DE3515194C2 - - Google Patents
Info
- Publication number
- DE3515194C2 DE3515194C2 DE3515194A DE3515194A DE3515194C2 DE 3515194 C2 DE3515194 C2 DE 3515194C2 DE 3515194 A DE3515194 A DE 3515194A DE 3515194 A DE3515194 A DE 3515194A DE 3515194 C2 DE3515194 C2 DE 3515194C2
- Authority
- DE
- Germany
- Prior art keywords
- detection line
- screen
- line sensor
- image
- position detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 115
- 238000012360 testing method Methods 0.000 claims description 43
- 230000007547 defect Effects 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 18
- 230000003287 optical effect Effects 0.000 claims description 17
- 238000003384 imaging method Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 description 13
- 238000011156 evaluation Methods 0.000 description 8
- 230000014509 gene expression Effects 0.000 description 6
- 238000000149 argon plasma sintering Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 239000003550 marker Substances 0.000 description 4
- 238000001444 catalytic combustion detection Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 101710179738 6,7-dimethyl-8-ribityllumazine synthase 1 Proteins 0.000 description 1
- 101710179734 6,7-dimethyl-8-ribityllumazine synthase 2 Proteins 0.000 description 1
- 101710186608 Lipoyl synthase 1 Proteins 0.000 description 1
- 101710137584 Lipoyl synthase 1, chloroplastic Proteins 0.000 description 1
- 101710090391 Lipoyl synthase 1, mitochondrial Proteins 0.000 description 1
- 101710186609 Lipoyl synthase 2 Proteins 0.000 description 1
- 101710122908 Lipoyl synthase 2, chloroplastic Proteins 0.000 description 1
- 101710101072 Lipoyl synthase 2, mitochondrial Proteins 0.000 description 1
- 229910002056 binary alloy Inorganic materials 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000005338 frosted glass Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8388884A JPS60228908A (ja) | 1984-04-27 | 1984-04-27 | 表面欠陥検査方法 |
JP8388984A JPS60228909A (ja) | 1984-04-27 | 1984-04-27 | 表面欠陥検査装置におけるセンサ配置構造 |
JP8389084A JPS60228910A (ja) | 1984-04-27 | 1984-04-27 | 表面欠陥検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3515194A1 DE3515194A1 (de) | 1985-11-07 |
DE3515194C2 true DE3515194C2 (en, 2012) | 1988-11-10 |
Family
ID=27304359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19853515194 Granted DE3515194A1 (de) | 1984-04-27 | 1985-04-26 | Verfahren und vorrichtung zur ermittlung von oberflaechenfehlern |
Country Status (3)
Country | Link |
---|---|
US (1) | US4715709A (en, 2012) |
DE (1) | DE3515194A1 (en, 2012) |
GB (1) | GB2159271B (en, 2012) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19804370C2 (de) * | 1997-02-05 | 2001-03-01 | Advantest Corp | Vorrichtung zum Detektieren des Oberflächenzustandes eines Wafers |
Families Citing this family (72)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4585343A (en) * | 1983-11-04 | 1986-04-29 | Libbey-Owens-Ford Company | Apparatus and method for inspecting glass |
US5206700A (en) * | 1985-03-14 | 1993-04-27 | Diffracto, Ltd. | Methods and apparatus for retroreflective surface inspection and distortion measurement |
GB8517834D0 (en) * | 1985-07-15 | 1985-08-21 | Sira Ltd | Inspection apparatus |
DE3712513A1 (de) * | 1987-04-13 | 1988-11-03 | Roth Electric Gmbh | Verfahren und vorrichtung zur erkennung von oberflaechenfehlern |
US4868404A (en) * | 1987-04-23 | 1989-09-19 | Hajime Industries, Ltd. | Surface inspection apparatus using a mask system to monitor uneven surfaces |
DE3840677A1 (de) * | 1988-12-02 | 1990-06-07 | Krupp Atlas Elektronik Gmbh | Optischer ueberwachungssensor |
FR2640060A1 (fr) * | 1988-12-06 | 1990-06-08 | Esia | Procede et dispositif de saisie informatique de caracteristiques de surface d'un produit |
DE69008623T2 (de) * | 1989-06-30 | 1994-08-18 | Jaguar Cars | Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern. |
CH681112A5 (en, 2012) * | 1990-01-06 | 1993-01-15 | Wilfried Schoeps | |
US5142648A (en) * | 1990-08-02 | 1992-08-25 | General Motors Corporation | Method and apparatus for paint inspection |
US5153445A (en) * | 1991-07-22 | 1992-10-06 | General Motors Corporation | Method and apparatus for measuring orange peel and texture in painted surfaces |
US5168322A (en) * | 1991-08-19 | 1992-12-01 | Diffracto Ltd. | Surface inspection using retro-reflective light field |
FR2686697B1 (fr) * | 1992-01-27 | 1994-04-29 | Aerospatiale | Dispositif de detection de defauts dans des pieces bicouches, notamment dans des cellules solaires. |
SE470029B (sv) * | 1992-03-19 | 1993-10-25 | Sandvik Ab | Optisk anordning för kontroll av jämnhet och planhet hos en yta |
AT402860B (de) * | 1993-06-22 | 1997-09-25 | Oesterr Forsch Seibersdorf | Verfahren und vorrichtung zur prüfung von transparenten gegenständen |
DE19713584C2 (de) * | 1997-04-02 | 1999-05-12 | Selbach Gerd | Verfahren und Vorrichtung zur Messung des Zerfallzustandes von fester, flüssiger und gasförmiger Materie mittels Photonenreflexion und -absorption |
US6608676B1 (en) * | 1997-08-01 | 2003-08-19 | Kla-Tencor Corporation | System for detecting anomalies and/or features of a surface |
DE19816992A1 (de) * | 1998-04-17 | 1999-11-04 | Daimler Chrysler Ag | Verfahren zur Markierung wenigstens eines Punktes auf einem Gegenstand |
DE59906205D1 (de) * | 1998-10-08 | 2003-08-07 | Daimler Chrysler Ag | Vermessen kleiner, periodischer welligkeiten in oberflächen |
GB2376068A (en) * | 2001-05-31 | 2002-12-04 | Millennium Venture Holdings Lt | Method and apparatus of in-process inspection |
ATE467114T1 (de) * | 2003-02-28 | 2010-05-15 | Koninkl Philips Electronics Nv | Streumesser und verfahren zur untersuchung einer oberfläche |
ES2290402T3 (es) * | 2003-04-03 | 2008-02-16 | Erwin Pristner | Dispositivo para detectar, determinar y documentar daños, especialmente deformaciones originadas por sucesos repentinos en superficies lacadas. |
JP2005283310A (ja) * | 2004-03-29 | 2005-10-13 | Jatco Ltd | リング端面欠陥検査装置 |
FR2873204B1 (fr) * | 2004-07-19 | 2007-04-27 | Plastic Omnium Cie | Appareil de mesure pour le controle de pieces de carrosserie peintes, muni d'un dispositif anti-deterioration |
FR2873205B1 (fr) * | 2004-07-19 | 2007-05-18 | Plastic Omnium Cie | Procede et poste de controle de peinture de piece de carrosserie de vehicules automobiles |
US20070146692A1 (en) * | 2005-12-23 | 2007-06-28 | Xerox Corporation | Fiber optic specular surface flaw detection |
US7362450B2 (en) * | 2005-12-23 | 2008-04-22 | Xerox Corporation | Specular surface flaw detection |
FR2899966B1 (fr) * | 2006-04-18 | 2010-02-26 | Holo 3 | Procede et dispositif de controle optique d'une surface optiquement reflechissante |
FR2899965A1 (fr) * | 2006-04-18 | 2007-10-19 | Holo 3 | Procede et dispositif de controle optique d'une surface optiquement reflechissante |
NL1032584C1 (nl) * | 2006-09-27 | 2008-03-28 | Paccus Interfaces B V | Hoekverdraaiing sensor. |
US7499811B2 (en) * | 2006-10-17 | 2009-03-03 | Ford Motor Company | System and method for measuring surface appearance of a surface |
CN101526347A (zh) * | 2008-03-07 | 2009-09-09 | 鸿富锦精密工业(深圳)有限公司 | 便携式电子装置及其测量物体长度的方法 |
