CN110857963A

CN110857963A - Inspection tool, inspection unit, and detection device

Info

Publication number: CN110857963A
Application number: CN201910332549.3A
Authority: CN
Inventors: 笹野直哉; 寺西宏真; 酒井贵浩
Original assignee: Omron Corp
Current assignee: Omron Corp
Priority date: 2018-08-09
Filing date: 2019-04-24
Publication date: 2020-03-03
Anticipated expiration: 2039-04-24
Also published as: JP7110817B2; KR102148842B1; KR20200018221A; TW202009489A; CN110857963B; TWI709749B; CN114690049A; JP2020026972A

Abstract

The invention provides an inspection instrument capable of coping with miniaturization. The inspection instrument includes: the power supply device includes a housing having at least three housing sections therein, and a first power supply terminal, a signal terminal, and a second power supply terminal that are housed in the housing sections, respectively, with both ends in an extending direction exposed to the outside of the housing. The first power supply terminal, the signal terminal, and the second power supply terminal are each constituted by at least one plate-shaped probe that is extendable and retractable in the extension direction, and the probes are arranged in series in the plate thickness direction so that the plate surfaces thereof face each other. The signal terminal is disposed between the first power supply terminal and the second power supply terminal in the thickness direction of the probe.

Description

Inspection tool, inspection unit, and detection device

Technical Field

The present invention relates to an inspection device capable of inspecting an object to be inspected (for example, an electronic component module such as a battery module), an inspection unit provided with the inspection device, and an inspection apparatus provided with the inspection unit.

Background

In an electronic component module such as a battery module, a conduction test, an operation characteristic test, and the like are generally performed in a manufacturing process thereof. These inspections are generally performed by connecting an inspection apparatus and an electronic component module using an inspection device in which a plurality of probes are housed.

As such a probe, there is a pogo pin (pogo pin) type probe described in patent document 1. The probe is provided with: the plug portion has a contact terminal and a plug body portion provided coaxially with the contact terminal, and a cylinder portion provided on an outer peripheral side of the plug portion.

Patent document

Patent document 1: japanese unexamined patent application publication No. 2016-142644

In recent years, electronic component modules have been increasingly downsized, and inspection tools for inspecting electronic component modules are also required to be downsized.

In general, as miniaturization is advanced, a pogo pin type probe such as the above-described probe is more likely to be damaged as its rigidity is lower. Therefore, there is a possibility that the inspection device using the probe cannot cope with miniaturization.

Disclosure of Invention

The invention aims to provide an inspection instrument, an inspection unit and an inspection device which can be applied to miniaturization.

An inspection instrument according to an example of the present invention includes: a housing having at least three receiving portions therein; and a first power supply terminal, a signal terminal, and a second power supply terminal that are respectively housed in the housing sections with both ends in an extending direction exposed to the outside of the case, wherein each of the first power supply terminal, the signal terminal, and the second power supply terminal is formed of at least one plate-like probe that is stretchable in the extending direction, the probes constituting the first power supply terminal, the signal terminal, and the second power supply terminal are arranged in series in a plate thickness direction with plate surfaces thereof facing each other, and the signal terminal is arranged between the first power supply terminal and the second power supply terminal in the plate thickness direction.

In addition, an inspection unit according to an example of the present invention includes at least one inspection tool.

The inspection apparatus according to an example of the present invention includes at least one inspection unit.

According to the inspection tool, the first power supply terminal, the signal terminal, and the second power supply terminal are respectively housed in the at least three housing portions in a state where both end portions in the extending direction are exposed to the outside of the case, and the first power supply terminal, the signal terminal, and the second power supply terminal are respectively constituted by at least one plate-like probe. That is, since the first power supply terminal, the signal terminal, and the second power supply terminal are each formed of a plate-like probe whose rigidity is not easily lowered even when the probe is miniaturized, it is possible to realize an inspection instrument that can cope with miniaturization.

According to the inspection unit, an inspection unit capable of inspecting a smaller electronic component module by the inspection tool can be realized.

According to the inspection apparatus, an inspection apparatus in which the inspection unit can inspect a smaller electronic component module can be realized.

Drawings

FIG. 1 is a perspective view showing an inspection instrument according to an embodiment of the present invention;

fig. 2 is a perspective view of the inspection device of fig. 1 with the terminal connecting portion removed;

FIG. 3 is a cross-sectional view taken along line III-III of FIG. 1;

FIG. 4 is a cross-sectional view taken along line IV-IV of FIG. 1;

FIG. 5 is an enlarged plan view of a terminal connecting portion of the inspection instrument of FIG. 1;

FIG. 6 is a plan view showing a terminal connecting portion of the inspection tool of FIG. 1;

fig. 7 is a perspective view showing a probe of the inspection instrument of fig. 1.

Description of the reference numerals

1 inspection tool

10 casing

11 base shell

111 connecting surface

12 core shell

13 recess

14 opening part

15 storage groove

16 storage space

17 receiving part

21 first power supply terminal

211 probe laminate

22 signal terminal

23 second power supply terminal

231 probe laminate

30 probe

31 first contact part

32 second contact part

33 elastic part

34 first contact part

35 second contact part

36. 37 support part

40 terminal connection part

41 connecting plate part

411 outer surface

42 connecting wall portion

43 connecting hole

431 recess

432 through hole

44 first receiving area

45 second receiving area

46 positioning recess

47 flange part

48 insulating wall

50 helical spring

100 connector

X, Y, Z direction

P1 initial position

P2 connection position

Detailed Description

Hereinafter, an example of the present invention will be described with reference to the drawings. In the following description, terms indicating specific directions or positions (for example, terms including "up", "down", "right" and "left") are used as necessary, but these terms are used for convenience of understanding the present invention with reference to the drawings, and the technical scope of the present invention is not limited by the meanings of these terms. Furthermore, the following description is merely exemplary in nature and is not intended to limit the invention, its application, or uses. The drawings are schematic, and the ratio of the dimensions and the like do not necessarily match those in reality.

As shown in fig. 1, an inspection instrument 1 according to an embodiment of the present invention includes: an insulating housing 10, a conductive first power supply terminal 21, a signal terminal 22, and a second power supply terminal 23 housed inside the housing 10. In addition, fig. 1 shows only the first power supply terminal 21 and the signal terminal 22.

As shown in fig. 2 and 3, the housing 10 has at least three receiving portions 17 in the inside thereof. The first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are housed in the housing portions 17, respectively. Each of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 is composed of at least one plate-shaped probe 30.

Specifically, as shown in fig. 2, the housing 10 includes a base housing 11 having a substantially rectangular parallelepiped shape and a core housing 12 housed inside the base housing 11.

As shown in fig. 2, the base housing 11 has a substantially rectangular connection surface 111 constituting one of the outer surfaces thereof, and as shown in fig. 3, a recess 13 having a substantially rectangular opening 14 is provided substantially at the center in the longitudinal direction of the connection surface 111. As shown in fig. 2, the recess 13 is disposed such that the longitudinal direction of the opening 14 is substantially parallel to the short side direction of the base housing 11, and the substantially rectangular parallelepiped core housing 12 is housed therein.

In the following description, the short side direction of the connection surface 111 is defined as the X direction, the long side direction of the connection surface 111 is defined as the Y direction, and the direction intersecting the connection surface 111 is defined as the Z direction.

As shown in fig. 3, the core case 12 has at least three housing portions 17 in its interior capable of housing the probes 30. Specifically, in the core case 12, two rows of 5 housing portions 17 arranged in series along the longitudinal direction (i.e., X direction) of the opening 14 and extending along the direction orthogonal to the connection surface 111 (i.e., Z direction) are provided at intervals in the short side direction (i.e., Y direction) of the opening 14 in a state electrically independent from each other. That is, in this embodiment, the core case 12 has 10 receiving portions 17.

The first power supply terminal 21 and the second power supply terminal 23 are respectively housed in the housing portions 17 at both ends of the row of each housing portion 17, and the signal terminal 22 is housed in the housing portion 17 in the middle of the row of each housing portion 17. In the rows of the respective housing sections 17, the probes 30 constituting the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are arranged in series in the plate thickness direction so that the plate surfaces thereof face each other in a state where both end portions in the extending direction are exposed to the outside of the housing. That is, the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are housed in the housing 17 in a state in which both ends in the extending direction are exposed to the outside of the case.

The first power supply terminal 21 and the second power supply terminal 23 are each constituted by a plurality of probes 30. Specifically, as shown in fig. 3, the first power supply terminal 21 and the second power supply terminal 23 are each composed of a

probe laminate

211 and 231 laminated in the plate thickness direction in a state where 5 probes 30 are in contact with each other. The signal terminal 22 is constituted by a plurality of probes 30 arranged independently of each other at intervals in the plate thickness direction. Specifically, as shown in fig. 3, the signal terminals 22 are constituted by 3 probes 30 which are housed in 3 housing portions 17 in the middle of the row of the housing portions 17.

In this embodiment, the probes 30 constituting the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 have the same shape.

As shown in fig. 1, the housing 10 has an insulating terminal connection portion 40 that can be connected to a connector 100 (shown in fig. 5) of an inspection object or an inspection apparatus. The terminal connection portion 40 is supported on a connection surface 111 intersecting with (e.g., orthogonal to) the extending direction (i.e., Z direction, hereinafter referred to as terminal extending direction) of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 so as to be swingable in the terminal extending direction with respect to the housing 10.

Specifically, as shown in fig. 4, the terminal connecting portion 40 includes a substantially rectangular plate-shaped connecting plate portion 41 disposed so as to face the connecting surface 111, and a pair of connecting wall portions 42 extending from a pair of opposing edge portions of the connecting plate portion 41 in a direction intersecting (e.g., orthogonal to) the connecting plate portion 41.

As shown in fig. 5 and 6, the connection plate portion 41 has a connection hole 43 that penetrates in the terminal extending direction and can simultaneously receive the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23. The connection hole 43 has a first accommodation region 44 and a second accommodation region 45.

The first housing region 44 is provided substantially in the center of a direction (i.e., Y direction) intersecting the arrangement direction (i.e., X direction, hereinafter referred to as terminal arrangement direction) of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 of the connection hole 43 as viewed from the terminal extending direction, and the first contact portion 31 of each probe 30 described later is arranged. The first housing area 44 is configured to be able to house an inspection object or a connector 100 (shown in fig. 5) of an inspection apparatus that can simultaneously contact the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23.

The second housing region 45 is disposed in at least one direction (both directions in the Y direction in the present embodiment) intersecting the terminal arrangement direction with respect to the first housing region 44 when viewed from the terminal extending direction. The second housing area 45 is configured to be able to dispose a part of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23.

As shown in fig. 3 and 4, the connection hole 43 is constituted by a recess 431 opening on an outer surface 411 of the connection plate portion 41 described later, and a plurality of through holes 432 opening on a bottom surface of the recess 431. As shown in fig. 6, each through hole 432 corresponds to the housing portion 17 of each core case 12 in the terminal extending direction. That is, in this embodiment, 10 through holes 432 are formed in the bottom surface of the recess 431.

In addition, the connection hole 43 has two insulating walls 48 in the second housing area 45 that separate the first power terminal 21, the signal terminal 22, and the second power terminal 23 from each other. The insulating walls 48 are provided between the first power supply terminal 21 and the signal terminal 22 and between the signal terminal 22 and the second power supply terminal 23 in the second housing area 45, respectively, and extend in a direction intersecting the terminal arrangement direction when viewed from the terminal extending direction.

The connecting plate portion 41 has a positioning recess 46, and the positioning recess 46 is provided around the connecting hole 43 on an outer surface 411 opposite to a surface facing the connecting surface 111 in the terminal extending direction. The positioning recess 46 is configured to accommodate a part of the inspection object or the inspection device when the connector 100 of the inspection object or the inspection device is connected to the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23, and to specify a position of the connector 100 of the inspection object or the inspection device with respect to the terminal connection portion 40.

As shown in fig. 4, the tip end of each connecting wall portion 42 in the extending direction, which is apart from the connecting plate portion 41, is received in the receiving groove 15 provided around the recess 13 of the connecting surface 111. A flange portion 47 extending in a direction away from each other from each connecting wall portion 42 is provided at a distal end portion of each connecting wall portion 42. Each flange 47 is housed in a housing space 16 connected to the housing groove 15 and provided inside the base housing 11, together with a coil spring 50 that biases each flange 47 toward the connection surface 111. The movement of each flange 47 is restricted only between the initial position P1 and the connection position P2 in the direction intersecting the connection surface 111 (i.e., in the Z direction) by the housing space 16. The initial position P1 is the position of the terminal connecting portion 40 in a state where the connector 100 of the inspection object or the inspection apparatus is not connected, and the connection position P2 is the position of the terminal connecting portion 40 in a state where the connector 100 of the inspection object or the inspection apparatus is connected.

As shown in fig. 3 and 4, when the terminal connection portion 40 is located at the initial position P1, one end portion in the extending direction of each probe 30 constituting the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 is received in the through hole 432 of the connection hole 43. Thereby, the movement of one end portion of each probe pin 30 in the extending direction thereof in the direction intersecting the terminal extending direction (i.e., XY direction) is restricted, so that the positions of each of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 with respect to the housing 10 can be accurately determined.

As shown in fig. 7, each probe 30 includes an elastic portion 33 that is stretchable and contractible in the longitudinal direction (i.e., the vertical direction in fig. 7), and a first contact portion 34 and a second contact portion 35 that are connected to both ends of the elastic portion 33 in the longitudinal direction of the probe 30.

The elastic portions 33 are arranged with a gap therebetween, and are composed of a plurality of band-shaped elastic pieces (4 band-shaped elastic pieces in the present embodiment) that are elastically deformable in the extending direction of the probe 30. The first contact portion 34 includes a first contact portion 31, and one end portion of the first contact portion 31 in the longitudinal direction of the probe 30 is connected to the elastic portion 33 and is disposed at the other end portion of the probe 30 in the longitudinal direction. The second contact portion 35 has a second contact portion 32, and one end portion in the longitudinal direction of the probe 30 of the second contact portion 32 is connected to the elastic portion 33 and is disposed at the other end portion in the longitudinal direction of the probe 30.

A support portion 36 is provided on the elastic portion 33 side of the intermediate portion in the extending direction of the first contact portion 34, and the support portion 36 is in contact with the core case 12 when the probe 30 is housed in the housing portion 17 to support the probe 30. A support portion 37 is provided on the elastic portion 33 side of the middle portion of the second contact portion 35 in the extending direction, and the support portion 37 contacts the base housing 11 to support the probe 30 when the probe 30 is accommodated in the accommodating portion 17.

In addition, each probe 30 is formed by electroforming, and the elastic portion 33, the first contact portion 34, and the second contact portion 35 are integrally formed.

The inspection device 1 includes a first power supply terminal 21, a signal terminal 22, and a second power supply terminal 23 which are respectively housed in at least three housing portions 17 with both ends in the extending direction exposed to the outside of the case 10, and the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are each constituted by at least one plate-like probe 30. That is, since the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are each constituted by the plate-shaped probe 30 whose rigidity is less likely to decrease even when the device is miniaturized, the inspection device 1 that can be applied to miniaturization can be realized.

The probes 30 constituting the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 have the same shape. According to such a configuration, for example, by configuring the first power supply terminal 21 or the second power supply terminal 23 with a plurality of probes, the first power supply terminal 21 or the second power supply terminal 23 having a uniform cross-sectional shape as a whole can be easily obtained.

The first power supply terminal 21 and the second power supply terminal 23 are respectively constituted by

probe laminates

211 and 231 stacked in the plate thickness direction in a state where the plurality of probes 30 are in contact with each other, and the signal terminal 22 is constituted by the plurality of probes 30 arranged independently of each other at intervals in the plate thickness direction. With this configuration, the

terminals

21, 22, and 23 having different magnitudes of currents flowing through them can be easily formed by the plurality of probes 30.

The inspection device further includes a terminal connection portion 40, the terminal connection portion 40 being supported by the housing 10 on a connection surface 111 of the housing 10 intersecting with the terminal extending direction in a state of being swingable in the terminal extending direction and being connectable to an inspection object or an inspection apparatus, the terminal connection portion 40 having a connection hole 43 penetrating in the terminal extending direction and capable of accommodating the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 at the same time. With the terminal connecting portion 40, for example, when only the inspection device 1 is connected to the inspection object or the inspection apparatus, one end portion of each of the

terminals

21, 22, 23 in the terminal extending direction can be exposed to the outside of the inspection device 1, and therefore, the occurrence of damage to each of the

terminals

21, 22, 23 can be reduced.

The terminal connecting portion 40 has a positioning recess 46, and the positioning recess 46 is provided around the connecting hole 43 and on an outer surface 411 opposite to a surface facing the connecting surface 111 in the terminal extending direction, and positions the inspection object or the inspection apparatus with respect to the terminal connecting portion 40. The positioning recess 46 enables the inspection device 1 to be more accurately connected to the inspection object or the inspection apparatus.

The connection hole 43 includes a first housing area 44 in which the connector 100 of the inspection object or the inspection device can be housed, and a second housing area 45 which is disposed in at least one direction intersecting the terminal arrangement direction with respect to the first housing area 44 when viewed from the terminal extending direction and in which the first power supply terminal 21, the signal terminal 22, and a part of the second power supply terminal 23 can be disposed. With this configuration, the probes 30 constituting the

terminals

21, 22, and 23 can be arranged across the first housing region 44 to the second housing region 45. As a result, for example, when the first contact portion 31 is provided at one end portion in the width direction of each probe 30 (i.e., in the direction intersecting the terminal extending direction and the terminal arranging direction), the first contact portion 31 of each probe 30 is disposed in the first housing region 44, and the size of each terminal 21, 22, 23 can be sufficiently secured while coping with the downsizing of the connector 100 of the inspection object or the inspection apparatus.

The connection holes 43 are provided between the first power supply terminal 21 and the signal terminal 22 and between the signal terminal 22 and the second power supply terminal 23 in the second housing area 45, respectively, and have two insulating walls 48 extending in a direction intersecting the terminal arrangement direction, respectively, as viewed from the terminal extending direction. The insulating wall 48 can more reliably ensure insulation between the

terminals

21, 22, and 23.

The inspection tool 1 described above can be used for an inspection unit. The inspection device 1 can realize an inspection unit that can inspect a smaller electronic component module.

In addition, the inspection unit can be used for an inspection apparatus. The inspection unit can realize an inspection apparatus capable of inspecting a smaller electronic component module.

The shape of each probe 30 can be appropriately changed according to the design of the inspection device 1. For example, the shape of each probe 30 constituting each of the

terminals

21, 22, and 23 may be changed, and one of the first power supply terminal 21 and the second power supply terminal 23 may be constituted by 1 probe 30, and the other may be constituted by the

probe laminate

211 and 231.

The shapes and positions of the first contact portion 31 and the second contact portion 32 may be appropriately changed according to various types of inspection apparatuses and inspection objects.

The base housing 11 and the core housing 12 may be appropriately modified in structure according to various modes of the inspection apparatus or the object to be inspected. That is, the base housing 11 and the core housing 12 can be made common, and the productivity of the inspection device 1 (and hence the inspection unit and the inspection apparatus) can be improved.

The terminal connecting portion 40 may be omitted depending on the design of the inspection tool 1 and the like. That is, the inspection device 1 may include at least a housing 10 having at least three receiving portions 17 therein, and a first power supply terminal 21, a signal terminal 22, and a second power supply terminal 23 which are received in the receiving portions 17, respectively.

The positioning recess 46 and the insulating wall 48 may be omitted depending on the design of the inspection device 1.

The connection hole 43 may have at least the first housing area 44 capable of housing the inspection object or the connector 100 of the inspection apparatus, and the second housing area 45 may be omitted.

The various embodiments of the present invention have been described in detail above with reference to the drawings, and finally, various embodiments of the present invention will be described. In the following description, reference numerals are attached thereto as an example.

An inspection device 1 according to a first aspect of the present invention includes: a housing 10 having at least three housing portions 17 therein, and a first power terminal 21, a signal terminal 22, and a second power terminal 23 housed in the housing portions 17 in a state where both end portions in an extending direction are exposed to the outside of the housing 10, wherein the first power terminal 21, the signal terminal 22, and the second power terminal 23 are each constituted by at least one plate-shaped probe 30 that is extendable and retractable in the extending direction, the probes 30 constituting the first power terminal 21, the signal terminal 22, and the second power terminal 23 are arranged in series in a plate thickness direction such that plate surfaces thereof face each other, and the signal terminal 22 is arranged between the first power terminal 21 and the second power terminal 23 in the plate thickness direction.

According to the inspection device 1 of the first aspect, the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are each constituted by the plate-shaped probe 30 whose rigidity is less likely to decrease even when the device is miniaturized, and therefore, the inspection device 1 that can cope with miniaturization can be realized.

In the inspection device 1 according to the second aspect of the present invention, the probes 30 constituting the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 have the same shape.

According to the inspection device 1 of the second aspect, for example, by forming the first power supply terminal 21 or the second power supply terminal 23 by a plurality of probes, the first power supply terminal 21 or the second power supply terminal 23 having a uniform cross-sectional shape as a whole can be easily obtained.

In the inspection device 1 according to the third aspect of the present invention, the first power supply terminal 21 and the second power supply terminal 23 are respectively constituted by

probe laminates

211 and 231 stacked in the plate thickness direction in a state where the plurality of probes 30 are in contact with each other, and the signal terminal 22 is constituted by the plurality of probes 30 arranged independently of each other at intervals in the plate thickness direction.

According to the inspection device 1 of the third aspect, the

terminals

21, 22, and 23 having different magnitudes of currents flowing therethrough can be easily formed using the plurality of probes 30.

The inspection device 1 according to the fourth aspect of the present invention includes a terminal connection portion 40 on a connection surface 111 of the housing 10 intersecting the extending direction, the terminal connection portion 40 being supported by the housing 10 in a state capable of swinging in the extending direction and connectable to an inspection object or an inspection apparatus, the terminal connection portion 40 having a connection hole 43 penetrating in the extending direction and capable of simultaneously housing the first power terminal 21, the signal terminal 22, and the second power terminal 23.

According to the inspection tool 1 of the fourth aspect, only when the inspection tool 1 is connected to an inspection object or an inspection apparatus, for example, by the terminal connection portion 40, one end portion in the extending direction of each of the

terminals

21, 22, and 23 can be exposed to the outside of the inspection tool 1, and therefore, the occurrence of damage to each of the

terminals

21, 22, and 23 can be reduced.

In the inspection tool 1 according to the fifth aspect of the present invention, the terminal connecting portion 40 is provided around the connection hole 43 on the outer surface 411 opposite to the surface facing the connection surface 111 in the extending direction, and has a positioning concave portion 46 for positioning the inspection object or the inspection device with respect to the position of the terminal connecting portion 40.

According to the inspection tool 1 of the fifth aspect, the positioning concave portion 46 enables the inspection tool 1 to be more accurately connected to the inspection object or the inspection apparatus.

In the inspection tool 1 according to the sixth aspect of the present invention, the connection hole 43 includes: a first housing area 44 capable of housing the inspection object or the connector 100 of the inspection apparatus which can be simultaneously brought into contact with the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23; and a second housing area 45 that is disposed in at least one of directions intersecting the direction in which the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 are arranged with respect to the first housing area 44 when viewed from the extending direction, and in which a part of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23 can be disposed.

According to the inspection instrument 1 of the sixth aspect, the probes 30 constituting the

terminals

21, 22, and 23 can be arranged across the first housing region 44 to the second housing region 45. As a result, for example, when the contact portion 31 is provided at one end portion in the width direction of each probe 30 (i.e., in the direction intersecting the extending direction and the arrangement direction of the first power supply terminal 21, the signal terminal 22, and the second power supply terminal 23), the contact portion 31 of each probe 30 can be disposed in the first housing area 44, and the size of each terminal 21, 22, and 23 can be sufficiently secured while coping with downsizing of the inspection object or the connector 100 of the inspection apparatus.

In the inspection tool 1 according to the seventh aspect of the present invention, the connection hole 43 includes two insulating walls 48, the insulating walls 48 are respectively provided between the first power supply terminal 21 and the signal terminal 22 and between the signal terminal 22 and the second power supply terminal 23 in the second housing area 45, and the insulating walls 48 respectively extend in a direction intersecting the arrangement direction when viewed from the extending direction.

According to the inspection tool 1 of the seventh aspect, the insulating wall 48 can more reliably ensure the insulation between the

terminals

21, 22, and 23.

An inspection unit according to an eighth aspect of the present invention includes at least one inspection tool 1 according to the above-described aspect.

According to the inspection unit of the eighth aspect, an inspection unit that can inspect a smaller electronic component module by the inspection tool 1 can be realized.

An inspection apparatus according to a ninth aspect of the present invention includes at least one inspection unit according to the above aspect.

According to the inspection apparatus of the ninth aspect, an inspection apparatus can be realized in which the inspection unit can inspect a smaller electronic component module.

In addition, by appropriately combining any of the various embodiments or modifications described above, the effects possessed by each can be achieved. In addition, combinations of the embodiments with each other or with each other, and combinations of the features in different embodiments or with each other may be made.

Industrial availability

The inspection device of the present invention can be applied to, for example, an inspection unit of a battery module as an inspection object.

The inspection unit of the present invention can be applied to an inspection device for a battery module, for example, as an inspection object.

The inspection apparatus of the present invention can be used for inspecting a battery module as an inspection object, for example.

Claims

1. An inspection instrument, comprising:

a housing having at least three receiving portions therein;

a first power supply terminal, a signal terminal, and a second power supply terminal, which are respectively accommodated in the accommodating portions in a state that both ends in an extending direction are exposed to the outside of the housing,

the first power supply terminal, the signal terminal, and the second power supply terminal are each constituted by at least one plate-shaped probe that is stretchable in the extending direction,

the probes constituting the first power supply terminal, the signal terminal, and the second power supply terminal are arranged in series in the plate thickness direction so that plate surfaces thereof face each other,

the signal terminal is disposed between the first power supply terminal and the second power supply terminal in the plate thickness direction.

2. The examination apparatus of claim 1,

the probes constituting the first power supply terminal, the signal terminal, and the second power supply terminal have the same shape.

3. The examination apparatus of claim 1,

the first power supply terminal and the second power supply terminal are each composed of a probe laminate in which a plurality of probes are laminated in the plate thickness direction in a state where the probes are in contact with each other,

the signal terminal is composed of a plurality of the probes arranged independently of each other at intervals in the plate thickness direction.

4. The inspection tool according to any one of claims 1 to 3,

a terminal connection portion that is provided on a connection surface of the housing intersecting the extending direction, is supported by the housing in a state of being swingable in the extending direction, and is connectable to an inspection object or an inspection apparatus,

the terminal connecting portion has a connecting hole that penetrates in the extending direction and can simultaneously receive the first power supply terminal, the signal terminal, and the second power supply terminal.

5. The examination apparatus of claim 4,

the terminal connecting portion is provided around the connecting hole on an outer surface of a side opposite to a surface facing the connecting surface in the extending direction, and has a positioning recess portion for positioning the inspection object or the inspection apparatus with respect to the terminal connecting portion.

6. The examination apparatus of claim 4,

the connection hole has:

a first housing area configured to house the inspection object or a connector of the inspection apparatus, the first power supply terminal, the signal terminal, and the second power supply terminal being simultaneously contactable;

and a second housing area which is disposed in at least one of directions intersecting with an arrangement direction of the first power supply terminal, the signal terminal, and the second power supply terminal with respect to the first housing area when viewed from the extending direction, and in which a part of the first power supply terminal, the signal terminal, and the second power supply terminal is disposed.

7. The examination apparatus of claim 6,

the connection hole has two insulating walls which are respectively provided between the first power supply terminal and the signal terminal and between the signal terminal and the second power supply terminal of the second housing region, and which extend in a direction intersecting the arrangement direction, as viewed from the extension direction.

8. An inspection unit, characterized in that,

the inspection device according to any one of claims 1 to 7.

9. An inspection apparatus, characterized in that,

at least one inspection unit according to claim 8 is provided.