CN1210764C - Cvd方法 - Google Patents
Cvd方法 Download PDFInfo
- Publication number
- CN1210764C CN1210764C CNB021062137A CN02106213A CN1210764C CN 1210764 C CN1210764 C CN 1210764C CN B021062137 A CNB021062137 A CN B021062137A CN 02106213 A CN02106213 A CN 02106213A CN 1210764 C CN1210764 C CN 1210764C
- Authority
- CN
- China
- Prior art keywords
- space
- film
- material gas
- film forming
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
- C23C16/402—Silicon dioxide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45514—Mixing in close vicinity to the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Liquid Crystal (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001038631A JP2002246381A (ja) | 2001-02-15 | 2001-02-15 | Cvd方法 |
| JP038631/2001 | 2001-02-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1372302A CN1372302A (zh) | 2002-10-02 |
| CN1210764C true CN1210764C (zh) | 2005-07-13 |
Family
ID=18901567
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB021062137A Expired - Fee Related CN1210764C (zh) | 2001-02-15 | 2002-02-10 | Cvd方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6537911B2 (enExample) |
| JP (1) | JP2002246381A (enExample) |
| KR (2) | KR20020067647A (enExample) |
| CN (1) | CN1210764C (enExample) |
| TW (1) | TW529086B (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3991315B2 (ja) * | 2002-09-17 | 2007-10-17 | キヤノンアネルバ株式会社 | 薄膜形成装置及び方法 |
| JP4051619B2 (ja) * | 2002-09-17 | 2008-02-27 | キヤノンアネルバ株式会社 | シリコン酸化膜作製方法 |
| US7023010B2 (en) * | 2003-04-21 | 2006-04-04 | Nanodynamics, Inc. | Si/C superlattice useful for semiconductor devices |
| KR20070065443A (ko) * | 2004-10-19 | 2007-06-22 | 미쓰비시덴키 가부시키가이샤 | 플라즈마 cvd 장치 |
| US20060223788A1 (en) * | 2005-03-29 | 2006-10-05 | Cathcart Clifton H | Analgesic composition for topical use |
| WO2008117832A1 (ja) * | 2007-03-27 | 2008-10-02 | Canon Anelva Corporation | 真空処理装置 |
| JP5276101B2 (ja) * | 2008-06-24 | 2013-08-28 | 東芝三菱電機産業システム株式会社 | 窒素ラジカル発生器、窒化処理装置、窒素ラジカルの発生方法および窒化処理方法 |
| US8580993B2 (en) * | 2008-11-12 | 2013-11-12 | Air Products And Chemicals, Inc. | Amino vinylsilane precursors for stressed SiN films |
| US8889235B2 (en) | 2009-05-13 | 2014-11-18 | Air Products And Chemicals, Inc. | Dielectric barrier deposition using nitrogen containing precursor |
| US10039157B2 (en) | 2014-06-02 | 2018-07-31 | Applied Materials, Inc. | Workpiece processing chamber having a rotary microwave plasma source |
| US10269541B2 (en) * | 2014-06-02 | 2019-04-23 | Applied Materials, Inc. | Workpiece processing chamber having a thermal controlled microwave window |
| US11222769B2 (en) | 2017-05-26 | 2022-01-11 | Applied Materials, Inc. | Monopole antenna array source with gas supply or grid filter for semiconductor process equipment |
| KR102670124B1 (ko) | 2018-05-03 | 2024-05-28 | 주성엔지니어링(주) | 기판 처리 장치 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2506539B2 (ja) * | 1992-02-27 | 1996-06-12 | 株式会社ジーティシー | 絶縁膜の形成方法 |
| US5865896A (en) * | 1993-08-27 | 1999-02-02 | Applied Materials, Inc. | High density plasma CVD reactor with combined inductive and capacitive coupling |
| US5614055A (en) * | 1993-08-27 | 1997-03-25 | Applied Materials, Inc. | High density plasma CVD and etching reactor |
| US6151071A (en) * | 1996-02-29 | 2000-11-21 | Eastman Kodak Company | Circuit for generating control signals |
| US6125859A (en) * | 1997-03-05 | 2000-10-03 | Applied Materials, Inc. | Method for improved cleaning of substrate processing systems |
| US6063441A (en) * | 1997-12-02 | 2000-05-16 | Applied Materials, Inc. | Processing chamber and method for confining plasma |
| JP2000345349A (ja) * | 1999-06-04 | 2000-12-12 | Anelva Corp | Cvd装置 |
| JP2001023918A (ja) * | 1999-07-08 | 2001-01-26 | Nec Corp | 半導体薄膜形成装置 |
-
2001
- 2001-02-15 JP JP2001038631A patent/JP2002246381A/ja not_active Abandoned
-
2002
- 2002-02-08 TW TW091102487A patent/TW529086B/zh active
- 2002-02-10 CN CNB021062137A patent/CN1210764C/zh not_active Expired - Fee Related
- 2002-02-13 US US10/073,228 patent/US6537911B2/en not_active Expired - Fee Related
- 2002-02-14 KR KR1020020007897A patent/KR20020067647A/ko not_active Ceased
-
2009
- 2009-07-28 KR KR1020090069040A patent/KR20090092257A/ko not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US20020110998A1 (en) | 2002-08-15 |
| KR20090092257A (ko) | 2009-08-31 |
| US6537911B2 (en) | 2003-03-25 |
| KR20020067647A (ko) | 2002-08-23 |
| JP2002246381A (ja) | 2002-08-30 |
| CN1372302A (zh) | 2002-10-02 |
| TW529086B (en) | 2003-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20250357114A1 (en) | Method of forming low-k material layer, structure including the layer, and system for forming same | |
| CN100390943C (zh) | 薄膜形成装置及形成方法 | |
| CN1210764C (zh) | Cvd方法 | |
| US7825038B2 (en) | Chemical vapor deposition of high quality flow-like silicon dioxide using a silicon containing precursor and atomic oxygen | |
| US5387546A (en) | Method for manufacturing a semiconductor device | |
| US10177025B2 (en) | Method and apparatus for filling a gap | |
| TWI535882B (zh) | 使用非碳可流動cvd製程形成氧化矽的方法 | |
| KR101533464B1 (ko) | 박막 증착 장치, 박막 증착 방법 및 컴퓨터로 판독가능한 기억 매체 | |
| US8765573B2 (en) | Air gap formation | |
| JP2004047996A (ja) | 窒素がドープされたシリコンカーバイド膜の蒸着方法 | |
| CN1428825A (zh) | 氧化硅膜制作方法 | |
| US8921235B2 (en) | Controlled air gap formation | |
| JP2017531920A (ja) | 高温酸化ケイ素原子層堆積技術 | |
| CN1898409A (zh) | 形成高质量低温氮化硅层的方法和设备 | |
| TW201518535A (zh) | 以電漿輔助製程形成氧化物膜的方法 | |
| KR20130014543A (ko) | 라디칼 성분 cvd에 의한 컨포멀 층들 | |
| CN1791972A (zh) | 等离子体处理装置 | |
| CN1831192A (zh) | 半导体处理用成膜方法、成膜装置和存储介质 | |
| KR20100027062A (ko) | 활성화 가스 인젝터, 성막 장치 및 성막 방법 | |
| JP2013026479A (ja) | 原子層成長方法及び原子層成長装置 | |
| TW201137976A (en) | Chemical vapor deposition improvements through radical-component modification | |
| EP2024532A2 (en) | Chemical vapor deposition of high quality flow-like silicon dioxide using a silicon containing precursor and atomic oxygen | |
| CN107408493A (zh) | 脉冲氮化物封装 | |
| CN1831191A (zh) | 半导体处理用的成膜方法及装置 | |
| CN101167177A (zh) | 制造受应力电晶体结构的集成制程 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20050713 Termination date: 20170210 |