TW201920969A - Electrical connection device comprising a substrate and a socket portion - Google Patents

Electrical connection device comprising a substrate and a socket portion Download PDF

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Publication number
TW201920969A
TW201920969A TW107127353A TW107127353A TW201920969A TW 201920969 A TW201920969 A TW 201920969A TW 107127353 A TW107127353 A TW 107127353A TW 107127353 A TW107127353 A TW 107127353A TW 201920969 A TW201920969 A TW 201920969A
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Taiwan
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contact
contactor
substrate
support
tip
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TW107127353A
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Chinese (zh)
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TWI677693B (en
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大里衛知
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日商日本麥克隆尼股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The object of the present invention is to improve the contact load of an object to be inspected, thereby improving the durability of the device, achieving an improved electrical contact between the object to be inspected and the pattern of a substrate, and performing an electric current test of the object to be inspected with high precision. The solution is an electrical connection device which comprises a substrate on which a wiring is formed, a socket portion provided on the substrate, and an electrode portion of an object to be inspected, which is mounted on the socket portion electrically connected to the electrical connection device of the wiring formed on the substrate. The socket portion is provided with a plurality of contactors having tip ends in contact with the electrode portion of the object to be inspected, a plurality of connection members that are in contact with the contactors and the wiring on the substrate, and support bodies elastically support the rotation of each contactor. The support bodies are received in a hole portion. Each of the connection members is provided with a base portion in contact with the inner wall surface of the hole portion, and a bottom portion electrically connected to the wiring on the substrate. Each contactor is electrically connected to the base portion and the bottom portion of the connection member.

Description

電性連接裝置Electrical connection device

本發明係關於電性連接裝置,例如可適用於如積體電路之平板狀的被檢查體之通電試驗所使用的電性連接裝置者。The present invention relates to an electrical connection device, for example, an electrical connection device that can be applied to a flat-shaped test object such as an integrated circuit for use in an electric current test.

先前,在積體電路的製造過程中,進行關於被封裝之積體電路的電性特性的檢查(例如,封裝測試及最終測試)。於此種檢查中,使用在可裝卸地保持被檢查體即積體電路之狀態下,使該被保持之積體電路的電極端子電性接觸接觸子的電性連接裝置(所謂測試插座及插座板)。安裝於電性連接裝置的積體電路,係透過該電性連接裝置電性連接於檢查裝置(測試機),進行電性特性的檢查。Previously, during the manufacturing process of the integrated circuit, inspections (eg, packaging test and final test) regarding the electrical characteristics of the packaged integrated circuit were performed. In this kind of inspection, an electrical connection device (so-called test socket and socket) that electrically contacts the electrode terminal of the held integrated circuit to the contactor while detachably holding the circuit under test, that is, the integrated circuit is used. board). The integrated circuit mounted on the electrical connection device is electrically connected to the inspection device (testing machine) through the electrical connection device, and the electrical characteristics are inspected.

於專利文獻1,揭示有一種組裝於基板的電性連接裝置,利用內藏的接觸子分別使安裝於電性連接裝置之被檢查體的複數端子,與分別對應其複數端子之形成於基板上的複數導電性部接觸並電性連接的電性連接裝置。各接觸子係於前端具有與被檢查體的端子接觸的尖端,並且於下側的端面具有與基板的導電性部接觸之彎曲成凸狀的部分。複數接觸子係在組裝於基板上的殼體內,藉由彈性構件即針夾可旋動地被彈性支持。又,複數接觸子係藉由配置於尖端與被針夾支持的部分之間的中間附近下方的橡膠構件,旋動部分從下方被彈性支持。Patent Document 1 discloses an electrical connection device assembled on a substrate. A built-in contactor is used to separately form a plurality of terminals of an object to be inspected mounted on the electrical connection device, and corresponding terminals are formed on the substrate. An electrical connection device in which a plurality of conductive portions are in contact with and electrically connected. Each contact element has a tip end having a tip contacting the terminal of the object to be inspected, and a lower end surface having a convexly curved portion that contacts the conductive portion of the substrate. The plurality of contact elements are supported in a housing assembled on the substrate, and are elastically supported by a needle clip, which is an elastic member. In addition, the plurality of contact sub-systems are elastically supported from below by a rubber member disposed below and near the middle between the tip and the portion supported by the needle clamp.

專利文獻1所記載的電性連接裝置係接觸子的尖端利用針夾與橡膠構件的復原力往上方彈撥,故可對於被檢查體的電極以所定針壓使接觸子尖端接觸,並且接觸子尖端進行擦拭動作(scrubbing),故可一邊使被檢查體與接觸子良好地接觸,一邊進行穩定的測定。 [先前技術文獻] [專利文獻]The electrical connection device described in Patent Document 1 uses a pin clip and the restoring force of the rubber member to pull upwards on the tip of the contactor. Therefore, the electrode of the subject can be contacted with the tip of the contactor with a predetermined needle pressure, and the tip of the contactor can be contacted. Since the scrubbing operation is performed, stable measurement can be performed while the subject to be in good contact with the contactor. [Prior Art Literature] [Patent Literature]

[專利文獻1] 日本特開2008-89555號公報[Patent Document 1] Japanese Patent Laid-Open No. 2008-89555

[發明所欲解決之課題][Problems to be Solved by the Invention]

電性連接裝置係例如被檢查體的端子以焊接形成時般,有為了獲得良好且穩定的接觸,以更強的按壓荷重使被檢查體的端子接觸接觸子為佳,因為周圍的塵埃、來自被檢查體的異物的影響,以接觸性不降低之方式更強化擦拭動作(scrubbing)為佳的狀況。The electrical connection device is, for example, when the terminal of the test object is formed by welding. In order to obtain a good and stable contact, it is better to make the terminal of the test object contact the contactor with a stronger pressing load because the surrounding dust, It is preferable that the influence of the foreign body of the test object is to further strengthen the scrubbing so that the contact is not reduced.

然而,以高荷重使被檢查體接觸接觸子時,會藉由接觸子之下端的端面,大力按壓基板,並且大力滑動基板圖案的表面,所以,有發生基板圖案損傷之虞。又,在增加接觸子的行程(Stroke)且增加擦拭動作時,更提高基板圖案損傷之虞。However, when the test object is brought into contact with the contactor with a high load, the substrate is strongly pressed against the end surface of the lower end of the contactor, and the surface of the substrate pattern is strongly slid. Therefore, the substrate pattern may be damaged. In addition, when the stroke of the contactor is increased and the wiping operation is increased, the risk of damage to the substrate pattern is further increased.

因此,有鑑於前述課題,要求可比先前更高荷重使被檢查體的端子接觸接觸子,即使該狀況中,也可抑制被檢查體之基板圖案的傷害,良好地穩定被檢查體及基板圖案的電性接觸性且可進行被檢查體的通電試驗的電性連接裝置。 [用以解決課題之手段]Therefore, in view of the above-mentioned problems, it is required that the terminals of the test object can be brought into contact with the contactor at a higher load than before. Even in this situation, the damage of the substrate pattern of the test object can be suppressed, and the test object and the substrate pattern can be stabilized well. An electrical connection device capable of conducting electrical contact and capable of conducting a current test of a test object. [Means to solve the problem]

為了解決相關課題,本發明的電性連接裝置,係具備形成配線的基板,與設置於其基板上的插座部,並使安裝於插座部之被檢查體的電極部,電性連接於形成於基板之配線的電性連接裝置,其特徵為:(1)插座部,係具有具有與被檢查體的電極部接觸之尖端的複數接觸子、和接觸子與基板上之配線接觸的複數連接構件、彈性地支持各接觸子之旋轉的支持體,並將該等收容於孔部;(2)各連接構件具有和孔部的內壁面接觸的基部,與和基板的配線電性連接的底部;(3)接觸子與前述連接構件的基部及底部電性連接。 [發明的效果]In order to solve the related problems, the electrical connection device of the present invention includes a substrate on which wiring is formed, and a socket portion provided on the substrate, and an electrode portion of an object to be mounted on the socket portion is electrically connected to the electrode portion formed on the substrate. The electrical connection device for wiring of a substrate is characterized in that: (1) the socket part is a plurality of contact members having a tip having a tip in contact with the electrode part of the object to be inspected, and a plurality of connection members having the contacts in contact with the wiring on the substrate; A support that elastically supports the rotation of each contact and accommodates them in the hole portion; (2) Each connecting member has a base portion in contact with the inner wall surface of the hole portion and a bottom portion electrically connected to the wiring of the substrate; (3) The contactor is electrically connected to the base and the bottom of the connection member. [Effect of the invention]

依據本發明,可將被檢查體的端子與接觸子的接觸設為高荷重,即使該狀況中,也可減少基板圖案的傷害,可讓被檢查體及基板圖案有良好的電性連接性,可高精度進行被檢查體的通電試驗。According to the present invention, the contact between the terminal of the test object and the contactor can be set to a high load, and even in this situation, the damage of the substrate pattern can be reduced, and the test object and the substrate pattern can have good electrical connectivity. It is possible to perform the energization test of the subject with high accuracy.

(A)主要實施形態   以下,一邊參照圖面一邊詳細說明本發明的電性連接裝置的實施形態。(A) Main Embodiments Hereinafter, embodiments of the electrical connection device of the present invention will be described in detail with reference to the drawings.

(A-1)實施形態的構造   參照圖1~圖4,說明實施形態之電性連接裝置1的構造。圖1是電性連接裝置1的俯視圖,圖2是構成電性連接裝置1之插座部20的仰視圖,圖3是圖1所示之電性連接裝置1的A-A線箭頭視點方向剖面圖,圖4是將接觸子組裝體40收容於構成插座部20的殼體部24之狀態的剖面立體圖。(A-1) Structure of the embodiment The structure of the electrical connection device 1 of the embodiment will be described with reference to FIGS. 1 to 4. FIG. 1 is a plan view of the electrical connection device 1, FIG. 2 is a bottom view of the socket portion 20 constituting the electrical connection device 1, and FIG. 3 is a sectional view taken along the line AA of the electrical connection device 1 shown in FIG. FIG. 4 is a cross-sectional perspective view showing a state in which the contact sub-assembly 40 is housed in the housing portion 24 constituting the socket portion 20.

如圖1所示,實施形態的電性連接裝置1係具有基板10,與設置於其基板10上的插座部20。As shown in FIG. 1, the electrical connection device 1 according to the embodiment includes a substrate 10 and a socket portion 20 provided on the substrate 10.

電性連接裝置1係與發送接收試驗所需之電性訊號的檢查裝置(也稱為「測試器」)連接,檢查所收容之被檢查體51的電氣特性。例如,作為在作為被檢查體51之積體電路的製造工程中,組裝完成之積體電路的電性試驗(例如,封裝測試及最終測試)所用的試驗用IC插座,可使用電性連接裝置1。The electrical connection device 1 is connected to an inspection device (also referred to as a "tester") for electrical signals required for transmission and reception tests, and inspects the electrical characteristics of the subject 51 to be accommodated. For example, an electrical connection device can be used as a test IC socket used in the electrical test (for example, package test and final test) of an integrated integrated circuit that has been assembled in the manufacturing process of the integrated circuit that is the subject 51 to be inspected. 1.

電性連接裝置1係於位於殼體部20的中央部的開口部14收容被檢查體51(參照圖3)。例如,藉由未圖示的手段,利用所定壓陷荷重,將被檢查體51往下方向,亦即從開口部14的上方往基板10側推頂,將被檢查體51安裝於電性連接裝置1。在此,被檢查體51的端子511係例示例如以焊錫電鍍等形成之狀況。具有以此種材質形成之端子511的被檢查體51的壓陷荷重係高荷重為佳,但未特別限定,例如可設為70gf~80gf程度。The electrical connection device 1 accommodates a subject 51 in an opening 14 located at a central portion of the housing portion 20 (see FIG. 3). For example, by a method not shown, using the predetermined indentation load, the object to be inspected 51 is pushed downward, that is, pushed upward from the opening 14 to the substrate 10 side, and the object to be inspected 51 is mounted on the electrical connection.装置 1。 Device 1. Here, the terminal 511 of the object 51 is exemplified in a case where it is formed by solder plating or the like. The indentation load of the test object 51 having the terminal 511 formed of such a material is preferably a high load, but it is not particularly limited, and may be, for example, about 70 gf to 80 gf.

基板10係例如以電性絕緣構件形成的配線基板。於基板10的表面上,例如藉由印刷配線技術形成由具有導電性的金屬材料所成的配線圖案11。於形成配線圖案11之基板10的表面上,例如藉由螺絲或定位銷等的固定構件15固定插座部20。The substrate 10 is a wiring substrate formed of, for example, an electrically insulating member. A wiring pattern 11 made of a conductive metal material is formed on the surface of the substrate 10 by, for example, a printed wiring technology. The socket portion 20 is fixed on the surface of the substrate 10 on which the wiring pattern 11 is formed, for example, by a fixing member 15 such as a screw or a positioning pin.

基板10上的配線圖案11係如圖1及圖3所示,帶狀地形成於與各接觸子12的位置對應的位置。亦即,配線圖案11係以在基板10上,與各接觸子12的下部接觸且電性連接之方式形成。As shown in FIGS. 1 and 3, the wiring pattern 11 on the substrate 10 is formed in a strip shape at a position corresponding to the position of each contact 12. That is, the wiring pattern 11 is formed on the substrate 10 so as to be in contact with the lower portion of each contact 12 and electrically connected thereto.

配線圖案11係如圖1所示,延伸於插座部20的外側,與未圖示之檢查裝置側的配線圖案連接。在此實施形態中,從插座部20的各邊,6條配線圖案11隔開所定間隔並排延伸至插座部20的外部。The wiring pattern 11 extends to the outside of the socket portion 20 as shown in FIG. 1 and is connected to a wiring pattern on the inspection device side (not shown). In this embodiment, from each side of the socket section 20, six wiring patterns 11 extend side by side to the outside of the socket section 20 at a predetermined interval.

插座部20係具有框架部26、包含電性連接於被檢查體51的端子(電極部)511之複數接觸子12的接觸子組裝體40、收容其接觸子組裝體40的殼體部24。再者,電性連接裝置1係於相同的基板10上設置複數插座部20亦可。The socket portion 20 includes a frame portion 26, a contact subassembly 40 including a plurality of contacts 12 that are terminals (electrode portions) 511 electrically connected to the subject 51, and a housing portion 24 that accommodates the contact subassembly 40. In addition, the electrical connection device 1 may be provided with a plurality of socket portions 20 on the same substrate 10.

框架部26係以電性絕緣構件形成,固定於殼體部24的上面。框架部26係俯視外形狀為大略長方形(再者,大略長方形包含正方形),於其俯視中央部分,設置有用以收容被檢查體51之貫通上下的孔,且具有長方形之開口的開口部14。The frame portion 26 is formed of an electrically insulating member and is fixed to the upper surface of the case portion 24. The frame portion 26 is a substantially rectangular shape when viewed from above (moreover, the substantially rectangular shape includes a square), and an opening portion 14 having a rectangular opening is provided in a central portion of the frame portion 26 to receive an upper and lower hole for receiving the subject 51.

框架部26之開口部14的內壁面下側,係為了可裝卸被檢查體並且確實進行被收容之被檢查體51的定位,設置有對於基板10垂直的收容壁面14b(參照圖3),其前視內形狀呈形成為與被安裝之被檢查體51的外形相同程度,或稍大的大略長方形。又,開口部14的內壁面上側係為了容易安裝被檢查體51,具有以開口朝向框架部26的上方擴張之方式傾斜的傾斜面14a。亦即,開口部14的4個側面的上側分別成為傾斜面14a。The lower side of the inner wall surface of the opening portion 14 of the frame portion 26 is provided with a receiving wall surface 14b (see FIG. 3) perpendicular to the substrate 10 in order to be able to attach and detach the object to be inspected and to position the object 51 to be accommodated. The inside shape of the front view is formed to be approximately the same as the outer shape of the subject 51 to be mounted, or a slightly larger rectangular shape. In addition, the inner wall surface side of the opening portion 14 has an inclined surface 14 a that is inclined so that the opening is expanded toward the upper side of the frame portion 26 in order to facilitate mounting of the subject 51. That is, the upper sides of the four side surfaces of the opening portion 14 are each an inclined surface 14a.

殼體部24係收容接觸子組裝體40,並與框架部26及基板10聯合,保持接觸子組裝體40的構件,以電性絕緣構件形成。殼體部24係如圖3所示般設置於基板10上,又,於殼體部24的上面,設置有框架部26。殼體部24的俯視外形狀呈與框架部26的俯視外形狀相同形狀的大略長方形,殼體部24與框架部26以在俯視中外形一致之方式重疊。The case portion 24 is a member that houses the contact sub-assembly 40 and is combined with the frame portion 26 and the substrate 10 to hold the contact sub-assembly 40 and is formed as an electrically insulating member. The case portion 24 is provided on the substrate 10 as shown in FIG. 3, and a frame portion 26 is provided on the upper surface of the case portion 24. The outer shape of the case portion 24 in a plan view is a substantially rectangular shape having the same shape as the outer shape of the frame portion 26 in plan view, and the outer shape of the case portion 24 and the frame portion 26 overlap with each other in plan view.

於殼體部24,配合框架部26的開口部14所收容之被檢查體51的端子511的位置,設置有用以收容接觸子組裝體40的孔部18。在此實施形態中,被檢查體51是俯視大略長方形,沿著其底面的4個邊並排配置端子,故孔部18與開口部14的4個邊分別平行設置。再者,孔部18可因應被檢查體51之端子511的位置,設置於對應開口部14之邊的位置,例如於俯視長方形的被檢查體51中,端子511沿著對向之一組邊設置時,於對應開口部14的對向之一組邊的位置,設置孔部18為佳。A hole portion 18 is provided at the housing portion 24 to accommodate the terminal 511 of the subject 51 to be accommodated in the opening portion 14 of the frame portion 26 to receive the sub-assembly 40. In this embodiment, the test object 51 has a substantially rectangular shape in plan view, and the terminals are arranged side by side along the four sides of the bottom surface thereof. Therefore, the four sides of the hole portion 18 and the opening portion 14 are provided in parallel. In addition, the hole portion 18 may be provided at a position corresponding to the side of the opening portion 14 according to the position of the terminal 511 of the inspection object 51. For example, in a rectangular inspection object 51 in plan view, the terminal 511 is arranged along a set of opposite sides. During installation, the hole portion 18 is preferably provided at a position corresponding to a group of opposite sides of the opening portion 14.

各孔部18係具有用以個別收容複數接觸子12的複數縫隙17、收容用以彈性支持收容於各縫隙17之複數接觸子12的柱狀的支持體的橫孔,且收容用以支持接觸子12之尖端側的第1支持體41的第1橫孔191、收容用以支持接觸子12之後端側的第2支持體42的第2橫孔192連接的空間。Each of the hole portions 18 is provided with a plurality of slits 17 for individually accommodating the plurality of contacts 12, and a horizontal hole for accommodating a columnar support body for elastically supporting the plurality of contacts 12 accommodated in each of the slits 17, and is accommodated for supporting the contacts. The first horizontal hole 191 of the first support body 41 on the tip side of the child 12 and the space connected to the second horizontal hole 192 for supporting the second support body 42 on the rear end side of the child 12 are received.

構成孔部18的複數縫隙17部分係以對於開口部14的各邊垂直地朝向,並以一定間隔平行地併排成一列進行配置,鄰接之縫隙17彼此藉由間隔壁25區劃。縫隙17開放於殼體部24的上下。The plurality of slits 17 constituting the hole portion 18 are vertically oriented to each side of the opening portion 14 and are arranged in parallel at a certain interval in parallel. The adjacent slits 17 are partitioned by the partition wall 25. The slit 17 is opened above and below the case portion 24.

位於殼體部24的上面之各縫隙17的上側開口,係內側面向框架部26的開口部14,外側藉由框架部26的下面封堵。面向開口部14之縫隙17的上側開口部分,係接觸子12的尖端可上下移動地朝向開口部14突出的部分,也稱為接觸子突出用開口171(參照圖5)。從接觸子突出用開口171突出之複數接觸子12的尖端,可分別接觸安裝於開口部14的被檢查體51的複數端子511。The upper sides of the slits 17 located on the upper surface of the housing portion 24 are open, and the inside faces the opening portion 14 of the frame portion 26, and the outside is blocked by the lower surface of the frame portion 26. The upper opening portion facing the slit 17 of the opening portion 14 is a portion protruding from the tip of the contactor 12 toward the opening portion 14 so as to move up and down, and is also referred to as a contactor protruding opening 171 (see FIG. 5). The tips of the plurality of contactors 12 protruding from the contactor projection opening 171 can respectively contact the plurality of terminals 511 of the subject 51 mounted on the opening 14.

構成孔部18的第1橫孔191部分及第2橫孔192部分,係以與複數縫隙17垂直交叉之方式,分別通過設置於縫隙17之間的複數間隔壁25的凹部251、252延伸,開放於殼體部24的下面。第1橫孔191及第2橫孔192係與兩端的縫隙17交叉,往兩外側延伸。再者,在此實施形態中,第1橫孔191係與直角地鄰接之其他第1橫孔191以端部連接。The first horizontal hole 191 portion and the second horizontal hole 192 portion constituting the hole portion 18 extend perpendicularly to the plurality of slits 17 through the recesses 251 and 252 of the plurality of partition walls 25 provided between the slits 17, respectively. Opened below the case portion 24. The first horizontal hole 191 and the second horizontal hole 192 intersect with the slits 17 at both ends and extend to both outer sides. Furthermore, in this embodiment, the first horizontal hole 191 is connected to the other first horizontal hole 191 which is adjacent at a right angle by an end.

第1橫孔191位於縫隙17的內側(亦即,接近開口部14之側),第2橫孔192位於比第1橫孔更靠外側(遠離開口部14之側)。第1橫孔191位於接觸子突出用開口171的下方的話,收容於第1橫孔191的第1支持體41可支持接觸子12的尖端下方,因此為佳。The first horizontal hole 191 is located inside the slit 17 (that is, the side closer to the opening 14), and the second horizontal hole 192 is located further outside (the side away from the opening 14) than the first horizontal hole. If the first horizontal hole 191 is located below the contact projection 171, the first support 41 received in the first horizontal hole 191 can support the lower end of the contact 12. Therefore, it is preferable.

設置於縫隙17之間隔壁25的第1橫孔191通過的第1凹部251,係從殼體部24的下面以相同寬度往垂直上方延伸的凹部,其深端成半圓形狀。同樣地,設置於縫隙17之間隔壁25的第2橫孔192通過的第2凹部252,係從殼體部24的下面以相同寬度往垂直上方延伸的凹部,其深端成半圓形狀。The first recessed portion 251 passing through the first horizontal hole 191 of the partition wall 25 provided in the slit 17 is a recessed portion extending vertically upward with the same width from the lower surface of the housing portion 24, and the deep end thereof has a semicircular shape. Similarly, the second recessed portion 252 passing through the second horizontal hole 192 of the partition wall 25 of the slit 17 is a recessed portion extending vertically upward with the same width from the lower surface of the housing portion 24, and the deep end thereof has a semicircular shape.

位於殼體部24的下面之孔部18的開口,係縫隙17的下側開口、第1橫孔191的開口、及第2橫孔192的開口剛好對合的開口,藉由基板10封堵。The opening of the hole portion 18 on the lower surface of the housing portion 24, the opening of the lower side of the slit 17, the opening of the first horizontal hole 191, and the opening of the second horizontal hole 192 are just aligned, and are blocked by the substrate 10. .

於縫隙17的上端部分,形成以相同寬度往外側延伸的溝即延長溝172,延長溝172的底面成為後述之接觸子組裝體40的連接構件43卡合的段部173(參照圖5)。At the upper end portion of the slit 17, an extension groove 172 that is a groove extending outward with the same width is formed, and the bottom surface of the extension groove 172 becomes a section 173 (see FIG. 5) to which the connecting member 43 of the contact subassembly 40 is engaged, as will be described later.

接著,參照圖5~圖6,說明實施形態相關之包含收容於殼體部24的複數各接觸子12的接觸子組裝體40的構造。圖5係揭示圖3所示之剖面圖的收容於殼體部24之接觸子組裝體40的構造的放大圖,圖6係揭示接觸子組裝體40之構造的構造圖。Next, a structure of a contactor assembly 40 including a plurality of contacts 12 housed in the housing portion 24 according to the embodiment will be described with reference to FIGS. 5 to 6. FIG. 5 is an enlarged view showing the structure of the contact sub-assembly 40 housed in the case portion 24 in the cross-sectional view shown in FIG. 3, and FIG. 6 is a structure view showing the structure of the contact sub-assembly 40.

於殼體部24的各孔部18,組入包含複數接觸子12的接觸子組裝體40。該接觸子組裝體40係具有複數接觸子12、複數連接構件43、第1支持體41、第2支持體42。A contactor assembly 40 including a plurality of contactors 12 is incorporated in each hole portion 18 of the housing portion 24. The contact assembly 40 includes a plurality of contacts 12, a plurality of connection members 43, a first support 41, and a second support 42.

各連接構件43係以具有導電性的金屬構件形成,存在於接觸子12與基板10上的配線圖案11之間,用以電性連接接觸子12與配線圖案11的構件。連接構件43係如圖5所示,是形成為大略L字狀的板狀構件,具有對於基板10起立於垂直方向的基部432,與對於基板10平行地延伸的底部431。連接構件43的厚度係形成為與接觸子12的厚度相同。Each of the connection members 43 is formed of a conductive metal member, and exists between the contactor 12 and the wiring pattern 11 on the substrate 10 to electrically connect the contactor 12 and the wiring pattern 11. As shown in FIG. 5, the connecting member 43 is a plate-like member formed in a substantially L-shape, and has a base portion 432 standing upright to the substrate 10 and a bottom portion 431 extending parallel to the substrate 10. The thickness of the connection member 43 is formed to be the same as the thickness of the contact 12.

連接構件43係以與接觸子12成對地被收容於各縫隙17內,底部431的下端面接觸基板10上面的配線圖案11,並且基部432的外側側端抵接縫隙17的內壁深端之方式配置於縫隙17內。連接構件43之底部431的上端面與基部432的內側側端面,成為與接觸子12的端面接觸之面。藉此,連接構件43係發揮從接觸子12的尖端藉由被檢查體51的端子511往下方按壓時之接觸子12端面的滑動及按壓,防止基板10及配線圖案11、縫隙17內壁深端的損傷的作用。The connecting member 43 is housed in each slot 17 in pairs with the contact 12, the lower end surface of the bottom portion 431 contacts the wiring pattern 11 on the substrate 10, and the outer side end of the base portion 432 abuts the deep end of the inner wall of the slot 17. This method is arranged in the slit 17. An upper end surface of the bottom portion 431 of the connection member 43 and an inner side end surface of the base portion 432 are surfaces that contact the end surface of the contactor 12. As a result, the connecting member 43 exerts the sliding and pressing of the end face of the contactor 12 when the contactor 12 is pressed downward from the tip of the contactor 12 through the terminal 511 of the subject 51 to prevent the inner wall of the substrate 10, the wiring pattern 11, and the gap 17 from deep The effect of end damage.

將基部432的寬度(圖5之左右方向的寬度)增加到大於底部431的寬度(圖5之上下方向的寬度)的話,基部432的放熱性會提升,所以為佳。又,縫隙17的內壁深端彎曲成凹下的圓弧狀的話,在與基部432的外側端面之間形成間隙,放熱性會提升,所以為佳。If the width of the base portion 432 (the width in the left-right direction in FIG. 5) is larger than the width of the bottom portion 431 (the width in the up-down direction in FIG. 5), the heat radiation of the base portion 432 is improved, so it is preferable. In addition, if the deep end of the inner wall of the slit 17 is curved into a concave arc shape, a gap is formed between the outer end surface of the base portion 432 and the heat radiation property is improved.

於各連接構件43之基部432的上部,設置有突出於橫方向外側的上端部434,該上端部434進入縫隙17的延長溝172,上端部434的下面與段部173上面接觸而勾住。藉此,各連接構件43可穩定支持。上端部434的上面係以成為與殼體部24之上面的位置相同或低於其的位置之方式設定,藉此,可不妨礙框架部26下面與殼體部24上面的連接,防止連接構件43的飛出。於上端部434與基部432連接之角部分的端面,形成有凹部433,防止對上端部434施加應力時的損傷。On the upper portion of the base portion 432 of each connecting member 43, an upper end portion 434 protruding outward in the lateral direction is provided. The upper end portion 434 enters the extension groove 172 of the slit 17. The lower portion of the upper end portion 434 is in contact with the upper portion of the segment portion 173 and is hooked. Thereby, each connection member 43 can be stably supported. The upper surface of the upper end portion 434 is set to be the same as or lower than the position of the upper surface of the housing portion 24, thereby preventing the connection between the lower surface of the frame portion 26 and the upper surface of the housing portion 24 and preventing the connection member 43 Fly out. A concave portion 433 is formed on an end surface of a corner portion where the upper end portion 434 is connected to the base portion 432 to prevent damage when the upper end portion 434 is stressed.

各連接構件43的底部431係以其下面與基板10之帶狀的配線圖案11電性連接之方式設置。底部431係沿著配線圖案11的長邊方向延伸,故可讓各連接構件43與基板10的配線圖案11有良好的電性連接性。The bottom portion 431 of each connection member 43 is provided so as to be electrically connected with the lower surface thereof to the strip-shaped wiring pattern 11 of the substrate 10. The bottom portion 431 extends along the longitudinal direction of the wiring pattern 11, so that each connection member 43 and the wiring pattern 11 of the substrate 10 can have good electrical connectivity.

連接構件43的基部432之內側的側端面,係上側略沿著外側,可順暢地進行接觸子12的旋動。The side end surface on the inner side of the base portion 432 of the connecting member 43 is slightly along the outer side on the upper side, and the contactor 12 can be smoothly rotated.

各接觸子12係以具有導電性的金屬構件形成,如圖5所示,是形成為大略C字形狀的板狀構件,於前端側(尖端側)具有與被檢查體51的端子511電性連接之尖端,並且於後端側具有與連接構件43的基部432電性連接之後端。Each contact 12 is formed of a conductive metal member. As shown in FIG. 5, each contact 12 is a plate-shaped member formed in a substantially C-shape. The contact 12 has electrical properties with the terminal 511 of the subject 51 on the tip side (tip side). The connected tip has a rear end electrically connected to the base portion 432 of the connection member 43 on the rear end side.

接觸子12之尖端側的部分,係具有從接觸子12之後端側的部分往斜上方延伸的臂部128,與從臂部128的端部往大略垂直上方延伸的尖端部121。The tip-side portion of the contactor 12 includes an arm portion 128 extending obliquely upward from the rear-end portion of the contactor 12 and a tip portion 121 extending substantially vertically upward from the end of the arm portion 128.

臂部128係接近尖端則寬度變窄,於臂部128之下側的端面,具有與第1支持體41的後方側斜上方的圓弧部分接觸而被支持之彎曲成凹下的圓弧狀的第1支持端面122。第1支持端面122係設置於尖端部121的下方,並且位於連接構件43之底部431的上方。藉此,可對應被檢查體51的高壓陷荷重。第1支持端面122係尖端部121被往下方按壓時,會藉由被壓縮之第1支持體的復原力往後方側斜上方彈撥,故可抑制接觸子12之後端部分的翹曲。The arm portion 128 is narrowed toward the tip, and the end surface on the lower side of the arm portion 128 has a concave arc shape that is in contact with the arc portion diagonally above the rear side of the first support 41 and is supported. The first support end face 122. The first support end surface 122 is provided below the tip portion 121 and is located above the bottom portion 431 of the connection member 43. Accordingly, it is possible to cope with the high-pressure sinking load of the subject 51. When the first support end surface 122 is the tip portion 121 being pressed downward, it will be pulled upward obliquely by the restoring force of the compressed first support body, so that the warpage of the rear end portion of the contact 12 can be suppressed.

尖端部121係其尖端形狀成為凸的圓弧狀,所以,尖端部121被被檢查體51的端子511按壓,臂部128會旋動,即使尖端部121往前方傾斜的狀態下,也可讓尖端部121的接觸部分的曲率也不變地穩定而進行接觸。The tip portion 121 has a convex arc shape. Therefore, the tip portion 121 is pressed by the terminal 511 of the subject 51, and the arm portion 128 rotates. Even if the tip portion 121 is inclined forward, the tip portion 121 can be rotated. The curvature of the contact portion of the tip portion 121 is also stabilized and brought into contact.

接觸子12之後端側的部分,係於其上端,具有與第2支持體42的下方及側方的圓弧部分接觸而被支持之彎曲成凹下的圓弧狀的第2支持端面123。又,在接觸子12的尖端未被按壓的狀態下,於下端具有與連接構件43的底部431上面接觸的第1接觸端面124,於後方側端具有與連接構件43的基部432內側側端面接觸的第2接觸端面125。The rear end portion of the contactor 12 is attached to the upper end thereof, and has a second arcuate arc-shaped second support end surface 123 that is in contact with the arcuate portion below and to the side of the second supporter 42 and is supported. In a state where the tip of the contactor 12 is not pressed, the first contact end surface 124 is in contact with the upper surface of the bottom portion 431 of the connection member 43 at the lower end, and the inner end surface of the base portion 432 of the connection member 43 is contacted at the rear end的 第二 contactEndface 125.

第1支持端面122與第1接觸端面124之間的接觸子12下方的端面係成為彎曲成凸狀的第3接觸端面126。又,第1接觸端面124與第2接觸端面125係成為大略直角,其角部分係成為彎曲成凸出的圓弧狀的第4接觸端面127。The end face below the contactor 12 between the first support end face 122 and the first contact end face 124 is a third contact end face 126 that is curved in a convex shape. In addition, the first contact end face 124 and the second contact end face 125 are substantially at right angles, and the corner portion thereof is a fourth contact end face 127 which is curved in a convex arc shape.

在接觸子12尖端被往下方按壓而接觸子12旋動之狀態下,第3接觸端面126係接觸且電性連接於連接構件43的底部431,第4接觸端面127係接觸且電性連接於連接構件43的基部432。從第3接觸端面126經由第1接觸端面124、第2接觸端面127,到第2接觸端面125為止的端面係滑順地連接,接觸子12的旋動時之與連接構件43的連接良好地進行。In a state in which the tip of the contactor 12 is pressed downward and the contactor 12 is rotated, the third contact end face 126 is in contact with and electrically connected to the bottom portion 431 of the connection member 43, and the fourth contact end face 127 is in contact with and electrically connected to Base portion 432 of the connecting member 43. The end surfaces from the third contact end surface 126 through the first contact end surface 124 and the second contact end surface 127 to the second contact end surface 125 are smoothly connected. When the contact 12 is rotated, the connection with the connection member 43 is good. get on.

於接觸子12的後端,具有被第2支持端面123與第2接觸端面125挾持,對於基板10往大略垂直上方延伸的凸部129。凸部129係接觸子12的尖端被往下方按壓而接觸子12旋動時,為按壓第2支持體42的部分,藉由被壓縮之第2支持體42的復原力,以讓接觸子12的旋動恢復成原本狀態之方式施加應力,並且以將第4接觸端面127推頂至連接構件43的基部432之方式施加應力。The rear end of the contactor 12 has a convex portion 129 that is held by the second support end surface 123 and the second contact end surface 125 and extends substantially vertically upward from the substrate 10. The convex portion 129 is a point where the tip of the contactor 12 is pressed downward and the contactor 12 is rotated. In order to press the portion of the second supporter 42, the restoring force of the compressed second supporter 42 is used to contact the contactor 12. Stress is applied in such a manner that the rotation is restored to the original state, and stress is applied so as to push the fourth contact end surface 127 to the base portion 432 of the connection member 43.

第4接觸端面127係彎曲成凸出的圓弧狀,無關於接觸子12的旋動位置,可使相同曲率的端面接觸連接構件43的基部432。又,第4接觸端面127係曲率大於第3接觸端面126,且曲率小於連接構件43之底部431的上面與基部432之內側側端面的角部分之凸出的弧狀。藉此,即使藉由被檢查體51按壓接觸子12尖端,而接觸子12旋轉時,也可確實進行與連接構件43的基部432的電性接觸。The fourth contact end surface 127 is curved into a convex arc shape, and regardless of the rotation position of the contactor 12, the end surface with the same curvature can contact the base portion 432 of the connection member 43. The fourth contact end surface 127 has a curvature greater than that of the third contact end surface 126, and has a curvature smaller than the convex arc shape of the corner portion of the upper surface of the bottom portion 431 of the connection member 43 and the inner side end surface of the base portion 432. Thereby, even when the tip of the contactor 12 is pressed by the subject 51 and the contactor 12 is rotated, electrical contact with the base portion 432 of the connection member 43 can be reliably performed.

各接觸子12的第2支持端面123係彎曲成圓弧的中心角為180度以上之凹下的圓弧狀,可與第2支持體42的下方與側方的側面接觸。如此一來,接觸子12尖端藉由被檢查體51按壓時,接觸子12會以第2支持體42為軸旋動,並且藉由被第2支持端面123按壓之第2支持體42的復原力,第2支持端面123被往下方及後方側側方推頂,故第3接觸端面126會一邊被推頂至連接構件43的底部431上面一邊滑動,並且第4接觸端面127會一邊被推頂至連接構件43的基部432內側側端面一邊滑動。藉此,可確實且穩定進行與連接構件43的電性連接。The second support end surface 123 of each contact 12 is curved in a concave arc shape with the central angle of the arc being 180 degrees or more, and can contact the lower side of the second support body 42 and the lateral sides. In this way, when the tip of the contactor 12 is pressed by the subject 51, the contactor 12 rotates around the second support 42 as an axis, and is restored by the second support 42 pressed by the second support end face 123. Force, the second supporting end surface 123 is pushed downward and rearwardly, so the third contact end surface 126 is pushed while pushing against the bottom 431 of the connecting member 43, and the fourth contact end surface 127 is pushed The inner end surface of the base portion 432 which is pushed to the connecting member 43 slides. Thereby, the electrical connection with the connection member 43 can be performed reliably and stably.

各接觸子12係無關於接觸子12的尖端被按壓時的旋動位置,可與各連接構件43的底部431與基部432雙方同時電性接觸,所以,可與基板10的配線圖案11有良好的電性接觸性。又,構成為可接觸各連接構件43的底部431與基部432雙方,故即使任一方因為某些理由無法接觸的狀況中,只要另一方有接觸,即可確保電性連接,可減低接觸不良。Each contactor 12 is independent of the rotation position when the tip of the contactor 12 is pressed, and can be in electrical contact with both the bottom portion 431 and the base portion 432 of each connecting member 43 at the same time. Therefore, it can be in good contact with the wiring pattern 11 of the substrate 10 Electrical contact. In addition, since both the bottom portion 431 and the base portion 432 of each connection member 43 can be contacted, even if either of them cannot be contacted for some reason, as long as the other party is in contact, electrical connection can be ensured and contact failure can be reduced.

各接觸子12的尖端部121係如圖4所示,從殼體部24的縫隙17突出,如圖3所示,對於被檢查體51的端子511電性接觸。在此實施形態中,例示尖端部121係對於基板10往垂直方向延伸的狀況,適用於以高荷重按壓尖端的狀況,但並不限定於此,往前方傾斜亦可。再者,接觸子12的尖端係以尖端部121被往下方按壓之前,及按壓中也位於第1支持體41的上方之方式構成的話,可對應以高荷重按壓尖端的狀況,所以為佳,在接觸子12的尖端未被按壓的狀態下,接觸子12尖端位於比第2支持體42的中心更靠後方側更為佳。又,例示尖端部121的尖端形狀為圓弧狀的狀況,但並不限定於此。As shown in FIG. 4, the tip portion 121 of each contact 12 protrudes from the slit 17 of the housing portion 24, and as shown in FIG. 3, the terminal 511 of the subject 51 is electrically contacted. In this embodiment, the tip portion 121 is exemplified in a case where the substrate 10 extends in a vertical direction, and is suitable for a situation in which the tip is pressed with a high load, but it is not limited to this, and it may be tilted forward. In addition, the tip of the contactor 12 is structured so that the tip 121 is pressed downward and is positioned above the first support 41 during the pressing, so that the tip can be pressed under a high load, so it is better. In a state where the tip of the contactor 12 is not pressed, it is more preferable that the tip of the contactor 12 is located on the rear side than the center of the second support 42. In addition, the case where the tip shape of the tip portion 121 is arc-shaped is exemplified, but it is not limited to this.

第1支持體41及第2支持體42任一皆由具有彈性的電性絕緣材料所成,例如可使用由矽氧橡膠等之彈性體所成的材料。第1支持體41及第2支持體42係如圖6所示,形成為圓柱狀,為了支持複數接觸子12,分別沿著複數接觸子12的並排方向配置。第1支持體41係配置於接觸子12之尖端部121的下方,第2支持體42係配置於接觸子12的第2支持端面123上。Either the first support 41 or the second support 42 is made of an electrically insulating material having elasticity. For example, a material made of an elastomer such as silicone rubber can be used. The first support body 41 and the second support body 42 are formed in a cylindrical shape as shown in FIG. 6. In order to support the plurality of contactors 12, they are arranged along the side-by-side direction of the plurality of contactors 12. The first support 41 is disposed below the tip 121 of the contact 12, and the second support 42 is disposed on the second support end surface 123 of the contact 12.

第1支持體41係成為與孔部18之第1橫孔191的兩端,及設置於間隔壁25的第1凹部251寬度相同或稍大的尺寸,故藉由押入至第1橫孔191被殼體部24保持。同樣地,第2支持體42係成為與第2橫孔192的兩端,及設置於間隔壁25的第2凹部252寬度相同或稍大的尺寸,故藉由押入至第2橫孔192被殼體部24保持。The first support 41 is the same size as or slightly larger than both ends of the first horizontal hole 191 of the hole portion 18 and the first recessed portion 251 provided in the partition wall 25, so it is pushed into the first horizontal hole 191 It is held by the case portion 24. Similarly, the second support body 42 has the same or slightly larger width than the two ends of the second horizontal hole 192 and the second recessed portion 252 provided in the partition wall 25. Therefore, the second support 42 is pushed into the second horizontal hole 192 by The case portion 24 is held.

第1支持體41係如圖5所示,以與孔部18的前方側內壁面、接觸子12的第1支持端面122、及連接構件43的底部431上面同時接觸之方式配置,第1支持端面122係在第1支持體41的後方側斜上方接觸。藉此,接觸子12尖端被按壓時荷重會適度被分散,故也可對應高荷重。As shown in FIG. 5, the first support 41 is disposed so as to be in contact with the front side inner wall surface of the hole portion 18, the first support end surface 122 of the contactor 12, and the bottom portion 431 of the connection member 43 at the same time. The end surface 122 contacts diagonally upward from the rear side of the first support 41. This allows the load to be moderately dispersed when the tip of the contactor 12 is pressed, so that it can cope with high loads.

第2支持體42係如圖5所示,以與各接觸子12之第2支持端面123的圓弧狀之面接觸之方式配置。第2支持體42的直徑係形成為大於第2支持端面123之弧形狀的直徑,故各接觸子12端面被推頂至連接構件43的底部431及基部432,可確實接觸。As shown in FIG. 5, the second support body 42 is disposed so as to contact the arc-shaped surface of the second support end surface 123 of each contact 12. Since the diameter of the second support body 42 is larger than the diameter of the arc shape of the second support end surface 123, the end surface of each contact 12 is pushed to the bottom portion 431 and the base portion 432 of the connection member 43 and can be reliably contacted.

再者,在此實施形態中,例示分別1個第1支持體41及第2支持體42共通地支持複數接觸子12的狀況,但並不限定於此。例如,分別各設置兩個長邊方向之長度短的第1支持體41及第2支持體42,1組第1支持體41及第2支持體42以支持3個接觸子12之方式配置,另一組第1支持體41及第2支持體42以支持剩下的3個接觸子12之方式配置亦可。In addition, in this embodiment, a case where the first support 41 and the second support 42 support the plurality of contactors 12 in common is exemplified, but the present invention is not limited to this. For example, two first support bodies 41 and second support bodies 42 each having a short length in the long-side direction are respectively provided, and a group of the first support body 41 and the second support body 42 are arranged to support three contactors 12, Another set of the first support body 41 and the second support body 42 may be arranged so as to support the remaining three contactors 12.

