NL172594C - Een met roentgenstralen werkende fluorescentiespectrometer. - Google Patents

Een met roentgenstralen werkende fluorescentiespectrometer.

Info

Publication number
NL172594C
NL172594C NLAANVRAGE7610384,A NL7610384A NL172594C NL 172594 C NL172594 C NL 172594C NL 7610384 A NL7610384 A NL 7610384A NL 172594 C NL172594 C NL 172594C
Authority
NL
Netherlands
Prior art keywords
rotent
rays
fluorescence spectrometer
spectrometer operating
operating
Prior art date
Application number
NLAANVRAGE7610384,A
Other languages
English (en)
Dutch (nl)
Other versions
NL172594B (nl
NL7610384A (nl
Original Assignee
Le N Proizv Ob Burevestnik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Le N Proizv Ob Burevestnik filed Critical Le N Proizv Ob Burevestnik
Publication of NL7610384A publication Critical patent/NL7610384A/xx
Publication of NL172594B publication Critical patent/NL172594B/xx
Application granted granted Critical
Publication of NL172594C publication Critical patent/NL172594C/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NLAANVRAGE7610384,A 1975-09-26 1976-09-17 Een met roentgenstralen werkende fluorescentiespectrometer. NL172594C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU752174672A SU614367A1 (ru) 1975-09-26 1975-09-26 Флуоресцентный рентгеновский спектрометр

Publications (3)

Publication Number Publication Date
NL7610384A NL7610384A (nl) 1977-03-29
NL172594B NL172594B (nl) 1983-04-18
NL172594C true NL172594C (nl) 1983-09-16

Family

ID=20632495

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7610384,A NL172594C (nl) 1975-09-26 1976-09-17 Een met roentgenstralen werkende fluorescentiespectrometer.

Country Status (6)

Country Link
US (1) US4091282A (xx)
DE (1) DE2642637C2 (xx)
FR (1) FR2325926A1 (xx)
GB (1) GB1564534A (xx)
NL (1) NL172594C (xx)
SU (1) SU614367A1 (xx)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4417355A (en) * 1981-01-08 1983-11-22 Leningradskoe Npo "Burevestnik" X-Ray fluorescence spectrometer
NL8300420A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4785470A (en) * 1983-10-31 1988-11-15 Ovonic Synthetic Materials Company, Inc. Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
NL8700488A (nl) * 1987-02-27 1988-09-16 Philips Nv Roentgen analyse apparaat met saggitaal gebogen analyse kristal.
GB2214769A (en) * 1988-03-04 1989-09-06 Le N Proizv Ob Burevestnik Multichannel x-ray spectrometer
RU94022820A (ru) * 1994-06-14 1996-04-10 К.В. Анисович Рентгеновский флюоресцентный спектрометр
DE29517080U1 (de) * 1995-10-30 1997-03-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80636 München Vorrichtung für die Röntgenfluoreszenzmikroskopie
US7899154B2 (en) * 2007-03-15 2011-03-01 X-Ray Optical Systems, Inc. Small spot and high energy resolution XRF system for valence state determination
US11054375B2 (en) 2016-09-15 2021-07-06 University Of Washington X-ray spectrometer and methods for use

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805343A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
GB1148646A (en) * 1967-02-16 1969-04-16 Cambridge Instr Co Ltd X-ray microanalysers

Also Published As

Publication number Publication date
DE2642637A1 (de) 1977-04-07
SU614367A1 (ru) 1978-07-05
NL172594B (nl) 1983-04-18
DE2642637C2 (de) 1982-02-11
US4091282A (en) 1978-05-23
FR2325926A1 (fr) 1977-04-22
GB1564534A (en) 1980-04-10
FR2325926B1 (xx) 1978-11-03
NL7610384A (nl) 1977-03-29

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Legal Events

Date Code Title Description
V1 Lapsed because of non-payment of the annual fee