CN207248943U - A kind of probe unit - Google Patents
A kind of probe unit Download PDFInfo
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- CN207248943U CN207248943U CN201721234094.4U CN201721234094U CN207248943U CN 207248943 U CN207248943 U CN 207248943U CN 201721234094 U CN201721234094 U CN 201721234094U CN 207248943 U CN207248943 U CN 207248943U
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- probe
- conductive contact
- cavity
- probe unit
- elastic component
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Abstract
The utility model embodiment discloses a kind of probe unit, including：Pedestal, including body, be arranged at intrinsic cavity, the conductive contact for being arranged on body and being grounded and be arranged at the through hole being connected on body with the cavity；Probe, including main part, the end of probe arranged on the main part one end and the mounting portion arranged on the main part other end, the mounting portion are inserted into the cavity by the through hole；Conduct piece, is placed in the cavity and on the mounting portion, for by the mounting portion holding in the cavity；When the probe unit does not work, electric charge that the conduct piece is accumulated when being contacted with the conductive contact to discharge the probe face.The present embodiment is by increasing conduct piece in probe structure and being contacted with the conduct piece to discharge the conductive contact of electric charge, so that the probe can discharge the probe unit and test point on circuit board because of the electric charge that contacts and accumulate of working long hours, it minimizing electrostatic can effectively discharge, improve producing line yield.
Description
Technical field
It the utility model is related to display technology field, more particularly to a kind of probe unit.
Background technology
At present, liquid crystal display panel has become display platform important in modern IT, video product.Wherein, display surface
The main driving principle of plate includes：R/G/B compressed signals, control signal and power supply are passed through signal wire rod and PCB by system board
Connector (connector) on plate is connected, and input data is by the time schedule controller IC (Timing on pcb board
Controller, TCON) after processing, then pass through source electrode chip on film chip (Source-Chip onFilm, S-COF) and grid
Chip on film chip (Gate-Chip onFilm, G-COF) is connected with the display area (DisplayArea) of display panel,
So that display panel LCD obtains required power supply and signal, wherein, the driving framework is further included arranged on display panel
The fanout area (Fan OutArea) at edge, the scan line and data cable of the display area are respectively connected to S- via fanout area
COF chips and G-COF chips.Therefore, it is to pass through signal by system board that display panel LCD, which obtains required power supply and signal,
The power supply and signal that Transmission system mainboard exports after wire rod is connected with the connector on pcb board.Wherein, in order to avoid daily
Manually plug signal wire rod is damaged caused by the connector on pcb board in use, and the production automation journey of lifting factory
Degree, improves production efficiency, thus imports automatic checkout system (Auto Contact System) on plant produced line, so that
R/G/B compressed signals, control signal and the power supply of pcb board, transformation are inputted after script is connected by signal wire rod with connector
It is in contact into by metal probe device with the test point on PCB directly to transmit compressed signal, control signal and power supply.
Be in contact the power supply provided with direct Transmission system mainboard, letter by metal probe device with the test point on PCB
Number can damage to avoid the mode of artificial plug signal wire rod caused by pcb board, and the production efficiency of raising display.So
And the long-time of metal probe device uses, the electric charge that may result on metal probe device adds up, and will ultimately result in electrostatic
Discharge (Electro-Static Discharge, ESD), lesion element.Wherein, static discharge refers to there is different electrostatic potentials
Object is adjacent to each other or direct contact caused by electric charge transfer, that is, add up the metal probe devices of many electric charges with pcb board
On test point contact when inevitably result from electrostatic, so as to cause static discharge, the instantaneous voltage of kilovolt, makes in generation
Into the damage by static electricity of circuit board so that liquid crystal display panel can not work normally.
Therefore, a kind of new Auto Contact probe units how are designed, to discharge new A uto Contact
The electric charge that probe unit is contacted and accumulated by long-time with the test point on circuit board, so as to effectively reduce what static discharge occurred
Possibility, improves producing line yield, is those skilled in the art's technical problem urgently to be resolved hurrily.
Utility model content
The utility model embodiment provides a kind of probe unit, according to probe structure increase conduct piece, for the conduction
Part contact is to discharge the conductive contact of electric charge and for controlling whether probe unit will discharge the elastic component of electric charge, so that the spy
The probe of needle device can effectively discharge the probe unit with the test point on circuit board because working long hours what is contacted and accumulate
Electric charge.
The utility model embodiment provides a kind of probe unit, which includes:Pedestal, including body, setting
In intrinsic cavity, the conductive contact for being arranged on body and being grounded and it is arranged at what is be connected on body with the cavity
Through hole；Probe, including main part, the end of probe arranged on described main part one end and the peace arranged on the main part other end
Dress portion, the mounting portion are inserted into by the through hole in the cavity of the pedestal；And conduct piece, be placed in the cavity and
On the mounting portion of the probe, for by the mounting portion holding in the cavity；When the probe unit does not work
When, electric charge that the conduct piece is accumulated when being contacted with the conductive contact to discharge the probe face.
Further：The probe unit includes：Elastic component, the elastic component are arranged in the cavity, the elasticity
One end of part is connected with side of the body away from the through hole, the installation of the other end of the elastic component and the probe
Portion is connected, and the elastic component is used to compressive deformation occur during the probe face so that the conduct piece and the conductive contact
Separation.
Further：The elastic component is spring.
Further：The conductive contact is located on the bottom of the body two lateral walls, the two lateral walls
Bottom is equipped with a port, and the port is used to place the conductive contact, and the conductive contact is in circular arc bar shape, described
The inner side of conductive contact is flushed with the side wall of the cavity.
Further：The outside of the conductive contact is flushed with the lateral wall of the body.
Further：The outside of the conductive contact is not flushed with the lateral wall of the body.
Further：The conduct piece is conductive ring.
Further：The outer diameter of the conductive ring and the side wall dimensions of the cavity match.
Further：The conductive contact is located on the bottom of the body two lateral walls, the two lateral walls
Bottom is equipped with a port, and the port is used to place the conductive contact, and the conductive contact is in circular arc bar shape, described
The inner side of conductive contact is not flushed with the side wall of the cavity and the inner side of the conductive contact can be with the outside of the conductive ring
Match contact, and the outside of the conductive contact is not flushed with the lateral wall of the body.
The utility model embodiment additionally provides another probe unit, which includes:Pedestal, including body,
It is arranged at intrinsic cavity, the conductive contact for being arranged on body and being grounded and is arranged on body and is connected with the cavity
Logical through hole；Probe, including main part, the end of probe arranged on described main part one end and arranged on the main part other end
Mounting portion, the mounting portion is inserted into by the through hole in the cavity of the pedestal；Conduct piece, is placed in the cavity and sets
In on the mounting portion of the probe, for by the mounting portion holding in the cavity；And elastic component, the elastic component
It is arranged in the cavity, one end of the elastic component is connected with side of the body away from the through hole, the elasticity
The other end of part is connected with the mounting portion of the probe, occur when the elastic component is used for the probe face compressive deformation with
The conduct piece is set to be separated with the conductive contact；Wherein, the conductive contact is located at the bottom of the body two lateral walls
On, the bottom of the two lateral walls is equipped with a port, and the port is used to place the conductive contact, described conductive tactile
Point is in circular arc bar shape, and the inner side of the conductive contact is flushed with the side wall of the cavity；When the probe unit does not work,
The electric charge that the conduct piece is accumulated when being contacted with the conductive contact to discharge the probe face.
The present embodiment in probe structure by increasing conduct piece, for being contacted with the conduct piece to discharge the conduction of electric charge
Contact and for controlling whether probe unit will discharge the elastic component of electric charge, so that the probe of the probe unit can effectively discharge
The probe unit and the test point on the circuit board are because of the electric charge that contacts and accumulate of working long hours, so as to effectively reduce electrostatic
The possibility that electric discharge occurs, improves producing line yield.
Brief description of the drawings
In order to illustrate more clearly of the utility model embodiment technical solution, make required in being described below to embodiment
Attached drawing is briefly described, it should be apparent that, drawings in the following description are some embodiments of the utility model, for
For those of ordinary skill in the art, without creative efforts, other can also be obtained according to these attached drawings
Attached drawing.
Fig. 1 is a kind of cross-sectional view for probe unit that the utility model first embodiment provides.
Cross-section structure signal when Fig. 2 is a kind of probe unit working status that the utility model first embodiment provides
Figure.
Fig. 3 is a kind of cross-sectional view for probe unit that the utility model second embodiment provides.
Fig. 4 is a kind of cross-sectional view for probe unit that the utility model 3rd embodiment provides.
Embodiment
The following is a combination of the drawings in the embodiments of the present utility model, and the technical scheme in the embodiment of the utility model is carried out
Clearly and completely describe, it is clear that described embodiment is the utility model part of the embodiment, rather than whole implementation
Example.Based on the embodiment in the utility model, those of ordinary skill in the art are obtained without making creative work
The every other embodiment obtained, shall fall within the protection scope of the present invention.
It should be appreciated that ought use in this specification and in the appended claims, term " comprising " and "comprising" instruction
Described feature, entirety, step, operation, the presence of element and/or component, but it is not precluded from one or more of the other feature, whole
Body, step, operation, element, component and/or its presence or addition for gathering.
It is also understood that in this utility model term used in the description merely for the sake of description specific embodiment
Purpose and be not intended to limit the utility model.As used in the utility model specification and appended book
Like that, unless context clearly indicates other situations, otherwise " one " of singulative, "one" and "the" are intended to include plural number
Form.
In the specific implementation, display screen can be implemented in a variety of manners.It is for example, aobvious described in the utility model embodiment
Display screen includes but not limited to such as thin film transistor liquid crystal display screen (LCD), organic light-emitting diode (OLED) display screen (OLED), quantum
The display screens such as point display screen (QLED), plasma panel, CRT display screen.
Fig. 1 is referred to, it is a kind of schematic diagram for probe unit that the utility model first embodiment provides.In this implementation
In example, pedestal 10, probe 20, conduct piece 30 and elastic component 40 are provided with the probe unit 100.
The pedestal 10 includes body 11, the cavity 12 being arranged in body 11, is arranged on body 11 and what is be grounded leads
Electric contact 131 and 132 and it is arranged at the through hole 14 being connected on body 11 with the cavity 12.The pedestal 10 is arranged at
The top of probe 20, in the present embodiment, the pedestal 10 is in hollow circular cylinder, can in other feasible embodiments
In hollow, rectangular cylinder；The pedestal 10 can use plastics etc. to possess the material of insulation performance, and the pedestal 10 is for fixing institute
Probe 20 is stated, prevents situations such as probe 20 in test point contact process on circuit board with rocking, and in the present embodiment
In, port 15 and 15 ' is provided with the bottom of the two lateral walls of pedestal 10, which is used to place described
Conductive contact 131 and 132, the conductive contact 131 and 132 can possess the material of electric conductivity using metal etc..In this implementation
In example, the conductive contact be in circular arc bar shape, and the side wall of the inner side of the conductive contact 131 and 132 and the cavity 12
Flush, the outside of the conductive contact 131 and 132 is flushed with the lateral wall of the body 11, the conductive contact 131 and 132
Outside connect ground wire 111 and 112 respectively so that the electric charge that the probe 20 is accumulated can be led by conduct piece 30 with described
Electric contact 131 and 132 is in contact to be conducting to the earth, so as to discharge the electric charge that the probe 20 is accumulated.
The probe 20 includes main part 21, the end of probe 22 arranged on described 21 one end of main part and arranged on the master
The mounting portion 23 of 21 other end of body portion, the mounting portion 23 are inserted into by the through hole 14 in the cavity 12 of the pedestal 10, institute
The size and the size of the through hole 14 for stating mounting portion 23 match.The probe 20 is metal probe, the end of probe 22
For being connected with the test point on the circuit board directly to transmit power supply, signal.The mounting portion 23 is placed in the base
In the cavity 12 of seat 10, for being fixedly connected with the conduct piece 30 installation so that 23 holding of mounting portion is in the cavity
In 12, the outer diameter of the conduct piece 30 is more than the size of the through hole.
The conduct piece 30 is placed in the cavity 12 and is arranged on the mounting portion 23 of the probe 20, for by described in
23 holding of mounting portion is in the cavity 12；When the probe unit 100 does not work, the conduct piece 30 is touched with the conduction
Point 131 and 132 is contacted to discharge the electric charge accumulated after described work a period of time of probe 20.In the present embodiment, it is described to lead
Electric part 30 is conductive ring, and the conductive ring is in torus shape, is arranged and is installed on the mounting portion 23 of the probe 20, the probe
20 be in cylindrical shape, and the outer diameter of the conductive ring and the side wall dimensions of the cavity 12 match.Again because described lead
Electric contact 131 and 132 is in circular arc bar shape, is flushed with the side wall of the cavity 12, therefore, the conductive contact 131 and 132 with
The outside diameter of the conductive ring matches, and the surface that can greatly expand the conductive contact 131 and 132 and the conductive ring is pasted
Area is closed, so as to improve electric charge turn-on rate, accelerates to discharge the speed of accumulated electric charge.
The elastic component 40 is arranged in the cavity 12, and one end of the elastic component 40 is with the body 11 away from described
The side of through hole 14 is connected, and the other end of the elastic component 40 is connected with the mounting portion 23 of the probe 20, the elasticity
Part 40 is used to compressive deformation occur when the probe 20 works so that the conduct piece 30 and the conductive contact 131 and 132 points
From.In the present embodiment, the elastic component 40 is spring, for example, when the test point contact on the probe 20 and circuit board connects
When connecing, circuit board has upward bearing capacity to the probe 20, causes 40 compressive deformation of elastic component, causes the probe 20
With conduct piece 30 along 12 upward sliding of cavity, since the position of the conductive contact 131 and 132 immobilizes, work as institute
Conduct piece 30 is stated by upward bearing capacity and during up-slip, the conduct piece 30 is separated with the conductive contact 131 and 132.
In the above-described embodiments, according to the existing structure of probe 20 to the conductive contact 131 and 132 and conduct piece 30
Etc. being designed so that the probe 20 is contacted by the conduct piece 30 with the conductive contact 131 and 132 to be formed ground connection and close
Close circuit so that the electric charge accumulated after described work a period of time of probe 20 can be led by the conductive contact 131 and 132
The earth is led to, so as to effectively reduce the possibility of the generation of static discharge, the product for effectively improving Auto Contact systems is good
Rate.
Fig. 2 is referred to, signal when it is a kind of probe unit working status that the utility model first embodiment provides
Figure.In the present embodiment, which is in contact with circuit board 200 to transmit power supply, signal.On the probe unit 100
Pedestal 10, probe 20, conduct piece 30 and elastic component 40 are provided with, further includes circuit board 200 and test point region 201.
The pedestal 10 includes body 11, the cavity 12 being arranged in body 11, is arranged on body 11 and what is be grounded leads
Electric contact 131 and 132 and it is arranged at the through hole 14 being connected on body 11 with the cavity 12.The pedestal 10 is arranged at
The top of probe 20, in the present embodiment, the pedestal 10 is in hollow circular cylinder, can in other feasible embodiments
In hollow, rectangular cylinder；The pedestal 10 can use plastics etc. to possess the material of insulation performance, and the pedestal 10 is for fixing institute
Probe 20 is stated, prevents situations such as probe 20 in test point contact process on circuit board with rocking, and in the present embodiment
In, port 15 and 15 ' is provided with the bottom of the two lateral walls of pedestal 10, which is used to place described
Conductive contact 131 and 132, the conductive contact 131 and 132 can possess the material of electric conductivity using metal etc..In this implementation
In example, the conductive contact be in circular arc bar shape, and the side wall of the inner side of the conductive contact 131 and 132 and the cavity 12
Flush, the outside of the conductive contact 131 and 132 is flushed with the lateral wall of the body 11.The conductive contact 131 and 132
Outside connect ground wire 111 and 112 respectively so that the electric charge that the probe 20 is accumulated can be led by conduct piece 30 with described
Electric contact 131 and 132 is in contact to be conducting to the earth, so as to discharge the electric charge that the probe 20 is accumulated.
The probe 20 includes main part 21, the end of probe 22 arranged on described 21 one end of main part and arranged on the master
The mounting portion 23 of 21 other end of body portion, the mounting portion 23 are inserted into by the through hole 14 in the cavity 12 of the pedestal 10, institute
The size and the size of the through hole 14 for stating mounting portion 23 match.The probe 20 is metal probe, the end of probe 22
For being connected with the test point on the circuit board directly to transmit power supply, signal.The mounting portion 23 is placed in the base
In the cavity 12 of seat 10, for being fixedly connected with the conduct piece 30 installation so that 23 holding of mounting portion is in the cavity
In 12, the outer diameter of the conduct piece 30 is more than the size of the through hole.
The conduct piece 30 is placed in the cavity 12 and is arranged on the mounting portion 23 of the probe 20, for by described in
23 holding of mounting portion is in the cavity 12；When the probe unit 100 does not work, the conduct piece 30 is touched with the conduction
Point 131 and 132 is contacted to discharge the electric charge accumulated after described work a period of time of probe 20.In the present embodiment, it is described to lead
Electric part 30 is conductive ring, and the conductive ring is in torus shape, is arranged and is installed on the mounting portion 23 of the probe 20, the probe
20 be in cylindrical shape, and the outer diameter of the conductive ring and the side wall dimensions of the cavity 12 match.Again because described lead
Electric contact 131 and 132 is in circular arc bar shape, is flushed with the side wall of the cavity 12, therefore, the conductive contact 131 and 132 with
The outside diameter of the conductive ring matches, and the surface that can greatly expand the conductive contact 131 and 132 and the conductive ring is pasted
Area is closed, so as to improve electric charge turn-on rate, accelerates to discharge the speed of accumulated electric charge.
The elastic component 40 is arranged in the cavity 12, and one end of the elastic component 40 is with the body 11 away from described
The side of through hole 14 is connected, and the other end of the elastic component 40 is connected with the mounting portion 23 of the probe 20, the elasticity
Part 40 is used to compressive deformation occur when the probe 20 works so that the conduct piece 30 and the conductive contact 131 and 132 points
From.In the present embodiment, the elastic component 40 is spring, for example, when the test point contact on the probe 20 and circuit board connects
When connecing, circuit board has upward bearing capacity to the probe 20, causes 40 compressive deformation of elastic component, causes the probe 20
With conduct piece 30 along 12 upward sliding of cavity, since the position of the conductive contact 131 and 132 immobilizes, work as institute
Conduct piece 30 is stated by upward bearing capacity and during up-slip, the conduct piece 30 is separated with the conductive contact 131 and 132.
In the above-described embodiments, the probe unit 100 is additionally provided with elastic component 40, and the elastic component 40, which is used to distinguish, to be visited
The state during work of needle device 100 with the probe 20 during inoperative, when the probe unit 100 does not work, the probe
20 are in vacant state, the conductive contact 131 of bottom of the conduct piece 30 with being arranged at the body two lateral walls
It is in contact with 132 to discharge the electric charge accumulated when the probe 20 works, the conduct piece is located at first position；When the spy
Needle device 100 work when, the probe 20 is in contact with the test point region 201 on the circuit board 200, the probe 20 by
The effect of circuit board 200 has upward bearing capacity, and the conduct piece 30 is moved upwards up to the second place in the cavity 12, described
Conduct piece 30 is separated with the conductive contact 131 and 132, can not form ground connection closed circuit so that is tired out on the probe 20
Long-pending electric charge cannot be conducting to the conductive contact 131 and 132 by conduct piece 30, and then be conducting in the earth, so that it is guaranteed that
The probe unit 100 can work normally, can be by the probe unit 100 by the control signal and power supply of system board
Etc. being transferred on display panel.Wherein, the conduct piece 30 follows the probe 20 interior in first position in the cavity 12
Move back and forth between the second place.
Fig. 3 is refer to, it is a kind of cross-sectional view for probe unit that the utility model second embodiment provides.
The probe unit 100 is provided with pedestal 10, probe 20, conduct piece 30 and elastic component 40.The second embodiment is real with first
Applying example, difference lies in the projected side wall of the inner side cavity 12 of the conductive contact 131 and 132, so as to promote
Coming into full contact with for conduct piece 30 and the conductive contact 131 and 132 is stated, so that the electric charge that the probe 20 is accumulated when working can
To be more quickly and efficiently conducting to the earth by the conductive electric shock 131 and 132.And the conductive contact 131 and 132
Outside do not flushed with the lateral wall of the body 11, the outside extraction wire of the conductive contact 131 and 132 respectively with ground wire
111 are connected with 112 so that the electric charge accumulated of the probe 20 can by conduct piece 30 and the conductive contact 131 and
132 are in contact to be conducting to the earth, so as to discharge the electric charge that the probe 20 is accumulated.In some feasible embodiments, such as
Shown in Fig. 4, it is a kind of cross-sectional view for probe unit that the utility model 3rd embodiment provides, described conductive tactile
Point 131 and 132 inner side and the side wall of the cavity 12 are flush, outside and the body of the conductive contact 131 and 132
11 lateral wall does not flush.In the feasible embodiment of other, the inner side sky of the conductive contact 131 and 132
The side wall of chamber 12 is slightly convex, and the outside of the conductive contact 131 and 132 is flushed with the lateral wall of the body 11.
In the above-described embodiments, according to the structure of probe 20 to the conductive contact 131 and 132 and the grade of conduct piece 30 into
Row design so that the electric charge that the probe 20 is accumulated can be connect by the conduct piece 30 and the conductive contact 131 and 132
Touch and be conducting to the earth, to discharge accumulated electric charge, so as to effectively reduce the possibility of the generation of static discharge, effectively improve
The product yield of Auto Contact systems.
In several embodiments provided herein, it should be understood that disclosed device, can be by others side
Formula is realized.For example, device embodiment described above is only schematical, for example, the division of described device, is only one
The division of kind of structure function, can there is an other dividing mode when actually realizing, for example, multiple devices or component can combine or
Another device is desirably integrated into, or some features can be ignored, or do not perform.In addition, shown or discussed is mutual
Coupling, direct-coupling or communication connection can be INDIRECT COUPLING or communication connection by some interfaces, device or module,
Can also be electric, mechanical or other form connections.
The above, is only specific embodiment of the present utility model, but the scope of protection of the utility model is not limited to
In this, any one skilled in the art can readily occur in various in the technical scope that the utility model discloses
Equivalent modifications or substitutions, these modifications or substitutions should be covered within the scope of the utility model.Therefore, this practicality
New protection domain should be subject to scope of the claims.
Claims (10)
- A kind of 1. probe unit, it is characterised in that including：Pedestal, including body, be arranged at intrinsic cavity, the conductive contact for being arranged on body and being grounded and be arranged at this The through hole being connected on body with the cavity；Probe, including main part, the end of probe arranged on described main part one end and the peace arranged on the main part other end Dress portion, the mounting portion are inserted into by the through hole in the cavity of the pedestal；AndConduct piece, is placed in the cavity and on the mounting portion of the probe, for by the mounting portion holding described In cavity；Wherein, when the probe unit does not work, the conduct piece is contacted with the conductive contact to discharge the probe work The electric charge accumulated when making.
- 2. probe unit according to claim 1, it is characterised in that the probe unit further includes：Elastic component, the elastic component are arranged in the cavity, and one end of the elastic component is with the body away from the through hole Side be connected, the other end of the elastic component is connected with the mounting portion of the probe, and the elastic component is used for the spy Compressive deformation occurs when pin works so that the conduct piece is separated with the conductive contact.
- 3. probe unit according to claim 2, it is characterised in that the elastic component is spring.
- 4. probe unit according to claim 1, it is characterised in that the conductive contact is located at the body opposite sides On the bottom of wall, the bottom of the two lateral walls is equipped with a port, and the port is used to place the conductive contact, institute It is in circular arc bar shape to state conductive contact, and the inner side of the conductive contact is flushed with the side wall of the cavity.
- 5. probe unit according to claim 4, it is characterised in that the outside of the conductive contact is outer with the body Side wall flushes.
- 6. probe unit according to claim 4, it is characterised in that the outside of the conductive contact is outer with the body Side wall does not flush.
- 7. probe unit according to claim 1, it is characterised in that the conduct piece is conductive ring.
- 8. probe unit according to claim 7, it is characterised in that the outer diameter of the conductive ring and the cavity Side wall dimensions match.
- 9. probe unit according to claim 1, it is characterised in that the conductive contact is located at the body opposite sides On the bottom of wall, the bottom of the two lateral walls is equipped with a port, and the port is used to place the conductive contact, institute It is in circular arc bar shape to state conductive contact, and the inner side of the conductive contact is not flushed with the side wall of the cavity and the conductive contact Inner side can be contacted with matching on the outside of the conductive ring, the outside of the conductive contact and the lateral wall of the body are uneven It is flat.
- A kind of 10. probe unit, it is characterised in that including：Pedestal, including body, be arranged at intrinsic cavity, the conductive contact for being arranged on body and being grounded and be arranged at this The through hole being connected on body with the cavity；Probe, including main part, the end of probe arranged on described main part one end and the peace arranged on the main part other end Dress portion, the mounting portion are inserted into by the through hole in the cavity of the pedestal；Conduct piece, is placed in the cavity and on the mounting portion of the probe, for by the mounting portion holding described In cavity；AndElastic component, the elastic component are arranged in the cavity, and one end of the elastic component is with the body away from the through hole Side be connected, the other end of the elastic component is connected with the mounting portion of the probe, and the elastic component is used for the spy Compressive deformation occurs when pin works so that the conduct piece is separated with the conductive contact；Wherein, the conductive contact is located on the bottom of the body two lateral walls, and the bottom of the two lateral walls is all provided with There is a port, the port is used to placing the conductive contact, and the conductive contact is in circular arc bar shape, the conductive contact Inner side flushed with the side wall of the cavity；When the probe unit does not work, the conduct piece contacts to discharge the probe face when institute with the conductive contact The electric charge of accumulation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721234094.4U CN207248943U (en) | 2017-09-25 | 2017-09-25 | A kind of probe unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721234094.4U CN207248943U (en) | 2017-09-25 | 2017-09-25 | A kind of probe unit |
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| Publication Number | Publication Date |
|---|---|
| CN207248943U true CN207248943U (en) | 2018-04-17 |
Family
ID=61886897
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721234094.4U Active CN207248943U (en) | 2017-09-25 | 2017-09-25 | A kind of probe unit |
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| Country | Link |
|---|---|
| CN (1) | CN207248943U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107525953A (en) * | 2017-09-25 | 2017-12-29 | 惠科股份有限公司 | A kind of probe unit |
| CN112534276A (en) * | 2018-08-09 | 2021-03-19 | 欧姆龙株式会社 | Probe unit |
-
2017
- 2017-09-25 CN CN201721234094.4U patent/CN207248943U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107525953A (en) * | 2017-09-25 | 2017-12-29 | 惠科股份有限公司 | A kind of probe unit |
| WO2019056624A1 (en) * | 2017-09-25 | 2019-03-28 | 惠科股份有限公司 | Probe device |
| US11067599B2 (en) | 2017-09-25 | 2021-07-20 | HKC Corporation Limited | Probe device |
| CN112534276A (en) * | 2018-08-09 | 2021-03-19 | 欧姆龙株式会社 | Probe unit |
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