MX2022014785A - Dispositivo de inspeccion de defectos superficiales, linea de inspeccion de defectos superficiales de carrocerias de vehiculos y procedimiento de inspeccion de defectos superficiales. - Google Patents

Dispositivo de inspeccion de defectos superficiales, linea de inspeccion de defectos superficiales de carrocerias de vehiculos y procedimiento de inspeccion de defectos superficiales.

Info

Publication number
MX2022014785A
MX2022014785A MX2022014785A MX2022014785A MX2022014785A MX 2022014785 A MX2022014785 A MX 2022014785A MX 2022014785 A MX2022014785 A MX 2022014785A MX 2022014785 A MX2022014785 A MX 2022014785A MX 2022014785 A MX2022014785 A MX 2022014785A
Authority
MX
Mexico
Prior art keywords
defect inspection
surface defect
light
inspection
vehicle body
Prior art date
Application number
MX2022014785A
Other languages
English (en)
Inventor
Juarez Jorge Marina
Garcia Ignacio Alvarez
Garcia Daniel Perez
Original Assignee
Cin Advanced Systems Group S L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cin Advanced Systems Group S L filed Critical Cin Advanced Systems Group S L
Publication of MX2022014785A publication Critical patent/MX2022014785A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G01N2021/9518—Objects of complex shape, e.g. examined with use of a surface follower device using a surface follower, e.g. robot
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/104—Mechano-optical scan, i.e. object and beam moving

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Dispositivo de inspección de defectos superficiales que comprende unos medios de traslación (1) desplazables según una dirección de avance (A) en un primer eje (X), una estructura portante (3) con unos medios de inspección para inspeccionar la superficie de una pieza (2) que tienen unos medios para emitir al menos un perfil de luz (5) sobre la pieza (2) y unos medios para visualizar la luz reflejada por el perfil de luz (5), y una unidad de control que está configurada para procesar la luz reflejada y detectar defectos superficiales en la pieza (2), en donde los medios de inspección comprenden al menos un cabezal de inspección (4) móvil, y la unidad de control está adicionalmente configurada para mover el cabezal de inspección (4) en función de la luz reflejada por el perfil de luz (5) mientras se desplazan los medios de traslación (1) en la dirección de avance (A), orientando el perfil de luz (5) hacia la pieza (2).
MX2022014785A 2020-05-26 2020-05-26 Dispositivo de inspeccion de defectos superficiales, linea de inspeccion de defectos superficiales de carrocerias de vehiculos y procedimiento de inspeccion de defectos superficiales. MX2022014785A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/ES2020/070345 WO2021240025A1 (es) 2020-05-26 2020-05-26 Dispositivo de inspección de defectos superficiales, línea de inspección de defectos superficiales de carrocerías de vehículos y procedimiento de inspección de defectos superficiales

Publications (1)

Publication Number Publication Date
MX2022014785A true MX2022014785A (es) 2023-01-16

Family

ID=71523186

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2022014785A MX2022014785A (es) 2020-05-26 2020-05-26 Dispositivo de inspeccion de defectos superficiales, linea de inspeccion de defectos superficiales de carrocerias de vehiculos y procedimiento de inspeccion de defectos superficiales.

Country Status (6)

Country Link
US (1) US20230089226A1 (es)
EP (1) EP4160193A1 (es)
JP (1) JP2023527474A (es)
KR (1) KR20230017247A (es)
MX (1) MX2022014785A (es)
WO (1) WO2021240025A1 (es)

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0614012B2 (ja) * 1984-01-23 1994-02-23 光洋精工株式会社 外観検査装置
GB2159271B (en) * 1984-04-27 1988-05-18 Nissan Motor Surface flaw detecting method and apparatus
JPH01148852U (es) * 1988-04-05 1989-10-16
JPH0979988A (ja) * 1995-09-11 1997-03-28 Nissan Motor Co Ltd 表面欠陥検査装置
DE19730885A1 (de) * 1997-07-18 1999-01-21 Audi Ag Verfahren zur automatischen Erkennung von Oberflächenfehlern an Rohkarosserien und Vorrichtung zur Durchführung des Verfahrens
DE10104355B4 (de) * 2000-03-09 2010-02-18 Isra Vision Systems Ag Vorrichtung und Verfahren zur Bildabtastung der Oberfläche eines Objekts
JP2002131238A (ja) * 2000-10-25 2002-05-09 Honda Motor Co Ltd 外観検査装置
JP2006290504A (ja) * 2005-04-07 2006-10-26 Sumitomo Electric Ind Ltd 帯状可撓性部材の矯正、搬送、検査及び製造に係る装置並びに方法
KR101351004B1 (ko) * 2013-05-03 2014-01-24 주식회사 미루시스템즈 상하 이동이 가능한 결함 검출용 카메라 어레이가 구비된 이송장치
WO2016121878A1 (ja) * 2015-01-29 2016-08-04 株式会社デクシス 光学式外観検査装置、及びこれを用いた光学式外観検査システム
JP2017189748A (ja) * 2016-04-14 2017-10-19 シブヤ精機株式会社 玉ねぎの選別装置
US11158041B2 (en) * 2017-05-26 2021-10-26 Sintokogio, Ltd. Inspection device and casting system
CN112334761B (zh) * 2018-06-22 2023-12-15 柯尼卡美能达株式会社 缺陷判别方法、缺陷判别装置及记录介质

Also Published As

Publication number Publication date
US20230089226A1 (en) 2023-03-23
KR20230017247A (ko) 2023-02-03
WO2021240025A1 (es) 2021-12-02
EP4160193A1 (en) 2023-04-05
JP2023527474A (ja) 2023-06-28

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