CN1773726A - 半导体集成电路和半导体器件 - Google Patents
半导体集成电路和半导体器件 Download PDFInfo
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- CN1773726A CN1773726A CNA2005101163844A CN200510116384A CN1773726A CN 1773726 A CN1773726 A CN 1773726A CN A2005101163844 A CNA2005101163844 A CN A2005101163844A CN 200510116384 A CN200510116384 A CN 200510116384A CN 1773726 A CN1773726 A CN 1773726A
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- mos transistor
- well region
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- drain
- transistor
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 54
- 239000000758 substrate Substances 0.000 claims abstract description 54
- 230000004044 response Effects 0.000 claims abstract description 21
- 230000004888 barrier function Effects 0.000 claims description 12
- 230000008878 coupling Effects 0.000 claims description 7
- 238000010168 coupling process Methods 0.000 claims description 7
- 238000005859 coupling reaction Methods 0.000 claims description 7
- 238000006880 cross-coupling reaction Methods 0.000 claims description 5
- 238000004806 packaging method and process Methods 0.000 claims description 2
- 230000003071 parasitic effect Effects 0.000 abstract description 41
- 230000008859 change Effects 0.000 abstract description 15
- 238000010586 diagram Methods 0.000 description 11
- -1 phosphonium ion Chemical class 0.000 description 11
- 239000012535 impurity Substances 0.000 description 10
- 229910052796 boron Inorganic materials 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 5
- 229910052753 mercury Inorganic materials 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- 229920005591 polysilicon Polymers 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- WQJQOUPTWCFRMM-UHFFFAOYSA-N tungsten disilicide Chemical compound [Si]#[W]#[Si] WQJQOUPTWCFRMM-UHFFFAOYSA-N 0.000 description 1
- 229910021342 tungsten silicide Inorganic materials 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7816—Lateral DMOS transistors, i.e. LDMOS transistors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0705—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
- H01L27/0727—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with diodes, or capacitors or resistors
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
- H02M3/156—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
- H02M3/158—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators including plural semiconductor devices as final control devices for a single load
- H02M3/1588—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators including plural semiconductor devices as final control devices for a single load comprising at least one synchronous rectifier element
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49111—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0843—Source or drain regions of field-effect devices
- H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
- H01L29/0852—Source or drain regions of field-effect devices of field-effect transistors with insulated gate of DMOS transistors
- H01L29/0856—Source regions
- H01L29/086—Impurity concentration or distribution
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/107—Substrate region of field-effect devices
- H01L29/1075—Substrate region of field-effect devices of field-effect transistors
- H01L29/1079—Substrate region of field-effect devices of field-effect transistors with insulated gate
- H01L29/1083—Substrate region of field-effect devices of field-effect transistors with insulated gate with an inactive supplementary region, e.g. for preventing punch-through, improving capacity effect or leakage current
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
- Y02B70/10—Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Dc-Dc Converters (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004306473A JP4545548B2 (ja) | 2004-10-21 | 2004-10-21 | 半導体集積回路及び半導体装置 |
JP2004306473 | 2004-10-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1773726A true CN1773726A (zh) | 2006-05-17 |
CN100514674C CN100514674C (zh) | 2009-07-15 |
Family
ID=36205424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005101163844A Expired - Fee Related CN100514674C (zh) | 2004-10-21 | 2005-10-21 | 半导体集成电路和半导体器件 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7345340B2 (zh) |
JP (1) | JP4545548B2 (zh) |
CN (1) | CN100514674C (zh) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101335211B (zh) * | 2007-06-26 | 2010-06-09 | 东部高科股份有限公司 | 侧向dmos器件及其制造方法 |
CN103077895A (zh) * | 2012-12-19 | 2013-05-01 | 上海宏力半导体制造有限公司 | Ldmos晶体管及其形成方法 |
CN104103685A (zh) * | 2013-04-02 | 2014-10-15 | 中芯国际集成电路制造(上海)有限公司 | 一种具有降低纵向寄生晶体管效应的器件结构及其制作方法 |
CN104378072A (zh) * | 2013-08-14 | 2015-02-25 | 恩智浦有限公司 | 放大器电路 |
CN109326563A (zh) * | 2017-08-01 | 2019-02-12 | 意法半导体(鲁塞)公司 | 检测集成电路的衬底从背侧减薄的方法和相关集成电路 |
CN110556373A (zh) * | 2018-06-01 | 2019-12-10 | 英飞凌科技股份有限公司 | 整流器器件 |
CN111124022A (zh) * | 2018-10-31 | 2020-05-08 | 财团法人成大研究发展基金会 | 数字线性调节器与功率金属氧化物半导体数组 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7868388B2 (en) * | 2007-01-31 | 2011-01-11 | Sandisk 3D Llc | Embedded memory in a CMOS circuit and methods of forming the same |
US7888200B2 (en) * | 2007-01-31 | 2011-02-15 | Sandisk 3D Llc | Embedded memory in a CMOS circuit and methods of forming the same |
JP4587003B2 (ja) * | 2008-07-03 | 2010-11-24 | セイコーエプソン株式会社 | 半導体装置 |
US7906810B2 (en) * | 2008-08-06 | 2011-03-15 | United Microelectronics Corp. | LDMOS device for ESD protection circuit |
US8338888B2 (en) * | 2009-09-29 | 2012-12-25 | STMicroelectronicis S.r.l. | Process for manufacturing an integrated device with “damascene” field insulation, and integrated device made by such process |
US8941176B2 (en) * | 2009-09-29 | 2015-01-27 | Stmicroelectronics S.R.L. | Integrated device with raised locos insulation regions and process for manufacturing such device |
JP4820899B2 (ja) | 2009-10-23 | 2011-11-24 | 株式会社東芝 | 半導体装置 |
US8450801B2 (en) * | 2010-08-27 | 2013-05-28 | United Microelectronics Corp. | Lateral-diffusion metal-oxide-semiconductor device |
US9147701B2 (en) * | 2011-09-22 | 2015-09-29 | Raytheon Company | Monolithic InGaN solar cell power generation with integrated efficient switching DC-DC voltage convertor |
JP6031954B2 (ja) * | 2012-11-14 | 2016-11-24 | ソニー株式会社 | 発光素子、表示装置及び電子機器 |
JP2014192361A (ja) * | 2013-03-27 | 2014-10-06 | Sharp Corp | 半導体装置およびその製造方法 |
CN104681609B (zh) * | 2013-12-03 | 2017-12-05 | 上海华虹宏力半导体制造有限公司 | 一种n型LDMOS器件及其制造方法 |
CN104681608B (zh) * | 2013-12-03 | 2017-12-05 | 上海华虹宏力半导体制造有限公司 | 一种高隔离性的n型LDMOS器件及其制造方法 |
JP6368393B2 (ja) * | 2017-02-22 | 2018-08-01 | キヤノン株式会社 | 記録素子基板、記録ヘッド及び記録装置 |
TWI777525B (zh) * | 2021-01-08 | 2022-09-11 | 立錡科技股份有限公司 | 可降低寄生電感之開關 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5446300A (en) * | 1992-11-04 | 1995-08-29 | North American Philips Corporation | Semiconductor device configuration with multiple HV-LDMOS transistors and a floating well circuit |
GB9320246D0 (en) * | 1993-10-01 | 1993-11-17 | Sgs Thomson Microelectronics | A driver circuit |
EP0880183A3 (en) * | 1997-05-23 | 1999-07-28 | Texas Instruments Incorporated | LDMOS power device |
US6064249A (en) * | 1997-06-20 | 2000-05-16 | Texas Instruments Incorporated | Lateral DMOS design for ESD protection |
DE69731088D1 (de) * | 1997-10-31 | 2004-11-11 | St Microelectronics Srl | Ausgangsstufe mit hoher Versorgungsspannung zum Steuern einer elektrischen Last |
JPH11205123A (ja) * | 1998-01-20 | 1999-07-30 | Toshiba Corp | 高耐圧パワー集積回路 |
JP2000022142A (ja) | 1998-06-29 | 2000-01-21 | Denso Corp | 半導体装置及び半導体装置の製造方法 |
JP3448546B2 (ja) | 2000-04-26 | 2003-09-22 | 三洋電機株式会社 | 半導体装置とその製造方法 |
JP3831602B2 (ja) | 2000-12-07 | 2006-10-11 | 三洋電機株式会社 | 半導体装置の製造方法 |
US6911694B2 (en) * | 2001-06-27 | 2005-06-28 | Ricoh Company, Ltd. | Semiconductor device and method for fabricating such device |
US6794719B2 (en) * | 2001-06-28 | 2004-09-21 | Koninklijke Philips Electronics N.V. | HV-SOI LDMOS device with integrated diode to improve reliability and avalanche ruggedness |
JP2003115585A (ja) * | 2001-10-03 | 2003-04-18 | Oki Electric Ind Co Ltd | 半導体装置の製造方法 |
JP4271910B2 (ja) * | 2002-08-01 | 2009-06-03 | 株式会社ルネサステクノロジ | 半導体集積回路および電源回路 |
JP2004200359A (ja) * | 2002-12-18 | 2004-07-15 | Ricoh Co Ltd | 半導体装置及びその製造方法 |
JP4437388B2 (ja) * | 2003-02-06 | 2010-03-24 | 株式会社リコー | 半導体装置 |
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2004
- 2004-10-21 JP JP2004306473A patent/JP4545548B2/ja not_active Expired - Fee Related
-
2005
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101335211B (zh) * | 2007-06-26 | 2010-06-09 | 东部高科股份有限公司 | 侧向dmos器件及其制造方法 |
CN103077895A (zh) * | 2012-12-19 | 2013-05-01 | 上海宏力半导体制造有限公司 | Ldmos晶体管及其形成方法 |
CN104103685A (zh) * | 2013-04-02 | 2014-10-15 | 中芯国际集成电路制造(上海)有限公司 | 一种具有降低纵向寄生晶体管效应的器件结构及其制作方法 |
CN104378072A (zh) * | 2013-08-14 | 2015-02-25 | 恩智浦有限公司 | 放大器电路 |
CN104378072B (zh) * | 2013-08-14 | 2017-08-11 | 安普林荷兰有限公司 | 放大器电路 |
CN109326563A (zh) * | 2017-08-01 | 2019-02-12 | 意法半导体(鲁塞)公司 | 检测集成电路的衬底从背侧减薄的方法和相关集成电路 |
CN110556373A (zh) * | 2018-06-01 | 2019-12-10 | 英飞凌科技股份有限公司 | 整流器器件 |
CN111124022A (zh) * | 2018-10-31 | 2020-05-08 | 财团法人成大研究发展基金会 | 数字线性调节器与功率金属氧化物半导体数组 |
Also Published As
Publication number | Publication date |
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US7345340B2 (en) | 2008-03-18 |
CN100514674C (zh) | 2009-07-15 |
JP4545548B2 (ja) | 2010-09-15 |
US20060086973A1 (en) | 2006-04-27 |
JP2006120818A (ja) | 2006-05-11 |
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