CN1793999A - 半导体集成电路 - Google Patents
半导体集成电路 Download PDFInfo
- Publication number
- CN1793999A CN1793999A CNA2005101377063A CN200510137706A CN1793999A CN 1793999 A CN1793999 A CN 1793999A CN A2005101377063 A CNA2005101377063 A CN A2005101377063A CN 200510137706 A CN200510137706 A CN 200510137706A CN 1793999 A CN1793999 A CN 1793999A
- Authority
- CN
- China
- Prior art keywords
- selector
- signal
- circuit module
- circuit
- module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 7
- 238000000926 separation method Methods 0.000 claims abstract description 107
- 230000002401 inhibitory effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 6
- 238000010276 construction Methods 0.000 description 5
- 230000001360 synchronised effect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (3)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004367220A JP4563791B2 (ja) | 2004-12-20 | 2004-12-20 | 半導体集積回路 |
JP2004367220 | 2004-12-20 | ||
JP2004-367220 | 2004-12-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1793999A true CN1793999A (zh) | 2006-06-28 |
CN1793999B CN1793999B (zh) | 2010-04-07 |
Family
ID=36597620
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005101377063A Expired - Fee Related CN1793999B (zh) | 2004-12-20 | 2005-12-20 | 半导体集成电路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7373570B2 (zh) |
JP (1) | JP4563791B2 (zh) |
KR (1) | KR101174679B1 (zh) |
CN (1) | CN1793999B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101408587B (zh) * | 2007-10-12 | 2011-07-27 | 三洋电机株式会社 | 半导体集成电路 |
WO2016023216A1 (zh) * | 2014-08-15 | 2016-02-18 | 华为技术有限公司 | 测试装置和可测试性异步电路 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007105036A1 (en) * | 2006-03-13 | 2007-09-20 | Freescale Semiconductor, Inc. | Device and method for testing a device |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0257990A (ja) * | 1988-08-24 | 1990-02-27 | Mitsubishi Electric Corp | Lsiテスト回路 |
US5477545A (en) * | 1993-02-09 | 1995-12-19 | Lsi Logic Corporation | Method and apparatus for testing of core-cell based integrated circuits |
JPH06324113A (ja) * | 1993-05-11 | 1994-11-25 | Nippon Steel Corp | 半導体集積回路 |
JP3695768B2 (ja) * | 1993-12-20 | 2005-09-14 | 株式会社東芝 | テスト回路の検証方法 |
TW307927B (zh) * | 1994-08-29 | 1997-06-11 | Matsushita Electric Ind Co Ltd | |
US5592493A (en) * | 1994-09-13 | 1997-01-07 | Motorola Inc. | Serial scan chain architecture for a data processing system and method of operation |
US5889788A (en) * | 1997-02-03 | 1999-03-30 | Motorola, Inc. | Wrapper cell architecture for path delay testing of embedded core microprocessors and method of operation |
US6412098B1 (en) * | 1998-06-30 | 2002-06-25 | Adaptec, Inc. | Scan cell including a propagation delay and isolation element |
KR100308189B1 (ko) * | 1998-09-17 | 2001-11-30 | 윤종용 | 코어셀기반의집적회로의테스트용이도를증가시키기위한바운더리스캔회로 |
JP2002296323A (ja) | 2001-03-29 | 2002-10-09 | Matsushita Electric Ind Co Ltd | スキャンテスト回路、およびスキャンテスト方法 |
US6701476B2 (en) | 2001-05-29 | 2004-03-02 | Motorola, Inc. | Test access mechanism for supporting a configurable built-in self-test circuit and method thereof |
CN1391351A (zh) * | 2001-06-12 | 2003-01-15 | 松下电器产业株式会社 | 半导体集成电路装置和半导体集成电路装置的设计方法 |
JP2003014819A (ja) * | 2001-07-03 | 2003-01-15 | Matsushita Electric Ind Co Ltd | 半導体配線基板,半導体デバイス,半導体デバイスのテスト方法及びその実装方法 |
JP4234357B2 (ja) * | 2002-05-29 | 2009-03-04 | 川崎マイクロエレクトロニクス株式会社 | 半導体集積回路の故障解析方法 |
-
2004
- 2004-12-20 JP JP2004367220A patent/JP4563791B2/ja not_active Expired - Fee Related
-
2005
- 2005-12-15 KR KR1020050123850A patent/KR101174679B1/ko not_active IP Right Cessation
- 2005-12-19 US US11/305,211 patent/US7373570B2/en not_active Expired - Fee Related
- 2005-12-20 CN CN2005101377063A patent/CN1793999B/zh not_active Expired - Fee Related
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101408587B (zh) * | 2007-10-12 | 2011-07-27 | 三洋电机株式会社 | 半导体集成电路 |
WO2016023216A1 (zh) * | 2014-08-15 | 2016-02-18 | 华为技术有限公司 | 测试装置和可测试性异步电路 |
CN105593694A (zh) * | 2014-08-15 | 2016-05-18 | 华为技术有限公司 | 测试装置和可测试性异步电路 |
CN105593694B (zh) * | 2014-08-15 | 2019-02-12 | 华为技术有限公司 | 测试装置和可测试性异步电路 |
US10209299B2 (en) | 2014-08-15 | 2019-02-19 | Huawei Technologies Co., Ltd. | Test apparatus and testable asynchronous circuit |
Also Published As
Publication number | Publication date |
---|---|
CN1793999C (zh) | |
KR101174679B1 (ko) | 2012-08-16 |
US7373570B2 (en) | 2008-05-13 |
CN1793999B (zh) | 2010-04-07 |
JP4563791B2 (ja) | 2010-10-13 |
KR20060070436A (ko) | 2006-06-23 |
US20060136796A1 (en) | 2006-06-22 |
JP2006170929A (ja) | 2006-06-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: OKI SEMICONDUCTOR CO., LTD. Free format text: FORMER OWNER: OKI ELECTRIC INDUSTRY CO., LTD. Effective date: 20131210 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: Tokyo, Japan Patentee after: LAPIS SEMICONDUCTOR Co.,Ltd. Address before: Tokyo, Japan Patentee before: Oki Semiconductor Co.,Ltd. |
|
CP02 | Change in the address of a patent holder |
Address after: yokohama Patentee after: LAPIS SEMICONDUCTOR Co.,Ltd. Address before: Tokyo, Japan Patentee before: LAPIS SEMICONDUCTOR Co.,Ltd. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20131210 Address after: Tokyo, Japan Patentee after: Oki Semiconductor Co.,Ltd. Address before: Tokyo, Japan Patentee before: Oki Electric Industry Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100407 Termination date: 20161220 |
|
CF01 | Termination of patent right due to non-payment of annual fee |