CN86100204A - 硅基底上附有热熔粘合剂的集成电路硅小片复合物的制做方法 - Google Patents

硅基底上附有热熔粘合剂的集成电路硅小片复合物的制做方法 Download PDF

Info

Publication number
CN86100204A
CN86100204A CN86100204.0A CN86100204A CN86100204A CN 86100204 A CN86100204 A CN 86100204A CN 86100204 A CN86100204 A CN 86100204A CN 86100204 A CN86100204 A CN 86100204A
Authority
CN
China
Prior art keywords
integrated circuit
silicon
hotmelt
small pieces
assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN86100204.0A
Other languages
English (en)
Other versions
CN1004843B (zh
Inventor
加里·查尔斯·戴维斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of CN86100204A publication Critical patent/CN86100204A/zh
Publication of CN1004843B publication Critical patent/CN1004843B/zh
Expired legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01013Aluminum [Al]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01014Silicon [Si]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01025Manganese [Mn]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01029Copper [Cu]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01052Tellurium [Te]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01057Lanthanum [La]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01075Rhenium [Re]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06Polymers
    • H01L2924/078Adhesive characteristics other than chemical
    • H01L2924/07802Adhesive characteristics other than chemical not being an ohmic electrical conductor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/10251Elemental semiconductors, i.e. Group IV
    • H01L2924/10253Silicon [Si]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12042LASER
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10Methods of surface bonding and/or assembly therefor
    • Y10T156/1052Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
    • Y10T156/1062Prior to assembly
    • Y10T156/1075Prior to assembly of plural laminae from single stock and assembling to each other or to additional lamina
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10Methods of surface bonding and/or assembly therefor
    • Y10T156/1052Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
    • Y10T156/1062Prior to assembly
    • Y10T156/1075Prior to assembly of plural laminae from single stock and assembling to each other or to additional lamina
    • Y10T156/1077Applying plural cut laminae to single face of additional lamina

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Die Bonding (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
  • Dicing (AREA)

Abstract

本文提供了一种制做在硅基底上附有热熔粘合剂的集成电路硅组合件小片的方法。当一种热熔粘合剂被甩涂到硅基上之后,片状的集成电路组合件硅片被切割,同时,由将集成电路硅小片整体地粘在导体衬底上的方法,可制出集成电路硅组合件阵列。

Description

在本发明以前,集成电路硅小片复合物的制做,一般是通过将一个表面上有许多集成电路的硅片切成小块来实现。片状的小片,一般是采用金刚划片器,激光划片器或金刚锯切割而成。然后,将集成的小片组合件粘在各种各样的导电或非导电衬底上,以做成集成电路阵列。集成电路硅小片组合件在载体上的敷贴,一般是在集成的小片组合件的硅基底上,涂上一种粘合剂,然后将集成小片组合件,放在载体的合适位置上来实现。另一种技术则包括直接将粘合剂涂在载体衬底上,并且把集成电路小片粘合在其上。尽管把粘合剂涂到载体阵列衬底的工艺,已取得了有效的结果,但粘合剂中往往含有一种对载体衬底上的相邻部件有损伤的有机溶剂。还有一种将粘合剂直接涂到集成电路硅组合件的基底上的工艺,它是有效的,只是不经济。
本发明的基础,是将一种热熔粘合剂的有机溶剂溶液,最好聚醚亚胺硅氧烷(将在后面详细说明),在集成小晶片的背面被甩成薄膜形状然后烘干;这样片状集成电路小片可以被切割。用一只金刚划片器或一只金刚锯,可大量制备在相应硅基底上有一层热熔粘合剂的集成电路硅组合件小片。
本发明提供了一种方法,它包括:
(1)把一种有机溶剂溶液的热熔粘合剂,涂到其上部有着大量的集成电路的硅片基底上。
(2)将使用的热熔粘合剂干燥。
(3)切割硅片以制备许多在相应基底上有热熔粘合剂层的集成电路硅小片组合件。
本发明的另一面:是提供一种将集成电路硅复合物粘合剂衬底表面上的方法,这包括:
(1)将衬底的表面与至少是一片的集成电路硅组合件小片接触,这小片是已经热熔粘合剂处理过的。
(2)当集成电路硅复合物小片与衬底表面接触时,经热熔粘合剂加热。
(3)使热熔粘合剂冷却,以达到将集成电路组合件小片粘在载体衬底上的目的。
图1显示了基底上涂了热熔粘合剂的片状集成电路小片的剖视图。图2显示了由切割图1所示片状晶片所得的集成电路组合件小片。图3则是一个带适当电接点的整体粘在载体表面上的集成电路组合件小片阵列。
特别是,图1中的10是一绝缘栅极,11是一个信号电极,12是硅基片,而13是热熔粘合剂层。
在图3中,20是源信号电极,21是控制栅极。
本发明实际所采用的热熔粘合剂,是聚醚亚胺硅氧烷,它已被Berger和Juliano描述(见美国专利4,011,279,这一专利与本发明选定同一委托人,在这里引入做为参考)。用于本发明实施的附加热熔粘合剂,可以是任意热塑性材料,其软化温度范围约为100℃-300℃,150℃-200℃更好。热熔粘合剂涂敷,可通过涂一种热熔热塑性材料的有机溶剂溶液来实现。一种典型的混合物,可以是N甲基吡喀烷酮或者二甘醇二甲醚一类有机溶剂中的聚醚亚胺聚硅氧烷。
在本发明的实施中,片状集成电路晶片的基底经过了热熔粘合剂有机溶剂溶液的处理。热熔粘合剂以每分钟2000-7000转的速度被甩在硅片的背面。然后,将经过处理的片子是在大约为100-120℃下加热30-60分钟,而后再在大约180°-220℃温度下烘烤0.5-1小时。这样,在硅片表面,会产生厚度从0.5微米到25微米的一层热熔粘合剂膜。
这样硅片再经过金刚划片器,激光划片器或金刚锯的切割,就制成了大批集成电路硅组合件小片。
将前述的一个或多个集成电路硅组合件小片装到载体,如非导电衬底像氧化铝或氧化铍或导电衬底像铝或铜上,就可以组合成一个集成电路的阵列。在从100-300℃的温度范围内,对集成组合件基底上的热熔粘合剂,予以局部加热,当冷却后,复合物就被整体的粘接在载体的衬底上了。再加上合适的连接就可以产生一个如图3所示的集成电路硅组合件的阵列。
为使本领域的技术人员,更好地实施本发明,下面给出一些例子,用以阐述发明,所有份数以重量计,但并不受限制。
实施例1
表面上有大量集成电路硅组合件的,直径为3英寸的10密尔厚硅片的背面上,用完全亚胺化的聚醚亚胺硅氧烷来处理。这里,聚醚酰亚胺硅氧烷已通过丙撑链连接到与双酚-A酰亚胺基相连的聚二甲基硅氧烷的嵌段上。这里还应用了在二甘醇二甲醚中的聚醚亚胺硅氧烷溶液。在以每分钟2000转的速度,将涂敷的聚醚亚胺硅氧烷甩30秒钟之后,将硅片在120℃下干燥 1/2 小时,然后,在150℃下干燥2.5小时。于是得到了基底上涂有15微米厚聚醚亚胺的片状集成电路组合件。该片再由自动微型1006A型金刚锯切割,从而产生50块直径为100密尔的小集成电路硅小片组合件。
一个集成电路硅组合件阵列的制做,可通过将几个集成电路硅组合件小片,放置在氧化铝衬底子来实现。该小片要保持与衬底紧密接触,以便使聚醚亚胺硅氧烷升到允许其软化的温度,约200℃,然后,通过冷却,将集成电路小片粘接在载体表面上。于是,通过相应连接各种集成电路的栅极以及源信号电极,就可制成一个可用的集成电路硅组合件阵列。
应当指出,尽管上述实施例只针对着可被用于本发明方法,许多实际施例中的一小部分,本发明方法却是适用于各种热熔粘合剂的。

Claims (3)

1、一种在硅基底上附有热熔粘合剂的集成电路硅小片复合物的制做方法,其特征在于该方法包括:
(1)将一种热熔粘合剂的有机溶剂溶液甩涂到其上表面,有着大量的集成电路的硅片的基底上。
(2)使涂好的热熔粘合剂干燥。
(3)切割硅片以制备出大批在相应基底上有一层热熔粘合剂薄层的集成电路硅小片组合件。
2、根据权利要求1所述的方法,其中所用的热熔粘合剂是聚醚亚胺硅氧烷。
3、根据权利要求1所述的方法,其中将数片集成电路硅小片组合件粘在氧化铝衬底,可制成集成电路硅组合件阵列。
CN86100204.0A 1985-01-17 1986-01-17 基底附热熔粘合剂集成电路硅芯片复合物的制做方法 Expired CN1004843B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US692,088 1985-01-17
US06/692,088 US4624724A (en) 1985-01-17 1985-01-17 Method of making integrated circuit silicon die composite having hot melt adhesive on its silicon base

Publications (2)

Publication Number Publication Date
CN86100204A true CN86100204A (zh) 1986-08-13
CN1004843B CN1004843B (zh) 1989-07-19

Family

ID=24779210

Family Applications (1)

Application Number Title Priority Date Filing Date
CN86100204.0A Expired CN1004843B (zh) 1985-01-17 1986-01-17 基底附热熔粘合剂集成电路硅芯片复合物的制做方法

Country Status (7)

Country Link
US (1) US4624724A (zh)
JP (1) JPS61201432A (zh)
KR (1) KR930006528B1 (zh)
CN (1) CN1004843B (zh)
DE (1) DE3600895A1 (zh)
FR (1) FR2576148B1 (zh)
GB (1) GB2170042B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111599743A (zh) * 2020-07-06 2020-08-28 绍兴同芯成集成电路有限公司 复合式胶膜结合通孔玻璃载板结构生产晶圆的方法
CN111599743B (zh) * 2020-07-06 2024-05-28 绍兴同芯成集成电路有限公司 复合式胶膜结合通孔玻璃载板结构生产晶圆的方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5296074A (en) * 1987-03-30 1994-03-22 E. I. Du Pont De Nemours And Company Method for bonding small electronic components
DE3744764A1 (de) * 1987-11-20 1989-06-01 Messerschmitt Boelkow Blohm Verfahren zur herstellung von klebeverbindungen mittels laser
US5300812A (en) * 1992-12-09 1994-04-05 General Electric Company Plasticized polyetherimide adhesive composition and usage
DE4413529C2 (de) * 1994-04-15 1996-07-25 Tele Filter Tft Gmbh Verfahren zur Herstellung elektronischer Oberflächenwellenbauelemente sowie ein nach dem Verfahren hergestelltes elektronisches Bauelement
JPH1135893A (ja) 1997-05-22 1999-02-09 Toray Dow Corning Silicone Co Ltd シート状ホットメルト接着剤、および半導体装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3600246A (en) * 1968-05-17 1971-08-17 Rca Corp Method of making laminated semiconductor devices
GB1285708A (en) * 1968-10-28 1972-08-16 Lucas Industries Ltd Semi-conductor devices
US3600240A (en) * 1968-12-12 1971-08-17 Ibm Epitaxial growth from solution with amphoteric dopant
US3706409A (en) * 1970-02-26 1972-12-19 Gen Electric Semiconductor lead attachment system including a semiconductor pellet orientation plate
US4021279A (en) * 1972-04-20 1977-05-03 Stichting Reactor Centrum Nederland Method of forming groove pattern
DE2436600A1 (de) * 1974-07-30 1976-02-19 Semikron Gleichrichterbau Verfahren zur erzielung einer oberflaechenstabilisierenden schutzschicht bei halbleiterbauelementen
US4011279A (en) * 1975-09-23 1977-03-08 General Electric Company Process for making polyimide-polydiorganosiloxane block polymers
DE2653366A1 (de) * 1976-11-24 1978-06-01 Siemens Ag Verfahren zum teilautomatisierten verbinden von halbleiterchips mit einem traeger
US4347302A (en) * 1980-06-06 1982-08-31 Alexander Gotman Process for applying a thin coating in liquid form and subsequently drying it
US4385083A (en) * 1980-08-25 1983-05-24 Applied Magnetics Corporation Apparatus and method for forming a thin film of coating material on a substrate having a vacuum applied to the edge thereof
EP0051165A1 (en) * 1980-11-03 1982-05-12 BURROUGHS CORPORATION (a Michigan corporation) Repairable IC package with thermoplastic chip attach
JPS5827721A (ja) * 1981-08-10 1983-02-18 Hitachi Chem Co Ltd ポリアミド酸シリコン型中間体及びポリイミドシリコン共重合体樹脂の製造法
JPS5844712B2 (ja) * 1981-07-07 1983-10-05 日立化成工業株式会社 接着剤組成物

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111599743A (zh) * 2020-07-06 2020-08-28 绍兴同芯成集成电路有限公司 复合式胶膜结合通孔玻璃载板结构生产晶圆的方法
CN111599743B (zh) * 2020-07-06 2024-05-28 绍兴同芯成集成电路有限公司 复合式胶膜结合通孔玻璃载板结构生产晶圆的方法

Also Published As

Publication number Publication date
GB2170042B (en) 1988-05-25
DE3600895A1 (de) 1986-07-17
GB2170042A (en) 1986-07-23
KR860006133A (ko) 1986-08-18
FR2576148B1 (fr) 1991-09-06
JPS61201432A (ja) 1986-09-06
GB8521611D0 (en) 1985-10-02
US4624724A (en) 1986-11-25
CN1004843B (zh) 1989-07-19
FR2576148A1 (fr) 1986-07-18
KR930006528B1 (ko) 1993-07-16

Similar Documents

Publication Publication Date Title
EP0277606B1 (en) Full panel electronic packaging structure
KR100321399B1 (ko) 반도체웨이퍼의 제조방법, 반도체칩의 제조방법 및 ic카드
US6917107B2 (en) Board-on-chip packages
JPH0334853B2 (zh)
KR950001997A (ko) 반도체 구조물 형성방법, 다중-칩 집적회로 구조물 형성방법, 집적회로 칩을 워크피스에 접착하는 방법, 집적 전기 구조물 및 입방체 구조물
CN107845625A (zh) 芯片封装结构
US4172907A (en) Method of protecting bumped semiconductor chips
EP0248314A2 (en) Soldering of electronic components
CA2181339A1 (en) Methods and apparatus for producing integrated circuit devices
JPS58209133A (ja) 電気接続方法及びそれを利用する個人カ−ド
US6951811B2 (en) Method of producing vias and other conductor parts on an electrode terminal forming surface of a semiconductor wafer
CN104221131A (zh) 半导体元件的制造方法
DE3787032T2 (de) Elektronische module hoher dichte, verfahren und erzeugnis.
CN86100204A (zh) 硅基底上附有热熔粘合剂的集成电路硅小片复合物的制做方法
CN107078068B (zh) 晶圆级芯片的封装方法及封装体
CA2540825A1 (en) Serial circuit of solar cells with integrated semiconductor bodies, corresponding method for production and module with serial connection
TWI718923B (zh) 發光二極體晶片結構以及晶片移轉系統與方法
US3947303A (en) Method for producing a surface stabilizing protective layer in semiconductor devices
RU2511054C2 (ru) Способ изготовления полупроводниковых приборов
JPH0719792B2 (ja) 集積回路
CN205827390U (zh) 指纹辨识模块
JPS62158336A (ja) 電子部品の実装構造およびその実装方法
JPH10326704A (ja) 薄膜抵抗器の製造方法
CN114695299A (zh) 芯片的封装方法及芯片模组
JPH04144298A (ja) 回路基板のスクライブ方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C13 Decision
GR02 Examined patent application
C14 Grant of patent or utility model
GR01 Patent grant
C53 Correction of patent of invention or patent application
CB02 Change of applicant information

Address after: Arisan, USA

Applicant after: Micro silicon Co.,Ltd.

Address before: American New York

Applicant before: General Electric Co.

COR Change of bibliographic data

Free format text: CORRECT: APPLICANT; FROM: GENERAL ELECTRIC CO. TO: MICROMACHINED LTD.

C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee