CN1503855A - 锰合金溅射靶及其制造方法 - Google Patents
锰合金溅射靶及其制造方法 Download PDFInfo
- Publication number
- CN1503855A CN1503855A CNA028082893A CN02808289A CN1503855A CN 1503855 A CN1503855 A CN 1503855A CN A028082893 A CNA028082893 A CN A028082893A CN 02808289 A CN02808289 A CN 02808289A CN 1503855 A CN1503855 A CN 1503855A
- Authority
- CN
- China
- Prior art keywords
- manganese alloy
- sputtering target
- alloy sputtering
- manufacture method
- manganese
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910000914 Mn alloy Inorganic materials 0.000 title claims abstract description 86
- 238000005477 sputtering target Methods 0.000 title claims abstract description 64
- 239000002245 particle Substances 0.000 claims abstract description 53
- 238000004519 manufacturing process Methods 0.000 claims abstract description 40
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000001301 oxygen Substances 0.000 claims abstract description 24
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 24
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 claims description 57
- 238000005242 forging Methods 0.000 claims description 37
- 238000002844 melting Methods 0.000 claims description 26
- 230000008018 melting Effects 0.000 claims description 26
- 239000005864 Sulphur Substances 0.000 claims description 18
- 239000011572 manganese Substances 0.000 claims description 13
- 230000006698 induction Effects 0.000 claims description 11
- 229910052697 platinum Inorganic materials 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 9
- 238000002425 crystallisation Methods 0.000 claims description 7
- 230000008025 crystallization Effects 0.000 claims description 7
- 229910052741 iridium Inorganic materials 0.000 claims description 7
- 229910052759 nickel Inorganic materials 0.000 claims description 7
- 229910052763 palladium Inorganic materials 0.000 claims description 7
- 229910052702 rhenium Inorganic materials 0.000 claims description 7
- 229910052703 rhodium Inorganic materials 0.000 claims description 7
- 238000010894 electron beam technology Methods 0.000 claims description 4
- 238000005260 corrosion Methods 0.000 abstract description 4
- 230000007797 corrosion Effects 0.000 abstract description 2
- 229910052717 sulfur Inorganic materials 0.000 abstract description 2
- 239000011593 sulfur Substances 0.000 abstract description 2
- 238000005336 cracking Methods 0.000 abstract 1
- 230000001747 exhibiting effect Effects 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
- 230000000052 comparative effect Effects 0.000 description 36
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 14
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 12
- 239000000843 powder Substances 0.000 description 11
- 238000004544 sputter deposition Methods 0.000 description 9
- IGOJMROYPFZEOR-UHFFFAOYSA-N manganese platinum Chemical compound [Mn].[Pt] IGOJMROYPFZEOR-UHFFFAOYSA-N 0.000 description 8
- 239000002994 raw material Substances 0.000 description 8
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 6
- 230000014509 gene expression Effects 0.000 description 6
- SHMWNGFNWYELHA-UHFFFAOYSA-N iridium manganese Chemical compound [Mn].[Ir] SHMWNGFNWYELHA-UHFFFAOYSA-N 0.000 description 6
- ZAUUZASCMSWKGX-UHFFFAOYSA-N manganese nickel Chemical compound [Mn].[Ni] ZAUUZASCMSWKGX-UHFFFAOYSA-N 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 229910001260 Pt alloy Inorganic materials 0.000 description 5
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 5
- 239000010948 rhodium Substances 0.000 description 5
- 229910000575 Ir alloy Inorganic materials 0.000 description 4
- 238000003723 Smelting Methods 0.000 description 4
- 238000005245 sintering Methods 0.000 description 4
- 230000005303 antiferromagnetism Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000007731 hot pressing Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 229910052748 manganese Inorganic materials 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000012217 deletion Methods 0.000 description 2
- 230000037430 deletion Effects 0.000 description 2
- 238000000280 densification Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004062 sedimentation Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 206010021143 Hypoxia Diseases 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000000265 homogenisation Methods 0.000 description 1
- 208000018875 hypoxemia Diseases 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000803 paradoxical effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C22/00—Alloys based on manganese
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C5/00—Alloys based on noble metals
- C22C5/02—Alloys based on gold
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C5/00—Alloys based on noble metals
- C22C5/04—Alloys based on a platinum group metal
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
- C22F1/18—High-melting or refractory metals or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/851—Coating a support with a magnetic layer by sputtering
Abstract
Description
Mn(at%) | Pt(at%) | 熔点(℃) | 锻造温度(℃) | 压下率(%) | 实际应变速率(l/s) | |
实施例1 | 79.9 | 20.1 | 1190 | 1050 | 42.1 | 1.9×10-4 |
实施例2 | 59.9 | 40.1 | 1380 | 1200 | 75.1 | 4.6×10-4 |
实施例3 | 55.0 | 45.0 | 1460 | 1200 | 65.3 | 3.8×10-4 |
实施例4 | 50.0 | 50.0 | 1480 | 1250 | 75.3 | 1.1×10-4 |
实施例5 | 39.8 | 60.2 | 1420 | 1250 | 62.7 | 1.4×10-4 |
比较例1 | 59.5 | 40.5 | - | - | - | - |
比较例2 | 59.7 | 40.3 | - | - | - | - |
比较例3 | 59.9 | 40.1 | - | - | - | - |
氧含量(wtppm) | 硫含量(wtppm) | 氧化物粒子数目 | 平均粒径(μm) | |
实施例1 | 40 | 20 | 0.0 | 120 |
实施例2 | 150 | 40 | 0.0 | 50 |
实施例3 | 310 | 50 | 0.1 | 100 |
实施例4 | 110 | 30 | 0.0 | 110 |
实施例5 | 180 | 10 | 0.0 | 140 |
比较例1 | 1910 | 100 | 11.0 | <10 |
比较例2 | 800 | 70 | 7.0 | <10 |
比较例3 | 320 | 70 | 0.0 | 700 |
Mn(at%) | Ir(at%) | 熔点(℃) | 锻造温度(℃) | 压下率(%) | 实际应变速率(l/s) | |
实施例6 | 78.9 | 21.9 | 1520 | 1200 | 64.4 | 3.4×10-4 |
比较例4 | 78.4 | 21.6 | - | - | - | - |
比较例5 | 77.9 | 22.1 | - | - | - | - |
氧含量(wtppm) | 硫含量(wtppm) | 氧化物粒子数目 | 平均粒径(μm) | |
实施例6 | 70 | 50 | 0.0 | 150 |
比较例4 | 2870 | 160 | 15.0 | <10 |
比较例5 | 220 | 60 | 0.1 | 600 |
Mn(at%) | Ni(at%) | 熔点(℃) | 锻造温度(℃) | 压下率(%) | 实际应变速率(l/s) | |
实施例7 | 49.9 | 50.1 | 1060 | 950 | 61.2 | 5.3×10-4 |
比较例6 | 49.8 | 50.2 | - | - | - | - |
氧含量(wtppm) | 硫含量(wtppm) | 氧化物粒子数目 | 平均粒径(μm) | |
实施例7 | 20 | 80 | 0.0 | 60 |
比较例6 | 30 | 150 | 0.0 | 1000 |
结节数(20小时后) | 结节数(40小时后) | |
实施例1 | 7 | 16 |
实施例2 | 9 | 17 |
实施例3 | 22 | 28 |
实施例4 | 8 | 13 |
实施例5 | 11 | 14 |
比较例1 | 167 | 412 |
比较例2 | 98 | 359 |
比较例3 | 54 | 173 |
实施例6 | 3 | 7 |
比较例4 | 191 | 587 |
比较例5 | 35 | 144 |
实施例7 | 14 | 31 |
比较例6 | 43 | 165 |
Claims (16)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP116323/2001 | 2001-04-16 | ||
JP2001116323 | 2001-04-16 | ||
JP167040/2001 | 2001-06-01 | ||
JP2001167040A JP3973857B2 (ja) | 2001-04-16 | 2001-06-01 | マンガン合金スパッタリングターゲットの製造方法 |
PCT/JP2002/001341 WO2002086184A1 (fr) | 2001-04-16 | 2002-02-18 | Cible de pulverisation d'alliage de manganese et procede de production associe |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1503855A true CN1503855A (zh) | 2004-06-09 |
CN1311096C CN1311096C (zh) | 2007-04-18 |
Family
ID=26613615
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB028082893A Expired - Lifetime CN1311096C (zh) | 2001-04-16 | 2002-02-18 | 锰合金溅射靶及其制造方法 |
Country Status (8)
Country | Link |
---|---|
US (2) | US7229510B2 (zh) |
EP (2) | EP1568796B1 (zh) |
JP (1) | JP3973857B2 (zh) |
KR (1) | KR100598420B1 (zh) |
CN (1) | CN1311096C (zh) |
DE (1) | DE60208360T2 (zh) |
TW (1) | TWI227746B (zh) |
WO (1) | WO2002086184A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102877033A (zh) * | 2011-07-14 | 2013-01-16 | 北京有色金属研究总院 | 一种锰合金靶材及其制造方法 |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3973857B2 (ja) * | 2001-04-16 | 2007-09-12 | 日鉱金属株式会社 | マンガン合金スパッタリングターゲットの製造方法 |
CN100415929C (zh) * | 2003-01-22 | 2008-09-03 | 佳能株式会社 | 烧结体和用它的成膜方法 |
US20060226003A1 (en) * | 2003-01-22 | 2006-10-12 | John Mize | Apparatus and methods for ionized deposition of a film or thin layer |
US7454763B2 (en) | 2003-03-26 | 2008-11-18 | Microsoft Corporation | System and method for linking page content with a video media file and displaying the links |
JP2004319410A (ja) * | 2003-04-21 | 2004-11-11 | Mitsubishi Materials Corp | マイクロマシンスイッチの接触電極用薄膜およびこの接触電極用薄膜を形成するためのスパッタリングターゲット |
US20060078457A1 (en) * | 2004-10-12 | 2006-04-13 | Heraeus, Inc. | Low oxygen content alloy compositions |
US9659758B2 (en) * | 2005-03-22 | 2017-05-23 | Honeywell International Inc. | Coils utilized in vapor deposition applications and methods of production |
US20060278520A1 (en) * | 2005-06-13 | 2006-12-14 | Lee Eal H | Use of DC magnetron sputtering systems |
KR100757410B1 (ko) * | 2005-09-16 | 2007-09-11 | 삼성전자주식회사 | 상 변화 메모리 장치 및 그것의 프로그램 방법 |
JP4955008B2 (ja) * | 2006-10-03 | 2012-06-20 | Jx日鉱日石金属株式会社 | Cu−Mn合金スパッタリングターゲット及び半導体配線 |
US20080105542A1 (en) * | 2006-11-08 | 2008-05-08 | Purdy Clifford C | System and method of manufacturing sputtering targets |
US20090028744A1 (en) * | 2007-07-23 | 2009-01-29 | Heraeus, Inc. | Ultra-high purity NiPt alloys and sputtering targets comprising same |
WO2013038983A1 (ja) | 2011-09-14 | 2013-03-21 | Jx日鉱日石金属株式会社 | 高純度銅マンガン合金スパッタリングターゲット |
US9704695B2 (en) | 2011-09-30 | 2017-07-11 | Jx Nippon Mining & Metals Corporation | Sputtering target and manufacturing method therefor |
EP2767617A4 (en) | 2012-01-10 | 2015-06-24 | Jx Nippon Mining & Metals Corp | HIGH PURITY MANGANESE AND PROCESS FOR PREPARING THE SAME |
KR101620762B1 (ko) | 2012-01-23 | 2016-05-12 | 제이엑스 킨조쿠 가부시키가이샤 | 고순도 구리 망간 합금 스퍼터링 타깃 |
CN115094390A (zh) * | 2014-09-30 | 2022-09-23 | 捷客斯金属株式会社 | 溅射靶用母合金和溅射靶的制造方法 |
JP6626732B2 (ja) * | 2015-06-29 | 2019-12-25 | 山陽特殊製鋼株式会社 | スパッタリングターゲット材 |
US10166553B2 (en) | 2017-04-21 | 2019-01-01 | Xiamen Lota International., Ltd. | Diverter valve assembly |
US11183373B2 (en) | 2017-10-11 | 2021-11-23 | Honeywell International Inc. | Multi-patterned sputter traps and methods of making |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4131457A (en) * | 1977-10-11 | 1978-12-26 | Carpenter Technology Corporation | High-strength, high-expansion manganese alloy |
US4415529A (en) * | 1982-09-29 | 1983-11-15 | Unitika Ltd. | Mn-Based alloy of nonequilibrium austenite phase |
JPS61124566A (ja) | 1984-11-19 | 1986-06-12 | Mitsubishi Metal Corp | スパツタリング用Al−Si系合金タ−ゲツト板材の製造法 |
JPS63238268A (ja) | 1987-03-27 | 1988-10-04 | Hitachi Ltd | スパツタリング用タ−ゲツトの製造法 |
JP2791403B2 (ja) | 1989-11-27 | 1998-08-27 | 工業技術院長 | セラミックスの高速塑性成形法 |
JP2796752B2 (ja) | 1990-04-27 | 1998-09-10 | 日本軽金属株式会社 | 耐食皮膜用Al―Ni―Si合金製スパッタリングターゲット |
WO1998022636A1 (fr) | 1996-11-20 | 1998-05-28 | Kabushiki Kaisha Toshiba | Cible pour pulverisation, et film antiferromagnetique et element a effet magnetoresistant formes a l'aide de ladite cible |
US20030052000A1 (en) * | 1997-07-11 | 2003-03-20 | Vladimir Segal | Fine grain size material, sputtering target, methods of forming, and micro-arc reduction method |
TW470779B (en) * | 1997-07-28 | 2002-01-01 | Nippon Steel Welding Prod Eng | Iron base Si-Mn alloy or iron base Si-Mn-Ni alloy having good crushability and alloy powder thereof |
JP3544293B2 (ja) * | 1997-07-31 | 2004-07-21 | 株式会社日鉱マテリアルズ | 磁性材用Mn合金材料、Mn合金スパッタリングタ−ゲット及び磁性薄膜 |
JP4013999B2 (ja) | 1997-11-18 | 2007-11-28 | 日鉱金属株式会社 | 高純度Mn材料の製造方法 |
JP4197579B2 (ja) * | 1997-12-24 | 2008-12-17 | 株式会社東芝 | スパッタリングターゲットとそれを用いたAl配線膜の製造方法および電子部品の製造方法 |
JP3396420B2 (ja) | 1998-03-18 | 2003-04-14 | 株式会社ジャパンエナジー | 磁性薄膜形成用Mn−Ir合金スパッタリングターゲット及びMn−Ir合金磁性薄膜 |
KR20010034218A (ko) | 1998-11-20 | 2001-04-25 | 노미야마 아키히콰 | 코발트 - 티타늄 합금 스팟터링 타겟트 및 그 제조방법 |
JP4224880B2 (ja) | 1998-11-26 | 2009-02-18 | 日鉱金属株式会社 | Co−Ni合金スパッタリングターゲット及びその製造方法 |
JP2000239836A (ja) | 1999-02-23 | 2000-09-05 | Japan Energy Corp | 高純度銅または銅合金スパッタリングターゲットおよびその製造方法 |
US6423161B1 (en) * | 1999-10-15 | 2002-07-23 | Honeywell International Inc. | High purity aluminum materials |
JP3973857B2 (ja) * | 2001-04-16 | 2007-09-12 | 日鉱金属株式会社 | マンガン合金スパッタリングターゲットの製造方法 |
-
2001
- 2001-06-01 JP JP2001167040A patent/JP3973857B2/ja not_active Expired - Lifetime
-
2002
- 2002-02-18 KR KR1020037013496A patent/KR100598420B1/ko active IP Right Grant
- 2002-02-18 US US10/474,451 patent/US7229510B2/en not_active Expired - Lifetime
- 2002-02-18 CN CNB028082893A patent/CN1311096C/zh not_active Expired - Lifetime
- 2002-02-18 EP EP20050012256 patent/EP1568796B1/en not_active Expired - Lifetime
- 2002-02-18 EP EP02700590A patent/EP1380668B1/en not_active Expired - Lifetime
- 2002-02-18 WO PCT/JP2002/001341 patent/WO2002086184A1/ja active IP Right Grant
- 2002-02-18 DE DE60208360T patent/DE60208360T2/de not_active Expired - Lifetime
- 2002-03-15 TW TW091104965A patent/TWI227746B/zh not_active IP Right Cessation
-
2007
- 2007-03-19 US US11/687,765 patent/US7713364B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102877033A (zh) * | 2011-07-14 | 2013-01-16 | 北京有色金属研究总院 | 一种锰合金靶材及其制造方法 |
Also Published As
Publication number | Publication date |
---|---|
US7713364B2 (en) | 2010-05-11 |
WO2002086184A1 (fr) | 2002-10-31 |
CN1311096C (zh) | 2007-04-18 |
EP1568796A1 (en) | 2005-08-31 |
EP1380668B1 (en) | 2005-12-28 |
EP1380668A4 (en) | 2004-08-18 |
EP1380668A1 (en) | 2004-01-14 |
US7229510B2 (en) | 2007-06-12 |
KR20030092071A (ko) | 2003-12-03 |
EP1568796B1 (en) | 2015-05-20 |
KR100598420B1 (ko) | 2006-07-10 |
DE60208360D1 (de) | 2006-02-02 |
TWI227746B (en) | 2005-02-11 |
US20070163878A1 (en) | 2007-07-19 |
JP2003003256A (ja) | 2003-01-08 |
DE60208360T2 (de) | 2006-08-03 |
JP3973857B2 (ja) | 2007-09-12 |
US20040103750A1 (en) | 2004-06-03 |
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