JP7218723B2 - 異物の検査方法、検査装置、フィルムロール及びフィルムロールの製造方法 - Google Patents

異物の検査方法、検査装置、フィルムロール及びフィルムロールの製造方法 Download PDF

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JP7218723B2
JP7218723B2 JP2019523885A JP2019523885A JP7218723B2 JP 7218723 B2 JP7218723 B2 JP 7218723B2 JP 2019523885 A JP2019523885 A JP 2019523885A JP 2019523885 A JP2019523885 A JP 2019523885A JP 7218723 B2 JP7218723 B2 JP 7218723B2
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foreign matter
film
film roll
inspection
winding
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充 渡辺
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Toray Industries Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/61—Specific applications or type of materials thin films, coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/623—Specific applications or type of materials plastics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/642—Specific applications or type of materials moving sheet, web
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/66—Specific applications or type of materials multiple steps inspection, e.g. coarse/fine
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Toxicology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2019523885A 2018-03-15 2019-03-12 異物の検査方法、検査装置、フィルムロール及びフィルムロールの製造方法 Active JP7218723B2 (ja)

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JP2018047922 2018-03-15
JP2018047922 2018-03-15
PCT/JP2019/009885 WO2019176903A1 (ja) 2018-03-15 2019-03-12 異物の検査方法、検査装置、フィルムロール及びフィルムロールの製造方法

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JPWO2019176903A1 JPWO2019176903A1 (ja) 2021-02-04
JPWO2019176903A5 JPWO2019176903A5 (https=) 2022-02-16
JP7218723B2 true JP7218723B2 (ja) 2023-02-07

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US (1) US20200348242A1 (https=)
EP (1) EP3767284A4 (https=)
JP (1) JP7218723B2 (https=)
KR (1) KR20200131215A (https=)
CN (1) CN111684269B (https=)
WO (1) WO2019176903A1 (https=)

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JP2019175363A (ja) * 2018-03-29 2019-10-10 住友化学株式会社 画像処理装置、異物検査装置、画像処理方法、および異物検査方法
JP7390617B2 (ja) * 2020-03-09 2023-12-04 パナソニックＩｐマネジメント株式会社 学習済みモデルの生成方法、装置、及びプログラム
JP7647551B2 (ja) * 2020-08-26 2025-03-18 東レ株式会社 フィルム製品リールの放射線透過検査装置およびこれを用いたフィルム製品リールの製造方法、ならびにフィルム製品リールの放射線透過方法
JP2022069392A (ja) * 2020-10-23 2022-05-11 東レ株式会社 巻回体の内層シワ検査装置、巻回体の内層シワ検査方法及びウェブ巻回体の製造方法
CN113805242B (zh) * 2021-08-25 2024-07-12 浙江大华技术股份有限公司 安检机射线源控制方法、装置、计算机设备和存储介质
TWI767828B (zh) * 2021-08-27 2022-06-11 開必拓數據股份有限公司 應用於具有卷對卷機構的設備的馬達控制系統
CN115876787A (zh) * 2021-08-27 2023-03-31 开必拓数据股份有限公司 应用于具有卷对卷机构的设备的马达控制系统
CN114048422B (zh) * 2021-09-26 2026-03-24 东软睿驰汽车技术（沈阳）有限公司 电池异物检测方法、装置及存储介质
KR102661396B1 (ko) 2021-11-08 2024-04-29 주식회사 엘지에너지솔루션 합권취 전극의 롤맵 생성장치
KR20240169596A (ko) * 2022-03-31 2024-12-03 도레이 카부시키가이샤 검사 장치 및 검사 방법
JP2024073808A (ja) * 2022-11-18 2024-05-30 コニカミノルタ株式会社 製造管理システム、及び製造管理方法
US20240310307A1 (en) * 2023-03-17 2024-09-19 Curpow Inc. System and method for x-ray imaging of battery layers during manufacturing
US20250054125A1 (en) * 2023-08-10 2025-02-13 Schlumberger Technology Corporation Enhanced imaging analysis for three-dimensional scan acquisition and fiber/wire separation
JP2025072964A (ja) * 2023-10-25 2025-05-12 株式会社日立ハイテクサイエンス Ｘ線分析装置
KR102743309B1 (ko) 2024-04-17 2024-12-16 (주)신명엔지니어링 재권취를 통한 롤 검사 장치
CN119334969A (zh) * 2024-11-13 2025-01-21 上海恩捷新材料科技有限公司 一种用于隔膜缺陷检测系统及其方法
CN119880373B (zh) * 2025-03-28 2025-07-08 爱克斯瑞真空技术（苏州）有限公司 一种x射线管焦点校验仪及采用该装置的校验方法

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JP2001041898A (ja) 1999-07-27 2001-02-16 Mitsubishi Chemicals Corp ロール状フィルムの欠陥検出装置及び欠陥検出方法
JP2003315275A (ja) 2002-04-26 2003-11-06 Daio Paper Corp シートロールの検査装置、シートロール包装品の検査装置、シートロール及びシートロール包装品
WO2006137385A1 (ja) 2005-06-21 2006-12-28 Gunze Limited フィルム検査装置およびフィルム検査方法
JP2008051583A (ja) 2006-08-23 2008-03-06 Kokusai Gijutsu Kaihatsu Co Ltd 検査装置
US20090088889A1 (en) 2007-09-27 2009-04-02 Ake Hellstrom Accurate Tracking Of Web Features Through Converting Processes
JP2010534834A (ja) 2007-07-26 2010-11-11 スリーエム イノベイティブ プロパティズ カンパニー マルチユニットプロセスの空間的同期化のための基準マーキング
JP2016525691A (ja) 2013-08-01 2016-08-25 ショット アクチエンゲゼルシャフトＳｃｈｏｔｔ ＡＧ 少なくとも部分的に透明な硬脆材料または破砕性材料から成るテープロールにおける欠陥を検出する方法および装置ならびにその使用
JP2017049250A (ja) 2015-09-02 2017-03-09 トレスター・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツング・ウント・コンパニー・コマンデイトゲゼルシャフト 弾性ゴム又は合成樹脂から成る本質的な構成要素を有するストリップ状の材料を放射線透視式に検査するための装置及び方法
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JP2001041898A (ja) 1999-07-27 2001-02-16 Mitsubishi Chemicals Corp ロール状フィルムの欠陥検出装置及び欠陥検出方法
JP2003315275A (ja) 2002-04-26 2003-11-06 Daio Paper Corp シートロールの検査装置、シートロール包装品の検査装置、シートロール及びシートロール包装品
WO2006137385A1 (ja) 2005-06-21 2006-12-28 Gunze Limited フィルム検査装置およびフィルム検査方法
JP2008051583A (ja) 2006-08-23 2008-03-06 Kokusai Gijutsu Kaihatsu Co Ltd 検査装置
JP2010534834A (ja) 2007-07-26 2010-11-11 スリーエム イノベイティブ プロパティズ カンパニー マルチユニットプロセスの空間的同期化のための基準マーキング
US20090088889A1 (en) 2007-09-27 2009-04-02 Ake Hellstrom Accurate Tracking Of Web Features Through Converting Processes
JP2016525691A (ja) 2013-08-01 2016-08-25 ショット アクチエンゲゼルシャフトＳｃｈｏｔｔ ＡＧ 少なくとも部分的に透明な硬脆材料または破砕性材料から成るテープロールにおける欠陥を検出する方法および装置ならびにその使用
JP2017049250A (ja) 2015-09-02 2017-03-09 トレスター・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツング・ウント・コンパニー・コマンデイトゲゼルシャフト 弾性ゴム又は合成樹脂から成る本質的な構成要素を有するストリップ状の材料を放射線透視式に検査するための装置及び方法
JP2017058336A (ja) 2015-09-18 2017-03-23 住友化学株式会社 フィルム製造方法及びフィルム製造装置

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WO2019176903A1 (ja) 2019-09-19
CN111684269B (zh) 2022-12-30
KR20200131215A (ko) 2020-11-23
EP3767284A4 (en) 2021-12-01
JPWO2019176903A1 (ja) 2021-02-04
EP3767284A1 (en) 2021-01-20
CN111684269A (zh) 2020-09-18
US20200348242A1 (en) 2020-11-05

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