahren zum Trennen unterschiedlicher Emissionswellenlängen in einem Scanmikroskop
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DE102004034991A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2626383A1 (fr) * 1988-01-27 1989-07-28 Commissariat Energie Atomique Procede de microscopie optique confocale a balayage et en profondeur de champ etendue et dispositifs pour la mise en oeuvre du procede
EP0327425A1 (fr) * 1988-01-27 1989-08-09 Commissariat A L'energie Atomique Procédé de microscopie optique confocale à balayage et en profondeur de champ étendue et dispositifs pour la mise en oeuvre du procédé
US4965441A (en) * 1988-01-27 1990-10-23 Commissariat A L'energie Atomique Method for the scanning confocal light-optical microscopic and indepth examination of an extended field and devices for implementing said method
US5608564A (en) * 1992-05-25 1997-03-04 Siemens Aktiengesellschaft Scanning objective
EP0716327A1 (en) * 1994-12-08 1996-06-12 Nikon Corporation Laser scanning microscope
RU2140661C1 (ru) * 1999-03-19 1999-10-27 Левин Геннадий Генрихович Способ конфокальной сканирующей трехмерной микроскопии и конфокальный сканирующий томографический микроскоп
DE10206020A1 (de) * 2002-02-14 2003-08-28 Zeiss Carl Jena Gmbh Optisches Nahfeldmikroskop
DE102015213897A1 (de) * 2015-07-23 2017-01-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Anordnung und Verfahren zur verzeichnungsfreien zweidimensionalen Ablenkung von räumlich ausgedehnten Intensitätsverteilungen

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