DE3486178T2 - Optisches Instrument zur Messung einer Verschiebung. - Google Patents

Optisches Instrument zur Messung einer Verschiebung.

Info

Publication number
DE3486178T2
DE3486178T2 DE88117622T DE3486178T DE3486178T2 DE 3486178 T2 DE3486178 T2 DE 3486178T2 DE 88117622 T DE88117622 T DE 88117622T DE 3486178 T DE3486178 T DE 3486178T DE 3486178 T2 DE3486178 T2 DE 3486178T2
Authority
DE
Germany
Prior art keywords
displacement
measuring
optical instrument
instrument
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Revoked
Application number
DE88117622T
Other languages
English (en)
Other versions
DE3486178D1 (de
Inventor
Kayoko Taniguchi
Hideki Tsuchitani
Masaaki Toyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Magnescale Inc
Original Assignee
Sony Magnescale Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27328553&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3486178(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from JP20595683A external-priority patent/JPS6098302A/ja
Priority claimed from JP59205853A external-priority patent/JPH0781884B2/ja
Priority claimed from JP59205854A external-priority patent/JPS6183912A/ja
Application filed by Sony Magnescale Inc filed Critical Sony Magnescale Inc
Publication of DE3486178D1 publication Critical patent/DE3486178D1/de
Application granted granted Critical
Publication of DE3486178T2 publication Critical patent/DE3486178T2/de
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses
    • G01D5/38—Forming the light into pulses by diffraction gratings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE88117622T 1983-11-04 1984-10-31 Optisches Instrument zur Messung einer Verschiebung. Revoked DE3486178T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP20595683A JPS6098302A (ja) 1983-11-04 1983-11-04 光学式変位測定装置
JP59205853A JPH0781884B2 (ja) 1984-10-01 1984-10-01 光学式変位測定装置
JP59205854A JPS6183912A (ja) 1984-10-01 1984-10-01 光学式変位測定装置の信号検出機構

Publications (2)

Publication Number Publication Date
DE3486178D1 DE3486178D1 (de) 1993-08-19
DE3486178T2 true DE3486178T2 (de) 1993-10-21

Family

ID=27328553

Family Applications (2)

Application Number Title Priority Date Filing Date
DE88117622T Revoked DE3486178T2 (de) 1983-11-04 1984-10-31 Optisches Instrument zur Messung einer Verschiebung.
DE8484307484T Expired - Lifetime DE3484649D1 (de) 1983-11-04 1984-10-31 Optisches instrument zur messung einer verschiebung.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE8484307484T Expired - Lifetime DE3484649D1 (de) 1983-11-04 1984-10-31 Optisches instrument zur messung einer verschiebung.

Country Status (3)

Country Link
US (1) US4676645A (de)
EP (2) EP0146244B2 (de)
DE (2) DE3486178T2 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19938869B4 (de) * 1998-08-20 2015-10-01 Dmg Mori Seiki Co., Ltd. Optisches Verschiebungsmeßsystem
DE19930687B4 (de) * 1998-07-02 2017-01-05 Dmg Mori Seiki Co., Ltd. Optisches Verschiebungsmeßsystem

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FR2615280B1 (fr) * 1987-05-11 1996-07-19 Canon Kk Dispositif de mesure de la distance en mouvement relatif de deux objets mobiles l'un par rapport a l'autre
JPH073344B2 (ja) * 1987-06-15 1995-01-18 キヤノン株式会社 エンコ−ダ−
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JP2567036B2 (ja) * 1988-05-10 1996-12-25 キヤノン株式会社 光学式エンコーダ
JPH0718714B2 (ja) * 1988-05-10 1995-03-06 キヤノン株式会社 エンコーダー
JP2603305B2 (ja) * 1988-07-19 1997-04-23 キヤノン株式会社 変位測定装置
JPH0778433B2 (ja) * 1988-07-19 1995-08-23 キヤノン株式会社 ロータリーエンコーダ
JP2586120B2 (ja) * 1988-09-22 1997-02-26 キヤノン株式会社 エンコーダー
JP2547826B2 (ja) * 1988-10-19 1996-10-23 キヤノン株式会社 マルチモード半導体レーザを使用する干渉計測装置
US5198873A (en) * 1988-10-19 1993-03-30 Canon Kabushiki Kaisha Encoder utilizing interference using multi-mode semiconductor laser
JP2586122B2 (ja) * 1988-11-18 1997-02-26 キヤノン株式会社 ロータリーエンコーダ
US5035507A (en) * 1988-12-21 1991-07-30 Mitutoyo Corporation Grating-interference type displacement meter apparatus
JP2629948B2 (ja) * 1989-03-03 1997-07-16 キヤノン株式会社 エンコーダー
JPH02285705A (ja) * 1989-04-26 1990-11-26 Canon Inc 信号内挿回路
DE69011188T2 (de) * 1989-05-12 1994-12-08 Canon Kk Kodierer.
US5050993A (en) * 1989-06-14 1991-09-24 Rockwell International Corporation Diffraction encoded position measuring apparatus
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JP2683117B2 (ja) * 1989-10-31 1997-11-26 キヤノン株式会社 エンコーダー
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JPH04229702A (ja) * 1990-06-20 1992-08-19 Canon Inc 信号処理方法及び装置、並びにこれを用いた変位検出装置等のシステム
US5225918A (en) * 1990-07-18 1993-07-06 Sony Magnescale, Inc. Hologram scale, apparatus for making hologram scale, moving member having hologram scale assembled hologram scale and apparatus for making assembled hologram scale
JP2796756B2 (ja) * 1990-08-30 1998-09-10 ソニー・プレシジョン・テクノロジー株式会社 ホログラムスケール
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JP3232795B2 (ja) * 1992-08-06 2001-11-26 キヤノン株式会社 検出装置
US5424829A (en) * 1992-09-02 1995-06-13 Mitutoyo Corporation Apparatus wherein diffracted light does not return to the source
JP2557171B2 (ja) * 1992-11-25 1996-11-27 株式会社ミツトヨ 変位検出装置
US5317385A (en) * 1992-12-16 1994-05-31 Federal Products Corporation Portable extended life metrology system for measuring scale displacement with three output signals using a pulsed source
JPH074993A (ja) * 1993-03-23 1995-01-10 Ricoh Co Ltd エンコーダ装置
DE4337005C2 (de) * 1993-10-29 2000-11-02 Heidenhain Gmbh Dr Johannes Längen- oder Winkelmeßeinrichtung
US5507455A (en) * 1993-12-28 1996-04-16 Yang; Ro-King Automatic control device for flying state of remote-control toy airplane
JP3531375B2 (ja) * 1996-09-03 2004-05-31 ソニー・プレシジョン・テクノロジー株式会社 変位量検出装置
AU5588700A (en) 1999-05-24 2000-12-12 Brimrose Corporation Of America Device and method for optical path length measurement
DE10043635A1 (de) 1999-09-16 2001-03-22 Heidenhain Gmbh Dr Johannes Vorrichtung zur Positionsbestimmung und Ermittlung von Führungsfehlern
US6914405B2 (en) * 2000-09-19 2005-07-05 Microe Systems Corp. Interface component for a positioning system and method for designing an interface component
JP4077637B2 (ja) 2002-02-25 2008-04-16 株式会社ミツトヨ 格子干渉型変位測定装置
US20030174343A1 (en) * 2002-03-18 2003-09-18 Mitutoyo Corporation Optical displacement sensing device with reduced sensitivity to misalignment
US6879405B2 (en) * 2002-11-18 2005-04-12 Sony Precision Technology, Inc. Displacement pickup
DE102004053082A1 (de) 2004-11-03 2006-05-04 Dr. Johannes Heidenhain Gmbh Positionsmesssystem
JP4722474B2 (ja) * 2004-12-24 2011-07-13 株式会社ミツトヨ 変位検出装置
JP4670438B2 (ja) * 2005-04-01 2011-04-13 ソニー株式会社 コンテンツおよびそのプレイリストの提供方法
DE102005025385B4 (de) * 2005-04-20 2007-03-22 Von Ardenne Anlagentechnik Gmbh Vakuumbeschichtungsanlage zur Beschichtung flächiger Substrate mit einer Messeinrichtung zur Transmissions- oder/und Reflexionsmessung
US8233154B2 (en) 2005-12-22 2012-07-31 Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College High precision code plates and geophones
KR101725529B1 (ko) 2010-03-30 2017-04-10 지고 코포레이션 간섭계 인코더 시스템
DE102010041556A1 (de) 2010-09-28 2012-03-29 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Mikrolithographie und Verfahren zur mikrolithographischen Abbildung
WO2012106246A2 (en) 2011-02-01 2012-08-09 Zygo Corporation Interferometric heterodyne optical encoder system
JP5905729B2 (ja) 2011-10-26 2016-04-20 Dmg森精機株式会社 変位検出装置
TWI516746B (zh) 2012-04-20 2016-01-11 賽格股份有限公司 在干涉編碼系統中執行非諧循環錯誤補償的方法、裝置及計算機程式產品，以及微影系統
JP6427399B2 (ja) * 2014-04-14 2018-11-21 Dmg森精機株式会社 変位検出装置
CN104048597B (zh) * 2014-06-13 2017-06-13 中国科学院上海光学精密机械研究所 自适应共光路光栅干涉仪及其实现方法
CN105066908B (zh) * 2015-08-12 2017-06-09 北京航空航天大学 一种基于多波长和多偏振态的数字全息三维形貌检测装置
EP3674344B1 (de) * 2018-06-20 2023-03-15 LG Chem, Ltd. Zusammensetzung zur grenzflächenpolymerisation von polyamid und herstellungsverfahren für eine trennmembran zur wasseraufbereitung damit
DE102019201699A1 (de) 2019-02-11 2019-04-04 Carl Zeiss Smt Gmbh Optischer Sensor für eine Projektionsbelichtungsanlage für die Halbleiterlithographie und Projektionsbelichtungsanlage
DE102020118659A1 (de) * 2019-07-17 2021-01-21 Dmg Mori Co., Ltd. Detektionsvorrichtung

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FR2504256A1 (fr) * 1981-04-16 1982-10-22 Euromask Procede et dispositif de mesure optique de deplacement et application aux photorepeteurs sur tranche

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19930687B4 (de) * 1998-07-02 2017-01-05 Dmg Mori Seiki Co., Ltd. Optisches Verschiebungsmeßsystem
DE19938869B4 (de) * 1998-08-20 2015-10-01 Dmg Mori Seiki Co., Ltd. Optisches Verschiebungsmeßsystem

Also Published As

Publication number Publication date
DE3486178D1 (de) 1993-08-19
EP0146244B1 (de) 1991-05-29
EP0146244A2 (de) 1985-06-26
EP0146244A3 (en) 1986-08-06
EP0311144A3 (de) 1991-02-06
EP0311144B1 (de) 1993-07-14
US4676645A (en) 1987-06-30
DE3484649D1 (de) 1991-07-04
EP0311144A2 (de) 1989-04-12
EP0146244B2 (de) 2002-07-03

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8331 Complete revocation