DE10309503A8 - Verfahren zum Steuern eines Spaltendecoderfreigabezeitablaufs und zugehöriger Spaltendecoder und Halbleiterspeicherbaustein - Google Patents

Verfahren zum Steuern eines Spaltendecoderfreigabezeitablaufs und zugehöriger Spaltendecoder und Halbleiterspeicherbaustein Download PDF

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Publication number
DE10309503A8
DE10309503A8 DE10309503A DE10309503A DE10309503A8 DE 10309503 A8 DE10309503 A8 DE 10309503A8 DE 10309503 A DE10309503 A DE 10309503A DE 10309503 A DE10309503 A DE 10309503A DE 10309503 A8 DE10309503 A8 DE 10309503A8
Authority
DE
Germany
Prior art keywords
column decoder
controlling
memory device
semiconductor memory
enable timing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10309503A
Other languages
English (en)
Other versions
DE10309503A1 (de
Inventor
Choong-sun Sungnam Shin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE10309503A1 publication Critical patent/DE10309503A1/de
Publication of DE10309503A8 publication Critical patent/DE10309503A8/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408—Address circuits
    • G11C11/4087—Address decoders, e.g. bit - or word line decoders; Multiple line decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4076—Timing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
DE10309503A 2002-04-27 2003-02-26 Verfahren zum Steuern eines Spaltendecoderfreigabezeitablaufs und zugehöriger Spaltendecoder und Halbleitspeicherbaustein Withdrawn DE10309503A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2002-0023273A KR100416622B1 (ko) 2002-04-27 2002-04-27 동기식 반도체 메모리장치의 컬럼 디코더 인에이블 타이밍제어방법 및 장치
KR2002/23273 2002-04-27

Publications (2)

Publication Number Publication Date
DE10309503A1 DE10309503A1 (de) 2003-11-13
DE10309503A8 true DE10309503A8 (de) 2004-07-08

Family

ID=29244802

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10309503A Withdrawn DE10309503A1 (de) 2002-04-27 2003-02-26 Verfahren zum Steuern eines Spaltendecoderfreigabezeitablaufs und zugehöriger Spaltendecoder und Halbleitspeicherbaustein

Country Status (5)

Country Link
US (1) US6839291B2 (de)
JP (1) JP4307894B2 (de)
KR (1) KR100416622B1 (de)
DE (1) DE10309503A1 (de)
TW (1) TW588381B (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4121026B2 (ja) * 2004-01-21 2008-07-16 富士フイルム株式会社 撮像装置および方法並びにプログラム
FR2871920B1 (fr) * 2004-06-18 2007-01-05 St Microelectronics Sa Circuit de memorisation rapide comprenant une memoire a double acces et procede d'activation d'une memoire a double acces
KR100610018B1 (ko) * 2004-12-13 2006-08-08 삼성전자주식회사 반도체 메모리 장치의 컬럼 선택선 신호 생성 장치
JP4586633B2 (ja) * 2005-05-25 2010-11-24 ソニー株式会社 デコーダ回路、デコード方法及びデータ記録装置
KR100744042B1 (ko) * 2005-09-28 2007-07-30 주식회사 하이닉스반도체 반도체메모리소자의 내부 어드레스 생성장치
KR100670730B1 (ko) * 2005-09-29 2007-01-17 주식회사 하이닉스반도체 동기식 반도체 메모리 소자의 컬럼 어드레스 인에이블 신호생성기 및 그 생성방법
JP5044153B2 (ja) 2005-09-29 2012-10-10 エスケーハイニックス株式会社 同期式半導体メモリ素子のカラムアドレスイネーブル信号生成器及びその生成方法
KR100712539B1 (ko) * 2005-11-23 2007-04-30 삼성전자주식회사 반도체 메모리 장치의 칼럼 디코더 및 반도체 메모리장치의 칼럼 선택 라인 신호 발생 방법
KR100868251B1 (ko) * 2007-03-22 2008-11-12 주식회사 하이닉스반도체 반도체 메모리장치
KR101080206B1 (ko) * 2010-04-30 2011-11-07 주식회사 하이닉스반도체 반도체 장치의 어드레스 출력 타이밍 제어 회로
KR102007364B1 (ko) * 2012-08-28 2019-08-05 에스케이하이닉스 주식회사 반도체 메모리 장치
KR102222968B1 (ko) * 2014-09-01 2021-03-04 삼성전자주식회사 어드레스 정렬기 및 이를 포함하는 메모리 장치
CN105989894B (zh) * 2015-02-12 2023-09-15 上海晟矽微电子股份有限公司 一种一次性可编程存储器控制器、集成电路及程序烧写方法
US11955163B2 (en) * 2022-07-28 2024-04-09 Elite Semiconductor Microelectronics Technology Inc. Method and circuit for adaptive column-select line signal generation

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100252043B1 (ko) * 1997-11-07 2000-05-01 윤종용 반도체 메모리 장치의 칼럼 선택 신호 제어기 및 칼럼 선택제어 방법
KR100274602B1 (ko) * 1997-11-20 2000-12-15 윤종용 동기형 메모리 장치
KR100266899B1 (ko) * 1997-12-26 2000-10-02 윤종용 동기형 메모리 장치
KR100311038B1 (ko) * 1998-09-17 2001-12-17 윤종용 칼럼선택속도가개선된칼럼선택라인구동회로와이를구비한메모리장치및그들의구동방법
KR100287542B1 (ko) * 1998-11-26 2001-04-16 윤종용 웨이브 파이프라인 스킴을 구비한 동기형 반도체 메모리 장치및 그것의 데이터 패스 제어 방법
KR100287184B1 (ko) * 1999-02-23 2001-04-16 윤종용 동기식 디램 반도체 장치의 내부 클럭 지연 회로 및 그 지연 방법

Also Published As

Publication number Publication date
KR20030084510A (ko) 2003-11-01
TW200305888A (en) 2003-11-01
US20030202385A1 (en) 2003-10-30
DE10309503A1 (de) 2003-11-13
JP2003331579A (ja) 2003-11-21
US6839291B2 (en) 2005-01-04
KR100416622B1 (ko) 2004-02-05
TW588381B (en) 2004-05-21
JP4307894B2 (ja) 2009-08-05

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OP8 Request for examination as to paragraph 44 patent law
OP8 Request for examination as to paragraph 44 patent law
8139 Disposal/non-payment of the annual fee