JP7067265B2 - connector - Google Patents

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Publication number
JP7067265B2
JP7067265B2 JP2018098188A JP2018098188A JP7067265B2 JP 7067265 B2 JP7067265 B2 JP 7067265B2 JP 2018098188 A JP2018098188 A JP 2018098188A JP 2018098188 A JP2018098188 A JP 2018098188A JP 7067265 B2 JP7067265 B2 JP 7067265B2
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connector
housing
contact spring
spring portion
connector housing
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JP2019204645A (en
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直哉 笹野
宏真 寺西
貴浩 酒井
チェ・シフン
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Omron Corp
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Omron Corp
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Priority to JP2018098188A priority Critical patent/JP7067265B2/en
Priority to KR1020207029955A priority patent/KR102454259B1/en
Priority to CN201980027033.6A priority patent/CN112005449B/en
Priority to PCT/JP2019/019287 priority patent/WO2019225432A1/en
Priority to TW108117304A priority patent/TWI708440B/en
Publication of JP2019204645A publication Critical patent/JP2019204645A/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/91—Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H01R13/629—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances
    • H01R13/631—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for engagement only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/66—Structural association with built-in electrical component
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
    • H01R24/54—Intermediate parts, e.g. adapters, splitters or elbows
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/60—Contacts spaced along planar side wall transverse to longitudinal axis of engagement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R31/00—Coupling parts supported only by co-operation with counterpart
    • H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors

Description

本開示は、検査対象とＵＳＢデバイス等の検査対象とを接続して検査対象の導通検査および動作特性検査等を行うためのコネクタに関する。 The present disclosure relates to a connector for connecting an inspection target and an inspection target such as a USB device to perform continuity inspection, operation characteristic inspection, and the like of the inspection target.

ＵＳＢデバイス等の電子部品モジュールでは、一般に、その製造工程において、導通検査および動作特性検査等が行われる。これらの検査は、検査装置と電子部品モジュールとをコネクタで接続することにより行われる。 In electronic component modules such as USB devices, continuity inspection, operation characteristic inspection, and the like are generally performed in the manufacturing process. These inspections are performed by connecting the inspection device and the electronic component module with a connector.

このようなコネクタとしては、特許文献１に記載されたものがある。このコネクタは、基板上に配置可能なベース部と、ベース部の上部から基板の上面と平行に延びて、電子部品モジュールのコネクタと嵌合可能な嵌合部とを備えている。前記コネクタでは、ベース部に設けられた移動規制部と、嵌合部に設けられた移動規制部とが、間隙を有して係合されており、この間隙の範囲内で嵌合部がベース部に対して相対的に移動可能になっている。 As such a connector, there is one described in Patent Document 1. The connector includes a base portion that can be arranged on the substrate and a fitting portion that extends from the upper portion of the base portion in parallel with the upper surface of the substrate and can be fitted with the connector of the electronic component module. In the connector, the movement restricting portion provided in the base portion and the movement restricting portion provided in the fitting portion are engaged with each other with a gap, and the fitting portion is the base within the range of the gap. It is movable relative to the part.

特開２０１５－１５８９９０号公報Japanese Unexamined Patent Publication No. 2015-158990

しかし、前記コネクタでは、ベース部および嵌合部の各々の長手方向の両端部にそれぞれ移動規制部が設けられているため、高い精度でベース部および嵌合部の各部材を形成しなければ、設計通り嵌合部を移動させることが困難になり、相手側コネクタが損傷してしまう場合がある。 However, in the connector, since the movement restricting portions are provided at both ends of the base portion and the fitting portion in the longitudinal direction, the members of the base portion and the fitting portion must be formed with high accuracy. It becomes difficult to move the fitting part as designed, and the mating connector may be damaged.

本開示は、検査対象が端子接続部への接続方向とは異なる方向から接続された場合であっても、検査対象を損傷させることなく接続可能なコネクタを提供することを課題とする。 It is an object of the present disclosure to provide a connector that can be connected without damaging the inspection target even when the inspection target is connected from a direction different from the connection direction to the terminal connection portion.

本開示の一例のコネクタは、
検査装置と検査対象とに接続可能なコネクタであって、
開口部が設けられた開口面を有する箱状のコネクタハウジングと、
前記開口面に交差する第１方向の一端部が前記コネクタハウジングの内部に位置しかつ前記第１方向の他端部が前記検査対象を接続可能に前記コネクタハウジングの外部に露出していると共に、前記開口部内で前記開口部の縁部との間に隙間が設けられる基準位置に配置され、前記開口面上で揺動可能な状態で前記コネクタハウジングに支持されている端子接続部と、
前記コネクタハウジングの内部に配置されて、前記コネクタハウジングに対して前記端子接続部を前記基準位置に向かって付勢する付勢部と
を備える。 The connector of the example of the present disclosure is
A connector that can be connected to the inspection device and the inspection target.
A box-shaped connector housing with an opening surface provided with an opening,
One end in the first direction intersecting the opening surface is located inside the connector housing, and the other end in the first direction is exposed to the outside of the connector housing so that the inspection target can be connected. A terminal connection portion that is arranged in the opening at a reference position where a gap is provided between the opening and the edge of the opening and is supported by the connector housing in a swingable state on the opening surface.
It is provided inside the connector housing and includes an urging portion that urges the terminal connection portion toward the reference position with respect to the connector housing.

前記コネクタによれば、開口部が設けられた開口面を有する箱状のコネクタハウジングと、開口部内であって開口部の縁部との間に隙間が設けられる基準位置に配置され、開口面上で揺動可能な状態でコネクタハウジングに支持されている端子接続部と、端子接続部を基準位置に向かって付勢する付勢部とを備えている。このような構成により、検査対象が端子接続部への接続方向に対して交差する方向から接続された場合であっても、端子接続部を検査対象に対してセルフアライメントさせることができるので、検査対象を損傷させることなく接続可能なコネクタを実現できる。 According to the connector, the connector housing is arranged at a reference position where a gap is provided between a box-shaped connector housing having an opening surface provided with an opening and an edge portion of the opening in the opening, and is placed on the opening surface. It is provided with a terminal connection portion supported by the connector housing in a swingable state and an urging portion for urging the terminal connection portion toward a reference position. With such a configuration, even when the inspection target is connected from a direction intersecting the connection direction to the terminal connection portion, the terminal connection portion can be self-aligned with respect to the inspection target, so that the inspection can be performed. It is possible to realize a connector that can be connected without damaging the target.

本開示の一実施形態のコネクタを示す斜視図。The perspective view which shows the connector of one Embodiment of this disclosure. 図１のII-II線に沿った断面図。Sectional drawing taken along line II-II of FIG. 図１のIII-III線に沿った断面図。Sectional drawing taken along the line III-III of FIG. 図１のコネクタの第１端子接続部側の側面図。The side view of the 1st terminal connection part side of the connector of FIG. 図１のコネクタの第１端子接続部を示す斜視図。The perspective view which shows the 1st terminal connection part of the connector of FIG. 図１のVI-VI線に沿った断面図。Sectional drawing along the VI-VI line of FIG. 図１のコネクタのプローブピンを示す斜視図。The perspective view which shows the probe pin of the connector of FIG. 図１のVIII-VIII線に沿った断面図。Sectional drawing taken along the line VIII-VIII of FIG. 図１のコネクタの第１の変形例を示す斜視図。The perspective view which shows the 1st modification of the connector of FIG. 図９のコネクタのコネクタハウジングを取り除いた状態における第１端子接続部側の側面図。FIG. 9 is a side view of the first terminal connection portion side in a state where the connector housing of the connector of FIG. 9 is removed. 図１のコネクタの第２の変形例を示す斜視図。The perspective view which shows the 2nd modification of the connector of FIG. 図１のコネクタの第３の変形例を示す第１端子接続部の斜視図。The perspective view of the 1st terminal connection part which shows the 3rd modification of the connector of FIG. 図１のコネクタの第４の変形例を示す図１のII-II線に沿った断面図。FIG. 2 is a cross-sectional view taken along the line II-II of FIG. 1 showing a fourth modification of the connector of FIG.

以下、本開示の一例を添付図面に従って説明する。なお、以下の説明では、必要に応じて特定の方向あるいは位置を示す用語（例えば、「上」、「下」、「右」、「左」を含む用語）を用いるが、それらの用語の使用は図面を参照した本開示の理解を容易にするためであって、それらの用語の意味によって本開示の技術的範囲が限定されるものではない。また、以下の説明は、本質的に例示に過ぎず、本開示、その適用物、あるいは、その用途を制限することを意図するものではない。さらに、図面は模式的なものであり、各寸法の比率等は現実のものとは必ずしも合致していない。 Hereinafter, an example of the present disclosure will be described with reference to the accompanying drawings. In the following description, terms indicating a specific direction or position (for example, terms including "top", "bottom", "right", and "left") are used as necessary, but the use of these terms is used. Is for facilitating the understanding of the present disclosure with reference to the drawings, and the meaning of those terms does not limit the technical scope of the present disclosure. Further, the following description is merely an example and is not intended to limit the present disclosure, its application, or its use. Further, the drawings are schematic, and the ratios of the dimensions and the like do not always match the actual ones.