US10853873B2 (en) | 2008-10-02 | 2020-12-01 | Ecoatm, Llc | Kiosks for evaluating and purchasing used electronic devices and related technology |
US7881965B2 (en) | 2008-10-02 | 2011-02-01 | ecoATM, Inc. | Secondary market and vending system for devices |
US11010841B2 (en) | 2008-10-02 | 2021-05-18 | Ecoatm, Llc | Kiosk for recycling electronic devices |
ES2791048T3 (es) | 2008-10-02 | 2020-10-30 | Ecoatm Llc | Sistema de venta y mercado secundario de dispositivos |
DE102009040837A1 (de) * | 2009-09-10 | 2011-03-17 | Carl Zeiss Ag | Vorrichtungen und Verfahren zur Positionsbestimmung und Oberflächenvermessung |
JP5562629B2 (ja) * | 2009-12-22 | 2014-07-30 | 三菱重工業株式会社 | 探傷装置及び探傷方法 |
EP2492668B1 (en) | 2011-02-28 | 2013-08-28 | C.R.F. Società Consortile per Azioni | System and method for monitoring painting quality of components, in particular of motor-vehicle bodies |
US10401411B2 (en) | 2014-09-29 | 2019-09-03 | Ecoatm, Llc | Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices |
EP3201885B1 (en) | 2014-10-02 | 2021-03-10 | ecoATM, LLC | Application for device evaluation and other processes associated with device recycling |
WO2016053378A1 (en) | 2014-10-02 | 2016-04-07 | ecoATM, Inc. | Wireless-enabled kiosk for recycling consumer devices |
US10445708B2 (en) | 2014-10-03 | 2019-10-15 | Ecoatm, Llc | System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods |
US10860990B2 (en) | 2014-11-06 | 2020-12-08 | Ecoatm, Llc | Methods and systems for evaluating and recycling electronic devices |
CA2966348C (en) | 2014-10-31 | 2019-11-12 | ecoATM, Inc. | Systems and methods for recycling consumer electronic devices |
US11080672B2 (en) | 2014-12-12 | 2021-08-03 | Ecoatm, Llc | Systems and methods for recycling consumer electronic devices |
WO2016069742A1 (en) | 2014-10-31 | 2016-05-06 | ecoATM, Inc. | Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices |
US20160275460A1 (en) * | 2015-03-17 | 2016-09-22 | ecoATM, Inc. | Systems and methods for inspecting mobile devices and other consumer electronic devices with a laser |
US20170082554A1 (en) * | 2015-09-17 | 2017-03-23 | Ford Global Technologies, Llc | High speed, flexible pretreatment process measurement scanner |
US10127647B2 (en) | 2016-04-15 | 2018-11-13 | Ecoatm, Llc | Methods and systems for detecting cracks in electronic devices |
US9885672B2 (en) | 2016-06-08 | 2018-02-06 | ecoATM, Inc. | Methods and systems for detecting screen covers on electronic devices |
DE102016111544A1 (de) * | 2016-06-23 | 2017-12-28 | Hochschule Düsseldorf | Laser-Scan-System |
US10269110B2 (en) * | 2016-06-28 | 2019-04-23 | Ecoatm, Llc | Methods and systems for detecting cracks in illuminated electronic device screens |
KR101807145B1 (ko) * | 2016-09-01 | 2017-12-07 | 현대자동차 주식회사 | 차체 부품 검사장치 |
DE102018113919A1 (de) * | 2018-06-11 | 2019-12-12 | ATB Blank GmbH | Vorrichtung zur Oberflächeninspektion eines Kraftfahrzeugs und Verfahren hierzu |
CN111197471B (zh) * | 2018-10-30 | 2022-03-22 | 中国石油化工股份有限公司 | 井下筛管瞬变电磁检测计算模型及检测方法 |
US12322259B2 (en) | 2018-12-19 | 2025-06-03 | Ecoatm, Llc | Systems and methods for vending and/or purchasing mobile phones and other electronic devices |
EP3884475A1 (en) | 2018-12-19 | 2021-09-29 | ecoATM, LLC | Systems and methods for vending and/or purchasing mobile phones and other electronic devices |
US10739259B2 (en) * | 2018-12-27 | 2020-08-11 | Axalta Coating Systems Ip Co., Llc | Systems and methods for measuring reflectivity of a painted object |