又,在此實施形態中,以第1支持體41與第2支持體42的兩個支持體,支持各接觸子12,相較於以1個支持體支持的狀況,可分散負荷荷重。亦即,可延長支持體(第1支持體41與第2支持體42)的壽命(降低劣化速度)。Moreover, in this embodiment, each contact 12 is supported by two support bodies of the 1st support body 41 and the 2nd support body 42, and a load can be disperse | distributed compared with the state supported by 1 support body. That is, it is possible to extend the life of the support (the first support 41 and the second support 42) (reducing the rate of deterioration).

接著,參照圖7,說明壓陷荷重施加於實施形態之接觸子12的尖端部121時的動作。圖7係收容接觸子組裝體40之部分的插座部20及基板10的剖面圖(框架部26係省略記載),以實線描繪的接觸子12係揭示尖端藉由被檢查體51按下前的狀態,以虛線描繪的接觸子係揭示尖端藉由被檢查體51按下的狀態。Next, an operation when a crushing load is applied to the tip portion 121 of the contactor 12 of the embodiment will be described with reference to FIG. 7. FIG. 7 is a cross-sectional view of the socket portion 20 and the substrate 10 (the frame portion 26 is omitted from the description) in which the contact subassembly 40 is housed, and the contact 12 shown in a solid line reveals that the tip is pressed by the subject 51 before it is pressed. The state of the contact subline depicted by the dotted line reveals the state where the tip is pressed by the subject 51.

如圖7所示,於基板10上的配線圖案11配置連接構件43,於連接構件43的底部431上配置接觸子12。在接觸子12的前方側,於尖端部121的下方配置第1支持體41,接觸子12的第1支持端面122藉由第1支持體41朝向上方被支持。又,在接觸子12的後端側,於第2支持端面123上配置第2支持體42,第2支持端面123藉由第2支持體42朝向下方及後方被支持。As shown in FIG. 7, a connection member 43 is disposed on the wiring pattern 11 on the substrate 10, and a contact 12 is disposed on a bottom portion 431 of the connection member 43. A first supporter 41 is disposed below the tip portion 121 on the front side of the contactor 12, and the first support end surface 122 of the contactor 12 is supported upward by the first supporter 41. A second support body 42 is disposed on the second support end surface 123 on the rear end side of the contactor 12, and the second support end surface 123 is supported downward and rearward by the second support body 42.

在接觸子12尖端被往下方按下前的狀態中,第1接觸端面124與連接構件43之底部431的上面接觸,並且第2接觸端面125與連接構件43的基部432接觸。In a state before the tip of the contactor 12 is pushed downward, the first contact end surface 124 is in contact with the upper surface of the bottom portion 431 of the connection member 43, and the second contact end surface 125 is in contact with the base portion 432 of the connection member 43.

接觸子12的臂部128尖端側係藉由第1支持體41支持,尖端部121係從接觸子突出用開口171往開口部14突出,並且對於被檢查體51的端子511成為大略垂直。又,尖端部121的尖端位置係比第1支持體41的中心A,更靠圖6之右側(亦即,接觸子12的旋轉軸即第2支持體42側)。The tip side of the arm portion 128 of the contactor 12 is supported by the first support 41, the tip portion 121 protrudes from the contactor projection opening 171 toward the opening portion 14, and is substantially perpendicular to the terminal 511 of the subject 51. The tip position of the tip portion 121 is closer to the right side of FIG. 6 than the center A of the first support 41 (that is, the second support 42 side, which is the rotation axis of the contactor 12).

從該狀態,被檢查體51以所定壓陷荷重對於基板10垂直地按壓的話,接觸子12會旋動,尖端部121係一邊描繪圓弧往下方移動,一邊往圖6中的左方向移動,接觸子12尖端擦拭端子511。又,接觸子12旋動,第4接觸端面127一邊接觸於連接構件43的基部432一邊往上方移動,並且第3接觸端面126一邊滾動一邊往左右方向移動。From this state, if the subject 51 is pressed vertically against the substrate 10 with a predetermined indentation load, the contactor 12 rotates, and the tip 121 moves downward while drawing an arc, and moves to the left in FIG. 6. The tip of the contactor 12 wipes the terminal 511. When the contactor 12 rotates, the fourth contact end surface 127 moves upward while contacting the base portion 432 of the connection member 43, and the third contact end surface 126 moves in the left-right direction while rolling.

此時,接觸子12的第1支持端面122按壓第1支持體41,所以,第1支持體41邊被壓縮邊彈性變形。又,接觸子12的凸部129旋動,第2支持端面123按壓第2支持體42,所以,第2支持體42邊被壓縮邊彈性變形。At this time, the first support end surface 122 of the contactor 12 presses the first support body 41. Therefore, the first support body 41 is elastically deformed while being compressed. In addition, since the convex portion 129 of the contactor 12 rotates, and the second support end surface 123 presses the second support body 42, the second support body 42 is elastically deformed while being compressed.

然後,在被檢查體51被完全按下的狀態下,第1支持體41被押入接觸子12的第1支持端面122而壓縮變形,故藉由第1支持體41的復原力,尖端部121的尖端朝向被檢查體51的端子往上方被按壓。又,第2支持體42被押入接觸子12的第2支持端面123而壓縮變形,故藉由第2支持體42的復原力,以使接觸子12的旋動回復到原來狀態之方式施加應力,所以因此,尖端部121的尖端也朝向被檢查體51的端子往上方被按壓。Then, in a state where the object 51 to be inspected is fully pressed, the first support body 41 is pushed into the first support end surface 122 of the contactor 12 to be compressed and deformed. Therefore, the tip portion 121 is restored by the restoration force of the first support body 41. The tip of is pressed upward toward the terminal of the subject 51. In addition, the second support body 42 is compressed and deformed by being pressed into the second support end surface 123 of the contactor 12, so that the restoring force of the second supporter 42 is used to restore the rotation of the contactor 12 to its original state and apply stress. Therefore, therefore, the tip of the tip portion 121 is also pressed upward toward the terminal of the subject 51.

此時,接觸子12的尖端部121係成為斜方向的姿勢,接觸端子51之尖端部121的尖端的位置,係往與第1支持體41的中心A的位置相同位置或者左側移動,位於第1支持體41的上方。於接觸子12的尖端部121的下方有第1支持體41,故從被檢查體51的端子511作用於尖端部121的荷重P,係透過第1支持端面122傳達至第1支持體41,分布荷重(distributed load)傳達至連接構件43的底部及孔部18的前方側內壁面。又,第3接觸端面126接觸底部431,且第4接觸端面127接觸基部432,所以,來自被檢查體51的分布荷重從第3接觸端面126傳達至底部431,且從第4接觸端面127傳達至基部432。如此,被檢查體51被按壓時,接觸子12與連接構件43可確實穩定地電性連接。At this time, the tip portion 121 of the contactor 12 is in an oblique posture, and the position of the tip of the tip portion 121 of the contact terminal 51 is moved to the same position as the position of the center A of the first support 41 or to the left, and is located at the first position. 1 Above the support 41. The first support 41 is located below the tip 121 of the contactor 12, so the load P acting on the tip 121 from the terminal 511 of the subject 51 is transmitted to the first support 41 through the first support end surface 122. The distributed load is transmitted to the bottom of the connection member 43 and the front-side inner wall surface of the hole portion 18. Since the third contact end surface 126 contacts the bottom portion 431 and the fourth contact end surface 127 contacts the base portion 432, the distributed load from the subject 51 is transmitted from the third contact end surface 126 to the bottom portion 431 and from the fourth contact end surface 127. To the base 432. In this way, when the subject 51 is pressed, the contacts 12 and the connection member 43 can be reliably and electrically connected in a stable manner.

接著,參照圖8來說明實施形態之接觸子12及連接構件43的導電路徑。圖8係於安裝被檢查體51之狀態的收容接觸子組裝體40之部分的插座部20及基板10的剖面圖(省略框架部26的記載)中,說明導電路徑的圖。Next, a conductive path of the contactor 12 and the connection member 43 according to the embodiment will be described with reference to FIG. 8. FIG. 8 is a cross-sectional view (the description of the frame portion 26 is omitted) of the socket portion 20 and the substrate 10 in a state in which the contact subassembly 40 is accommodated in a state where the subject 51 is mounted, and a diagram illustrating a conductive path.

於圖8中,粗線是概念表示導電路徑的部分。再者,在圖8中,導電路徑R1及R2係連結被檢查體51的端子511與基板10的配線圖案11的最短路徑。In FIG. 8, a thick line is a part that conceptually shows a conductive path. In addition, in FIG. 8, the conductive paths R1 and R2 are the shortest paths connecting the terminal 511 of the subject 51 and the wiring pattern 11 of the substrate 10.

如圖8所示,設置大略L字狀的連接構件43,以接觸於連接構件43的底部431與基部432之方式配置接觸子12,藉此成為兩個導電路徑R1及R2。As shown in FIG. 8, a substantially L-shaped connection member 43 is provided, and the contactors 12 are arranged so as to contact the bottom portion 431 and the base portion 432 of the connection member 43, thereby becoming two conductive paths R1 and R2.

導電路徑R1係從接觸子12的尖端部121,通過第3接觸端面126、連接構件43的底部431、配線圖案11的路徑。導電路徑R2係從接觸子12的尖端部121,通過第4接觸端面127、連接構件43的基部432、配線圖案11的路徑。The conductive path R1 is a path that passes from the tip portion 121 of the contactor 12 through the third contact end surface 126, the bottom portion 431 of the connection member 43, and the wiring pattern 11. The conductive path R2 is a path that passes from the tip portion 121 of the contactor 12 through the fourth contact end surface 127, the base portion 432 of the connection member 43, and the wiring pattern 11.

先前未設置連接構件43,故只有1個導電路徑,如此實施形態般,藉由對於配線圖案11,隔著大略L字狀的連接構件43,設置接觸子12,如圖8所示,可設為兩個導電路徑R1及R2。結果,可讓電性連接裝置1所致之被檢查體51的通電試驗有良好的電性連接,可高精度進行試驗。又,假設即使未形成一方的導電路徑,也可利用另一方的導電路徑確保電性連接,所以,可減低接觸不良。The connection member 43 has not been previously provided, so there is only one conductive path. As in this embodiment, the contact 12 is provided for the wiring pattern 11 through the approximately L-shaped connection member 43. As shown in FIG. Are two conductive paths R1 and R2. As a result, the electrical connection test of the subject 51 caused by the electrical connection device 1 can have good electrical connection, and the test can be performed with high accuracy. In addition, even if one conductive path is not formed, the other conductive path can be used to ensure electrical connection. Therefore, contact failure can be reduced.

又,先前未設置大略L字狀的連接構件43,故相當於接觸子12的第4接觸端面127的部分會直接接觸殼體部24之孔部的內壁面。一般來說,殼體24是以絕緣性的合成樹脂形成,故相當於第4接觸端面127的部分會損傷殼體部24之孔部的內壁面,而接觸子12卡到該部位,有造成接觸子12離開基板10的配線圖案11,或從殼體部24產生的異物造成接觸子12與基板10的配線圖案11的電性接觸性惡化的可能性。但是,依據此實施形態,藉由隔著大略L字狀的連接構件43來設置接觸子12,接觸子12不會接觸殼體部24,所以,可迴避損傷殼體部24的內面之狀況等,也可迴避異物產生。In addition, since a substantially L-shaped connecting member 43 has not been previously provided, a portion corresponding to the fourth contact end face 127 of the contactor 12 directly contacts the inner wall surface of the hole portion of the housing portion 24. Generally, the housing 24 is formed of an insulating synthetic resin. Therefore, a portion corresponding to the fourth contact end surface 127 may damage the inner wall surface of the hole portion of the housing portion 24, and the contactor 12 may be caught at this portion, which may cause The contactor 12 may be separated from the wiring pattern 11 of the substrate 10, or foreign matter generated from the housing portion 24 may cause the electrical contact between the contactor 12 and the wiring pattern 11 of the substrate 10 to deteriorate. However, according to this embodiment, the contactor 12 is provided through the substantially L-shaped connecting member 43 so that the contactor 12 does not contact the housing portion 24. Therefore, the situation of damaging the inner surface of the housing portion 24 can be avoided. It is also possible to avoid the generation of foreign objects.

(A-2)實施形態的效果   如上所述,依據此實施形態,藉由使由導電性材料所成的連接構件存在於接觸子與基板的配線圖案之間,可減低基板的配線圖案的傷害及殼體部之內面的傷害,可迴避異物的影響所導致電性接觸性的降低。(A-2) Effect of the embodiment As described above, according to this embodiment, the presence of a connection member made of a conductive material between the contactor and the wiring pattern of the substrate can reduce the damage of the wiring pattern of the substrate. And the damage to the inner surface of the casing can avoid the reduction of electrical contact caused by the influence of foreign objects.

又,連接構件係藉由設為大略L字狀的形狀,可與接觸子的端面在兩處接觸,可穩定地電性連接接觸子與基板的配線圖案之間。In addition, the connection member has a substantially L-shape, and can contact the end surface of the contactor at two places, and can stably electrically connect the contactor and the wiring pattern of the substrate.

又,藉由設置配置在接觸子尖端的下方且連接構件的上方來進行支持的第1支持體,與成為接觸子的旋動軸並且將接觸子的端面在兩處推頂至連接構件的第2支持體的兩個支持體,可強力支持接觸子,故可將被檢查體的壓陷荷重設為高荷重。又,可藉由具備兩個支持體與連接構件來分散作用於接觸子尖端的荷重,可減低高溫環境下或低溫環境下之各支持體的劣化。結果,可延長支持體的壽命。In addition, a first support body that is disposed below the tip of the contactor and supported above the connection member is provided with a rotation axis that becomes the contactor and pushes the end face of the contactor to the first of the connection member at two places. 2 The two support bodies of the support body can strongly support the contactor, so the crushing load of the body to be inspected can be set to a high load. In addition, by providing two support bodies and a connection member, the load acting on the contact tip can be dispersed, and the deterioration of each support body in a high-temperature environment or a low-temperature environment can be reduced. As a result, the life of the support can be extended.

(B)其他實施形態   於上述之實施形態中已言及各種變形實施形態,但是,本發明也可適用於以下的實施形態。(B) Other Embodiments Although various modified embodiments have been described in the above embodiments, the present invention is also applicable to the following embodiments.

(B-1)圖9係揭示第1變形實施形態的電性連接裝置1A之構造的剖面圖。(B-1) FIG. 9 is a cross-sectional view showing the structure of the electrical connection device 1A according to the first modified embodiment.

於圖9中,第1變形實施形態的電性連接裝置1A係將連接構件43A之基部432A的寬度,設置成大於第1實施形態的連接構件43之基部432的寬度。如此,藉由增加基部432A的寬度,讓放熱性更提升,且可抑制通電時的接觸子12A的溫度上升,所以,可流通更大的電流。亦即,可利用大電流來對被檢查體51進行試驗。連接構件43A之基部432A的寬度可因應電性連接裝置1A的規格來決定,但是,利用基部432A的寬度在配置於連接構件43A上之接觸子12A的後端側中延長於其長邊方向,可有效率地放熱,故可進行更高精度的試驗。In FIG. 9, the electrical connection device 1A of the first modified embodiment has a width of the base portion 432A of the connection member 43A larger than the width of the base portion 432 of the connection member 43 of the first embodiment. In this way, by increasing the width of the base portion 432A, the heat release performance is further improved, and the temperature rise of the contactor 12A when the current is applied can be suppressed, so that a larger current can flow. That is, the test object 51 can be tested with a large current. The width of the base portion 432A of the connection member 43A can be determined according to the specifications of the electrical connection device 1A. However, the width of the base portion 432A is extended in the long side direction of the rear end side of the contactor 12A disposed on the connection member 43A. Since heat can be efficiently radiated, more accurate tests can be performed.

(B-2)圖10係揭示第2變形實施形態的電性連接裝置1B之構造的剖面圖。(B-2) FIG. 10 is a cross-sectional view showing the structure of the electrical connection device 1B according to the second modified embodiment.

於圖10中,第2變形實施形態的電性連接裝置1B係在不具有第1支持體41之處,與第1變形實施形態不同。又,接觸子12B的形狀、孔部18B的形狀、第2支持體42的保持構造、及連接構件43B的形狀也不同。In FIG. 10, the electrical connection device 1B according to the second modified embodiment is different from the first modified embodiment in that it does not include the first support 41. The shape of the contact 12B, the shape of the hole 18B, the holding structure of the second support 42 and the shape of the connection member 43B are also different.

第2變形實施形態的電性連接裝置1B係具有基板10,與設置於其基板10上的插座部20B。插座部20B係具有框架部26、接觸子組裝體40B、收容其接觸子組裝體40B的殼體部24B。關於基板10與框架部26,因為幾乎與第1實施形態相同,所以省略說明。The electrical connection device 1B according to the second modified embodiment includes a substrate 10 and a socket portion 20B provided on the substrate 10. The socket portion 20B includes a frame portion 26, a contact sub-assembly 40B, and a case portion 24B housing the contact sub-assembly 40B. Since the substrate 10 and the frame portion 26 are almost the same as those of the first embodiment, description thereof is omitted.

殼體部24B係收容接觸子組裝體40B,並與基板10聯合,保持接觸子組裝體40B的構件,以電性絕緣構件形成。殼體部24B係設置於基板10上,又,於殼體部24B的上面,設置有框架部26。殼體部24B的俯視外形狀呈與框架部26的俯視外形狀相同形狀的大略長方形,殼體部24B與框架部26以在俯視中外形一致之方式重疊。The case portion 24B is a member that accommodates the contact sub-assembly 40B and is combined with the substrate 10 to hold the contact sub-assembly 40B and is formed as an electrically insulating member. The case portion 24B is provided on the substrate 10, and a frame portion 26 is provided on the upper surface of the case portion 24B. The outer shape of the case portion 24B in a plan view is a substantially rectangular shape having the same shape as the outer shape of the frame portion 26 in plan view, and the outer shape of the case portion 24B and the frame portion 26 overlap each other in plan view.

於殼體部24B,配合框架部26的開口部14所收容之被檢查體51的端子511的位置,設置有用以收容接觸子組裝體40B的孔部18B。孔部18B係與開口部14的4邊分別平行地設置。The housing portion 24B is provided with a hole portion 18B for receiving the contact sub-assembly 40B at a position corresponding to the terminal 511 of the subject 51 to be accommodated in the opening portion 14 of the frame portion 26. The hole portion 18B is provided in parallel with each of the four sides of the opening portion 14.

各孔部18B係具有用以個別收容複數接觸子12B之前端側的複數縫隙17B,與收容各縫隙17B所收容之複數接觸子12B的後端側,並且收容彈性地支持接觸子12B之後端側的支持體42B的凹部即後端收容部16。縫隙17B的寬度係設定為稍寬於接觸子12的厚度,讓接觸子的前端側可自由地旋動。縫隙17B係開放於殼體部24B的上下,後端收容部16係開放於殼體部24B的下面。然後,複數縫隙17B的深側下方與後端收容部16的前側下方連通。Each hole portion 18B has a plurality of slits 17B for accommodating the plurality of contactors 12B on the front end side, and a rear end side of the plurality of contactors 12B accommodated in each of the slots 17B, and elastically supports the rear end side of the contactor 12B. The rear end accommodating portion 16 is a recessed portion of the support 42B. The width of the slit 17B is set to be slightly wider than the thickness of the contactor 12 so that the front end side of the contactor can rotate freely. The slit 17B is opened above and below the case portion 24B, and the rear end receiving portion 16 is opened below the case portion 24B. Then, the lower side of the plurality of slits 17B communicates with the lower side of the front side of the rear end housing portion 16.

構成孔部18B的複數縫隙17B部分係以對於開口部14的各邊垂直地朝向,並以一定間隔平行地併排成一列進行配置,鄰接之縫隙17B彼此藉由間隔壁25B區劃。The plurality of slits 17B constituting the hole portion 18B are vertically oriented to the sides of the opening portion 14 and are arranged in parallel at a certain interval in parallel. The adjacent slits 17B are partitioned by the partition wall 25B.

位於殼體部24B的上面之各縫隙17B的上側開口,係內側面向框架部26的開口部14,外側藉由框架部26的下面封堵。面向開口部14之縫隙17B的上側開口部分,係接觸子12B的尖端可上下移動地朝向開口部14突出的部分,也稱為接觸子突出用開口171B。從接觸子突出用開口171B突出之複數接觸子12B的尖端,可分別接觸安裝於開口部14的被檢查體51的複數端子511。The slits 17B located on the upper surface of the housing portion 24B are opened on the upper side, the inside faces the opening portion 14 of the frame portion 26, and the outside is blocked by the lower surface of the frame portion 26. The upper opening portion facing the slit 17B of the opening portion 14 is a portion where the tip of the contactor 12B projects up and down toward the opening portion 14 and is also referred to as a contactor protruding opening 171B. The tips of the plurality of contactors 12B protruding from the contactor protrusion opening 171B can respectively contact the plurality of terminals 511 of the subject 51 mounted on the opening 14.

構成孔部18B的後端收容部16係於前側內壁上角落,具有以與圓柱狀的支持體42B的圓柱面接觸之方式彎曲成凹下的圓弧狀的支持體承受面161。該支持體承受面161從前側斜上方支持支持體42B。又,於後端收容部16的兩側,具有用以支持支持體42B之兩端部的未圖示的溝部。該溝部係以與支持體42B的寬度相同或稍小的寬度,從殼體部24B的下面往垂直上方凹陷的溝,深端彎曲成凹下的圓弧。支持體42B係以側面接觸支持體承受面161之方式將兩端分別押入前述溝部,安裝於後端收容部16。The rear end accommodating portion 16 constituting the hole portion 18B is attached to the upper corner of the inner wall of the front side, and has a support receiving surface 161 curved in a concave shape so as to be in contact with the cylindrical surface of the cylindrical support 42B. The support body receiving surface 161 supports the support body 42B obliquely from the front side. In addition, grooves (not shown) are provided on both sides of the rear end housing portion 16 to support both ends of the support 42B. This groove portion is a groove which is recessed vertically upward from the lower surface of the housing portion 24B with the same width or slightly smaller than the width of the support body 42B, and the deep end is bent into a concave arc. The supporting body 42B is pressed into the groove portion at both ends in such a manner that the side contacts the supporting body receiving surface 161, and is mounted on the rear-end receiving portion 16.

位於殼體部24B的下面之孔部18B的開口,係縫隙17B的下側開口與後端收容部16的開口剛好對合的開口,藉由基板10封堵。The opening of the hole portion 18B located at the lower surface of the housing portion 24B is an opening where the lower opening of the slit 17B and the opening of the rear-end accommodating portion 16 coincide with each other, and is blocked by the substrate 10.

接著,說明包含收容於殼體部24B之複數各接觸子12B的接觸子組裝體40B的構造。Next, a structure of the contactor assembly 40B including the plurality of contactors 12B housed in the case portion 24B will be described.

於殼體部24B的各孔部18B,組入接觸子組裝體40B。該接觸子組裝體40B係具有複數接觸子12B、複數連接構件43B、支持體42B。A contact sub-assembly 40B is assembled in each hole portion 18B of the case portion 24B. The contact assembly 40B includes a plurality of contacts 12B, a plurality of connection members 43B, and a support 42B.

各連接構件43B係以具有導電性的金屬構件形成,存在於接觸子12B與基板10上的配線圖案11之間,用以電性連接接觸子12B與配線圖案11的構件。連接構件43B係形成為大略L字狀的板狀構件,具有對於基板10起立於垂直方向的基部432B,與對於基板10平行地延伸的底部431B。連接構件43B的厚度係形成為與接觸子12B的厚度相同。Each of the connection members 43B is formed of a conductive metal member, and is located between the contactor 12B and the wiring pattern 11 on the substrate 10 to electrically connect the contactor 12B and the wiring pattern 11. The connecting member 43B is a substantially L-shaped plate-shaped member, and has a base portion 432B standing upright to the substrate 10 and a bottom portion 431B extending parallel to the substrate 10. The thickness of the connection member 43B is formed to be the same as the thickness of the contact 12B.

連接構件43B係以與接觸子12B成對底部431B的前端側被收容於各縫隙17B內,底部431B的下端面接觸基板10上面的配線圖案11,並且基部432B的外側側端抵接後端收容部16的深側內壁之方式配置於後端收容部16內。連接構件43B之底部431B的上端面與基部432B的內側側端面,成為與接觸子12B的端面接觸之面。藉此,連接構件43B係發揮從接觸子12B的尖端藉由被檢查體51的端子511往下方按壓時之接觸子12B端面的滑動及按壓,防止基板10及配線圖案11、後端收容部16的深側內壁的損傷的作用。The connecting member 43B is housed in each slit 17B with the front end side of the bottom portion 431B paired with the contact 12B. The lower end surface of the bottom portion 431B contacts the wiring pattern 11 on the substrate 10, and the outer side end of the base portion 432B abuts against the rear end and is accommodated. The deep inner wall of the portion 16 is arranged in the rear end housing portion 16. The upper end surface of the bottom portion 431B of the connection member 43B and the inner side end surface of the base portion 432B are surfaces that come into contact with the end surface of the contactor 12B. Thereby, the connecting member 43B exerts the sliding and pressing of the end face of the contactor 12B when the contactor 12B is pressed downward from the tip of the contactor 12B by the terminal 511 of the subject 51 to prevent the substrate 10, the wiring pattern 11, and the rear-end receiving portion 16 The role of damage to the deep inner wall.

連接部件43B的基部432B的上端面,係以成為與後端收容部16的頂板面162相同或低於其的位置之方式設定。連接構件43B的底部431B係以下面與基板10之帶狀的配線圖案11電性連接之方式設置。The upper end surface of the base portion 432B of the connection member 43B is set so as to be the same as or lower than the top plate surface 162 of the rear end housing portion 16. The bottom portion 431B of the connection member 43B is provided in such a manner that the lower surface thereof is electrically connected to the strip-shaped wiring pattern 11 of the substrate 10.

各接觸子12B係以具有導電性的金屬構件形成,是形成為大略C字形狀的板狀構件,於前端側(尖端側)具有與被檢查體51的端子511電性連接之尖端,並且於後端側具有與連接構件43B的基部432B電性連接之後端。Each contact 12B is formed of a conductive metal member, and is a plate-shaped member formed in a substantially C-shape. The contact 12B has a tip electrically connected to the terminal 511 of the subject 51 on the front end side (the tip side), and The rear end side has a rear end electrically connected to the base portion 432B of the connection member 43B.

接觸子12B之尖端側的部分,係具有從接觸子12B之後端側的部分往斜上方延伸的臂部128B,與從臂部128B的端部往大略垂直上方延伸的尖端部121B。The tip side portion of the contactor 12B has an arm portion 128B extending obliquely upward from the rear end portion of the contactor 12B and a tip portion 121B extending substantially vertically upward from the end portion of the arm portion 128B.

臂部128B係以相同程度的寬度延伸,臂部128的上端彎曲成凹下的圓弧狀,下端彎曲成凸出的圓弧狀。尖端部121B係其尖端形狀成為凸出的圓弧狀。The arm portion 128B extends with the same width. The upper end of the arm portion 128 is bent into a concave arc shape, and the lower end is bent into a convex arc shape. The tip portion 121B has a convex arc shape.

接觸子12B之後端側的部分,係於其上端,具有與支持體42B的後方側斜下方的圓弧部分接觸而被支持之彎曲成凹下的圓弧狀的支持端面123B。又,在接觸子12B的尖端未被按壓的狀態下,於下端具有與連接構件43B的底部431B上面接觸的第1接觸端面124B,於後方側端具有與連接構件43B的基部432B內側側端面接觸的第2接觸端面125B。The rear end portion of the contactor 12B is tied to the upper end thereof, and has a concave arc-shaped support end surface 123B that is bent and brought into contact with the arc portion obliquely below the rear side of the support body 42B. In a state where the tip of the contactor 12B is not pressed, the first contact end face 124B is in contact with the upper surface of the bottom portion 431B of the connection member 43B, and the rear end is in contact with the inner end surface of the base portion 432B of the connection member 43B The second contact end face 125B.

比臂部128B之下端的第1接觸端面124B更前方側係成為彎曲成凸出的第3接觸端面126B。又,第1接觸端面124B與第2接觸端面125B係成為大略直角,其角部分係成為彎曲成凸出的圓弧狀的第4接觸端面127B。再者,在此實施形態中,第4接觸端面127B係將曲率提高至大於第1實施形態的第4接觸端面127,增加對連接構件43B的基部432B的接觸壓。The third contact end surface 126B which is curved to protrude further forward than the first contact end surface 124B at the lower end of the arm portion 128B is a convex side. In addition, the first contact end face 124B and the second contact end face 125B are at a substantially right angle, and the corner portion thereof is a fourth contact end face 127B which is curved in a convex arc shape. Furthermore, in this embodiment, the fourth contact end surface 127B increases the curvature to be larger than the fourth contact end surface 127 of the first embodiment, and increases the contact pressure against the base portion 432B of the connection member 43B.

在接觸子12B的尖端被往下方按壓而接觸子12B旋動之狀態下,第3接觸端面126B係接觸且電性連接於連接構件43B的底部431B,第4接觸端面127B係接觸且電性連接於連接構件43B的基部432B。從第3接觸端面126B經由第1接觸端面124B、第2接觸端面127B,到第2接觸端面125B為止的端面係滑順地連接,接觸子12B的旋動時之與連接構件43B的連接良好地進行。In a state where the tip of the contactor 12B is pressed downward and the contactor 12B rotates, the third contact end face 126B is in contact and electrically connected to the bottom portion 431B of the connection member 43B, and the fourth contact end face 127B is in contact and electrically connected. On the base portion 432B of the connecting member 43B. The end surface from the third contact end surface 126B through the first contact end surface 124B and the second contact end surface 127B to the second contact end surface 125B is smoothly connected. When the contact 12B is rotated, it is well connected to the connection member 43B. get on.

於接觸子12B的後端,具有被支持端面123B與第2接觸端面125B挾持,對於基板10往大略垂直上方延伸的凸部129B。凸部129B係接觸子12B的尖端被往下方按壓而接觸子12B旋動時,為按壓支持體42B的部分,藉由被壓縮之支持體42B的復原力,以讓接觸子12B的旋動恢復成原本狀態之方式施加應力,並且以將第4接觸端面127B推頂至連接構件43B的基部432B之方式施加應力。At the rear end of the contactor 12B, there is a convex portion 129B that is held by the support end surface 123B and the second contact end surface 125B and extends substantially vertically upward from the substrate 10. The convex portion 129B is the tip of the contactor 12B being pressed downward and the contactor 12B is rotated. In order to press the part of the support 42B, the restoring force of the compressed supporter 42B is used to restore the rotation of the contactor 12B. The stress is applied in the original state, and the stress is applied so as to push the fourth contact end surface 127B to the base portion 432B of the connection member 43B.

各接觸子12B的支持端面123B係彎曲成圓弧的中心角為90度以上之凹下的圓弧狀,可與支持體42B的後方側斜下方接觸。如此一來,藉由與接觸支持體42B之前方側斜上方的支持體承受面161的聯合,接觸子12B被被檢查體51按下時,接觸子12B會以支持體42B為軸旋動,並且藉由被支持端面123B按壓之支持體42B的復原力,支持端面123B被往下方及後方側側方推頂,故第3接觸端面126B會一邊被推頂至連接構件43B的底部432B上面一邊滑動,並且第4接觸端面127B會一邊被推頂至連接構件43B的基部432B內側側端面一邊滑動。藉此,可確實且穩定進行與連接構件43B的電性連接。The support end surface 123B of each contact 12B is curved into a concave arc shape having a central angle of an arc of 90 degrees or more, and can contact obliquely downward from the rear side of the support 42B. In this way, by combining with the support receiving surface 161 diagonally above the front side of the contact support 42B, when the contact 12B is pressed by the subject 51, the contact 12B rotates around the support 42B. And by the restoring force of the support body 42B pressed by the support end surface 123B, the support end surface 123B is pushed downward and laterally, so the third contact end surface 126B is pushed up to the bottom of the connecting member 43B above the 432B side. Sliding, and the fourth contact end surface 127B slides while being pushed up to the inner side end surface of the base portion 432B of the connecting member 43B. Thereby, the electrical connection with the connection member 43B can be performed reliably and stably.

即使於此變形實施形態中,也與上述之實施形態相同,各接觸子12B係無關於接觸子12B的尖端被按壓時的旋動位置,可與各連接構件43B的底部431B與基部432B雙方同時電性接觸,所以,可與基板10的配線圖案11有良好的電性接觸性。又,即使任一方因某些理由無法接觸的狀況中,只要另一方接觸,即可確保電性連接,可減低接觸不良。Even in this modified embodiment, it is the same as the above-mentioned embodiment. Each contact 12B is independent of the rotation position when the tip of the contact 12B is pressed, and can be simultaneously with both the bottom 431B and the base 432B of each connection member 43B. Since electrical contact is made, it is possible to have good electrical contact with the wiring pattern 11 of the substrate 10. In addition, even in a situation where either party cannot be contacted for some reason, as long as the other party contacts, electrical connection can be ensured, and contact failure can be reduced.

支持體42B係可利用與實施形態的第2支持體42相同者,故省略詳細說明。再者,於此實施形態中,支持體為一個,所以,適合接觸荷重比較小的狀況。Since the support 42B is the same as the second support 42 of the embodiment, detailed description is omitted. Furthermore, in this embodiment, since there is only one support, it is suitable for a situation where the contact load is relatively small.

(B-3)在上述之實施形態中,已例示圓柱狀構件即第1支持體與第2支持體的直徑相同的構件之狀況。但是,第1支持體的直徑與第2支持體的直徑不同亦可。藉由調整第1支持體的直徑,可容易調整接觸子尖端的行程及接觸荷重。又,第1支持體與第2支持體的彈性率不同亦可。藉由調整第1支持體的彈性率,可容易調整接觸荷重。(B-3) In the embodiment described above, the state of the cylindrical member, that is, the member having the same diameter as the first support and the second support has been exemplified. However, the diameter of the first support may be different from the diameter of the second support. By adjusting the diameter of the first support, the stroke of the contact tip and the contact load can be easily adjusted. The elasticity of the first support may be different from that of the second support. The contact load can be easily adjusted by adjusting the elastic modulus of the first support.

1‧‧‧電性連接裝置1‧‧‧ Electrical connection device

1A‧‧‧電性連接裝置1A‧‧‧electrical connection device

1B‧‧‧電性連接裝置1B‧‧‧electrical connection device

10‧‧‧基板10‧‧‧ substrate

11‧‧‧配線圖案11‧‧‧wiring pattern

12‧‧‧接觸子12‧‧‧ Contact

12A‧‧‧接觸子12A‧‧‧Contact

12B‧‧‧接觸子12B‧‧‧Contact

14‧‧‧開口部14‧‧‧ opening

14a‧‧‧傾斜面14a‧‧‧inclined surface

14b‧‧‧收容壁面14b‧‧‧ Containment wall

15‧‧‧固定構件15‧‧‧Fixed components

16‧‧‧後端收容部16‧‧‧ rear-end containment unit

17‧‧‧縫隙17‧‧‧ gap

17B‧‧‧縫隙17B‧‧‧Gap

18‧‧‧孔部18‧‧‧ Hole

18B‧‧‧孔部18B‧‧‧Hole

20‧‧‧插座部20‧‧‧Socket Department

20A‧‧‧插座部20A‧‧‧Socket Department

20B‧‧‧插座部20B‧‧‧Socket Department

24‧‧‧殼體部24‧‧‧Shell

24B‧‧‧殼體部24B‧‧‧Shell

25‧‧‧間隔壁25‧‧‧ partition

25B‧‧‧間隔壁25B‧‧‧ partition wall

26‧‧‧框架部26‧‧‧Frame Department

40‧‧‧接觸子組裝體40‧‧‧ contact subassembly

40B‧‧‧接觸子組裝體40B‧‧‧Contact subassembly

41‧‧‧第1支持體41‧‧‧ the first support

42‧‧‧第2支持體42‧‧‧ 2nd support

42B‧‧‧支持體42B‧‧‧ support

43‧‧‧連接構件43‧‧‧ connecting member

43A‧‧‧連接構件43A‧‧‧Connecting member

43B‧‧‧連接構件43B‧‧‧Connecting member

51‧‧‧被檢查體51‧‧‧ Subject

121‧‧‧尖端部121‧‧‧ Tip

121B‧‧‧尖端部121B‧‧‧ Tip

122‧‧‧第1支持端面122‧‧‧The first support end face

123‧‧‧第2支持端面123‧‧‧ 2nd support face

123B‧‧‧支持端面123B‧‧‧Support end face

124‧‧‧第1接觸端面124‧‧‧The first contact end face

124B‧‧‧第1接觸端面124B‧‧‧The first contact end face

125‧‧‧第2接觸端面125‧‧‧ 2nd contact end face

125B‧‧‧第2接觸端面125B‧‧‧ 2nd contact end face

126‧‧‧第3接觸端面126‧‧‧3rd contact end face

126B‧‧‧第3接觸端面126B‧‧‧3rd contact end face

127‧‧‧第4接觸端面127‧‧‧The fourth contact end face

128‧‧‧臂部128‧‧‧ arm

128B‧‧‧臂部128B‧‧‧ Arm

129‧‧‧凸部129‧‧‧ convex

129B‧‧‧凸部129B‧‧‧ convex

161‧‧‧支持體承受面161‧‧‧ support body bearing surface

171‧‧‧接觸子突出用開口171‧‧‧ opening for contactor protrusion

171B‧‧‧接觸子突出用開口171B‧‧‧Opening for contactor protrusion

172‧‧‧延長溝172‧‧‧Extended trench

173‧‧‧段部173‧‧‧section

191‧‧‧第1橫孔191‧‧‧The first horizontal hole

192‧‧‧第2橫孔192‧‧‧ 2nd horizontal hole

251‧‧‧凹部251‧‧‧concave

252‧‧‧凹部252‧‧‧ Recess

431‧‧‧底部431‧‧‧ bottom

431A‧‧‧底部431A‧‧‧ bottom

431B‧‧‧底部431B‧‧‧ bottom

432‧‧‧基部432‧‧‧base

432A‧‧‧基部432A‧‧‧Base

432B‧‧‧基部432B‧‧‧Base

433‧‧‧凹部433‧‧‧concave

434‧‧‧上端部434‧‧‧upper

434A‧‧‧上端部434A‧‧‧upper

511‧‧‧端子511‧‧‧terminal

R1‧‧‧導電路徑R1‧‧‧ conductive path

R2‧‧‧導電路徑R2‧‧‧ conductive path

[圖1] 揭示實施形態之電性連接裝置的構造的俯視圖。   [圖2] 揭示實施形態之電性連接裝置的插座部之構造的仰視圖。   [圖3] 揭示實施形態之電性連接裝置的構造的剖面圖。   [圖4] 揭示接觸子組裝體被收容於實施形態之電性連接裝置的殼體部之狀態的剖面立體圖。   [圖5] 揭示收容於實施形態的電性連接裝置之接觸子組裝體的構造的剖面圖。   [圖6] 揭示實施形態之接觸子組裝體的構造的構造圖。   [圖7] 說明壓陷荷重施加於實施形態之接觸子的尖端時的動作的說明圖。   [圖8] 說明實施形態之接觸子及連接構件的導電路徑的說明圖。   [圖9] 揭示變形實施形態之電性連接裝置的構造的剖面圖。   [圖10] 揭示變形實施形態之電性連接裝置的構造的剖面圖。[Fig. 1] A plan view showing a structure of an electrical connection device according to an embodiment. [Fig. 2] A bottom view showing the structure of the socket portion of the electrical connection device according to the embodiment. [Fig. 3] A sectional view showing the structure of the electrical connection device of the embodiment. [Fig. 4] A cross-sectional perspective view showing a state where the contact sub-assembly is housed in a housing portion of the electrical connection device of the embodiment. [FIG. 5] A cross-sectional view showing the structure of a contact subassembly housed in the electrical connection device of the embodiment. [Fig. 6] A structural diagram showing the structure of a contactor assembly according to an embodiment. [Fig. 7] An explanatory diagram for explaining an operation when an indentation load is applied to the tip of the contactor of the embodiment. [Fig. 8] An explanatory diagram for explaining the conductive paths of the contactor and the connecting member according to the embodiment. [FIG. 9] A cross-sectional view showing the structure of an electrical connection device according to a modified embodiment. [Fig. 10] A cross-sectional view showing the structure of an electrical connection device according to a modified embodiment.

Claims (6)

一種電性連接裝置,係具備形成配線的基板,與設置於其基板上的插座部,並使安裝於前述插座部之被檢查體的電極部,電性連接於形成於前述基板之配線的電性連接裝置,其特徵為:   前述插座部,係具有具有與前述被檢查體的電極部接觸之尖端的複數接觸子、和前述接觸子與前述基板上之配線接觸的複數連接構件、彈性地支持前述各接觸子之旋轉的支持體,並將該等收容於孔部;   前述各連接構件具有和前述孔部的內壁面接觸的基部,與和前述基板的配線電性連接的底部;   前述接觸子與前述連接構件的基部及底部電性連接。An electrical connection device includes a substrate on which wiring is formed, and a socket portion provided on the substrate, and an electrode portion of an object to be mounted on the socket portion is electrically connected to a wiring formed on the wiring on the substrate. The connection device is characterized in that: The socket part is provided with a plurality of contact members having a tip in contact with the electrode part of the object to be inspected, and a plurality of connection members in which the contact members are in contact with wiring on the substrate, and elastically supports The rotating support of each of the contacts, and accommodates these in the hole portion; Each of the connection members has a base portion in contact with the inner wall surface of the hole portion, and a bottom portion which is electrically connected to the wiring of the substrate; The contactor It is electrically connected to the base and bottom of the connection member. 如申請專利範圍第1項所記載之電性連接裝置,其中,   前述各連接構件的前述底部沿著前述基板的配線延伸;   前述各連接構件的前述基部係與前述底部連結,沿著前述孔部的殼體部的內面,對於前述基板往垂直方向延伸。The electrical connection device according to item 1 of the scope of patent application, wherein: the bottom portion of each connection member extends along the wiring of the substrate; the base portion of each connection member is connected to the bottom portion along the hole portion The inner surface of the housing portion extends perpendicular to the substrate. 如申請專利範圍第1項所記載之電性連接裝置,其中,   前述連接構件之前述基部的寬度大於前述底部的寬度。The electrical connection device according to item 1 of the scope of patent application, wherein: the width of the base portion of the connection member is greater than the width of the bottom portion. 如申請專利範圍第1項所記載之電性連接裝置,其中,   前述各連接構件之前述基部的上端部係往後方延伸,與設置於前述插座部之孔部的溝部分卡合。According to the electrical connection device described in item 1 of the scope of the patent application, the upper end portion of the base portion of each of the connection members extends rearward and engages with a groove portion provided in a hole portion of the socket portion. 如申請專利範圍第1項所記載之電性連接裝置,其中,   前述插座部更具有從下方支持前述各接觸子之尖端側的支持體。According to the electrical connection device described in item 1 of the scope of patent application, the socket part further includes a support body that supports the tip side of each of the contacts from below. 如申請專利範圍第5項所記載之電性連接裝置,其中,   前述被檢查體之前述各接觸子的尖端位置,係位於支持前述接觸子尖端側的支持體的上方。The electrical connection device according to item 5 of the scope of patent application, wherein: (i) the position of the tip of each contactor of the test object is located above a support supporting the tip side of the contactor;
TW107127353A 2017-08-15 2018-08-07 Electrical connection device TWI677693B (en)

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