DE2642637C2 - Röntgenfluoreszenzspektrometer - Google Patents

Röntgenfluoreszenzspektrometer

Info

Publication number
DE2642637C2
DE2642637C2 DE2642637A DE2642637A DE2642637C2 DE 2642637 C2 DE2642637 C2 DE 2642637C2 DE 2642637 A DE2642637 A DE 2642637A DE 2642637 A DE2642637 A DE 2642637A DE 2642637 C2 DE2642637 C2 DE 2642637C2
Authority
DE
Germany
Prior art keywords
sample
ray
analyzer crystal
distance
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2642637A
Other languages
German (de)
English (en)
Other versions
DE2642637A1 (de
Inventor
Kliment Vladislavovič Anisovič
Nikolai Ivanovič Leningrad Komyak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LE N- PROIZV OB EDINENIE BUREVESTNIK LE
Original Assignee
LE N- PROIZV OB EDINENIE BUREVESTNIK LE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LE N- PROIZV OB EDINENIE BUREVESTNIK LE filed Critical LE N- PROIZV OB EDINENIE BUREVESTNIK LE
Publication of DE2642637A1 publication Critical patent/DE2642637A1/de
Application granted granted Critical
Publication of DE2642637C2 publication Critical patent/DE2642637C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE2642637A 1975-09-26 1976-09-22 Röntgenfluoreszenzspektrometer Expired DE2642637C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU752174672A SU614367A1 (ru) 1975-09-26 1975-09-26 Флуоресцентный рентгеновский спектрометр

Publications (2)

Publication Number Publication Date
DE2642637A1 DE2642637A1 (de) 1977-04-07
DE2642637C2 true DE2642637C2 (de) 1982-02-11

Family

ID=20632495

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2642637A Expired DE2642637C2 (de) 1975-09-26 1976-09-22 Röntgenfluoreszenzspektrometer

Country Status (6)

Country Link
US (1) US4091282A (en:Method)
DE (1) DE2642637C2 (en:Method)
FR (1) FR2325926A1 (en:Method)
GB (1) GB1564534A (en:Method)
NL (1) NL172594C (en:Method)
SU (1) SU614367A1 (en:Method)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4417355A (en) * 1981-01-08 1983-11-22 Leningradskoe Npo "Burevestnik" X-Ray fluorescence spectrometer
NL8300420A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4785470A (en) * 1983-10-31 1988-11-15 Ovonic Synthetic Materials Company, Inc. Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
NL8700488A (nl) * 1987-02-27 1988-09-16 Philips Nv Roentgen analyse apparaat met saggitaal gebogen analyse kristal.
GB2214769A (en) * 1988-03-04 1989-09-06 Le N Proizv Ob Burevestnik Multichannel x-ray spectrometer
RU94022820A (ru) * 1994-06-14 1996-04-10 К.В. Анисович Рентгеновский флюоресцентный спектрометр
DE29517080U1 (de) * 1995-10-30 1997-03-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80636 München Vorrichtung für die Röntgenfluoreszenzmikroskopie
EP2162732A1 (en) * 2007-03-15 2010-03-17 X-ray Optical Systems, INC. Small spot and high energy resolution xrf system for valence state determination
CN109716115B (zh) 2016-09-15 2023-01-06 华盛顿大学 X射线光谱仪及使用方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805343A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
GB1148646A (en) * 1967-02-16 1969-04-16 Cambridge Instr Co Ltd X-ray microanalysers

Also Published As

Publication number Publication date
GB1564534A (en) 1980-04-10
DE2642637A1 (de) 1977-04-07
NL172594B (nl) 1983-04-18
FR2325926A1 (fr) 1977-04-22
SU614367A1 (ru) 1978-07-05
FR2325926B1 (en:Method) 1978-11-03
NL172594C (nl) 1983-09-16
NL7610384A (nl) 1977-03-29
US4091282A (en) 1978-05-23

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Legal Events

Date Code Title Description
OD Request for examination
D2 Grant after examination
8339 Ceased/non-payment of the annual fee