本開示の一実施形態のコネクタ１は、検査装置１００と検査対象２００とに接続可能に構成され（図３参照）、図１に示すように、コネクタハウジング１０と、このコネクタハウジング１０に揺動可能に支持されている第１端子接続部２０とを備えている。コネクタハウジング１０の内部には、図２に示すように、付勢部３０が設けられている。 The connector 1 of the embodiment of the present disclosure is configured to be connectable to the inspection device 100 and the inspection target 200 (see FIG. 3), and as shown in FIG. 1, swings between the connector housing 10 and the connector housing 10. It is provided with a first terminal connection portion 20 that is supported as possible. As shown in FIG. 2, an urging portion 30 is provided inside the connector housing 10.

コネクタハウジング１０は、図１に示すように、略矩形の箱状で、厚さ方向（すなわち、図１の上下方向）に積み重ねられた上ハウジング１１と下ハウジング１２とで構成されている。このコネクタハウジング１０は、その長手方向（すなわち、第１方向Ｘ）に対向する側面の一方に開口面１３を有し、この開口面１３には、略楕円形状の開口部１４が設けられている。 As shown in FIG. 1, the connector housing 10 has a substantially rectangular box shape, and is composed of an upper housing 11 and a lower housing 12 stacked in the thickness direction (that is, the vertical direction in FIG. 1). The connector housing 10 has an opening surface 13 on one of the side surfaces facing the longitudinal direction (that is, the first direction X), and the opening surface 13 is provided with a substantially elliptical opening 14. ..

図３に示すように、コネクタハウジング１０の内部には、基板４０と、検査装置１００に接続可能な第２端子接続部５０が設けられている。基板４０は、その板面における第１方向Ｘの両端部に設けられた接続端子４１（図６に示す）を介して、第１端子接続部２０および第２端子接続部５０に電気的に接続されている。第２端子接続部５０は、基板４０に対して第１方向Ｘにおける第１端子接続部２０の反対側に配置されている。 As shown in FIG. 3, inside the connector housing 10, a substrate 40 and a second terminal connection portion 50 that can be connected to the inspection device 100 are provided. The substrate 40 is electrically connected to the first terminal connection portion 20 and the second terminal connection portion 50 via connection terminals 41 (shown in FIG. 6) provided at both ends of the first direction X on the plate surface. Has been done. The second terminal connection portion 50 is arranged on the opposite side of the first terminal connection portion 20 in the first direction X with respect to the substrate 40.

第１端子接続部２０は、図３に示すように、開口面１３に交差（例えば、直交）する第１方向Ｘの一端部である第１端部２０１がコネクタハウジング１０の内部に位置しかつ第１方向Ｘの他端部である第２端部２０２が検査対象２００を接続可能にコネクタハウジング１０の外部に露出している。なお、検査対象２００は、例えば、ＵＳＢコネクタあるいはＨＤＭＩコネクタを有する電子部品モジュールである。 As shown in FIG. 3, in the first terminal connection portion 20, the first end portion 201, which is one end portion of the first direction X intersecting (for example, orthogonal to) the opening surface 13, is located inside the connector housing 10. The second end 202, which is the other end of the first direction X, is exposed to the outside of the connector housing 10 so that the inspection target 200 can be connected. The inspection target 200 is, for example, an electronic component module having a USB connector or an HDMI connector.

また、第１端子接続部２０は、図４に示すように、開口部１４内であって開口部１４の縁部との間に隙間１５が基準位置Ｐに配置され、開口面１３上で図４の上下左右の任意の方向に対して揺動可能な状態で、コネクタハウジング１０に支持されている。この実施形態では、隙間１５は、基準位置Ｐにおいて、第１端子接続部２０の第１方向Ｘ（すなわち、図２の紙面貫通方向）まわりの全周に亘って設けられている。 Further, as shown in FIG. 4, in the first terminal connection portion 20, a gap 15 is arranged at a reference position P between the opening portion 14 and the edge portion of the opening portion 14, and is shown on the opening surface 13. It is supported by the connector housing 10 in a state where it can swing in any direction up, down, left, and right. In this embodiment, the gap 15 is provided at the reference position P over the entire circumference of the first terminal connection portion 20 around the first direction X (that is, the paper surface penetration direction in FIG. 2).

詳しくは、第１端子接続部２０は、図３に示すように、板状のプローブピン６０と、第１方向Ｘに延びて第１方向Ｘに交差（例えば、直交）する第２方向Ｙ（図４に示す）に板面が対向するようにプローブピン６０を収容可能な第１収容部２２が設けられた接続ハウジング２１とを有している。この実施形態では、第１端子接続部２０は、図２に示すように、複数のプローブピン６０を有し、接続ハウジング２１には、第２方向Ｙに沿って間隔を空けて配置された複数対の第１収容部２２が設けられ、各第１収容部２２にプローブピン６０がそれぞれ収容されている。これにより、各対の第１収容部２２は、第１方向Ｘから見て、第１端子接続部２０の第１方向Ｘおよび第２方向Ｙに交差（例えば、直交）する第３方向Ｚの中心線Ｌ１に対して対称に配置され、相互に電気的独立している。すなわち、各対の第１収容部２２に収容されたプローブピン６０は、後述する第１接触ばね部６１によって検査対象２００を第３方向Ｚから挟持可能であると共に、後述する第２接触ばね部６２によって基板４０を第３方向Ｚから挟持可能に構成されている。 Specifically, as shown in FIG. 3, the first terminal connection portion 20 has a plate-shaped probe pin 60 and a second direction Y (for example, orthogonal) extending in the first direction X and intersecting the first direction X (for example, orthogonal to each other). (Shown in FIG. 4) has a connection housing 21 provided with a first accommodating portion 22 capable of accommodating the probe pins 60 so that the plate surfaces face each other. In this embodiment, the first terminal connection portion 20 has a plurality of probe pins 60 as shown in FIG. 2, and a plurality of probe pins 60 are arranged in the connection housing 21 at intervals along the second direction Y. A pair of first accommodating portions 22 is provided, and probe pins 60 are accommodating in each of the first accommodating portions 22. As a result, the first accommodating portion 22 of each pair intersects (for example, orthogonally) the first direction X and the second direction Y of the first terminal connecting portion 20 when viewed from the first direction X. They are arranged symmetrically with respect to the center line L1 and are electrically independent of each other. That is, the probe pin 60 housed in the first accommodating portion 22 of each pair can sandwich the inspection target 200 from the third direction Z by the first contact spring portion 61 described later, and the second contact spring portion described later. The substrate 40 is configured to be able to be sandwiched from the third direction Z by 62.

図３に示すように、接続ハウジング２１の第１端部２０１側の端部には、後述する付勢部３０の付勢部材（すなわち、コイルばね３１）を支持する支持部２１１が設けられ、接続ハウジング２１の第２端部２０２側の端部には、第１方向Ｘに開口して第１方向Ｘから検査対象２００を収容可能な凹部２３と、確認用窓２４とが設けられている。凹部２３の内部には、各プローブピン６０の後述する第１接触ばね部６１が配置されている。すなわち、検査対象２００は、第１方向Ｘに沿って第１端子接続部２０に接続される。また、確認用窓２４は、第１収容部２２と接続ハウジング２１の外部とに連通して、各プローブピン６０の第１接触ばね部６１を接続ハウジング２１の外部から確認可能になっている。 As shown in FIG. 3, at the end of the connection housing 21 on the first end 201 side, a support portion 211 for supporting the urging member (that is, the coil spring 31) of the urging portion 30 described later is provided. At the end of the connection housing 21 on the second end 202 side, a recess 23 that opens in the first direction X and can accommodate the inspection target 200 from the first direction X and a confirmation window 24 are provided. .. Inside the recess 23, a first contact spring portion 61, which will be described later, of each probe pin 60 is arranged. That is, the inspection target 200 is connected to the first terminal connection portion 20 along the first direction X. Further, the confirmation window 24 communicates with the first accommodating portion 22 and the outside of the connection housing 21, so that the first contact spring portion 61 of each probe pin 60 can be confirmed from the outside of the connection housing 21.

また、図５に示すように、第１端子接続部２０は、接続ハウジング２１の外面を覆うと共に、コネクタハウジング１０の内部に配置されるグランド端子２６が設けられた導電性の外殻部２５を有している。この実施形態では、外殻部２５は、鉄等の金属で構成され、各プローブピン６０とは電気的に独立した状態で接続ハウジング２１の外面の第２端部２０２を除いた領域を覆っている。このように構成することで、第１端子接続部２０に検査対象２００を接続するときに、検査対象２００が外殻部２５に接触することがなくなり、第１端子接続部２０への接続時における検査対象２００の損傷を低減できる。また、グランド端子２６は、外殻部２５の第２方向Ｙの両端部のそれぞれに一対ずつ設けられている。 Further, as shown in FIG. 5, the first terminal connection portion 20 covers the outer surface of the connection housing 21 and has a conductive outer shell portion 25 provided with a ground terminal 26 arranged inside the connector housing 10. Have. In this embodiment, the outer shell portion 25 is made of a metal such as iron and is electrically independent of each probe pin 60 and covers the region excluding the second end portion 202 of the outer surface of the connection housing 21. There is. With this configuration, when the inspection target 200 is connected to the first terminal connection portion 20, the inspection target 200 does not come into contact with the outer shell portion 25, and when the inspection target 200 is connected to the first terminal connection portion 20. Damage to the inspection target 200 can be reduced. Further, a pair of ground terminals 26 are provided at both ends of the outer shell portion 25 in the second direction Y.

接続ハウジング２１の外面には、図３に示すように、外殻部２５を収容可能な凹部２１２が設けられている。この凹部２１２は、収容された外殻部２５の外面が、接続ハウジング２１の凹部２１２が設けられていない部分（例えば、接続ハウジング２１の第２端部２０１側の端部２１３）の外面に対して、同一平面上に位置するように構成されている。 As shown in FIG. 3, the outer surface of the connection housing 21 is provided with a recess 212 capable of accommodating the outer shell portion 25. In the recess 212, the outer surface of the housed outer shell portion 25 is relative to the outer surface of the portion of the connection housing 21 where the recess 212 is not provided (for example, the end portion 213 on the second end portion 201 side of the connection housing 21). It is configured to be located on the same plane.

各対のグランド端子２６は、図６に示すように、第３方向Ｚに対向するように配置され、第３方向Ｚに弾性変形した状態で基板４０接続端子４１に対して接触可能に構成されている。 As shown in FIG. 6, the ground terminals 26 of each pair are arranged so as to face the third direction Z, and are configured to be in contact with the substrate 40 connection terminal 41 in a state of being elastically deformed in the third direction Z. ing.

付勢部３０は、図２に示すように、コネクタハウジング１０の内部に配置されて、コネクタハウジング１０に対して第１端子接続部２０を基準位置Ｐに向かって付勢する。詳しくは、付勢部３０は、複数の付勢部材（この実施形態では、４つのコイルばね３１）で構成され、４つのコイルばね３１が、第１方向Ｘに直交する仮想直線（例えば、第１端子接続部２０の第３方向Ｚの中心線Ｌ１）に対して対称に配置されている。 As shown in FIG. 2, the urging portion 30 is arranged inside the connector housing 10 and urges the first terminal connecting portion 20 toward the reference position P with respect to the connector housing 10. Specifically, the urging unit 30 is composed of a plurality of urging members (in this embodiment, four coil springs 31), and the four coil springs 31 are virtual straight lines orthogonal to the first direction X (for example, the first). It is arranged symmetrically with respect to the center line L1) of the third direction Z of the 1-terminal connection portion 20.

各コイルばね３１は、接続ハウジング２１の支持部２１１に設けられた略円柱状の凹部２１４と、上ハウジング１１および下ハウジング１２の各々に設けられ相互に接続ハウジング２１の凹部２１４にそれぞれ対向するように配置された略円柱状の凹部１１１、１２１とで構成されるコイルばね収容部１６に収容されている。付勢部材としてコイルばね３１を用いることで、第１端子接続部２０を開口面１３上の任意の方向に加えて、第１方向Ｘに揺動させることができる。 Each coil spring 31 is provided in each of the substantially cylindrical recess 214 provided in the support portion 211 of the connection housing 21 and the upper housing 11 and the lower housing 12 so as to face each other in the recess 214 of the connection housing 21. It is housed in a coil spring accommodating portion 16 composed of substantially columnar recesses 111 and 121 arranged in. By using the coil spring 31 as the urging member, the first terminal connection portion 20 can be added to an arbitrary direction on the opening surface 13 and can be swung in the first direction X.

各プローブピン６０は、図７に示すように、板状で、第１接触ばね部６１および第２接触ばね部６２と、第１接触ばね部６１および第２接触ばね部６２の間に第１方向Ｘに沿って直列的に配置された中間部６３および緩衝ばね部６４とを備えている。すなわち、第１接触ばね部６１、中間部６３、緩衝ばね部６４および第２接触ばね部６２は、第１方向Ｘに沿って配列されている。また、各プローブピン６０は、例えば、電鋳法で形成され、第１接触ばね部６１、中間部６３、緩衝ばね部６４および第２接触ばね部６２が、一体に構成されている。 As shown in FIG. 7, each probe pin 60 has a plate shape, and is first between the first contact spring portion 61 and the second contact spring portion 62 and the first contact spring portion 61 and the second contact spring portion 62. It includes an intermediate portion 63 and a cushioning spring portion 64 arranged in series along the direction X. That is, the first contact spring portion 61, the intermediate portion 63, the cushioning spring portion 64, and the second contact spring portion 62 are arranged along the first direction X. Further, each probe pin 60 is formed by, for example, an electroforming method, and a first contact spring portion 61, an intermediate portion 63, a buffer spring portion 64, and a second contact spring portion 62 are integrally configured.

第１接触ばね部６１および第２接触ばね部６２の各々は、第２方向Ｙから見て、蛇行形状を有し、中間部６３に対して第３方向Ｚに弾性変形可能に構成されている。また、第２接触ばね部６２は、複数の帯状弾性片（この実施形態では、２つの帯状弾性片６２１、６２２）で構成されている。 Each of the first contact spring portion 61 and the second contact spring portion 62 has a meandering shape when viewed from the second direction Y, and is configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63. .. Further, the second contact spring portion 62 is composed of a plurality of strip-shaped elastic pieces (in this embodiment, two strip-shaped elastic pieces 621 and 622).

中間部６３は、略矩形状を有し、第１方向Ｘの両端部がそれぞれ第１接触ばね部６１および緩衝ばね部６４に接続されている。この中間部６３の緩衝ばね部６４側の端部には、接続ハウジング２１の第１収容部２２に収容されたときのプローブピン６０の第１方向Ｘでかつ第２接触ばね部６２に向かう方向の移動を規制する第１位置決め部６３１が設けられている。第１位置決め部６３１は、第３方向Ｚにおいて緩衝ばね部６４から離れる方向に延びる平面で構成されている。 The intermediate portion 63 has a substantially rectangular shape, and both ends of the first direction X are connected to the first contact spring portion 61 and the buffer spring portion 64, respectively. At the end of the intermediate portion 63 on the buffer spring portion 64 side, the direction X of the probe pin 60 when it is accommodated in the first accommodating portion 22 of the connection housing 21 and the direction toward the second contact spring portion 62. A first positioning unit 631 is provided to regulate the movement of the spring. The first positioning portion 631 is configured by a plane extending in a direction away from the buffer spring portion 64 in the third direction Z.

緩衝ばね部６４は、中間部６３から第３方向Ｚにおいて突出した略矩形の枠状を有し、第１方向Ｘの両端部がそれぞれ中間部６３および第２接触ばね部６２に接続され、中間部６３に対して第２方向Ｙ（すなわち、板厚方向）に弾性変形可能に構成されている。緩衝ばね部６４の中間部６３側の端部には、接続ハウジング２１の第１収容部２２に収容されたときのプローブピン６０の第１方向Ｘでかつ第１接触ばね部６１に向かう方向の移動を規制する第２位置決め部６４１が設けられている。第２位置決め部６４１は、第３方向Ｚにおいて緩衝ばね部６４から離れる方向でかつ中間部６３の第１位置決め部６３１とは反対方向に延びる平面で構成されている。 The cushioning spring portion 64 has a substantially rectangular frame shape protruding from the intermediate portion 63 in the third direction Z, and both ends of the first direction X are connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and are intermediate. It is configured to be elastically deformable in the second direction Y (that is, in the plate thickness direction) with respect to the portion 63. At the end of the cushioning spring portion 64 on the intermediate portion 63 side, the probe pin 60 is accommodated in the first accommodating portion 22 of the connection housing 21 in the first direction X and in the direction toward the first contact spring portion 61. A second positioning unit 641 that regulates movement is provided. The second positioning portion 641 is configured by a plane extending in a direction away from the buffer spring portion 64 in the third direction Z and in a direction opposite to the first positioning portion 631 of the intermediate portion 63.

また、第２位置決め部６４１の第３方向Ｚにおける中間部６３のから遠い方の端部には、第２位置決め部６４１から第１方向Ｘ沿いを第１接触ばね部６２に向かって延びる突起部６４２が設けられている。この突起部６４２は、図３に示すように、第３方向Ｚにおいて、接続ハウジング２１の支持部２１１に設けられ、コイルばね３１と中間部６３との間に配置された凹部２１５に収容されている。 Further, at the end far from the intermediate portion 63 in the third direction Z of the second positioning portion 641, a protrusion extending from the second positioning portion 641 along the first direction X toward the first contact spring portion 62. 642 is provided. As shown in FIG. 3, the protrusion 642 is provided in the support portion 211 of the connection housing 21 in the third direction Z, and is housed in the recess 215 arranged between the coil spring 31 and the intermediate portion 63. There is.

図３に示すように、第２接触ばね部６２および緩衝ばね部６４の各々は、接続ハウジング２１の外部でかつコネクタハウジング１０の内部に位置している。緩衝ばね部６４は、コネクタハウジング１０の内部に設けられた第２収容部１７に収容され、第２接触ばね部６２は、コネクタハウジング１０の内部に設けられた第３収容部１８に収容されている。 As shown in FIG. 3, each of the second contact spring portion 62 and the cushioning spring portion 64 is located outside the connection housing 21 and inside the connector housing 10. The cushioning spring portion 64 is housed in a second accommodating portion 17 provided inside the connector housing 10, and the second contact spring portion 62 is accommodated in a third accommodating portion 18 provided inside the connector housing 10. There is.

また、図８に示すように、第２方向Ｙにおける中間部６３の板面と第１収容部２２との間の最短距離Ｄ１が、第２方向Ｙにおける緩衝ばね部６４の板面と第２収容部１７との間の最短距離Ｄ２よりも小さくなっている。さらに、各プローブピン６０の板厚Ｗ１が、隣接するプローブピン６０の板面間の最短距離Ｗ２の１／２以下（好ましくは１／３以下）になるように構成されている。なお、図示していないが、第２方向Ｙにおける第２接触ばね部６２の板面と第３収容部１８との間の最短距離は、第２方向Ｙにおける中間部６３の板面と第１収容部２２との間の最短距離Ｄ１と略同一になっている。 Further, as shown in FIG. 8, the shortest distance D1 between the plate surface of the intermediate portion 63 in the second direction Y and the first accommodating portion 22 is the plate surface of the cushioning spring portion 64 in the second direction Y and the second. It is smaller than the shortest distance D2 between the accommodating portion 17. Further, the plate thickness W1 of each probe pin 60 is configured to be 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. Although not shown, the shortest distance between the plate surface of the second contact spring portion 62 and the third accommodating portion 18 in the second direction Y is the plate surface of the intermediate portion 63 and the first in the second direction Y. It is substantially the same as the shortest distance D1 between the accommodating portion 22 and the accommodating portion 22.

前記コネクタ１では、開口部１４が設けられた開口面１３を有する箱状のコネクタハウジング１０と、開口部１４内であって開口部１４の縁部との間に隙間１５が設けられる基準位置Ｐに配置され、開口面１３上で揺動可能な状態でコネクタハウジング１０に支持されている第１端子接続部２０と、第１端子接続部２０を基準位置Ｐに向かって付勢する付勢部３０とを備えている。このような構成により、検査対象２００が第１端子接続部２０への接続方向（すなわち、第１方向Ｘ）に対して交差する方向から接続された場合であっても、付勢部３０の付勢力に抗して第１端子接続部２０が基準位置Ｐから一旦ずれたのち付勢部３０の付勢力で第１端子接続部２０を基準位置Ｐに戻すことができる。よって、第１端子接続部２０を検査対象２００に対してセルフアライメントさせることができるので、検査対象２００を損傷させることなく接続可能なコネクタ１を実現できる。 In the connector 1, a reference position P in which a gap 15 is provided between a box-shaped connector housing 10 having an opening surface 13 provided with an opening 14 and an edge portion of the opening 14 within the opening 14. The first terminal connection portion 20 which is arranged in the above and is supported by the connector housing 10 in a swingable state on the opening surface 13 and the urging portion which urges the first terminal connection portion 20 toward the reference position P. It has 30 and. With such a configuration, even when the inspection target 200 is connected from a direction intersecting the connection direction to the first terminal connection portion 20 (that is, the first direction X), the urging portion 30 is attached. After the first terminal connection portion 20 is once displaced from the reference position P against the force, the first terminal connection portion 20 can be returned to the reference position P by the urging force of the urging unit 30. Therefore, since the first terminal connection portion 20 can be self-aligned with respect to the inspection target 200, the connector 1 that can be connected without damaging the inspection target 200 can be realized.

また、第１端子接続部２０が、その外面を覆うと共に、コネクタハウジング１０の内部に配置されたグランド端子２６が設けられた導電性の外殻部２５を有している。この外殻部２５により、コネクタを流れる高周波領域の信号の損失を低減できる。 Further, the first terminal connection portion 20 has a conductive outer shell portion 25 which covers the outer surface thereof and is provided with a ground terminal 26 arranged inside the connector housing 10. The outer shell portion 25 can reduce the loss of the signal in the high frequency region flowing through the connector.

また、コネクタハウジング１０の内部に、第１端子接続部２０に対して電気的に接続された基板４０が設けられており、グランド端子２６が、弾性変形した状態で基板４０の接続端子４１に接触可能に構成されている。このような構成により、グランド端子２６の基板４０の接続端子４１に対する接圧を高めて、グランド端子２６と接続端子４１との間の接触信頼性を高めることができる。 Further, a substrate 40 electrically connected to the first terminal connection portion 20 is provided inside the connector housing 10, and the ground terminal 26 comes into contact with the connection terminal 41 of the substrate 40 in an elastically deformed state. It is configured to be possible. With such a configuration, the contact pressure of the ground terminal 26 with respect to the connection terminal 41 of the substrate 40 can be increased, and the contact reliability between the ground terminal 26 and the connection terminal 41 can be improved.

また、付勢部３０が、複数の付勢部材（例えば、コイルばね３１）で構成されており、複数の付勢部材が、第１方向Ｘに直交する仮想直線Ｌ１に対して対称に配置されている。このような構成により、第１端子接続部２０に対する付勢力のばらつきを低減して、より確実に第１端子接続部２０を設計通りに揺動させることができる。その結果、第１端子接続部２０を検査対象２００に対してより確実にセルフアライメントさせることができる。 Further, the urging portion 30 is composed of a plurality of urging members (for example, a coil spring 31), and the plurality of urging members are arranged symmetrically with respect to a virtual straight line L1 orthogonal to the first direction X. ing. With such a configuration, it is possible to reduce the variation in the urging force with respect to the first terminal connection portion 20 and more reliably swing the first terminal connection portion 20 as designed. As a result, the first terminal connection portion 20 can be more reliably self-aligned with respect to the inspection target 200.

また、第１端子接続部２０が、板状のプローブピン６０と、第１方向Ｘに延びて第２方向Ｙで板面が対向するようにプローブピン６０を収容可能な第１収容部２２が設けられた接続ハウジング２１とを有し、プローブピン６０は、第１接触ばね部６１および第２接触ばね部６２と、第１接触ばね部６１および第２接触ばね部６２の間に第１方向Ｘに沿って直列的に配置された中間部６３および緩衝ばね部６４とを備えている。第１接触ばね部６１および第２接触ばね部６２は、中間部６３に対して第３方向Ｚに弾性変形可能に構成され、中間部６３は、第１方向Ｘの両端部がそれぞれ第１接触ばね部６１および緩衝ばね部６４に接続され、緩衝ばね部６４は、第１方向Ｘの両端部がそれぞれ中間部６３および第２接触ばね部６２に接続されていると共に、中間部６３に対して第２方向Ｙに弾性変形可能に構成されている。第２接触ばね部６２および緩衝ばね部６４は、接続ハウジング２１の外部でかつコネクタハウジング１０の内部に位置し、コネクタハウジング１０には、第１方向Ｘに延びて緩衝ばね部６４を収容可能な第２収容部１７が設けられている。そして、第２方向Ｙにおける中間部６３の板面と第１収容部２２との間の最短距離Ｄ１が、第２方向Ｙにおける緩衝ばね部６４の板面と第２収容部１７との間の最短距離Ｄ２よりも小さい。このような構成により、検査対象２００が接触方向（すなわち、第１方向Ｘ）に交差する方向から第１端子接続部２０に接続されて、プローブピン６０に予定している接触方向に交差する方向（例えば、第２方向Ｙ）の応力が加えられたとしても、緩衝ばね部６４によりその応力を分散させて、プローブピン６０の損傷を低減できる。すなわち、検査対象２００が接触方向に交差する方向から第１端子接続部２０に接続された場合であっても、損傷し難いプローブピン６０を実現できる。 Further, the first terminal connecting portion 20 has a plate-shaped probe pin 60 and a first accommodating portion 22 that extends in the first direction X and can accommodate the probe pin 60 so that the plate surfaces face each other in the second direction Y. It has a connection housing 21 provided, and the probe pin 60 has a first direction between the first contact spring portion 61 and the second contact spring portion 62 and the first contact spring portion 61 and the second contact spring portion 62. It includes an intermediate portion 63 and a cushioning spring portion 64 arranged in series along X. The first contact spring portion 61 and the second contact spring portion 62 are configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63, and both ends of the intermediate portion 63 are in first contact with each other in the first direction X. It is connected to the spring portion 61 and the cushioning spring portion 64, and the cushioning spring portion 64 has both ends of the first direction X connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and with respect to the intermediate portion 63. It is configured to be elastically deformable in the second direction Y. The second contact spring portion 62 and the cushioning spring portion 64 are located outside the connection housing 21 and inside the connector housing 10, and the connector housing 10 can extend in the first direction X to accommodate the cushioning spring portion 64. A second housing unit 17 is provided. Then, the shortest distance D1 between the plate surface of the intermediate portion 63 and the first accommodating portion 22 in the second direction Y is between the plate surface of the buffer spring portion 64 and the second accommodating portion 17 in the second direction Y. It is smaller than the shortest distance D2. With such a configuration, the direction in which the inspection target 200 is connected to the first terminal connection portion 20 from the direction intersecting the contact direction (that is, the first direction X) and intersects the planned contact direction with the probe pin 60. Even if the stress in (for example, the second direction Y) is applied, the stress can be dispersed by the buffer spring portion 64 to reduce the damage to the probe pin 60. That is, even when the inspection target 200 is connected to the first terminal connection portion 20 from a direction intersecting the contact direction, the probe pin 60 that is not easily damaged can be realized.

また、接続ハウジング２１が、第１収容部２２と接続ハウジング２１の外部とに連通すると共に、第１接触ばね部６１を接続ハウジング２１の外部から確認可能な確認用窓２４を有している。この確認用窓２４により、第１収容部２２に収容されたプローブピン６０の第１接触ばね部６２の収容状態を容易に確認できる。 Further, the connection housing 21 communicates with the first accommodating portion 22 and the outside of the connection housing 21, and has a confirmation window 24 in which the first contact spring portion 61 can be confirmed from the outside of the connection housing 21. With this confirmation window 24, the accommodation state of the first contact spring portion 62 of the probe pin 60 accommodated in the first accommodation portion 22 can be easily confirmed.

また、第１端子接続部２０が、複数のプローブピン６０と、第２方向Ｙに間隔を空けて配置され、各プローブピン６０がそれぞれ収容された複数の第１収容部２２とを有し、各プローブピン６０の板厚Ｗ１が、隣接するプローブピン６０の板面間の最短距離Ｗ２の１／２以下である。このような構成により、各プローブピン６０の絶縁性を確実に確保することができる。 Further, the first terminal connecting portion 20 has a plurality of probe pins 60 and a plurality of first accommodating portions 22 arranged at intervals in the second direction Y and accommodating each probe pin 60. The plate thickness W1 of each probe pin 60 is ½ or less of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. With such a configuration, the insulating property of each probe pin 60 can be surely secured.

また、前記プローブピン６０が、第１接触ばね部６１および第２接触ばね部６２の間に設けられ、第１収容部２２に収容されたときの第１端子接続部２０に対する第１方向Ｘの位置を決める位置決め部６３１、６４１をさらに備えている。この位置決め部６３１、６４１により、プローブピン６０の第１収容部２２からの脱落を低減できる。 Further, the probe pin 60 is provided between the first contact spring portion 61 and the second contact spring portion 62, and is in the first direction X with respect to the first terminal connection portion 20 when the probe pin 60 is accommodated in the first accommodating portion 22. Further, positioning units 631 and 641 for determining the position are provided. The positioning portions 631 and 641 can reduce the dropping of the probe pin 60 from the first accommodating portion 22.

また、位置決め部が、中間部６３の第３方向Ｚの一方側に設けられ、第１方向Ｘの一方側（例えば、第２接触ばね部６２に向かう方向）への移動を規制する第１位置決め部６３１と、緩衝ばね部６４の第３方向Ｚの他方側に設けられ、第１方向Ｘの他方側（例えば、第２接触ばね部６１に向かう方向）への移動を規制する第２位置決め部６４１とを有している。このような構成により、プローブピン６０の第１収容部２２からの脱落をより低減できる。 Further, the positioning portion is provided on one side of the third direction Z of the intermediate portion 63, and the first positioning restricts the movement toward one side of the first direction X (for example, the direction toward the second contact spring portion 62). A second positioning portion provided on the other side of the third direction Z of the cushioning spring portion 64 and the portion 631 and restricting the movement of the first direction X to the other side (for example, the direction toward the second contact spring portion 61). It has 641 and. With such a configuration, it is possible to further reduce the dropout of the probe pin 60 from the first accommodating portion 22.

なお、前記コネクタ１では、コネクタハウジング１０が、第３方向Ｚに積層された上ハウジング１１および下ハウジング１２で構成されているが、これに限らない。例えば、図９に示すように、第２方向Ｙに積層された左ハウジング７１および右ハウジング７２で構成してもよい。この場合、図１０に示すように、付勢部３０の４つのコイルばね３１は、第１方向Ｘ（すなわち、図１０の紙面貫通方向）から見て、第１端子接続部２０の第２方向Ｙの中心線Ｌ２に対して対称に配置することができる。 In the connector 1, the connector housing 10 is composed of an upper housing 11 and a lower housing 12 laminated in the third direction Z, but the present invention is not limited to this. For example, as shown in FIG. 9, the left housing 71 and the right housing 72 laminated in the second direction Y may be configured. In this case, as shown in FIG. 10, the four coil springs 31 of the urging portion 30 are in the second direction of the first terminal connecting portion 20 when viewed from the first direction X (that is, the paper surface penetrating direction in FIG. 10). It can be arranged symmetrically with respect to the center line L2 of Y.

また、第１収容部２２に収容されたプローブピン６０の中間部６３の板面と第１収容部２２との間の最短距離Ｄ１が、このプローブピン６０の緩衝ばね部６４の板面と第２収容部１７との間の最短距離Ｄ２よりも小さくなるように構成されているが、これに限らず、例えば、最短距離Ｄ１と最短距離Ｄ２とが同じになるように構成してもよい。 Further, the shortest distance D1 between the plate surface of the intermediate portion 63 of the probe pin 60 accommodated in the first accommodating portion 22 and the first accommodating portion 22 is the plate surface of the buffer spring portion 64 of the probe pin 60 and the first. 2 It is configured to be smaller than the shortest distance D2 between the accommodating portions 17, but the present invention is not limited to this, and for example, the shortest distance D1 and the shortest distance D2 may be configured to be the same.

外殻部２５は、接続ハウジング２１の一部を覆うように構成されている場合に限らず、例えば、図９に示すように、接続ハウジング２１の全体を覆うように構成してもよいし、高周波領域の信号の損失をあまり考慮する必要がない場合には、省略することもできる。 The outer shell portion 25 is not limited to the case where it is configured to cover a part of the connection housing 21, and may be configured to cover the entire connection housing 21 as shown in FIG. 9, for example. If it is not necessary to consider the signal loss in the high frequency region so much, it can be omitted.

グランド端子２６は、弾性変形した状態で基板４０の接続端子４１に接触するように構成されている場合に限らず、弾性変形していない状態で基板４０の接続端子４１に接触するように構成してもよい。この場合、例えば、グランド端子２６は、基板４０の接続端子４１に半田付け等により接続して、接触信頼性を高めるようにしてもよい。 The ground terminal 26 is not limited to the case where it is configured to come into contact with the connection terminal 41 of the substrate 40 in an elastically deformed state, but is configured to come into contact with the connection terminal 41 of the substrate 40 in a state where it is not elastically deformed. You may. In this case, for example, the ground terminal 26 may be connected to the connection terminal 41 of the substrate 40 by soldering or the like to improve the contact reliability.

付勢部３０は、４つのコイルばね３１で構成されている場合に限らず、例えば、１～３のコイルばね３１で構成してもよいし、５以上のコイルばね３１で構成してもよい。また、付勢部３０は、複数のコイルばね３１を第３方向Ｚの上下に配置する場合に限らず、複数のコイルばね３１を第３方向Ｚの上下に加えて、第２方向Ｙの左右の一方または両方に配置してもよい。 The urging portion 30 is not limited to the case where it is composed of four coil springs 31, and may be composed of, for example, one to three coil springs 31 or five or more coil springs 31. .. Further, the urging portion 30 is not limited to the case where the plurality of coil springs 31 are arranged above and below the third direction Z, and the plurality of coil springs 31 are added above and below the third direction Z to the left and right of the second direction Y. It may be placed in one or both.

付勢部材は、コイルばね３１に限らず、例えば、図１２に示すように、板ばね３２で構成してもよい。図１２では、第３方向Ｚの上下に板ばね３２をそれぞれ２つずつ配置し（図１２には、３つの板ばね３２のみ示す）、第２方向Ｙの左右の両方に板ばね３２をそれぞれ２つずつ配置している。 The urging member is not limited to the coil spring 31, and may be composed of, for example, a leaf spring 32 as shown in FIG. In FIG. 12, two leaf springs 32 are arranged above and below the third direction Z (only three leaf springs 32 are shown in FIG. 12), and leaf springs 32 are arranged on both the left and right sides of the second direction Y, respectively. Two are arranged.

端子接続部は、コネクタ１の設計等に応じて、その構成を適宜変更できる。 The configuration of the terminal connection portion can be appropriately changed according to the design of the connector 1 and the like.

例えば、第１端子接続部２０のプローブピンは、前記プローブピン６０に限らず、他の構成のプローブピンを用いることもできる。例えば、第１端子接続部２０のプローブピンとして、電鋳法以外の方法で形成されたプローブピンを用いることもできるし、位置決め部６３１、６４１を設けていないプローブピンを用いることもできる。 For example, the probe pin of the first terminal connection portion 20 is not limited to the probe pin 60, and a probe pin having another configuration can be used. For example, as the probe pin of the first terminal connection portion 20, a probe pin formed by a method other than the electroforming method can be used, or a probe pin not provided with the positioning portions 631 and 641 can be used.

また、接続ハウジング２１は、第２方向Ｙに沿って間隔を空けて配置された複数対の第１収容部２２を有する場合に限らず、例えば、図１３に示すように、第３方向Ｚの中心線Ｌ１に対する一方側（図１３では、第３方向Ｚの中心線Ｌ１の上ハウジング１１側）のみに、複数の第１収容部２２を設けてもよい。この場合、外殻部２５のグランド端子２６も、第３方向Ｚの中心線Ｌ１の一方側のみに設ければよい。 Further, the connection housing 21 is not limited to the case where it has a plurality of pairs of first accommodating portions 22 arranged at intervals along the second direction Y, for example, as shown in FIG. 13, in the third direction Z. A plurality of first accommodating portions 22 may be provided only on one side with respect to the center line L1 (in FIG. 13, the upper housing 11 side of the center line L1 in the third direction Z). In this case, the ground terminal 26 of the outer shell portion 25 may be provided only on one side of the center line L1 in the third direction Z.

また、第１端子接続部２０の複数のプローブピン６０は、図５に示すように、第１接触ばね部６１および第２接触ばね部６２の先端部が、第２方向Ｙに沿って一直線に並ぶように配置されている（図５では、第２接触ばね部６２のみ示す）が、これに限らない。例えば、第１接触ばね部６１および第２接触ばね部６２の先端部が交互に第１方向Ｘにずれた千鳥状に、複数のプローブピン６０を配置してもよい。 Further, as shown in FIG. 5, in the plurality of probe pins 60 of the first terminal connection portion 20, the tip portions of the first contact spring portion 61 and the second contact spring portion 62 are aligned along the second direction Y. Although they are arranged side by side (in FIG. 5, only the second contact spring portion 62 is shown), the present invention is not limited to this. For example, a plurality of probe pins 60 may be arranged in a staggered manner in which the tips of the first contact spring portion 61 and the second contact spring portion 62 are alternately displaced in the first direction X.

また、確認用窓２４を省略してもよい。 Further, the confirmation window 24 may be omitted.

また、各プローブピン６０の板厚Ｗ１が、隣接するプローブピン６０の板面間の最短距離Ｗ２の１／２以下（好ましくは１／３以下）になるように構成されている場合に限らず、各プローブピン６０の板厚Ｗ１が、隣接するプローブピン６０の板面間の最短距離Ｗ２の１／２よりも大きくなるように構成することもできる。 Further, the plate thickness W1 of each probe pin 60 is not limited to the case where the plate thickness W1 is configured to be 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. The plate thickness W1 of each probe pin 60 can be configured to be larger than 1/2 of the shortest distance W2 between the plate surfaces of adjacent probe pins 60.

以上、図面を参照して本開示における種々の実施形態を詳細に説明したが、最後に、本開示の種々の態様について説明する。なお、以下の説明では、一例として、参照符号も添えて記載する。 The various embodiments of the present disclosure have been described in detail with reference to the drawings, and finally, various aspects of the present disclosure will be described. In the following description, a reference reference numeral is also described as an example.

本開示の第１態様のコネクタ１は、
検査装置１００と検査対象２００とに接続可能なコネクタ１であって、
開口部１４が設けられた開口面１３を有する箱状のコネクタハウジング１０と、
前記開口面１３に交差する第１方向Ｘの一端部が前記コネクタハウジング１０の内部に位置しかつ前記第１方向Ｘの他端部が前記検査対象２００を接続可能に前記コネクタハウジング１０の外部に露出していると共に、前記開口部１４内であって前記開口部１４の縁部との間に隙間１５が設けられる基準位置Ｐに配置され、前記開口面１３上で揺動可能な状態で前記コネクタハウジング１０に支持されている端子接続部２０と、
前記コネクタハウジング１０の内部に配置されて、前記コネクタハウジング１０に対して前記端子接続部２０を前記基準位置Ｐに向かって付勢する付勢部３０と
を備える。 The connector 1 of the first aspect of the present disclosure is
A connector 1 that can be connected to the inspection device 100 and the inspection target 200.
A box-shaped connector housing 10 having an opening surface 13 provided with an opening 14 and a box-shaped connector housing 10.
One end of the first direction X intersecting the opening surface 13 is located inside the connector housing 10, and the other end of the first direction X is outside the connector housing 10 so that the inspection target 200 can be connected. The exposed state is arranged at a reference position P in the opening 14 where a gap 15 is provided between the opening 14 and the edge of the opening 14, and the connector is swingable on the opening surface 13. The terminal connection portion 20 supported by the connector housing 10 and
It is provided inside the connector housing 10 with an urging portion 30 that urges the terminal connection portion 20 toward the reference position P with respect to the connector housing 10.

第１態様のコネクタ１によれば、検査対象２００が端子接続部２０への接続方向（すなわち、第１方向Ｘ）に対して交差する方向から接続された場合であっても、付勢部３０の付勢力に抗して端子接続部２０が基準位置Ｐから一旦ずれたのち付勢部３０の付勢力で第１端子接続部２０を基準位置Ｐに戻すことができる。よって、端子接続部２０を検査対象２００に対してセルフアライメントさせることができるので、検査対象２００を損傷させることなく接続可能なコネクタ１を実現できる。 According to the connector 1 of the first aspect, even when the inspection target 200 is connected from the direction intersecting the connection direction to the terminal connection portion 20 (that is, the first direction X), the urging portion 30 After the terminal connection portion 20 is temporarily displaced from the reference position P against the urging force of the above, the first terminal connection portion 20 can be returned to the reference position P by the urging force of the urging portion 30. Therefore, since the terminal connection portion 20 can be self-aligned with respect to the inspection target 200, the connector 1 that can be connected without damaging the inspection target 200 can be realized.

本開示の第２態様のコネクタ１は、
前記端子接続部２０が、その外面を覆うと共に、前記コネクタハウジング１０の内部に配置されたグランド端子２６が設けられた導電性の外殻部２５を有している。 The connector 1 of the second aspect of the present disclosure is
The terminal connection portion 20 has a conductive outer shell portion 25 that covers the outer surface thereof and is provided with a ground terminal 26 arranged inside the connector housing 10.

第２態様のコネクタ１によれば、外殻部２５により、コネクタを流れる高周波領域の信号の損失を低減できる。 According to the connector 1 of the second aspect, the outer shell portion 25 can reduce the loss of the signal in the high frequency region flowing through the connector.

本開示の第３態様のコネクタ１は、
前記コネクタハウジング１０の内部に、前記端子接続部２０に対して電気的に接続された基板４０が設けられており、
前記グランド端子２６が、弾性変形した状態で前記基板の接続端子４１に接触可能に構成されている。 The connector 1 of the third aspect of the present disclosure is
A substrate 40 electrically connected to the terminal connection portion 20 is provided inside the connector housing 10.
The ground terminal 26 is configured to be in contact with the connection terminal 41 of the substrate in an elastically deformed state.

第３態様のコネクタ１によれば、グランド端子２６の基板４０の接続端子４１に対する接圧を高めて、グランド端子２６と接続端子４１との間の接触信頼性を高めることができる。 According to the connector 1 of the third aspect, the contact pressure of the ground terminal 26 with respect to the connection terminal 41 of the substrate 40 can be increased to improve the contact reliability between the ground terminal 26 and the connection terminal 41.

本開示の第４態様のコネクタ１は、
前記付勢部３０が、複数の付勢部材３１、３２で構成されており、
前記複数の付勢部材３１、３２が、前記第１方向Ｘに直交する仮想直線Ｌ１に対して対称に配置されている。 The connector 1 of the fourth aspect of the present disclosure is
The urging portion 30 is composed of a plurality of urging members 31 and 32.
The plurality of urging members 31, 32 are arranged symmetrically with respect to the virtual straight line L1 orthogonal to the first direction X.

第４態様のコネクタ１によれば、端子接続部２０に対する付勢力のばらつきを低減して、より確実に端子接続部２０を設計通りに揺動させることができる。その結果、端子接続部２０を検査対象２００に対してより確実にセルフアライメントさせることができる。 According to the connector 1 of the fourth aspect, it is possible to reduce the variation in the urging force with respect to the terminal connection portion 20 and more reliably swing the terminal connection portion 20 as designed. As a result, the terminal connection portion 20 can be more reliably self-aligned with respect to the inspection target 200.

本開示の第５態様のコネクタ１は、
前記端子接続部２０が、
板状のプローブピン６０と、
前記第１方向Ｘに延びて前記第１方向Ｘに交差する第２方向Ｙで板面が対向するように前記プローブピン６０を収容可能な第１収容部２２が設けられた接続ハウジング２１と
を有し、
前記プローブピン６０は、
第１接触ばね部６１および第２接触ばね部６２と、
前記第１接触ばね部６１および前記第２接触ばね部６２の間に前記第１方向Ｘに沿って直列的に配置された中間部６３および緩衝ばね部６４と
を備え、
前記第１接触ばね部６１および前記第２接触ばね部６２は、前記中間部６３に対して前記第１方向Ｘおよび前記第２方向Ｙに交差する第３方向Ｚに弾性変形可能に構成され、
前記中間部６３は、前記第１方向Ｘの両端部がそれぞれ前記第１接触ばね部６１および前記緩衝ばね部６４に接続され、
前記緩衝ばね部６４は、前記第１方向Ｘの両端部がそれぞれ前記中間部６３および前記第２接触ばね部６２に接続されていると共に、前記中間部６３に対して前記第２方向Ｙに弾性変形可能に構成されており、
前記第２接触ばね部６２および前記緩衝ばね部６４は、前記接続ハウジング２１の外部でかつ前記コネクタハウジング１０の内部に位置し、
前記コネクタハウジング１０には、前記第１方向Ｘに延びて前記緩衝ばね部６４を収容可能な第２収容部１７が設けられており、
前記第２方向Ｙにおける前記中間部６３の板面と前記第１収容部２２との間の最短距離Ｄ１が、前記第２方向Ｙにおける前記緩衝ばね部６４の板面と前記第２収容部１７との間の最短距離Ｄ２よりも小さい。 The connector 1 of the fifth aspect of the present disclosure is
The terminal connection portion 20
Plate-shaped probe pin 60 and
A connection housing 21 provided with a first accommodating portion 22 capable of accommodating the probe pin 60 so that the plate surfaces face each other in the second direction Y extending in the first direction X and intersecting the first direction X. Have and
The probe pin 60 is
The first contact spring portion 61 and the second contact spring portion 62,
An intermediate portion 63 and a cushioning spring portion 64 arranged in series along the first direction X are provided between the first contact spring portion 61 and the second contact spring portion 62.
The first contact spring portion 61 and the second contact spring portion 62 are configured to be elastically deformable in a third direction Z intersecting the first direction X and the second direction Y with respect to the intermediate portion 63.
In the intermediate portion 63, both ends of the first direction X are connected to the first contact spring portion 61 and the buffer spring portion 64, respectively.
The buffer spring portion 64 has both ends of the first direction X connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and is elastic with respect to the intermediate portion 63 in the second direction Y. It is configured to be deformable and
The second contact spring portion 62 and the cushioning spring portion 64 are located outside the connection housing 21 and inside the connector housing 10.
The connector housing 10 is provided with a second accommodating portion 17 that extends in the first direction X and can accommodate the cushioning spring portion 64.
The shortest distance D1 between the plate surface of the intermediate portion 63 and the first accommodating portion 22 in the second direction Y is the plate surface of the buffer spring portion 64 and the second accommodating portion 17 in the second direction Y. It is smaller than the shortest distance D2 between and.

第５態様のコネクタ１によれば、検査対象２００が接触方向（すなわち、第１方向Ｘ）に交差する方向から端子接続部２０に接続されて、プローブピン６０に接触方向に交差する方向（例えば、第２方向Ｙ）の応力が加わったとしても、緩衝ばね部６４によりその応力を分散させて、プローブピン６０の損傷を低減できる。すなわち、検査対象２００が接触方向に交差する方向から端子接続部２０に接続された場合であっても、損傷し難いプローブピン６０を実現できる。 According to the connector 1 of the fifth aspect, the inspection target 200 is connected to the terminal connection portion 20 from the direction intersecting the contact direction (that is, the first direction X) and intersects the probe pin 60 in the contact direction (for example). , Even if the stress in the second direction Y) is applied, the stress can be dispersed by the buffer spring portion 64 to reduce the damage to the probe pin 60. That is, even when the inspection target 200 is connected to the terminal connection portion 20 from a direction intersecting the contact direction, the probe pin 60 that is not easily damaged can be realized.

本開示の第６態様のコネクタ１は、
前記接続ハウジング２１が、前記第１収容部２２と前記接続ハウジング２１の外部とに連通すると共に、前記第１接触ばね部６１を前記接続ハウジング２１の外部から確認可能な確認用窓２４を有している。 The connector 1 of the sixth aspect of the present disclosure is
The connection housing 21 communicates with the first accommodating portion 22 and the outside of the connection housing 21, and has a confirmation window 24 in which the first contact spring portion 61 can be confirmed from the outside of the connection housing 21. ing.

第６態様のコネクタ１によれば、確認用窓２４により、第１収容部２２に収容されたプローブピン６０の接触ばね部６２の収容状態を容易に確認できる。 According to the connector 1 of the sixth aspect, the accommodation state of the contact spring portion 62 of the probe pin 60 accommodated in the first accommodation portion 22 can be easily confirmed by the confirmation window 24.

本開示の第７態様のコネクタ１は、
前記端子接続部２０が、
複数の前記プローブピン６０と、
前記第２方向Ｙに間隔を空けて配置され、前記プローブピン６０がそれぞれ収容された複数の前記第１収容部２２と
を有し、
前記プローブピン６０の板厚Ｗ１が、隣接する前記プローブピン６０の板面間の最短距離Ｗ１の１／２以下である。 The connector 1 of the seventh aspect of the present disclosure is
The terminal connection portion 20
The plurality of probe pins 60 and
It has a plurality of first accommodating portions 22 arranged at intervals in the second direction Y and accommodating the probe pins 60, respectively.
The plate thickness W1 of the probe pin 60 is ½ or less of the shortest distance W1 between the plate surfaces of the adjacent probe pins 60.

第７態様のコネクタ１によれば、各プローブピン６０の絶縁性を確実に確保することができる。 According to the connector 1 of the seventh aspect, the insulating property of each probe pin 60 can be surely secured.

なお、前記様々な実施形態または変形例のうちの任意の実施形態または変形例を適宜組み合わせることにより、それぞれの有する効果を奏するようにすることができる。また、実施形態同士の組み合わせまたは実施例同士の組み合わせまたは実施形態と実施例との組み合わせが可能であると共に、異なる実施形態または実施例の中の特徴同士の組み合わせも可能である。 By appropriately combining any of the various embodiments or modifications thereof, the effects of each can be achieved. Further, a combination of embodiments, a combination of examples, or a combination of an embodiment and an embodiment is possible, and a combination of features in different embodiments or examples is also possible.

本開示のコネクタは、例えば、ＵＳＢデバイスあるいはＨＤＭＩデバイスの検査に用いることができる。 The connectors of the present disclosure can be used, for example, for inspecting USB devices or HDMI devices.

１ コネクタ
１０ コネクタハウジング
１１ 上ハウジング
１１１ 凹部
１２ 下ハウジング
１２１ 凹部
１３ 開口面
１４ 開口部
１５ 隙間
１６ コイルばね収容部
１７ 第２収容部
１８ 第３収容部
２０ 第１端子接続部
２０１ 第１端部
２０２ 第２端部
２１ 接続ハウジング
２１１ 支持部
２１２ 凹部
２１３ 端部
２１４、２１５ 凹部
２２ 第１収容部
２３ 凹部
２４ 確認用窓
２５ 外殻部
２６ グランド端子
３０ 付勢部
３１ コイルばね
３２ 板ばね
４０ 基板
５０ 第２端子接続部
６０ プローブピン
６１ 第１接触ばね部
６２ 第２接触ばね部
６２１、６２２ 帯状弾性片
６３ 中間部
６３１ 第１位置決め部
６４ 緩衝ばね部
６４１ 第２位置決め部
６４２ 突起部
７１ 左ハウジング
７２ 右ハウジング
１００ 検査装置
２００ 検査対象
Ｌ１、Ｌ２ 中心線
Ｐ 基準位置
Ｘ 第１方向
Ｙ 第２方向
Ｚ 第３方向
Ｄ１、Ｄ２ 最短距離
Ｗ１ 板厚
Ｗ２ 最短距離 1 Connector 10 Connector housing 11 Upper housing 111 Recess 12 Lower housing 121 Recess 13 Opening surface 14 Opening 15 Gap 16 Coil spring accommodating 17 Second accommodating 18 Third accommodating 20 First terminal connection 201 First end 202 Second end 21 Connection housing 211 Support part 212 Recess 213 End part 214, 215 Recess 22 First accommodating part 23 Recess 24 Confirmation window 25 Outer shell part 26 Ground terminal 30 Bounce part 31 Coil spring 32 Leaf spring 40 Board 50 2nd terminal connection part 60 Probe pin 61 1st contact spring part 62 2nd contact spring part 621, 622 Band-shaped elastic piece 63 Intermediate part 631 1st positioning part 64 Buffer spring part 641 2nd positioning part 642 Protrusion part 71 Left housing 72 Right housing 100 Inspection device 200 Inspection target L1, L2 Center line P Reference position X 1st direction Y 2nd direction Z 3rd direction D1, D2 Shortest distance W1 Plate thickness W2 Shortest distance

Claims (7)

検査装置と検査対象とに接続可能なコネクタであって、
開口部が設けられた開口面を有する箱状のコネクタハウジングと、
前記開口面に交差する第１方向の一端部が前記コネクタハウジングの内部に位置しかつ前記第１方向の他端部が前記検査対象を接続可能に前記コネクタハウジングの外部に露出していると共に、前記開口部内で前記開口部の縁部との間に隙間が設けられる基準位置に配置され、前記開口面上で揺動可能な状態で前記コネクタハウジングに支持されている端子接続部と、
前記コネクタハウジングの内部に配置されて、前記コネクタハウジングに対して前記端子接続部を前記基準位置に向かって付勢する付勢部と
を備え、
前記付勢部が、複数のコイルばねで構成されており、
前記複数のコイルばねが、前記コネクタハウジングから前記端子接続部に向かう方向に延びていると共に、前記第１方向に直交する仮想直線に対して対称に配置され、
前記複数のコイルばねの各々が、前記端子接続部に設けられた凹部と前記コネクタハウジングに設けられた凹部とで構成されたコイルばね収容部に収容されている、コネクタ。 A connector that can be connected to the inspection device and the inspection target.
A box-shaped connector housing with an opening surface provided with an opening,
One end in the first direction intersecting the opening surface is located inside the connector housing, and the other end in the first direction is exposed to the outside of the connector housing so that the inspection target can be connected. A terminal connection portion that is arranged in the opening at a reference position where a gap is provided between the opening and the edge of the opening and is supported by the connector housing in a swingable state on the opening surface.
It is provided with an urging portion that is arranged inside the connector housing and urges the terminal connection portion toward the reference position with respect to the connector housing.
The urging portion is composed of a plurality of coil springs.
The plurality of coil springs extend from the connector housing toward the terminal connection portion and are arranged symmetrically with respect to a virtual straight line orthogonal to the first direction.
A connector in which each of the plurality of coil springs is housed in a coil spring accommodating portion composed of a recess provided in the terminal connection portion and a recess provided in the connector housing . 前記コイルばねが、前記第１方向および前記仮想直線に直交する方向に配置されている、請求項１のコネクタ。The connector according to claim 1, wherein the coil spring is arranged in the first direction and in a direction orthogonal to the virtual straight line. 前記端子接続部が、その外面を覆うと共に、前記コネクタハウジングの内部に配置されたグランド端子が設けられた導電性の外殻部を有している、請求項１または２のコネクタ。 The connector according to claim 1 or 2 , wherein the terminal connection portion covers the outer surface thereof and has a conductive outer shell portion provided with a ground terminal arranged inside the connector housing. 前記コネクタハウジングの内部に、前記端子接続部に対して電気的に接続された基板が設けられており、
前記グランド端子が、弾性変形した状態で前記基板の接続端子に接触可能に構成されている、請求項３のコネクタ。 A substrate electrically connected to the terminal connection portion is provided inside the connector housing.
The connector according to claim 3 , wherein the ground terminal is configured to be in contact with a connection terminal of the substrate in an elastically deformed state. 前記端子接続部が、
板状のプローブピンと、
前記第１方向に延びて前記第１方向に交差する第２方向で板面が対向するように前記プローブピンを収容可能な第１収容部が設けられた接続ハウジングと
を有し、
前記プローブピンは、
第１接触ばね部および第２接触ばね部と、
前記第１接触ばね部および前記第２接触ばね部の間に前記第１方向に沿って直列的に配置された中間部および緩衝ばね部と
を備え、
前記第１接触ばね部および前記第２接触ばね部は、前記中間部に対して前記第１方向および前記第２方向に交差する第３方向に弾性変形可能に構成され、
前記中間部は、前記第１方向の両端部がそれぞれ前記第１接触ばね部および前記緩衝ばね部に接続され、
前記緩衝ばね部は、前記第１方向の両端部がそれぞれ前記中間部および前記第２接触ばね部に接続されていると共に、前記中間部に対して前記第２方向に弾性変形可能に構成されており、
前記第２接触ばね部および前記緩衝ばね部は、前記接続ハウジングの外部でかつ前記コネクタハウジングの内部に位置し、
前記コネクタハウジングには、前記第１方向に延びて前記緩衝ばね部を収容可能な第２収容部が設けられており、
前記第２方向における前記中間部の板面と前記第１収容部との間の最短距離が、前記第２方向における前記緩衝ばね部の板面と前記第２収容部との間の最短距離よりも小さい、請求項１から４のいずれか１つのコネクタ。 The terminal connection part
With a plate-shaped probe pin,
It has a connection housing provided with a first accommodating portion capable of accommodating the probe pin so that the plate surfaces face each other in the second direction extending in the first direction and intersecting the first direction.
The probe pin is
The first contact spring part and the second contact spring part,
An intermediate portion and a cushioning spring portion arranged in series along the first direction between the first contact spring portion and the second contact spring portion are provided.
The first contact spring portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion.
In the intermediate portion, both ends in the first direction are connected to the first contact spring portion and the buffer spring portion, respectively.
The buffer spring portion is configured such that both ends in the first direction are connected to the intermediate portion and the second contact spring portion, respectively, and elastically deformable in the second direction with respect to the intermediate portion. Ori,
The second contact spring portion and the cushioning spring portion are located outside the connection housing and inside the connector housing.
The connector housing is provided with a second accommodating portion that extends in the first direction and can accommodate the cushioning spring portion.
The shortest distance between the plate surface of the intermediate portion and the first accommodating portion in the second direction is smaller than the shortest distance between the plate surface of the buffer spring portion and the second accommodating portion in the second direction. Also small, any one of claims 1 to 4. 前記接続ハウジングが、前記第１収容部と前記接続ハウジングの外部とに連通すると共に、前記第１接触ばね部を前記接続ハウジングの外部から確認可能な確認用窓を有している、請求項５のコネクタ。 5. The connection housing communicates with the first accommodating portion and the outside of the connection housing, and has a confirmation window in which the first contact spring portion can be confirmed from the outside of the connection housing. Connector. 前記端子接続部が、
複数の前記プローブピンと、
前記第２方向に間隔を空けて配置され、前記プローブピンがそれぞれ収容された複数の前記第１収容部と
を有し、
前記プローブピンの板厚が、隣接する前記プローブピンの板面間の最短距離の１／２以下である、請求項５または６のコネクタ。 The terminal connection part
With the plurality of probe pins,
It has a plurality of the first accommodating portions, each of which is arranged at a distance in the second direction and accommodates the probe pins.
The connector according to claim 5 or 6, wherein the plate thickness of the probe pin is ½ or less of the shortest distance between the plate surfaces of the adjacent probe pins.
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