DE3482901D1 - Pruefgeraet fuer redundanzspeicher. - Google Patents

Pruefgeraet fuer redundanzspeicher.

Info

Publication number
DE3482901D1
DE3482901D1 DE8484105285T DE3482901T DE3482901D1 DE 3482901 D1 DE3482901 D1 DE 3482901D1 DE 8484105285 T DE8484105285 T DE 8484105285T DE 3482901 T DE3482901 T DE 3482901T DE 3482901 D1 DE3482901 D1 DE 3482901D1
Authority
DE
Germany
Prior art keywords
test device
data
redundancy storage
redundant
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8484105285T
Other languages
English (en)
Inventor
Ikuo Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP58080898A external-priority patent/JPS59207497A/ja
Priority claimed from JP58080897A external-priority patent/JPS59207496A/ja
Priority claimed from JP58080899A external-priority patent/JPS59207498A/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE3482901D1 publication Critical patent/DE3482901D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8484105285T 1983-05-11 1984-05-10 Pruefgeraet fuer redundanzspeicher. Expired - Lifetime DE3482901D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP58080898A JPS59207497A (ja) 1983-05-11 1983-05-11 メモリ不良ビット救済解析方法
JP58080897A JPS59207496A (ja) 1983-05-11 1983-05-11 半導体メモリ不良ビット救済解析装置
JP58080899A JPS59207498A (ja) 1983-05-11 1983-05-11 半導体メモリ試験装置

Publications (1)

Publication Number Publication Date
DE3482901D1 true DE3482901D1 (de) 1990-09-13

Family

ID=27303418

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484105285T Expired - Lifetime DE3482901D1 (de) 1983-05-11 1984-05-10 Pruefgeraet fuer redundanzspeicher.

Country Status (3)

Country Link
US (1) US4628509A (de)
EP (1) EP0125633B1 (de)
DE (1) DE3482901D1 (de)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60210000A (ja) * 1984-04-04 1985-10-22 Hitachi Ltd フエイルメモリ
US4751656A (en) * 1986-03-10 1988-06-14 International Business Machines Corporation Method for choosing replacement lines in a two dimensionally redundant array
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory
US5161158A (en) * 1989-10-16 1992-11-03 The Boeing Company Failure analysis system
JPH04177700A (ja) * 1990-11-13 1992-06-24 Toshiba Corp メモリ不良解析装置
JP3316876B2 (ja) * 1992-06-30 2002-08-19 安藤電気株式会社 データ圧縮用アドレス発生回路
JP3240709B2 (ja) * 1992-10-30 2001-12-25 株式会社アドバンテスト メモリ試験装置
FR2699301B1 (fr) * 1992-12-16 1995-02-10 Sgs Thomson Microelectronics Procédé de traitement d'éléments défectueux dans une mémoire.
US5588115A (en) * 1993-01-29 1996-12-24 Teradyne, Inc. Redundancy analyzer for automatic memory tester
JPH0816486A (ja) * 1994-06-29 1996-01-19 Hitachi Ltd 欠陥救済用ｌｓｉとメモリ装置
GB2292236A (en) * 1995-04-04 1996-02-14 Memory Corp Plc Improved partial memory engine
US5795797A (en) * 1995-08-18 1998-08-18 Teradyne, Inc. Method of making memory chips using memory tester providing fast repair
US5631868A (en) * 1995-11-28 1997-05-20 International Business Machines Corporation Method and apparatus for testing redundant word and bit lines in a memory array
US5754556A (en) * 1996-07-18 1998-05-19 Teradyne, Inc. Semiconductor memory tester with hardware accelerators
US5983374A (en) * 1996-09-26 1999-11-09 Kabushiki Kaisha Toshiba Semiconductor test system and method, and medium for recording test program therefor
JP3547064B2 (ja) * 1996-10-23 2004-07-28 株式会社アドバンテスト メモリ試験装置
GB9623215D0 (en) * 1996-11-07 1997-01-08 Process Insight Limited Solid state memory test system with defect compression
US6360340B1 (en) * 1996-11-19 2002-03-19 Teradyne, Inc. Memory tester with data compression
JP3558252B2 (ja) * 1997-11-10 2004-08-25 株式会社アドバンテスト 半導体メモリ試験装置
US6138254A (en) 1998-01-22 2000-10-24 Micron Technology, Inc. Method and apparatus for redundant location addressing using data compression
US6442724B1 (en) 1999-04-02 2002-08-27 Teradyne, Inc. Failure capture apparatus and method for automatic test equipment
JP2000348498A (ja) * 1999-06-08 2000-12-15 Mitsubishi Electric Corp 半導体試験装置
US6735729B1 (en) * 1999-08-18 2004-05-11 Micron Technology, Inc Compression circuit for testing a memory device
US6536005B1 (en) * 1999-10-26 2003-03-18 Teradyne, Inc. High-speed failure capture apparatus and method for automatic test equipment
JP2002343098A (ja) * 2001-05-18 2002-11-29 Mitsubishi Electric Corp 半導体記憶装置の試験方法
JP2003346496A (ja) * 2002-05-22 2003-12-05 Mitsubishi Electric Corp 不良情報格納装置とその装置を備える不良情報蓄積処理装置、不良情報蓄積方法、不良情報格納装置を備える半導体装置試験装置、および不良情報格納装置を備える半導体装置
TW578160B (en) * 2002-11-29 2004-03-01 Via Tech Inc Memory modeling circuit with fault tolerant
US7493534B2 (en) * 2003-08-29 2009-02-17 Hewlett-Packard Development Company, L.P. Memory error ranking
US7574640B2 (en) * 2003-09-05 2009-08-11 Intel Corporation Compacting circuit responses
US7484065B2 (en) 2004-04-20 2009-01-27 Hewlett-Packard Development Company, L.P. Selective memory allocation
US8977912B2 (en) * 2007-05-07 2015-03-10 Macronix International Co., Ltd. Method and apparatus for repairing memory
US8799732B2 (en) * 2012-02-09 2014-08-05 International Business Machines Corporation Methodology for correlated memory fail estimations
JP6715198B2 (ja) * 2017-02-20 2020-07-01 キオクシア株式会社 メモリ検査装置
DE102020134945A1 (de) * 2020-02-27 2021-09-02 Taiwan Semiconductor Manufacturing Co., Ltd. Dynamische fehlerüberwachung und -reparatur

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4232375A (en) * 1978-06-12 1980-11-04 Ncr Corporation Data compression system and apparatus
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
US4335447A (en) * 1980-02-05 1982-06-15 Sangamo Weston, Inc. Power outage recovery method and apparatus for demand recorder with solid state memory
FR2491703B1 (fr) * 1980-10-03 1988-04-29 Thomson Csf Dispositif de compression et dispositif de decompression temporelle de donnees et systeme de transmission comportant au moins l'un de ces dispositifs
US4380066A (en) * 1980-12-04 1983-04-12 Burroughs Corporation Defect tolerant memory
US4412306A (en) * 1981-05-14 1983-10-25 Moll Edward W System for minimizing space requirements for storage and transmission of digital signals
US4460999A (en) * 1981-07-15 1984-07-17 Pacific Western Systems, Inc. Memory tester having memory repair analysis under pattern generator control
US4460997A (en) * 1981-07-15 1984-07-17 Pacific Western Systems Inc. Memory tester having memory repair analysis capability
US4400794A (en) * 1981-11-17 1983-08-23 Burroughs Corporation Memory mapping unit
US4464747A (en) * 1982-02-18 1984-08-07 The Singer Company High reliability memory

Also Published As

Publication number Publication date
EP0125633A2 (de) 1984-11-21
US4628509A (en) 1986-12-09
EP0125633B1 (de) 1990-08-08
EP0125633A3 (en) 1987-08-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee