CN111684269B - 异物的检查方法、检查装置、薄膜辊以及薄膜辊的制造方法 - Google Patents

异物的检查方法、检查装置、薄膜辊以及薄膜辊的制造方法 Download PDF

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CN111684269B
CN111684269B CN201980012240.4A CN201980012240A CN111684269B CN 111684269 B CN111684269 B CN 111684269B CN 201980012240 A CN201980012240 A CN 201980012240A CN 111684269 B CN111684269 B CN 111684269B
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foreign matter
film
film roll
foreign
inspection
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CN111684269A (zh
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渡边充
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Toray Industries Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/61—Specific applications or type of materials thin films, coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/623—Specific applications or type of materials plastics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/642—Specific applications or type of materials moving sheet, web
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/66—Specific applications or type of materials multiple steps inspection, e.g. coarse/fine
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Toxicology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201980012240.4A 2018-03-15 2019-03-12 异物的检查方法、检查装置、薄膜辊以及薄膜辊的制造方法 Expired - Fee Related CN111684269B (zh)

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JP2018047922 2018-03-15
JP2018-047922 2018-03-15
PCT/JP2019/009885 WO2019176903A1 (ja) 2018-03-15 2019-03-12 異物の検査方法、検査装置、フィルムロール及びフィルムロールの製造方法

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CN111684269B true CN111684269B (zh) 2022-12-30

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US (1) US20200348242A1 (https=)
EP (1) EP3767284A4 (https=)
JP (1) JP7218723B2 (https=)
KR (1) KR20200131215A (https=)
CN (1) CN111684269B (https=)
WO (1) WO2019176903A1 (https=)

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JP2019175363A (ja) * 2018-03-29 2019-10-10 住友化学株式会社 画像処理装置、異物検査装置、画像処理方法、および異物検査方法
JP7390617B2 (ja) * 2020-03-09 2023-12-04 パナソニックＩｐマネジメント株式会社 学習済みモデルの生成方法、装置、及びプログラム
JP7647551B2 (ja) * 2020-08-26 2025-03-18 東レ株式会社 フィルム製品リールの放射線透過検査装置およびこれを用いたフィルム製品リールの製造方法、ならびにフィルム製品リールの放射線透過方法
JP2022069392A (ja) * 2020-10-23 2022-05-11 東レ株式会社 巻回体の内層シワ検査装置、巻回体の内層シワ検査方法及びウェブ巻回体の製造方法
CN113805242B (zh) * 2021-08-25 2024-07-12 浙江大华技术股份有限公司 安检机射线源控制方法、装置、计算机设备和存储介质
TWI767828B (zh) * 2021-08-27 2022-06-11 開必拓數據股份有限公司 應用於具有卷對卷機構的設備的馬達控制系統
CN115876787A (zh) * 2021-08-27 2023-03-31 开必拓数据股份有限公司 应用于具有卷对卷机构的设备的马达控制系统
CN114048422B (zh) * 2021-09-26 2026-03-24 东软睿驰汽车技术（沈阳）有限公司 电池异物检测方法、装置及存储介质
KR102661396B1 (ko) 2021-11-08 2024-04-29 주식회사 엘지에너지솔루션 합권취 전극의 롤맵 생성장치
KR20240169596A (ko) * 2022-03-31 2024-12-03 도레이 카부시키가이샤 검사 장치 및 검사 방법
JP2024073808A (ja) * 2022-11-18 2024-05-30 コニカミノルタ株式会社 製造管理システム、及び製造管理方法
US20240310307A1 (en) * 2023-03-17 2024-09-19 Curpow Inc. System and method for x-ray imaging of battery layers during manufacturing
US20250054125A1 (en) * 2023-08-10 2025-02-13 Schlumberger Technology Corporation Enhanced imaging analysis for three-dimensional scan acquisition and fiber/wire separation
JP2025072964A (ja) * 2023-10-25 2025-05-12 株式会社日立ハイテクサイエンス Ｘ線分析装置
KR102743309B1 (ko) 2024-04-17 2024-12-16 (주)신명엔지니어링 재권취를 통한 롤 검사 장치
CN119334969A (zh) * 2024-11-13 2025-01-21 上海恩捷新材料科技有限公司 一种用于隔膜缺陷检测系统及其方法
CN119880373B (zh) * 2025-03-28 2025-07-08 爱克斯瑞真空技术（苏州）有限公司 一种x射线管焦点校验仪及采用该装置的校验方法

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JPS58173456A (ja) * 1982-04-05 1983-10-12 Showa Electric Wire & Cable Co Ltd 異物自動検査装置
US4807270A (en) * 1985-10-22 1989-02-21 Thomson-Csf Radiological scanning apparatus
JP2001041898A (ja) * 1999-07-27 2001-02-16 Mitsubishi Chemicals Corp ロール状フィルムの欠陥検出装置及び欠陥検出方法
JP2005062042A (ja) * 2003-08-15 2005-03-10 Sony Corp Ｘ線断層撮像装置及び方法
JP2008051583A (ja) * 2006-08-23 2008-03-06 Kokusai Gijutsu Kaihatsu Co Ltd 検査装置
CN104737003A (zh) * 2012-10-17 2015-06-24 世高株式会社 包装体的检查装置
JP2015044602A (ja) * 2013-08-27 2015-03-12 株式会社フジシールインターナショナル ラベル連続体の継ぎ目検知方法、及びラベル連続体

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WO2019176903A1 (ja) 2019-09-19
JP7218723B2 (ja) 2023-02-07
KR20200131215A (ko) 2020-11-23
EP3767284A4 (en) 2021-12-01
JPWO2019176903A1 (ja) 2021-02-04
EP3767284A1 (en) 2021-01-20
CN111684269A (zh) 2020-09-18
US20200348242A1 (en) 2020-11-05

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