TW202009494A - Probe unit - Google Patents

Abstract

A probe unit comprises a plate-like probe pin that has, on both ends thereof in a first direction, a first contact portion and a second contact portion, a housing capable of accommodating the probe pin in the interior thereof, with the first contact portion being disposed outside of the housing through an opening portion of an open surface, a swing member that is supported in a swingable manner along the first direction and an extending direction of the open surface with respect to the housing and has an accommodating hole capable of accommodating the first contact portion, and an urging portion that urges the swing member toward an initial position in the first direction with respect to the housing and urges the swing member, with respect to the housing, toward a center of a swing range of the swing member in the extending direction of the open surface.

Description

Probe unit

The present disclosure relates to a probe unit.

In electronic component modules such as cameras and liquid crystal panels, in general, continuity inspection and operation characteristic inspection are performed in the manufacturing steps thereof. These inspections are performed by using probe pins to connect the terminals for connecting to the main body substrate provided in the electronic component module and the terminals of the inspection device.

As such a probe, there is a pogo pin type probe described in Patent Document 1. The probe includes: a plunger portion having a contact terminal and a plunger body portion coaxially disposed with the contact terminal; and a barrel portion provided on the outer peripheral side of the plunger portion. [Prior Art Literature] [Patent Literature]

[Patent Document 1] Japanese Patent Laid-Open No. 2016-142644

[Problems to be solved by the invention]

In recent years, progress has been made in miniaturization of electronic component modules, and inspection tools for inspecting electronic component modules are also required to be miniaturized. In general, the smaller the pogo pin-type probe like the above-mentioned probe is, the lower the rigidity is, and the easier it is to damage. Therefore, there is a concern that the inspection tool using the probe cannot cope with miniaturization.

An object of the present disclosure is to provide a probe unit capable of coping with miniaturization. [Means to solve the problem]

An example probe unit of the present disclosure includes: The plate-shaped probe has a first contact portion and a second contact portion at both ends in the first direction; The case has an opening surface that intersects the first direction, and the probe can be housed inside in a state where the first contact portion is arranged outside via the opening portion of the opening surface; The swinging member is supported by the housing in a state capable of swinging in the first direction and the extending direction of the opening surface, and has a penetration in the first direction and can accommodate the first contact portion Containment hole; and The urging portion is arranged inside the casing, and urges the swing member to the casing in the first direction toward the initial position farthest from the opening surface, on the opening surface The swinging member is biased toward the housing toward the center of the swinging range of the swinging member in the extending direction. [Effect of invention]

According to the probe unit, it includes a plate-shaped probe and a swing member, and the swing member has a receiving hole capable of receiving the first contact portion of the probe. With this configuration, it is possible to easily realize a probe unit capable of coping with miniaturization.

Hereinafter, an example of the present disclosure will be described based on the accompanying drawings. In addition, in the following description, terms indicating a specific direction or position are used as necessary (for example, terms including "upper", "lower", "right", and "left"), but the use of these terms is for ease of use Understand this disclosure with reference to the drawings, and the technical scope of this disclosure is not limited by the meaning of these terms. In addition, the following description is merely illustrative in nature, and is not intended to limit the present disclosure, its applications, or its uses. Furthermore, the drawings are schematic, and the ratios and the like of the dimensions do not necessarily coincide with the actual ones.

As shown in FIG. 1, a probe unit 1 according to an embodiment of the present disclosure includes: a housing 10; a plate-shaped probe 20 housed inside the housing 10; and a swing member 30 that is swingably supported by the housing体10。 10. In this embodiment, as an example, a plurality of probes 20 are housed inside the housing 10. As shown in FIGS. 2 and 3, each probe 20 has a first contact portion 21 and a second contact portion 22 at both ends in the first direction X, and crosses the first direction X (for example, orthogonal ) Are arranged at intervals in the plate thickness direction Z. That is, the probes 20 are arranged in a row with the plate surfaces facing each other.

As an example, as shown in FIG. 1, the case 10 includes a base case 11 having a substantially rectangular parallelepiped shape and a core case 12 housed inside the base case 11.

As an example, as shown in FIG. 2, the base case 11 has a pair of opening surfaces 111 and 112 (hereinafter referred to as a first opening surface 111 and a second opening surface 112) crossing the first direction X. A substantially rectangular opening 113 and an opening 114 are provided at the approximate center of the first opening surface 111 and the second opening surface 112 in the longitudinal direction (that is, the plate thickness direction Z). Inside the base housing 11, a housing accommodating portion 13 accommodating the core housing 12 is provided. The opening 113 and the opening 114 are respectively connected to the housing accommodating portion 13. The first contact portion 21 and the second contact portion 22 of the probe 20 are arranged outside the base case 11 via the opening 113 and the opening 114, respectively. In this embodiment, as shown in FIG. 1, the base case 11 includes three substantially rectangular plate members 116, 117, and 118 stacked in the first direction X. The plate member 116, the plate member 117, and the plate member 118 are integrated by the pin member 17.

A receiving groove 115 is provided around the core case 12 of the base case 11. The accommodating grooves 115 are provided on both sides in the thickness direction Z of the core case 12 of the base case 11. Each receiving groove 115 extends inside the base case 11 in the plate thickness direction Z and away from the core case 12. A support portion 32 of a swing member 30 and a coil spring 50 (an example of an urging portion), which will be described later, are accommodated in each of the housing grooves 115. The coil spring 50 faces the support portion 32 in the first direction X and from the second The opening surface 112 urges toward the first opening surface 111.

As an example, as shown in FIG. 3, the core case 12 has a first core case 121 and a second core case 122, the first core case 121 and the second core case 122 are respectively provided inside A plurality of probe housing portions 123 capable of housing the probe 20. In each of the core case 121 and the core case 122, the probe accommodating portions 123 are arranged adjacent to each other in the second direction Y crossing (eg, orthogonal) to the first direction X and the plate thickness direction Z, and by the base The housing 11 is positioned independently of each other and held integrally. As shown in FIG. 2, the probe housing portions 123 are arranged in a row at intervals in the plate thickness direction Z. In each probe accommodating portion 123, one probe 20 is electrically independent of the other probes 20, and each contact portion 21 and contact portion 22 at both ends of the first direction X are located in each core housing 121 1. The state outside the core case 122 is accommodated.

In addition, as shown in FIG. 1, the probe unit 1 includes a swing member 30 arranged outside the housing 10. The swing member 30 includes: a swing plate portion 31 arranged to face the first opening surface 111; and a pair of support portions 32 extending from both ends of the swing plate portion 31 in the thickness direction Z in the first direction X, respectively. The swing plate portion 31 is supported by the housing 10 via a pair of support portions 32 in a swingable state.

As shown in FIG. 3, the swing plate portion 31 has a recess 33 provided in the first direction X on a surface opposite to the surface facing the first opening surface 111; and a plurality of receiving holes 34 provided in the The bottom surface of the recess 33. The recess 33 is configured, for example, when a connector of an inspection object or an inspection device as an example of a contact object is brought into contact with the probe unit 1, a part of the connector is accommodated, and the position of the connector relative to the swing member 30 is determined. Each receiving hole 34 penetrates the swinging plate portion 31 in the first direction X, and receives the first contact portion 21 of the probe 20. In this embodiment, a number of storage holes 34 corresponding to the stored probes 20 are provided.

As shown in FIG. 2, in each support portion 32, the front end portion away from the swing plate portion 31 in the first direction X is accommodated in the accommodation groove 115 of the base case 11. A flange portion 38 is provided at the front end of each support portion 32, and the flange portion 38 extends in a direction away from each support portion 32. Each flange portion 38 is arranged in the first direction X so as to be able to contact the inner surface of the base case 11 constituting the receiving groove 115 and is urged to the base case 11 by the coil spring 50.

As shown in FIGS. 4 and 5, in the probe unit 1, each flange portion 38 is biased to the base housing 11 by four coil springs 50. In detail, each flange portion 38 has a substantially rectangular shape in which the second direction Y becomes a long side in a plan view when viewed along the first direction X, and the two ends of each flange portion 38 in the second direction Y are respectively Coil spring 50 is provided. In other words, each coil spring 50 is configured to be located at each vertex of the quadrilateral surrounding the probe 20 in a plan view viewed along the first direction X.

In addition, as shown in FIG. 5, in a plan view viewed along the first direction X, the center of gravity GP of the swing member 30 is located inside the quadrangle, and the quadrangle will pass through two adjacent ones in the first direction X and the second direction Y The four imaginary straight lines L1 to L4 at any point (for example, the center) of the coil spring 50 serve as one side, respectively. In other words, each coil spring 50 is arranged such that the center of gravity GP of the swing member 30 is located inside the polygon with each coil spring 50 as the apex.

As shown in FIGS. 2 and 3, the movement of the swing member 30 in the first direction X is restricted between the initial position P1 and the operating position P2 by the flange portion 38 and the receiving groove 115. The initial position P1 is the position farthest from the first opening surface 111 among the positions in the first direction X in which the swing member 30 can move. In a state where no external force in the first direction X is applied, the swing member 30 is held at the initial position P1 by the force applied by the coil spring 50. The operation position P2 is the position closest to the first opening surface 111 among the positions in the first direction X in which the swing member 30 can move.

In addition, as shown in FIG. 6, in a plan view viewed along the first direction X, a gap 35 in the second direction Y and a plate thickness direction Z are provided between each support portion 32 of the swing member 30 and the receiving groove 115. Clearance 36. Furthermore, in FIG. 6, only one support portion 32 is shown. The movement of the swing member 30 in the second direction Y and the plate thickness direction Z is restricted to the range of the gap 35 and the gap 36. When the extending direction of the first opening surface 111 (that is, the extending direction of the plane including the second direction Y and the thickness direction Z), the position where the gap 35 and the gap 36 are formed between the receiving groove 115 is set as At the center of the swing range, the swing member 30 is urged toward the center of the swing range by the four coil springs 50 in the extending direction of the first opening surface 111.

As an example, as shown in FIG. 7, each probe 20 has a thin plate shape elongated in the first direction X and has electrical conductivity. Each probe 20 includes: an elastic portion 201 capable of elastic deformation along the first direction X; a first contact portion 202 connected to one end of the elastic portion 201 in the first direction X and provided with a first contact portion 21; and a second The contact portion 203 is connected to the other end of the elastic portion 201 in the first direction X and is provided with a second contact portion 22. Each probe 20 is formed by, for example, an electroforming method, and the elastic portion 201, the first contact portion 202, and the second contact portion 203 are arranged in series along the first direction X and are integrally formed.

As an example, the elastic portion 201 includes a plurality of band-shaped elastic pieces arranged with a gap therebetween. Each band-shaped elastic sheet has an elongated band shape and has substantially the same cross-sectional shape.

As an example, the first contact portion 202 includes: a body portion 23 that connects the elastic portion 201 from a direction crossing the first direction X; and a pair of leg portions 24, 25 from the body portion 23 toward the first direction X and away from the elasticity The direction of the portion 201 extends.

The body portion 23 has an abutment portion 231 that is disposed near the end of the elastic portion 201 in the first direction X and extends in the second direction Y.

The leg portions 24 and 25 are arranged with a gap 26 in the second direction Y, and are configured to be elastically deformable in the second direction Y. The first contact portions 21 are provided at the front ends of the leg portions 24 and 25, respectively. Each first contact portion 21 is configured to be able to contact a contact object (for example, a convex contact of an inspection object) from the first direction X. In addition, each of the leg portions 24 and 25 has a protrusion portion 241 and a protrusion portion 251 provided on the side facing each other in the second direction Y. The protrusions 241 and the protrusions 251 protrude so as to close the gap 26 between the pair of leg portions 24 and 25, thereby preventing the contact object from being excessively inserted into the gap 26.

Furthermore, as shown in FIGS. 2 and 3, each first contact portion 21 is accommodated in the corresponding accommodation hole 34 of the swing member 30, and when the swing member 30 is at the initial position P1, each first contact portion A part of 21 protrudes from the bottom surface of the recess 33.

As an example, the second contact portion 203 has a body portion 27 that is connected to the elastic portion 201 from the second direction Y. The body portion 27 has a contact portion 271 that extends from the end portion on the elastic portion 201 side in the first direction X in the second direction Y. The front end of the main body portion 27 in the first direction X has a substantially triangular shape that is thinner in the first direction X as it moves away from the elastic portion 201 and constitutes the second contact portion 22.

The first contact portion 202 and the second contact portion 203 are respectively arranged on an imaginary straight line L5 passing through the center of the pair of leg portions 24 and 25 of the first contact portion 202 in the second direction Y and extending in the first direction X. The elastic portion 201, each contact portion 231, and the contact portion 271 are respectively disposed on the same side in the second direction Y with respect to the virtual straight line L5.

As shown in FIG. 3, in a state where the probe 20 is accommodated in each probe accommodating portion 123 of the core housing 12, the contact portion 231 of the first contact portion 202 and the contact portion 271 of the second contact portion 203 are respectively It is configured to contact the inner surfaces of the first core case 121 and the second core case 122 constituting each probe accommodating portion 123 in the first direction X. That is, the positions of the contact portions 21 and the contact portions 22 of the probe 20 in the first direction X are determined by the contact portions 231 and the contact portions 271.

In addition, the elastic portion 201 is disposed on one side with respect to the end 232 in the width direction (ie, the second direction Y) of the body portion 23 of the first contact portion 202 and the end 272 in the width direction of the body portion 27 of the second contact portion 203 . Furthermore, in this embodiment, one end 232 of the main body portion 23 of the first contact portion 202 and one end 272 of the main body portion 27 of the second contact portion 203 are arranged on a straight line parallel to the virtual straight line L5.

The probe unit 1 is used for, for example, a business-to-business (B to B) connector including a camera module as a module for connecting media, as well as a small outline package (SOP), a four-sided flat package (Quad Flat Package, QFP), ball grid array (Ball grid array, BGA) and other semiconductor packages for continuity inspection or operating characteristic inspection. In this type of inspection, each probe 20 generally makes frequent contact with and release of contact with an inspection object or inspection device, which is an example of the contact object, and therefore requires durability. When the probe 20 is miniaturized, the durability requirement is further enhanced.

In addition, the repetition frequency of the object to be inspected with respect to the contact and release of contact with the first contact portion 21 is higher than that of the inspection device with respect to the contact and disengagement of the second contact portion 22. Therefore, ensuring the durability of the first contact portion 21 in miniaturizing the probe unit 1 becomes an important element.

In addition, as one of the methods for ensuring the durability of the probe 20, it may be considered to change the material of the probe 20. When the probe 20 is formed of a high-hardness material such as nickel alloy or titanium alloy, the object to be contacted may be damaged. Conversely, when the probe 20 is formed of a low-hardness material such as beryllium steel or phosphor bronze, the probe 20 may not have sufficient durability, and sliding due to repeated contact and release of contact with the contact object Wear, the contact part will deteriorate. Therefore, it is not easy to ensure the durability of the probe 20 by changing the material.

According to the probe unit 1, it includes a plate-shaped probe 20 and a swing member 30 that has a receiving hole 34 that can receive the first contact portion 21 of the probe 20. Since the probe 20 has a plate shape, for example, compared with the pogo pin type probe, even if it is miniaturized, the rigidity of the probe 20 can be suppressed from decreasing and the durability can be ensured. In addition, since the first contact portion 21 of the probe 20 is accommodated in the accommodating hole 34 of the swing member 30, even when the probe 20 is miniaturized, the occurrence of damage to the first contact portion 21 can be reduced. That is, with such a configuration, it is possible to easily realize the probe unit 1 capable of coping with miniaturization.

In addition, the swing member 30 is swingable by the coil spring 50 in the first direction X and the extending direction of the first opening surface 111 (that is, the extending direction of the plane including the second direction Y and the thickness direction Z) The state is supported by the housing 10. With this configuration, even if the position of the probe unit 1 with respect to the contact object is shifted, the probe 20 can be more accurately positioned according to the contact object.

In addition, the urging portion includes at least three coil springs 50, and the center of gravity of the swing member 30 is located inside the polygon with each coil spring 50 as the apex in a plan view viewed along the first direction X. With such a configuration, it is possible to more reliably swing the swing member 30 along not only the first direction X but also the plane including the second direction Y and the plate thickness direction Z.

In addition, the urging portion has four coil springs 50 that are arranged at each vertex of the quadrilateral of the probe 20 in a plan view viewed along the first direction X. With this configuration, the swing member 30 can be swung more reliably along not only the first direction X but also the plane including the second direction Y and the plate thickness direction Z.

In addition, the probe 20 includes: an elastic portion 201 capable of elastically deforming in the first direction X; a first contact portion 202 connected to an end of the elastic portion 201 in the first direction X and provided with a first contact portion 21; and a first The second contact portion 203 is connected to the other end of the elastic portion 201 in the first direction X and is provided with a second contact portion 22. The first contact portion 202 and the second contact portion 203 have a contact portion 231 and a contact portion 271, the contact portion 231 and the contact portion 271 respectively extend along the second direction Y and are in the first direction X The upper portion abuts on the inner surface of the housing 10 to restrict the movement of the probe 20 in the first direction X. With this configuration, it is possible to more easily realize the probe unit 1 capable of coping with miniaturization.

In addition, the case 10 includes a first core case 121 and a second core case 122, each having a probe accommodating portion 123 capable of accommodating and holding the probe 20, and a base case 11, each core case 121, core The probe housing portion 123 of the housing 122 is positioned adjacent to each other in the second direction Y, and positions the core housing 121 and the core housing 122 independently of each other and integrally holds them. With such a configuration, for example, the base case 11 and the core case 12 can be generalized to be configured to be able to independently position a plurality of predetermined different types of core cases 12 with respect to one base case 11. And hold it integrally, thereby improving the productivity of the probe unit 1.

Furthermore, the urging portion is not limited to the case including four coil springs 50, as long as it includes at least three coil springs 50. For example, in a case where three coil springs 50 constitute an urging portion, as long as one coil spring 50 is disposed in the center of one of the flange portions 38 in the second direction Y, and the other flange portion 38 in the second direction A coil spring 50 may be arranged at each end.

In addition, the probe unit 1 can also be configured as shown in FIGS. 8 to 12, for example. In the probe unit 1 shown in FIGS. 8 to 12, the swing member 30 is arranged inside the housing 10 instead of outside the housing 10. As shown in FIGS. 9 and 10, in addition to the core housing 12, the housing housing portion 13 of the base housing 11 surrounds the swing member 30 via the first direction X and is housed in a state capable of swinging in the first direction X Swing member 30. The first opening surface 111 of the base housing 11 is provided with a groove portion 18 that extends in the second direction Y and communicates with the opening portion 113 and the outside of the base housing 11.

As shown in FIGS. 9 and 10, the swing member 30 is disposed in the opening 113 that opens to the first opening surface 111 of the base case 11. As shown in FIG. 11, in a plan view viewed along the first direction X, a gap 35 in the second direction Y and a gap 36 in the plate thickness direction Z are provided between the swing plate portion 31 of the swing member 30 and the opening 113. .

In this way, in the probe unit 1 shown in FIGS. 8 to 12, in the initial state P1, substantially the entire first contact portion 21 is covered by the housing 10 and the swing member 30. Therefore, the occurrence of damage to the first contact portion 21 can be further reduced, and thus the probe unit 1 capable of coping with miniaturization can be realized more easily.

In addition, as shown in FIG. 8, a flat portion 37 is provided around the concave portion 33 of the swing plate portion 31, and the flat portion 37 is arranged between the first opening surface 111 and the bottom surface of the groove portion 18 in the first direction X.

As shown in FIG. 9, the pin member 17 integrating the plate member 116, the plate member 117, and the plate member 118 of the base case 11 protrudes from the second opening surface 112 in the first direction X, and a part of the pin member 17 is located The exterior of the housing 10.

As shown in FIG. 12, the elastic portion 201 includes a plurality of elastic pieces (two strip-shaped elastic pieces in this embodiment) arranged with a gap therebetween. Each elastic piece has a zigzag shape including four extension portions and three bent portions, the four extension portions each extend in the second direction Y, and the three bent portions are respectively connected to adjacent extension portions. The extending portions arranged at both ends of the first direction X constitute the contact portion 204 and the contact portion 205, respectively. As shown in FIG. 10, each abutting portion 204 and abutting portion 205 are configured to be in the first direction X with the first core housing 121 constituting each probe housing portion 123 in the state of being accommodated in the core housing 12 And the inner surface of the second core case 122 abuts.

That is, the housing 10 is not limited to the above-mentioned embodiment, as long as it has an opening surface 111 crossing the first direction X, and can be arranged in the state where the first contact portion 21 is arranged outside through the opening 113 of the opening surface 111, The probe 20 may be stored inside.

In addition, the probe 20 is not limited to the above embodiment, as long as it has a plate shape having the first contact portion 21 and the second contact portion 22 at both ends in the first direction X, respectively. For example, the probe 20 of FIG. 12 can be used for the probe unit 1 of FIG. 1, and the probe 20 of FIG. 7 can also be used for the probe unit 1 of FIG. 8.

In addition, as for the contact portion 204 and the contact portion 205, the contact portion 204 and the contact portion 205 may be provided only at either end of the first direction X, or both may be omitted. In this case, instead of providing the contact portion 204, the contact portion 231 and the contact portion 271 extending from the first contact portion 202 or the second contact portion 203 in the second direction Y接部205.

In addition, the urging portion is not limited to the coil spring 50, and any configuration that can urge the swing member 30 toward the initial position P1 in the first direction X and toward the center of the swing range in the extending direction of the opening surface 111 can be adopted.

In the above, various embodiments of the present disclosure have been described in detail with reference to the drawings, and finally, various aspects of the present disclosure will be described. In addition, in the following description, as an example, the reference symbol is attached and described.

The probe unit 1 of the first aspect of the present disclosure includes: The plate-shaped probe 20 has a first contact portion 21 and a second contact portion 22 at both ends in the first direction X; The case 10 has an opening surface 111 that intersects the first direction X, and the first contact portion 21 can be arranged in the state where the first contact portion 21 is arranged outside via the opening 113 of the opening surface 111. The needle 20 is housed inside; The swing member 30 is supported by the housing 10 in a state capable of swinging along the first direction X and the extending direction of the opening surface 111, and has a penetration in the first direction X and can accommodate the The receiving hole 34 of the first contact portion 21; and The urging portion 50 is disposed inside the housing 10 and urges the swing member 30 to the housing 10 in the first direction X toward the initial position P1 farthest from the opening surface 111 In the extending direction of the opening surface 111, the swing member 30 is urged to the housing 10 toward the center of the swing range of the swing member 30.

The probe unit 1 according to the first aspect includes a plate-shaped probe 20 and a swing member 30 having a receiving hole 34 that can receive the first contact portion 21 of the probe 20. With this configuration, the probe unit 1 capable of coping with miniaturization can be easily realized.

In the probe unit 1 of the second aspect of the present disclosure, The urging part includes at least three coil springs 50, In a plan view viewed along the first direction, the center of gravity of the swing member 30 is located inside the polygon with each coil spring 50 as the apex.

According to the probe unit 1 of the second aspect, it is possible to support the swing member 30 in a state that it can swing more reliably in the first direction X and the extending direction of the opening surface 111. As a result, even if the position of the probe unit 1 with respect to the contact object is shifted, the probe 20 can be more accurately positioned according to the contact object.

In the probe unit 1 of the third aspect of the present disclosure, The urging portion has four coil springs 50, and the four coil springs 50 are arranged at each vertex of the quadrilateral of the probe 20 in a plan view viewed along the first direction X .

According to the probe unit 1 of the third aspect, the swing member 30 can be supported in a state in which it can swing more reliably in the first direction X and the extending direction of the opening surface 111. Even if the position of the probe unit 1 is shifted relative to the position of the contact object, the probe 20 can be positioned more accurately according to the contact object.

In the probe unit 1 of the fourth aspect of the present disclosure, The probe 20 includes: The elastic portion 201 can elastically deform along the first direction X; A first contact portion 202 connected to an end of the elastic portion 201 in the first direction X and provided with the first contact portion 21; and A second contact portion 203 connected to the other end of the elastic portion 201 in the first direction X and provided with the second contact portion 22; and The elastic portion 201 has a first contact portion 204 that extends in a second direction Y that intersects the first direction X and the thickness direction Z of the probe 20, and At least one of one end of the elastic portion 201 in the first direction X and the other end of the elastic portion 201 in the first direction X, The first abutment portion 204 abuts on the inner surface of the housing 10 in the first direction X, thereby restricting the movement of the probe 20 in the first direction X.

According to the probe unit 1 of the fourth aspect, the probe unit 1 capable of coping with miniaturization can be realized more easily.

In the probe unit 1 of the fifth aspect of the present disclosure, The probe 20 includes: The elastic portion 201 can elastically deform along the first direction X; A first contact portion 202 connected to an end of the elastic portion 201 in the first direction X and provided with the first contact portion 21; and A second contact portion 203 connected to the other end of the elastic portion 201 in the first direction X and provided with the second contact portion 22; and At least one of the first contact portion 202 and the second contact portion 203 has a second contact portion 231, a second contact portion 271, the second contact portion 231, the second contact portion 271 along It extends in a second direction Y that intersects the first direction X and the thickness direction Z of the probe 20, and is in contact with the inner surface of the housing 10 in the first direction X to restrict The movement of the probe 20 in the first direction X.

According to the probe unit 1 of the fifth aspect, the probe unit 1 capable of coping with miniaturization can be realized more easily.

In the probe unit 1 of the sixth aspect of the present disclosure, The housing 10 includes: The first core case 121 and the second core case 122 each have a probe accommodating portion 123 capable of accommodating and holding the probe 20; and The base housing 11 is disposed adjacent to the probe housing portion 123 of the first core housing 121 and the probe housing portion 123 of the second core housing 122 in the second direction In this state, the first core case 121 and the second core case 122 are positioned independently of each other and held integrally.

According to the probe unit 1 of the sixth aspect, for example, the base case 11 and the core case 12 can be generalized, and the plurality of types of core cases determined in advance with respect to one base case 11 can be configured. The bodies 12 are positioned independently of each other and held integrally, thereby improving the productivity of the probe unit 1.

In the probe unit 1 of the seventh aspect of the present disclosure, The base housing 11 has a housing accommodating portion 13 that accommodates the swing member 30 in a state capable of swinging in the first direction X and passes through the first direction X Surround the swing member 30.

According to the probe unit 1 of the seventh aspect, the occurrence of damage to the first contact portion 21 can be further reduced, and therefore the probe unit 1 capable of coping with miniaturization can be realized more easily.

In addition, by appropriately combining any of the above-mentioned various embodiments or modifications, each of the effects can be obtained. In addition, combinations of embodiments or embodiments and combinations of embodiments and embodiments are possible, and combinations of features in different embodiments or embodiments are also possible.

The probe unit of the present disclosure can be used for modules including B to B (Business-to-Business) connectors such as camera modules as connection media, as well as SOP (Small Outline Package), QFP (Quad Flat Package), BGA (Ball grid array) inspection of semiconductor packages, etc.

1‧‧‧ Probe unit 10‧‧‧Housing 11‧‧‧Base shell 12‧‧‧Core shell 13‧‧‧Housing housing 17‧‧‧pin component 18‧‧‧Slot 20‧‧‧probe 21‧‧‧First contact part (contact part) 22‧‧‧Second contact part (contact part) 23, 27‧‧‧Body 24, 25‧‧‧ feet 26‧‧‧ Clearance 30‧‧‧ Swing member 31‧‧‧ Swing board 32‧‧‧Support 33‧‧‧recess 34‧‧‧ containment hole 35, 36‧‧‧ gap 37‧‧‧flat 38‧‧‧Flange 50‧‧‧Coil Spring (Forcing Department) 111‧‧‧First opening surface (opening surface) 112‧‧‧Second opening surface (opening surface) 113, 114‧‧‧ opening 115‧‧‧ containment tank 116, 117, 118 ‧‧‧ plate members 121‧‧‧The first core shell (core shell) 122‧‧‧Second core shell (core shell) 123‧‧‧Probe containment department 201‧‧‧Elastic Department 202‧‧‧First Contact Department 203‧‧‧The second contact 204‧‧‧ Abutment Department (First Abutment Department) 205‧‧‧Abutment Department 231, 271‧‧‧ abutment (second abutment) 232, 272‧‧‧ one end 241, 251‧‧‧ protrusion GP‧‧‧Center of gravity L1～L5‧‧‧Imaginary straight line P1‧‧‧Initial position P2‧‧‧Motion position X‧‧‧First direction Y‧‧‧Second direction Z‧‧‧Board thickness direction

FIG. 1 is a perspective view showing a probe unit according to an embodiment of the present disclosure. Fig. 2 is a cross-sectional view taken along line II-II of Fig. 1. Fig. 3 is a cross-sectional view taken along line III-III of Fig. 1. 4 is a perspective view showing a swing member of the probe unit of FIG. 1. Fig. 5 is a plan view of the swing member of Fig. 4. 6 is an enlarged plan view of the probe unit of FIG. 1. 7 is a perspective view showing a probe of the probe unit of FIG. 1. 8 is a perspective view showing a modification of the probe unit of FIG. 1. 9 is a cross-sectional view taken along line IX-IX of FIG. 8. FIG. 10 is a cross-sectional view taken along line VIII-VIII of FIG. 8. 11 is an enlarged plan view of the probe unit of FIG. 8. 12 is a perspective view showing the probe of the probe unit of FIG. 8.

1‧‧‧ Probe unit

10‧‧‧Housing

11‧‧‧Base shell

12‧‧‧Core shell

17‧‧‧pin component

20‧‧‧probe

30‧‧‧ Swing member

31‧‧‧ Swing board

32‧‧‧Support

111‧‧‧First opening surface (opening surface)

113‧‧‧ opening

115‧‧‧ containment tank

116, 117, 118 ‧‧‧ plate members

X‧‧‧First direction

Y‧‧‧Second direction

Z‧‧‧Board thickness direction

Claims (7)

A probe unit, including: The plate-shaped probe has a first contact portion and a second contact portion at both ends in the first direction; The case has an opening surface that intersects the first direction, and the probe can be housed inside in a state where the first contact portion is arranged outside via the opening portion of the opening surface; The swinging member is supported by the housing in a state capable of swinging in the first direction and the extending direction of the opening surface, and has a penetration in the first direction and can accommodate the first contact portion Containment hole; and The urging portion is arranged inside the casing, and urges the swing member to the casing in the first direction toward the initial position farthest from the opening surface, on the opening surface The swinging member is biased toward the housing toward the center of the swinging range of the swinging member in the extending direction. The probe unit according to item 1 of the patent application scope, in which The urging part has at least three coil springs, In a plan view viewed along the first direction, the center of gravity of the swing member is located inside the polygon with each coil spring as the apex. The probe unit according to item 2 of the patent application scope, in which The urging portion has four coil springs, and the four coil springs are arranged at each vertex of the quadrilateral surrounding the probe in a plan view viewed in the first direction. The probe unit according to any one of items 1 to 3 of the patent application scope, wherein The probe includes: The elastic portion can be elastically deformed along the first direction; A first contact portion connected to an end of the elastic portion in the first direction and provided with the first contact portion; and A second contact portion connected to the other end of the elastic portion in the first direction and provided with the second contact portion; and The elastic portion has: The first contact portion extends in a second direction that intersects the first direction and the thickness direction of the probe, and constitutes one end of the elastic portion in the first direction and the At least one of the other ends of the first direction, The first abutting portion abuts against the inner surface of the housing in the first direction, thereby restricting movement of the probe in the first direction. The probe unit according to any one of items 1 to 3 of the patent application scope, wherein The probe includes: The elastic portion can be elastically deformed along the first direction; A first contact portion connected to an end of the elastic portion in the first direction and provided with the first contact portion; and A second contact portion connected to the other end of the elastic portion in the first direction and provided with the second contact portion; and At least one of the first contact portion and the second contact portion has a second abutting portion that intersects the first direction and the thickness direction of the probe The second direction extends and abuts the inner surface of the housing in the first direction, thereby restricting movement of the probe in the first direction. The probe unit according to any one of items 1 to 5 of the patent application scope, wherein The housing includes: The first core case and the second core case each have a probe accommodating portion capable of accommodating and holding the probe; and A base case, the probe accommodating part of the first core case and the probe accommodating part of the second core case in the first direction and the thickness direction of the probe In a state where they are arranged adjacent to each other in the crossing second direction, the first core case and the second core case are positioned independently and held integrally. The probe unit as described in item 6 of the patent application scope, in which The base case has a case accommodating portion that accommodates the swing member in a state capable of swinging in the first direction and surrounds the swing member via the first direction.

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