DE3130122C2 - - Google Patents
Info
- Publication number
- DE3130122C2 DE3130122C2 DE3130122A DE3130122A DE3130122C2 DE 3130122 C2 DE3130122 C2 DE 3130122C2 DE 3130122 A DE3130122 A DE 3130122A DE 3130122 A DE3130122 A DE 3130122A DE 3130122 C2 DE3130122 C2 DE 3130122C2
- Authority
- DE
- Germany
- Prior art keywords
- source
- drain electrode
- semiconductor layer
- layer
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims description 66
- 229920002120 photoresistant polymer Polymers 0.000 claims description 51
- 238000000034 method Methods 0.000 claims description 50
- 238000004519 manufacturing process Methods 0.000 claims description 33
- 238000007740 vapor deposition Methods 0.000 claims description 22
- 238000000059 patterning Methods 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 16
- 238000005530 etching Methods 0.000 claims description 8
- 239000010409 thin film Substances 0.000 claims description 8
- 230000008020 evaporation Effects 0.000 claims description 6
- 238000001704 evaporation Methods 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 description 24
- 238000000576 coating method Methods 0.000 description 24
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 20
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 18
- 239000000243 solution Substances 0.000 description 17
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 14
- 239000000463 material Substances 0.000 description 13
- 230000015572 biosynthetic process Effects 0.000 description 12
- 238000000151 deposition Methods 0.000 description 10
- 230000008021 deposition Effects 0.000 description 10
- 229910017709 Ni Co Inorganic materials 0.000 description 9
- 229910003267 Ni-Co Inorganic materials 0.000 description 9
- 229910003262 Ni‐Co Inorganic materials 0.000 description 9
- 229910045601 alloy Inorganic materials 0.000 description 9
- 239000000956 alloy Substances 0.000 description 9
- 238000003486 chemical etching Methods 0.000 description 9
- 238000011161 development Methods 0.000 description 9
- 230000018109 developmental process Effects 0.000 description 9
- 238000001312 dry etching Methods 0.000 description 9
- 239000007772 electrode material Substances 0.000 description 9
- 229910001220 stainless steel Inorganic materials 0.000 description 9
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 9
- 239000010937 tungsten Substances 0.000 description 9
- 229910052721 tungsten Inorganic materials 0.000 description 9
- 229910052782 aluminium Inorganic materials 0.000 description 8
- 229910052758 niobium Inorganic materials 0.000 description 8
- 230000003647 oxidation Effects 0.000 description 8
- 238000007254 oxidation reaction Methods 0.000 description 8
- 239000010935 stainless steel Substances 0.000 description 8
- 229910052715 tantalum Inorganic materials 0.000 description 8
- 238000001771 vacuum deposition Methods 0.000 description 8
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 7
- 229910052681 coesite Inorganic materials 0.000 description 7
- 229910052593 corundum Inorganic materials 0.000 description 7
- 229910052906 cristobalite Inorganic materials 0.000 description 7
- 238000001556 precipitation Methods 0.000 description 7
- 239000000377 silicon dioxide Substances 0.000 description 7
- 235000012239 silicon dioxide Nutrition 0.000 description 7
- 229910052682 stishovite Inorganic materials 0.000 description 7
- WYXIGTJNYDDFFH-UHFFFAOYSA-Q triazanium;borate Chemical compound [NH4+].[NH4+].[NH4+].[O-]B([O-])[O-] WYXIGTJNYDDFFH-UHFFFAOYSA-Q 0.000 description 7
- 229910052905 tridymite Inorganic materials 0.000 description 7
- 238000001039 wet etching Methods 0.000 description 7
- 229910001845 yogo sapphire Inorganic materials 0.000 description 7
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 7
- 238000004506 ultrasonic cleaning Methods 0.000 description 6
- 229910052759 nickel Inorganic materials 0.000 description 5
- FGHSTPNOXKDLKU-UHFFFAOYSA-N nitric acid;hydrate Chemical compound O.O[N+]([O-])=O FGHSTPNOXKDLKU-UHFFFAOYSA-N 0.000 description 5
- 229910052737 gold Inorganic materials 0.000 description 4
- 238000011417 postcuring Methods 0.000 description 4
- 239000012153 distilled water Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 1
- KGWYICAEPBCRBL-UHFFFAOYSA-N 1h-indene-1-carboxylic acid Chemical compound C1=CC=C2C(C(=O)O)C=CC2=C1 KGWYICAEPBCRBL-UHFFFAOYSA-N 0.000 description 1
- 229910004481 Ta2O3 Inorganic materials 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 239000003518 caustics Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 231100001010 corrosive Toxicity 0.000 description 1
- 230000006735 deficit Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/675—Group III-V materials, Group II-VI materials, Group IV-VI materials, selenium or tellurium
Landscapes
- Thin Film Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10688780A JPS5731179A (en) | 1980-07-31 | 1980-07-31 | Formation of thin-film transistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3130122A1 DE3130122A1 (de) | 1982-03-04 |
| DE3130122C2 true DE3130122C2 (en, 2012) | 1990-01-11 |
Family
ID=14444996
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19813130122 Granted DE3130122A1 (de) | 1980-07-31 | 1981-07-30 | Duennschichttransistor und dessen herstellung |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4514253A (en, 2012) |
| JP (1) | JPS5731179A (en, 2012) |
| DE (1) | DE3130122A1 (en, 2012) |
| GB (1) | GB2084795B (en, 2012) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5799774A (en) * | 1980-11-19 | 1982-06-21 | Sharp Corp | Forming method for thin-film transistor |
| GB2118774B (en) * | 1982-02-25 | 1985-11-27 | Sharp Kk | Insulated gate thin film transistor |
| JPS58209163A (ja) * | 1982-05-31 | 1983-12-06 | Toshiba Corp | 薄膜トランジスタ |
| JPH0752776B2 (ja) * | 1985-01-24 | 1995-06-05 | シャープ株式会社 | 薄膜トランジスタおよびその製造法 |
| JPS624402A (ja) * | 1985-06-28 | 1987-01-10 | Kimura Kakoki Kk | 高真空蒸発装置とそれに使用する吸収器 |
| JPS62285464A (ja) * | 1986-06-03 | 1987-12-11 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタアレイ基板及びその製造方法 |
| US4757361A (en) * | 1986-07-23 | 1988-07-12 | International Business Machines Corporation | Amorphous thin film transistor device |
| US5327001A (en) * | 1987-09-09 | 1994-07-05 | Casio Computer Co., Ltd. | Thin film transistor array having single light shield layer over transistors and gate and drain lines |
| US5032883A (en) * | 1987-09-09 | 1991-07-16 | Casio Computer Co., Ltd. | Thin film transistor and method of manufacturing the same |
| US5166085A (en) * | 1987-09-09 | 1992-11-24 | Casio Computer Co., Ltd. | Method of manufacturing a thin film transistor |
| US5229644A (en) * | 1987-09-09 | 1993-07-20 | Casio Computer Co., Ltd. | Thin film transistor having a transparent electrode and substrate |
| US4888632A (en) * | 1988-01-04 | 1989-12-19 | International Business Machines Corporation | Easily manufacturable thin film transistor structures |
| US5316893A (en) * | 1991-01-03 | 1994-05-31 | Lueder Ernst | Method of producing electronic switching element |
| JP3255942B2 (ja) | 1991-06-19 | 2002-02-12 | 株式会社半導体エネルギー研究所 | 逆スタガ薄膜トランジスタの作製方法 |
| US5327834A (en) * | 1992-05-28 | 1994-07-12 | Thiokol Corporation | Integrated field-effect initiator |
| CA2089240C (en) * | 1993-02-10 | 1998-07-14 | Stephen C. Jacobsen | Method and apparatus for fabrication of thin film semiconductor devices using non-planar, exposure beam lithography |
| US5501989A (en) * | 1993-03-22 | 1996-03-26 | Semiconductor Energy Laboratory Co., Ltd. | Method of making semiconductor device/circuit having at least partially crystallized semiconductor layer |
| KR0179137B1 (ko) * | 1995-10-17 | 1999-04-15 | 구자홍 | 금속배선의 양극산화 방지부분의 구조 및 양극산화 방법 |
| US6429120B1 (en) | 2000-01-18 | 2002-08-06 | Micron Technology, Inc. | Methods and apparatus for making integrated-circuit wiring from copper, silver, gold, and other metals |
| WO1998000870A1 (en) * | 1996-06-28 | 1998-01-08 | Seiko Epson Corporation | Thin film transistor, method of its manufacture and circuit and liquid crystal display using the thin film transistor |
| US7195960B2 (en) * | 1996-06-28 | 2007-03-27 | Seiko Epson Corporation | Thin film transistor, manufacturing method thereof, and circuit and liquid crystal display device using the thin film transistor |
| KR100451381B1 (ko) | 1998-07-30 | 2005-06-01 | 엘지.필립스 엘시디 주식회사 | 박막트랜지스터및그제조방법 |
| US6368963B1 (en) * | 2000-09-12 | 2002-04-09 | Advanced Micro Devices, Inc. | Passivation of semiconductor device surfaces using an iodine/ethanol solution |
| US7374984B2 (en) * | 2004-10-29 | 2008-05-20 | Randy Hoffman | Method of forming a thin film component |
| KR101240643B1 (ko) * | 2005-07-08 | 2013-03-08 | 삼성디스플레이 주식회사 | 포토레지스트 조성물, 상기 포토레지스트 조성물을 이용한 패턴의 형성 방법 및 이를 이용한 박막 트랜지스터표시판의 제조 방법 |
| KR100987840B1 (ko) * | 2007-04-25 | 2010-10-13 | 주식회사 엘지화학 | 박막 트랜지스터 및 이의 제조방법 |
| US9929044B2 (en) * | 2014-01-30 | 2018-03-27 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
| KR102423679B1 (ko) * | 2015-09-21 | 2022-07-21 | 삼성디스플레이 주식회사 | 표시 장치 제조 방법 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4065781A (en) * | 1974-06-21 | 1977-12-27 | Westinghouse Electric Corporation | Insulated-gate thin film transistor with low leakage current |
| JPS5499576A (en) * | 1978-01-23 | 1979-08-06 | Sharp Corp | Thin-film transistor and its manufacture |
-
1980
- 1980-07-31 JP JP10688780A patent/JPS5731179A/ja active Granted
-
1981
- 1981-07-28 GB GB8123217A patent/GB2084795B/en not_active Expired
- 1981-07-30 DE DE19813130122 patent/DE3130122A1/de active Granted
-
1983
- 1983-07-25 US US06/517,042 patent/US4514253A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS626674B2 (en, 2012) | 1987-02-12 |
| DE3130122A1 (de) | 1982-03-04 |
| GB2084795B (en) | 1985-04-17 |
| JPS5731179A (en) | 1982-02-19 |
| GB2084795A (en) | 1982-04-15 |
| US4514253A (en) | 1985-04-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8128 | New person/name/address of the agent |
Representative=s name: SCHMITT-NILSON, G., DIPL.-ING. DR.-ING. HIRSCH, P. |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition |