TW202309512A - 光透射性積層體之檢查方法及檢查裝置 - Google Patents

光透射性積層體之檢查方法及檢查裝置 Download PDF

Info

Publication number
TW202309512A
TW202309512A TW111127766A TW111127766A TW202309512A TW 202309512 A TW202309512 A TW 202309512A TW 111127766 A TW111127766 A TW 111127766A TW 111127766 A TW111127766 A TW 111127766A TW 202309512 A TW202309512 A TW 202309512A
Authority
TW
Taiwan
Prior art keywords
light
laminate
transmitting
transmissive
holding member
Prior art date
Application number
TW111127766A
Other languages
English (en)
Chinese (zh)
Inventor
自然浩次
山下裕司
Original Assignee
日商日東電工股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日東電工股份有限公司 filed Critical 日商日東電工股份有限公司
Publication of TW202309512A publication Critical patent/TW202309512A/zh

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW111127766A 2021-08-25 2022-07-25 光透射性積層體之檢查方法及檢查裝置 TW202309512A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021136809A JP7596234B2 (ja) 2021-08-25 2021-08-25 光透過性積層体の検査方法および検査装置
JP2021-136809 2021-08-25

Publications (1)

Publication Number Publication Date
TW202309512A true TW202309512A (zh) 2023-03-01

Family

ID=85322709

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111127766A TW202309512A (zh) 2021-08-25 2022-07-25 光透射性積層體之檢查方法及檢查裝置

Country Status (5)

Country Link
JP (2) JP7596234B2 (enExample)
KR (1) KR20240047381A (enExample)
CN (1) CN117836612A (enExample)
TW (1) TW202309512A (enExample)
WO (1) WO2023026660A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119375253A (zh) * 2024-12-30 2025-01-28 华翌智能装备(杭州)有限公司 一种基于aoi视觉检查的电路板自动检测装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06174650A (ja) * 1992-12-01 1994-06-24 Sony Corp 表示パネル外観検査装置
NL1006378C2 (nl) 1997-06-23 1998-12-24 Tno Werkwijze en inrichting voor het inspecteren van een voorwerp met betrekking tot verstoringen.
JP2001264259A (ja) 2000-03-16 2001-09-26 Konica Corp シート検査装置
JP4670090B2 (ja) 2000-08-11 2011-04-13 味の素株式会社 可撓性プラスチック容器の異物検査装置及びその異物検査方法
JP4560916B2 (ja) 2000-08-11 2010-10-13 味の素株式会社 可撓性プラスチック容器の異物検査装置
JP2004077261A (ja) * 2002-08-16 2004-03-11 Horiba Ltd 液晶パネルの異物検査装置および異物検査方法
JP2005062165A (ja) 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP2005134573A (ja) 2003-10-29 2005-05-26 Seiko Epson Corp 検査方法および検査装置
KR100789659B1 (ko) 2005-03-31 2007-12-31 에버테크노 주식회사 편광필름 검사장치 및 방법
JP2007163315A (ja) * 2005-12-14 2007-06-28 Tokuyama Corp 透明材料中の欠陥の形状及び位置の計測方法
JP2012002676A (ja) 2010-06-17 2012-01-05 Toshiba Corp マスク欠陥検査装置およびマスク欠陥検査方法
JP2014119255A (ja) * 2012-12-13 2014-06-30 Mitsubishi Electric Corp 光学フィルムの検査装置および光学フィルムの検査方法
US9816940B2 (en) 2015-01-21 2017-11-14 Kla-Tencor Corporation Wafer inspection with focus volumetric method
CN110998298B (zh) * 2017-08-24 2023-01-06 日本电气硝子株式会社 板状玻璃的制造方法

Also Published As

Publication number Publication date
CN117836612A (zh) 2024-04-05
JP2025019281A (ja) 2025-02-06
KR20240047381A (ko) 2024-04-12
JP7596234B2 (ja) 2024-12-09
WO2023026660A1 (ja) 2023-03-02
JP2023031371A (ja) 2023-03-09

Similar Documents

Publication Publication Date Title
JP7498815B2 (ja) 光透過性積層体
JP5924511B2 (ja) 光学フィルム貼付位置測定装置
TW201113598A (en) Method and system for continuously manufacturing liquid-crystal display element
JP2016118580A (ja) 光学表示パネルの製造方法および光学表示パネルの製造システム
JP2021135219A5 (enExample)
JP2015225041A (ja) 積層偏光フィルムの欠陥検査方法
JP2025019281A (ja) 光透過性積層体の検査方法および検査装置
JP2005009919A (ja) 保護膜付き偏光板の検査装置および検査方法
JP7288989B1 (ja) 長尺光学フィルムの検査方法
WO2015029998A1 (ja) フィルム貼合装置、光学表示デバイスの生産システム及び光学表示デバイスの生産方法
JP2019109532A (ja) 光学表示パネルの製造方法および光学表示パネルの製造システム
JP2023031371A5 (enExample)
WO2023021854A1 (ja) 光透過性積層体の検査方法
JP7413210B2 (ja) 検査方法
JP7413211B2 (ja) 検査方法
KR20210070930A (ko) 검사 방법, 광학 필름 검사 장치 및 광학 부품의 제조 방법
KR20250151141A (ko) 광학 필름의 검사 장치, 검사 방법 및 제조 방법
KR101385024B1 (ko) 편광 필름 검사 방법 및 이를 수행하기 위한 장치
TW202129254A (zh) 測量方法、管理方法及光學零件的製造方法
JP2010091534A (ja) 多層基板の放射線透過画像撮像装置および放射線透過画像撮像方法ならびにそれに用いる基板固定用治具
JP2007017368A (ja) 画像測定装置