WO2020167849A1 (en) | 2019-02-12 | 2020-08-20 | Ecoatm, Llc | Connector carrier for electronic device kiosk |
CA3130102A1 (en) | 2019-02-12 | 2020-08-20 | Ecoatm, Llc | Kiosk for evaluating and purchasing used electronic devices |
WO2020172190A1 (en) | 2019-02-18 | 2020-08-27 | Ecoatm, Llc | Neural network based physical condition evaluation of electronic devices, and associated systems and methods |
CZ2019530A3 (cs) * | 2019-08-13 | 2021-02-03 | Ĺ KODA AUTO a.s. | Lisovací linka a pracovní postup kontroly výlisků na této lisovací lince |
CN115581122A (zh) | 2019-12-18 | 2023-01-06 | 埃科亚特姆公司 | 用于贩售和/或购买移动电话和其他电子设备的系统和方法 |
MX2022014785A (es) * | 2020-05-26 | 2023-01-16 | Cin Advanced Systems Group S L | Dispositivo de inspeccion de defectos superficiales, linea de inspeccion de defectos superficiales de carrocerias de vehiculos y procedimiento de inspeccion de defectos superficiales. |
US12271929B2 (en) | 2020-08-17 | 2025-04-08 | Ecoatm Llc | Evaluating an electronic device using a wireless charger |
WO2022040667A1 (en) | 2020-08-17 | 2022-02-24 | Ecoatm, Llc | Evaluating an electronic device using a wireless charger |
US11922467B2 (en) | 2020-08-17 | 2024-03-05 | ecoATM, Inc. | Evaluating an electronic device using optical character recognition |
CA3193151A1 (en) | 2020-08-25 | 2022-03-03 | Ecoatm, Llc | Evaluating and recycling electronic devices |
ES2944725B2 (es) * | 2021-12-23 | 2023-12-18 | Seat Sa | Sistema de identificación de defectos en la carrocería de un vehículo |
CN117420144B (zh) * | 2023-12-19 | 2024-03-12 | 广东仁懋电子有限公司 | 一种高可靠碳化硅mos器件缺陷检测设备 |
CN118225794B (zh) * | 2024-05-23 | 2024-07-30 | 四川吉埃智能科技有限公司 | 一种基于三维成像的高精度小口径管坡口检测方法及装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1207489A (en) * | 1966-12-06 | 1970-10-07 | North Atlantic Res Products Lt | A system for detecting surface flaws in objects |
AR207635A1 (es) * | 1973-06-27 | 1976-10-22 | Connor B O | Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos |
SE7502440L (en, 2012) * | 1974-03-09 | 1975-09-10 | Feldmuehle Anlagen Prod | |
JPS6036013B2 (ja) * | 1977-09-30 | 1985-08-17 | 動力炉・核燃料開発事業団 | 金属表面の欠陥検査方法 |
GB2018985B (en) * | 1978-02-13 | 1983-01-06 | Sira Institute | Detecting flaws in sheets |
DE2816986C3 (de) * | 1978-04-19 | 1986-03-27 | Agfa-Gevaert Ag, 5090 Leverkusen | Anordnung zum Aufsuchen von Fehlern auf laufenden Bändern |
IT1143380B (it) * | 1981-02-10 | 1986-10-22 | Fiat Ricerche | Procedimento e dispositivo per il rilevamento di difetti superficiali di pezzi meccanici in particolare di pezzi a superficie curva |
DE3108234A1 (de) * | 1981-03-05 | 1982-09-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | "verfahren zur beurteilung der qualitaet von kfz-scheiben" |
JPS58219441A (ja) * | 1982-06-15 | 1983-12-20 | Hajime Sangyo Kk | 凸面体の表面欠陥検査装置 |
IL66788A (en) * | 1982-09-14 | 1985-02-28 | Optrotech Ltd | Optical scanning apparatus using a wave guide |
-
1985
- 1985-04-25 GB GB08510579A patent/GB2159271B/en not_active Expired
- 1985-04-26 DE DE19853515194 patent/DE3515194A1/de active Granted
- 1985-04-26 US US06/727,874 patent/US4715709A/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19804370C2 (de) * | 1997-02-05 | 2001-03-01 | Advantest Corp | Vorrichtung zum Detektieren des Oberflächenzustandes eines Wafers |
Also Published As
Publication number | Publication date |
---|---|
GB2159271A (en) | 1985-11-27 |
GB8510579D0 (en) | 1985-05-30 |
DE3515194A1 (de) | 1985-11-07 |
US4715709A (en) | 1987-12-29 |
GB2159271B (en) | 1988-05-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |