DE3028935A1 - Signalform-speicheranordnung - Google Patents
Signalform-speicheranordnungInfo
- Publication number
- DE3028935A1 DE3028935A1 DE19803028935 DE3028935A DE3028935A1 DE 3028935 A1 DE3028935 A1 DE 3028935A1 DE 19803028935 DE19803028935 DE 19803028935 DE 3028935 A DE3028935 A DE 3028935A DE 3028935 A1 DE3028935 A1 DE 3028935A1
- Authority
- DE
- Germany
- Prior art keywords
- arrangement
- buffer
- memory
- maximum
- clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000015654 memory Effects 0.000 title claims description 45
- 239000000872 buffer Substances 0.000 claims description 42
- 230000006870 function Effects 0.000 claims description 5
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- 230000004913 activation Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/208—Arrangements for measuring with C.R. oscilloscopes, e.g. vectorscope
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/40—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect
- G01R13/404—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect for discontinuous display, i.e. display of discrete values
- G01R13/408—Two or three dimensional representation of measured values
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analogue/Digital Conversion (AREA)
- Recording Measured Values (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/061,720 US4271486A (en) | 1979-07-30 | 1979-07-30 | Waveform storage system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3028935A1 true DE3028935A1 (de) | 1981-02-19 |
Family
ID=22037679
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19803028935 Ceased DE3028935A1 (de) | 1979-07-30 | 1980-07-30 | Signalform-speicheranordnung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4271486A (enExample) |
| JP (2) | JPS5847661B2 (enExample) |
| CA (1) | CA1143068A (enExample) |
| DE (1) | DE3028935A1 (enExample) |
| FR (1) | FR2462760A1 (enExample) |
| GB (1) | GB2057700B (enExample) |
| NL (1) | NL8004045A (enExample) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56101518A (en) * | 1980-01-18 | 1981-08-14 | Jeol Ltd | Data indicating method |
| US4507740A (en) * | 1981-09-08 | 1985-03-26 | Grumman Aerospace Corporation | Programmable signal analyzer |
| NL193803C (nl) * | 1981-10-08 | 2000-11-06 | Tektronix Inc | Inrichting voor het weergeven van golfvormen. |
| US4510571A (en) * | 1981-10-08 | 1985-04-09 | Tektronix, Inc. | Waveform storage and display system |
| JPS58100755A (ja) * | 1981-12-11 | 1983-06-15 | Nec Corp | 信号表示装置 |
| US4536760A (en) * | 1982-10-15 | 1985-08-20 | Tektronix, Inc. | Signal-envelope display system for a digital oscilloscope |
| GB2129238A (en) * | 1982-10-28 | 1984-05-10 | Micro Consultants Ltd | Snapshot recorder |
| DE3463976D1 (en) * | 1983-06-24 | 1987-07-02 | Siemens Ag | Disturbances detecting and recording system |
| US4631697A (en) * | 1983-08-11 | 1986-12-23 | Duffers Scientific, Inc. | Signal controlled waveform recorder |
| USRE34843E (en) * | 1983-08-11 | 1995-01-31 | Duffers Scientific, Inc. | Signal controlled waveform recorder |
| US4656598A (en) * | 1984-11-06 | 1987-04-07 | Hewlett Packard Company | Alias detector for digital oscilloscopes |
| US4833445A (en) * | 1985-06-07 | 1989-05-23 | Sequence Incorporated | Fiso sampling system |
| US4755960A (en) * | 1985-06-20 | 1988-07-05 | Tektronix, Inc. | Waveform data compressing circuit |
| US5084667A (en) * | 1985-07-26 | 1992-01-28 | Xicor, Inc. | Nonvolatile nonlinear programmable electronic potentiometer |
| US4668932A (en) * | 1985-07-26 | 1987-05-26 | Xicor, Inc. | Nonvolatile reprogrammable electronic potentiometer |
| US4800378A (en) * | 1985-08-23 | 1989-01-24 | Snap-On Tools Corporation | Digital engine analyzer |
| JPH0666612B2 (ja) * | 1987-05-26 | 1994-08-24 | ザイコール・インコーポレーテッド | 再プログラム可能な不揮発性非線形電子ポテンショメータ |
| US5115404A (en) * | 1987-12-23 | 1992-05-19 | Tektronix, Inc. | Digital storage oscilloscope with indication of aliased display |
| US5250935A (en) * | 1990-09-24 | 1993-10-05 | Snap-On Tools Corporation | Waveform peak capture circuit for digital engine analyzer |
| JPH04134269A (ja) * | 1990-09-26 | 1992-05-08 | Kikusui Electron Corp | グリッチ検出装置 |
| US5155431A (en) * | 1991-02-06 | 1992-10-13 | Hewlett-Packard Company | Very fast autoscale topology for digitizing oscilloscopes |
| JPH0594774U (ja) * | 1992-05-29 | 1993-12-24 | 株式会社アドバンテスト | 波形解析装置 |
| US5684507A (en) * | 1994-09-07 | 1997-11-04 | Fluke Corporation | Method of displaying continuously acquired data on a fixed length display |
| US5745409A (en) * | 1995-09-28 | 1998-04-28 | Invox Technology | Non-volatile memory with analog and digital interface and storage |
| JP3654083B2 (ja) * | 1999-09-27 | 2005-06-02 | ヤマハ株式会社 | 波形生成方法及び装置 |
| US6331768B1 (en) | 2000-06-13 | 2001-12-18 | Xicor, Inc. | High-resolution, high-precision solid-state potentiometer |
| US6771053B2 (en) | 2002-02-20 | 2004-08-03 | Catalyst Semiconductor, Inc. | Buffered configurable nonvolatile programmable digital potentiometer |
| US7345611B2 (en) | 2003-09-10 | 2008-03-18 | Catalyst Semiconductor, Inc. | Digital potentiometer including plural bulk impedance devices |
| US7012555B2 (en) | 2003-09-10 | 2006-03-14 | Catalyst Semiconductor, Inc. | Digital potentiometer including at least one bulk impedance device |
| US7042380B2 (en) * | 2004-06-02 | 2006-05-09 | Catalyst Semiconductor, Inc. | Digital potentiometer with resistor binary weighting decoding |
| US8079031B2 (en) * | 2005-10-21 | 2011-12-13 | Intel Corporation | Method, apparatus, and a system for dynamically configuring a prefetcher based on a thread specific latency metric |
| US7834780B2 (en) * | 2006-03-20 | 2010-11-16 | Tektronix, Inc. | Waveform compression and display |
| US8818744B2 (en) * | 2008-10-16 | 2014-08-26 | Tektronix, Inc. | Test and measurement instrument and method of switching waveform display styles |
| US9537690B1 (en) | 2015-07-10 | 2017-01-03 | Keysight Technologies, Inc. | Method and apparatus for extraction of baseband waveform from amplitude modulated signal via time domain sampling |
| US10845400B2 (en) | 2018-07-20 | 2020-11-24 | Rohde & Schwarz Gmbh & Co. Kg | Measurement apparatus and measurement method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3478266A (en) * | 1966-11-22 | 1969-11-11 | Radiation Inc | Digital data redundancy reduction methods and apparatus |
| US3812478A (en) * | 1971-07-31 | 1974-05-21 | Nippon Musical Instruments Mfg | Semiconductor storage device |
| FR2381313A2 (fr) * | 1975-12-31 | 1978-09-15 | Labo Electronique Physique | Enregistrement et visualisation de signaux |
-
1979
- 1979-07-30 US US06/061,720 patent/US4271486A/en not_active Expired - Lifetime
-
1980
- 1980-06-23 CA CA000354642A patent/CA1143068A/en not_active Expired
- 1980-07-14 NL NL8004045A patent/NL8004045A/nl not_active Application Discontinuation
- 1980-07-18 FR FR8016291A patent/FR2462760A1/fr active Granted
- 1980-07-22 GB GB8023885A patent/GB2057700B/en not_active Expired
- 1980-07-25 JP JP55103014A patent/JPS5847661B2/ja not_active Expired
- 1980-07-30 DE DE19803028935 patent/DE3028935A1/de not_active Ceased
-
1984
- 1984-10-23 JP JP59222863A patent/JPS60198466A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| GB2057700A (en) | 1981-04-01 |
| FR2462760B1 (enExample) | 1985-03-08 |
| GB2057700B (en) | 1983-03-23 |
| FR2462760A1 (fr) | 1981-02-13 |
| JPS5847661B2 (ja) | 1983-10-24 |
| CA1143068A (en) | 1983-03-15 |
| JPS60198466A (ja) | 1985-10-07 |
| JPS5621068A (en) | 1981-02-27 |
| NL8004045A (nl) | 1981-02-03 |
| US4271486A (en) | 1981-06-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OAP | Request for examination filed | ||
| OD | Request for examination | ||
| 8131 | Rejection |