DE3515194C2 - - Google Patents

Info

Publication number
DE3515194C2
DE3515194C2 DE3515194A DE3515194A DE3515194C2 DE 3515194 C2 DE3515194 C2 DE 3515194C2 DE 3515194 A DE3515194 A DE 3515194A DE 3515194 A DE3515194 A DE 3515194A DE 3515194 C2 DE3515194 C2 DE 3515194C2
Authority
DE
Germany
Prior art keywords
detection line
screen
line sensor
image
position detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3515194A
Other languages
German (de)
English (en)
Other versions
DE3515194A1 (de
Inventor
Yoshitada Hoya Kanagawa Jp Sekine
Fumiki Yamato Kanagawa Jp Yokota
Hisashi Fujisawa Kanagawa Jp Kubota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissan Motor Co Ltd
Original Assignee
Nissan Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP8388884A external-priority patent/JPS60228908A/ja
Priority claimed from JP8388984A external-priority patent/JPS60228909A/ja
Priority claimed from JP8389084A external-priority patent/JPS60228910A/ja
Application filed by Nissan Motor Co Ltd filed Critical Nissan Motor Co Ltd
Publication of DE3515194A1 publication Critical patent/DE3515194A1/de
Application granted granted Critical
Publication of DE3515194C2 publication Critical patent/DE3515194C2/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515Objects of complex shape, e.g. examined with use of a surface follower device

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE19853515194 1984-04-27 1985-04-26 Verfahren und vorrichtung zur ermittlung von oberflaechenfehlern Granted DE3515194A1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP8388884A JPS60228908A (ja) 1984-04-27 1984-04-27 表面欠陥検査方法
JP8388984A JPS60228909A (ja) 1984-04-27 1984-04-27 表面欠陥検査装置におけるセンサ配置構造
JP8389084A JPS60228910A (ja) 1984-04-27 1984-04-27 表面欠陥検査装置

Publications (2)

Publication Number Publication Date
DE3515194A1 DE3515194A1 (de) 1985-11-07
DE3515194C2 true DE3515194C2 (en, 2012) 1988-11-10

Family

ID=27304359

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853515194 Granted DE3515194A1 (de) 1984-04-27 1985-04-26 Verfahren und vorrichtung zur ermittlung von oberflaechenfehlern

Country Status (3)

Country Link
US (1) US4715709A (en, 2012)
DE (1) DE3515194A1 (en, 2012)
GB (1) GB2159271B (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19804370C2 (de) * 1997-02-05 2001-03-01 Advantest Corp Vorrichtung zum Detektieren des Oberflächenzustandes eines Wafers

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DE69008623T2 (de) * 1989-06-30 1994-08-18 Jaguar Cars Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern.
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US5142648A (en) * 1990-08-02 1992-08-25 General Motors Corporation Method and apparatus for paint inspection
US5153445A (en) * 1991-07-22 1992-10-06 General Motors Corporation Method and apparatus for measuring orange peel and texture in painted surfaces
US5168322A (en) * 1991-08-19 1992-12-01 Diffracto Ltd. Surface inspection using retro-reflective light field
FR2686697B1 (fr) * 1992-01-27 1994-04-29 Aerospatiale Dispositif de detection de defauts dans des pieces bicouches, notamment dans des cellules solaires.
SE470029B (sv) * 1992-03-19 1993-10-25 Sandvik Ab Optisk anordning för kontroll av jämnhet och planhet hos en yta
AT402860B (de) * 1993-06-22 1997-09-25 Oesterr Forsch Seibersdorf Verfahren und vorrichtung zur prüfung von transparenten gegenständen
DE19713584C2 (de) * 1997-04-02 1999-05-12 Selbach Gerd Verfahren und Vorrichtung zur Messung des Zerfallzustandes von fester, flüssiger und gasförmiger Materie mittels Photonenreflexion und -absorption
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DE19816992A1 (de) * 1998-04-17 1999-11-04 Daimler Chrysler Ag Verfahren zur Markierung wenigstens eines Punktes auf einem Gegenstand
DE59906205D1 (de) * 1998-10-08 2003-08-07 Daimler Chrysler Ag Vermessen kleiner, periodischer welligkeiten in oberflächen
GB2376068A (en) * 2001-05-31 2002-12-04 Millennium Venture Holdings Lt Method and apparatus of in-process inspection
ATE467114T1 (de) * 2003-02-28 2010-05-15 Koninkl Philips Electronics Nv Streumesser und verfahren zur untersuchung einer oberfläche
ES2290402T3 (es) * 2003-04-03 2008-02-16 Erwin Pristner Dispositivo para detectar, determinar y documentar daños, especialmente deformaciones originadas por sucesos repentinos en superficies lacadas.
JP2005283310A (ja) * 2004-03-29 2005-10-13 Jatco Ltd リング端面欠陥検査装置
FR2873204B1 (fr) * 2004-07-19 2007-04-27 Plastic Omnium Cie Appareil de mesure pour le controle de pieces de carrosserie peintes, muni d'un dispositif anti-deterioration
FR2873205B1 (fr) * 2004-07-19 2007-05-18 Plastic Omnium Cie Procede et poste de controle de peinture de piece de carrosserie de vehicules automobiles
US20070146692A1 (en) * 2005-12-23 2007-06-28 Xerox Corporation Fiber optic specular surface flaw detection
US7362450B2 (en) * 2005-12-23 2008-04-22 Xerox Corporation Specular surface flaw detection
FR2899966B1 (fr) * 2006-04-18 2010-02-26 Holo 3 Procede et dispositif de controle optique d'une surface optiquement reflechissante
FR2899965A1 (fr) * 2006-04-18 2007-10-19 Holo 3 Procede et dispositif de controle optique d'une surface optiquement reflechissante
NL1032584C1 (nl) * 2006-09-27 2008-03-28 Paccus Interfaces B V Hoekverdraaiing sensor.
US7499811B2 (en) * 2006-10-17 2009-03-03 Ford Motor Company System and method for measuring surface appearance of a surface
CN101526347A (zh) * 2008-03-07 2009-09-09 鸿富锦精密工业(深圳)有限公司 便携式电子装置及其测量物体长度的方法
US10853873B2 (en) 2008-10-02 2020-12-01 Ecoatm, Llc Kiosks for evaluating and purchasing used electronic devices and related technology
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
ES2791048T3 (es) 2008-10-02 2020-10-30 Ecoatm Llc Sistema de venta y mercado secundario de dispositivos
DE102009040837A1 (de) * 2009-09-10 2011-03-17 Carl Zeiss Ag Vorrichtungen und Verfahren zur Positionsbestimmung und Oberflächenvermessung
JP5562629B2 (ja) * 2009-12-22 2014-07-30 三菱重工業株式会社 探傷装置及び探傷方法
EP2492668B1 (en) 2011-02-28 2013-08-28 C.R.F. Società Consortile per Azioni System and method for monitoring painting quality of components, in particular of motor-vehicle bodies
US10401411B2 (en) 2014-09-29 2019-09-03 Ecoatm, Llc Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices
EP3201885B1 (en) 2014-10-02 2021-03-10 ecoATM, LLC Application for device evaluation and other processes associated with device recycling
WO2016053378A1 (en) 2014-10-02 2016-04-07 ecoATM, Inc. Wireless-enabled kiosk for recycling consumer devices
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
US10860990B2 (en) 2014-11-06 2020-12-08 Ecoatm, Llc Methods and systems for evaluating and recycling electronic devices
CA2966348C (en) 2014-10-31 2019-11-12 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
US11080672B2 (en) 2014-12-12 2021-08-03 Ecoatm, Llc Systems and methods for recycling consumer electronic devices
WO2016069742A1 (en) 2014-10-31 2016-05-06 ecoATM, Inc. Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices
US20160275460A1 (en) * 2015-03-17 2016-09-22 ecoATM, Inc. Systems and methods for inspecting mobile devices and other consumer electronic devices with a laser
US20170082554A1 (en) * 2015-09-17 2017-03-23 Ford Global Technologies, Llc High speed, flexible pretreatment process measurement scanner
US10127647B2 (en) 2016-04-15 2018-11-13 Ecoatm, Llc Methods and systems for detecting cracks in electronic devices
US9885672B2 (en) 2016-06-08 2018-02-06 ecoATM, Inc. Methods and systems for detecting screen covers on electronic devices
DE102016111544A1 (de) * 2016-06-23 2017-12-28 Hochschule Düsseldorf Laser-Scan-System
US10269110B2 (en) * 2016-06-28 2019-04-23 Ecoatm, Llc Methods and systems for detecting cracks in illuminated electronic device screens
KR101807145B1 (ko) * 2016-09-01 2017-12-07 현대자동차 주식회사 차체 부품 검사장치
DE102018113919A1 (de) * 2018-06-11 2019-12-12 ATB Blank GmbH Vorrichtung zur Oberflächeninspektion eines Kraftfahrzeugs und Verfahren hierzu
CN111197471B (zh) * 2018-10-30 2022-03-22 中国石油化工股份有限公司 井下筛管瞬变电磁检测计算模型及检测方法
US12322259B2 (en) 2018-12-19 2025-06-03 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
EP3884475A1 (en) 2018-12-19 2021-09-29 ecoATM, LLC Systems and methods for vending and/or purchasing mobile phones and other electronic devices
US10739259B2 (en) * 2018-12-27 2020-08-11 Axalta Coating Systems Ip Co., Llc Systems and methods for measuring reflectivity of a painted object
WO2020167849A1 (en) 2019-02-12 2020-08-20 Ecoatm, Llc Connector carrier for electronic device kiosk
CA3130102A1 (en) 2019-02-12 2020-08-20 Ecoatm, Llc Kiosk for evaluating and purchasing used electronic devices
WO2020172190A1 (en) 2019-02-18 2020-08-27 Ecoatm, Llc Neural network based physical condition evaluation of electronic devices, and associated systems and methods
CZ2019530A3 (cs) * 2019-08-13 2021-02-03 Ĺ KODA AUTO a.s. Lisovací linka a pracovní postup kontroly výlisků na této lisovací lince
CN115581122A (zh) 2019-12-18 2023-01-06 埃科亚特姆公司 用于贩售和/或购买移动电话和其他电子设备的系统和方法
MX2022014785A (es) * 2020-05-26 2023-01-16 Cin Advanced Systems Group S L Dispositivo de inspeccion de defectos superficiales, linea de inspeccion de defectos superficiales de carrocerias de vehiculos y procedimiento de inspeccion de defectos superficiales.
US12271929B2 (en) 2020-08-17 2025-04-08 Ecoatm Llc Evaluating an electronic device using a wireless charger
WO2022040667A1 (en) 2020-08-17 2022-02-24 Ecoatm, Llc Evaluating an electronic device using a wireless charger
US11922467B2 (en) 2020-08-17 2024-03-05 ecoATM, Inc. Evaluating an electronic device using optical character recognition
CA3193151A1 (en) 2020-08-25 2022-03-03 Ecoatm, Llc Evaluating and recycling electronic devices
ES2944725B2 (es) * 2021-12-23 2023-12-18 Seat Sa Sistema de identificación de defectos en la carrocería de un vehículo
CN117420144B (zh) * 2023-12-19 2024-03-12 广东仁懋电子有限公司 一种高可靠碳化硅mos器件缺陷检测设备
CN118225794B (zh) * 2024-05-23 2024-07-30 四川吉埃智能科技有限公司 一种基于三维成像的高精度小口径管坡口检测方法及装置

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GB1207489A (en) * 1966-12-06 1970-10-07 North Atlantic Res Products Lt A system for detecting surface flaws in objects
AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
SE7502440L (en, 2012) * 1974-03-09 1975-09-10 Feldmuehle Anlagen Prod
JPS6036013B2 (ja) * 1977-09-30 1985-08-17 動力炉・核燃料開発事業団 金属表面の欠陥検査方法
GB2018985B (en) * 1978-02-13 1983-01-06 Sira Institute Detecting flaws in sheets
DE2816986C3 (de) * 1978-04-19 1986-03-27 Agfa-Gevaert Ag, 5090 Leverkusen Anordnung zum Aufsuchen von Fehlern auf laufenden Bändern
IT1143380B (it) * 1981-02-10 1986-10-22 Fiat Ricerche Procedimento e dispositivo per il rilevamento di difetti superficiali di pezzi meccanici in particolare di pezzi a superficie curva
DE3108234A1 (de) * 1981-03-05 1982-09-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München "verfahren zur beurteilung der qualitaet von kfz-scheiben"
JPS58219441A (ja) * 1982-06-15 1983-12-20 Hajime Sangyo Kk 凸面体の表面欠陥検査装置
IL66788A (en) * 1982-09-14 1985-02-28 Optrotech Ltd Optical scanning apparatus using a wave guide

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19804370C2 (de) * 1997-02-05 2001-03-01 Advantest Corp Vorrichtung zum Detektieren des Oberflächenzustandes eines Wafers

Also Published As

Publication number Publication date
GB2159271A (en) 1985-11-27
GB8510579D0 (en) 1985-05-30
DE3515194A1 (de) 1985-11-07
US4715709A (en) 1987-12-29
GB2159271B (en) 1988-05-18

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee