CN1527415A - 薄膜压电元件及其制造方法与执行元件 - Google Patents
薄膜压电元件及其制造方法与执行元件 Download PDFInfo
- Publication number
- CN1527415A CN1527415A CNA2004100080375A CN200410008037A CN1527415A CN 1527415 A CN1527415 A CN 1527415A CN A2004100080375 A CNA2004100080375 A CN A2004100080375A CN 200410008037 A CN200410008037 A CN 200410008037A CN 1527415 A CN1527415 A CN 1527415A
- Authority
- CN
- China
- Prior art keywords
- electrode film
- counter electrode
- main electrode
- membrane
- peristome
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 82
- 239000010409 thin film Substances 0.000 title abstract 4
- 239000012528 membrane Substances 0.000 claims description 305
- 239000000758 substrate Substances 0.000 claims description 146
- 229920005989 resin Polymers 0.000 claims description 96
- 239000011347 resin Substances 0.000 claims description 96
- 238000005530 etching Methods 0.000 claims description 80
- 238000009826 distribution Methods 0.000 claims description 71
- 238000004519 manufacturing process Methods 0.000 claims description 53
- 230000004888 barrier function Effects 0.000 claims description 42
- 239000000853 adhesive Substances 0.000 claims description 39
- 230000001070 adhesive effect Effects 0.000 claims description 39
- 238000012545 processing Methods 0.000 claims description 37
- 238000003475 lamination Methods 0.000 claims description 34
- 239000000463 material Substances 0.000 claims description 30
- 239000010931 gold Substances 0.000 claims description 22
- 230000015572 biosynthetic process Effects 0.000 claims description 19
- 229920002120 photoresistant polymer Polymers 0.000 claims description 15
- 229910052737 gold Inorganic materials 0.000 claims description 11
- 238000010438 heat treatment Methods 0.000 claims description 10
- 230000002093 peripheral effect Effects 0.000 claims description 9
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 8
- 229910052718 tin Inorganic materials 0.000 claims description 8
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 6
- 230000004927 fusion Effects 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 5
- 229910052793 cadmium Inorganic materials 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- 238000011049 filling Methods 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 239000002904 solvent Substances 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 230000008929 regeneration Effects 0.000 claims description 2
- 238000011069 regeneration method Methods 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims 3
- 230000004907 flux Effects 0.000 claims 3
- 229910000679 solder Inorganic materials 0.000 claims 3
- 229910000925 Cd alloy Inorganic materials 0.000 claims 2
- 238000005275 alloying Methods 0.000 claims 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 229910001128 Sn alloy Inorganic materials 0.000 claims 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
- 239000011505 plaster Substances 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
- 239000010410 layer Substances 0.000 abstract 9
- 239000002344 surface layer Substances 0.000 abstract 1
- 230000001681 protective effect Effects 0.000 description 35
- 230000033228 biological regulation Effects 0.000 description 20
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 15
- 238000010276 construction Methods 0.000 description 10
- 239000000395 magnesium oxide Substances 0.000 description 10
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 10
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 10
- 230000001172 regenerating effect Effects 0.000 description 10
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 8
- 230000004224 protection Effects 0.000 description 8
- 238000000465 moulding Methods 0.000 description 7
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 7
- 235000014347 soups Nutrition 0.000 description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- 230000005496 eutectics Effects 0.000 description 6
- 238000009940 knitting Methods 0.000 description 6
- 239000000047 product Substances 0.000 description 6
- 238000003860 storage Methods 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 238000001039 wet etching Methods 0.000 description 5
- 239000002253 acid Substances 0.000 description 4
- 239000007767 bonding agent Substances 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 4
- 239000012467 final product Substances 0.000 description 4
- 229910015363 Au—Sn Inorganic materials 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 208000034189 Sclerosis Diseases 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- PQCCZSBUXOQGIU-UHFFFAOYSA-N [La].[Pb] Chemical compound [La].[Pb] PQCCZSBUXOQGIU-UHFFFAOYSA-N 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 239000003814 drug Substances 0.000 description 2
- 229960002050 hydrofluoric acid Drugs 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 239000012188 paraffin wax Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 239000011435 rock Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 229910052712 strontium Inorganic materials 0.000 description 2
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 229930192627 Naphthoquinone Natural products 0.000 description 1
- TZRXHJWUDPFEEY-UHFFFAOYSA-N Pentaerythritol Tetranitrate Chemical compound [O-][N+](=O)OCC(CO[N+]([O-])=O)(CO[N+]([O-])=O)CO[N+]([O-])=O TZRXHJWUDPFEEY-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229910002367 SrTiO Inorganic materials 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013036 cure process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- CMMUKUYEPRGBFB-UHFFFAOYSA-L dichromic acid Chemical compound O[Cr](=O)(=O)O[Cr](O)(=O)=O CMMUKUYEPRGBFB-UHFFFAOYSA-L 0.000 description 1
- HRKQOINLCJTGBK-UHFFFAOYSA-N dihydroxidosulfur Chemical compound OSO HRKQOINLCJTGBK-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 239000012943 hotmelt Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 150000002791 naphthoquinones Chemical class 0.000 description 1
- VIKNJXKGJWUCNN-XGXHKTLJSA-N norethisterone Chemical compound O=C1CC[C@@H]2[C@H]3CC[C@](C)([C@](CC4)(O)C#C)[C@@H]4[C@@H]3CCC2=C1 VIKNJXKGJWUCNN-XGXHKTLJSA-N 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000006303 photolysis reaction Methods 0.000 description 1
- 230000015843 photosynthesis, light reaction Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000013517 stratification Methods 0.000 description 1
- 229920006305 unsaturated polyester Polymers 0.000 description 1
- 150000003673 urethanes Chemical class 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
- H10N30/206—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using only longitudinal or thickness displacement, e.g. d33 or d31 type devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/08—Shaping or machining of piezoelectric or electrostrictive bodies
- H10N30/082—Shaping or machining of piezoelectric or electrostrictive bodies by etching, e.g. lithography
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3512—Cracking
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/074—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing
- H10N30/076—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing by vapour phase deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/85—Piezoelectric or electrostrictive active materials
- H10N30/853—Ceramic compositions
- H10N30/8548—Lead-based oxides
- H10N30/8554—Lead-zirconium titanate [PZT] based
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
- Supporting Of Heads In Record-Carrier Devices (AREA)
- Moving Of The Head To Find And Align With The Track (AREA)
- Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
Abstract
Description
Claims (24)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP059962/2003 | 2003-03-06 | ||
JP059962/03 | 2003-03-06 | ||
JP2003059962 | 2003-03-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1527415A true CN1527415A (zh) | 2004-09-08 |
CN100353579C CN100353579C (zh) | 2007-12-05 |
Family
ID=32984388
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100080375A Expired - Fee Related CN100353579C (zh) | 2003-03-06 | 2004-03-08 | 薄膜压电元件及其制造方法与执行元件 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7064401B2 (zh) |
CN (1) | CN100353579C (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102474206A (zh) * | 2009-09-24 | 2012-05-23 | 松下电器产业株式会社 | 平板层叠型导电性高分子致动器 |
CN103730379A (zh) * | 2014-01-16 | 2014-04-16 | 苏州晶方半导体科技股份有限公司 | 芯片封装方法及结构 |
CN105318866A (zh) * | 2014-05-26 | 2016-02-10 | Tdk株式会社 | 角速度传感器 |
CN107799648A (zh) * | 2016-08-29 | 2018-03-13 | 波音公司 | 致动器组件、包括该致动器组件的机械组件以及其制造方法 |
CN108701753A (zh) * | 2015-12-25 | 2018-10-23 | 三井化学株式会社 | 压电基材、压电机织物、压电针织物、压电装置、力传感器、致动器及生物体信息获取装置 |
CN110931049A (zh) * | 2018-09-19 | 2020-03-27 | 新科实业有限公司 | 薄膜压电材料元件及其制造方法、磁头折片组件、硬盘驱动器 |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1245768C (zh) * | 2001-09-07 | 2006-03-15 | 松下电器产业株式会社 | 薄膜压电体元件及其制造方法并致动器 |
JP3696596B2 (ja) * | 2003-02-07 | 2005-09-21 | アルプス電気株式会社 | 磁気ヘッドアクチュエータ及びその製造方法 |
US7219410B2 (en) * | 2004-12-20 | 2007-05-22 | General Electric Company | High speed linear motion mechanism |
JP2006247025A (ja) * | 2005-03-09 | 2006-09-21 | Fuji Photo Film Co Ltd | 体腔内診断用超音波プローブ |
DE102006002695A1 (de) * | 2006-01-11 | 2007-08-09 | Siemens Ag | Piezostack mit neuartiger Passivierung |
US20080161692A1 (en) * | 2006-12-29 | 2008-07-03 | Podmore Jonathan L | Devices and methods for ablation |
JP5032949B2 (ja) * | 2007-11-14 | 2012-09-26 | エイチジーエスティーネザーランドビーブイ | マイクロアクチュエータ、ヘッド・ジンバル・アセンブリ及びディスク・ドライブ装置 |
US8085508B2 (en) | 2008-03-28 | 2011-12-27 | Hitachi Global Storage Technologies Netherlands B.V. | System, method and apparatus for flexure-integrated microactuator |
US8144435B2 (en) * | 2008-10-20 | 2012-03-27 | Seagate Technology Llc | Cost reduced microactuator suspension |
JP4944159B2 (ja) | 2009-06-02 | 2012-05-30 | Tdk株式会社 | 圧電アクチュエータ及び圧電アクチュエータの製造方法 |
JP5869200B2 (ja) * | 2009-12-21 | 2016-02-24 | エイチジーエスティーネザーランドビーブイ | ヘッド・ジンバル・アセンブリ及びディスク・ドライブ |
US20130342078A1 (en) * | 2012-10-03 | 2013-12-26 | U.S. Army Research Laboratory Attn: Rdrl-Loc-I | Apparatus and method of making a multi-layered piezoelectric actuator |
US9406314B1 (en) | 2012-10-04 | 2016-08-02 | Magnecomp Corporation | Assembly of DSA suspensions using microactuators with partially cured adhesive, and DSA suspensions having PZTs with wrap-around electrodes |
US8773820B1 (en) * | 2013-02-21 | 2014-07-08 | Magnecomp Corporation | PZT microactuator for disk drive suspension having electrical via and wrap-around electrode |
US9224410B1 (en) | 2013-09-04 | 2015-12-29 | Magnecomp Corporation | Suspension having microactuator grounded to opposite side of metal support layer |
US9123367B1 (en) * | 2014-06-16 | 2015-09-01 | Intri-Plex Technologies, Inc. | Swage mount having a mixture of a conductive material and a coating material and method of manufacturing the swage mount |
US9722169B1 (en) | 2015-11-05 | 2017-08-01 | Sae Magnetics (H.K.) Ltd. | Thin-film piezoelectric material element, head gimbal assembly and hard disk drive |
US9646637B1 (en) * | 2015-11-05 | 2017-05-09 | Sae Magnetics (H.K.) Ltd. | Thin-film piezoelectric material element, head gimbal assembly and hard disk drive |
EP4061009A4 (en) * | 2019-11-12 | 2023-02-01 | FUJIFILM Corporation | PIEZOELECTRIC ELEMENT |
Family Cites Families (12)
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JPH06224483A (ja) | 1993-01-25 | 1994-08-12 | Brother Ind Ltd | 積層型圧電素子 |
JP3057967B2 (ja) | 1993-07-12 | 2000-07-04 | 株式会社村田製作所 | 積層型圧電体素子 |
JP2952159B2 (ja) | 1994-09-16 | 1999-09-20 | 川崎重工業株式会社 | マイクロアクチュエータの製造方法 |
JP2986706B2 (ja) | 1995-03-03 | 1999-12-06 | 日立金属株式会社 | 圧電素子及びそれを用いた圧電アクチュエータ |
JPH11142753A (ja) | 1997-11-04 | 1999-05-28 | Seiko Epson Corp | 変形可能ミラーデバイスの製造方法 |
JP2001060843A (ja) * | 1999-08-23 | 2001-03-06 | Murata Mfg Co Ltd | チップ型圧電部品 |
CN1166012C (zh) * | 1999-11-11 | 2004-09-08 | 三菱电机株式会社 | 薄膜压电元件 |
US6590748B2 (en) * | 2000-06-06 | 2003-07-08 | Seagate Technology Llc | Combined servo-tracking and preload-controlling microactuator |
JP2003197878A (ja) * | 2001-10-15 | 2003-07-11 | Hitachi Ltd | メモリ半導体装置およびその製造方法 |
JP3846271B2 (ja) * | 2001-11-05 | 2006-11-15 | 松下電器産業株式会社 | 薄膜圧電体素子およびその製造方法 |
JP4218350B2 (ja) * | 2002-02-01 | 2009-02-04 | パナソニック株式会社 | 強誘電体薄膜素子およびその製造方法、これを用いた薄膜コンデンサ並びに圧電アクチュエータ |
JP2003272324A (ja) * | 2002-03-15 | 2003-09-26 | Matsushita Electric Ind Co Ltd | 薄膜圧電体素子およびその製造方法並びにアクチュエータ |
-
2004
- 2004-03-05 US US10/792,930 patent/US7064401B2/en active Active
- 2004-03-08 CN CNB2004100080375A patent/CN100353579C/zh not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102474206A (zh) * | 2009-09-24 | 2012-05-23 | 松下电器产业株式会社 | 平板层叠型导电性高分子致动器 |
CN102474206B (zh) * | 2009-09-24 | 2014-08-13 | 松下电器产业株式会社 | 平板层叠型导电性高分子致动器 |
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