CN117836612A - 透光性层叠体的检查方法及检查装置 - Google Patents

透光性层叠体的检查方法及检查装置 Download PDF

Info

Publication number
CN117836612A
CN117836612A CN202280057312.9A CN202280057312A CN117836612A CN 117836612 A CN117836612 A CN 117836612A CN 202280057312 A CN202280057312 A CN 202280057312A CN 117836612 A CN117836612 A CN 117836612A
Authority
CN
China
Prior art keywords
light
transmitting laminate
laminate
transmitting
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280057312.9A
Other languages
English (en)
Chinese (zh)
Inventor
自然浩次
山下裕司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Publication of CN117836612A publication Critical patent/CN117836612A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202280057312.9A 2021-08-25 2022-06-23 透光性层叠体的检查方法及检查装置 Pending CN117836612A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021136809A JP7596234B2 (ja) 2021-08-25 2021-08-25 光透過性積層体の検査方法および検査装置
JP2021-136809 2021-08-25
PCT/JP2022/025044 WO2023026660A1 (ja) 2021-08-25 2022-06-23 光透過性積層体の検査方法および検査装置

Publications (1)

Publication Number Publication Date
CN117836612A true CN117836612A (zh) 2024-04-05

Family

ID=85322709

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280057312.9A Pending CN117836612A (zh) 2021-08-25 2022-06-23 透光性层叠体的检查方法及检查装置

Country Status (5)

Country Link
JP (2) JP7596234B2 (enExample)
KR (1) KR20240047381A (enExample)
CN (1) CN117836612A (enExample)
TW (1) TW202309512A (enExample)
WO (1) WO2023026660A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119375253A (zh) * 2024-12-30 2025-01-28 华翌智能装备(杭州)有限公司 一种基于aoi视觉检查的电路板自动检测装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06174650A (ja) * 1992-12-01 1994-06-24 Sony Corp 表示パネル外観検査装置
NL1006378C2 (nl) 1997-06-23 1998-12-24 Tno Werkwijze en inrichting voor het inspecteren van een voorwerp met betrekking tot verstoringen.
JP2001264259A (ja) 2000-03-16 2001-09-26 Konica Corp シート検査装置
JP4670090B2 (ja) 2000-08-11 2011-04-13 味の素株式会社 可撓性プラスチック容器の異物検査装置及びその異物検査方法
JP4560916B2 (ja) 2000-08-11 2010-10-13 味の素株式会社 可撓性プラスチック容器の異物検査装置
JP2004077261A (ja) * 2002-08-16 2004-03-11 Horiba Ltd 液晶パネルの異物検査装置および異物検査方法
JP2005062165A (ja) 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP2005134573A (ja) 2003-10-29 2005-05-26 Seiko Epson Corp 検査方法および検査装置
KR100789659B1 (ko) 2005-03-31 2007-12-31 에버테크노 주식회사 편광필름 검사장치 및 방법
JP2007163315A (ja) * 2005-12-14 2007-06-28 Tokuyama Corp 透明材料中の欠陥の形状及び位置の計測方法
JP2012002676A (ja) 2010-06-17 2012-01-05 Toshiba Corp マスク欠陥検査装置およびマスク欠陥検査方法
JP2014119255A (ja) * 2012-12-13 2014-06-30 Mitsubishi Electric Corp 光学フィルムの検査装置および光学フィルムの検査方法
US9816940B2 (en) 2015-01-21 2017-11-14 Kla-Tencor Corporation Wafer inspection with focus volumetric method
CN110998298B (zh) * 2017-08-24 2023-01-06 日本电气硝子株式会社 板状玻璃的制造方法

Also Published As

Publication number Publication date
JP2025019281A (ja) 2025-02-06
KR20240047381A (ko) 2024-04-12
JP7596234B2 (ja) 2024-12-09
WO2023026660A1 (ja) 2023-03-02
TW202309512A (zh) 2023-03-01
JP2023031371A (ja) 2023-03-09

Similar Documents

Publication Publication Date Title
JP7766141B2 (ja) 光透過性積層体の製造方法
JP6529250B2 (ja) 光学表示パネルの製造方法および光学表示パネルの製造システム
CN102043277B (zh) 信息存储读出运算系统及其制造方法
TW201113598A (en) Method and system for continuously manufacturing liquid-crystal display element
JP7383559B2 (ja) 光学フィルムの検査方法及び光学フィルムの製造方法
CN110873918B (zh) 光学膜
CN102057415A (zh) 光学显示装置的制造方法
JP2025019281A (ja) 光透過性積層体の検査方法および検査装置
JP6826886B2 (ja) 偏光板、及び、液晶パネルの製造方法
CN103403586B (zh) 光学膜片的切割装置及光学膜片的切割方法
WO2015029998A1 (ja) フィルム貼合装置、光学表示デバイスの生産システム及び光学表示デバイスの生産方法
JP2019109532A (ja) 光学表示パネルの製造方法および光学表示パネルの製造システム
JP2010127910A (ja) フィルムの検査装置及びこれを備えた光透過性のフィルムの製造装置、並びにフィルムの検査方法及びこれを用いた光透過性のフィルムの製造方法
JP2010044304A (ja) 保護フィルムを有する基体の検査方法
JP2010127909A (ja) フィルムの検査装置及びこれを備えた光透過性のフィルムの製造装置、並びにフィルムの検査方法及びこれを用いた光透過性のフィルムの製造方法
JP2023031371A5 (enExample)
KR20230029821A (ko) 용제 적층된 리타더 스택의 정밀 제조를 위한 장비 및 공정
TWI875870B (zh) 測量方法、管理方法及光學零件的製造方法
CN112924458A (zh) 检查方法、光学膜检查装置以及光学部件的制造方法
KR20250151141A (ko) 광학 필름의 검사 장치, 검사 방법 및 제조 방법
CN115867780A (zh) 检查方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination