CN110328161A - A kind of the high and low temperature test integrated machine for sorting - Google Patents
A kind of the high and low temperature test integrated machine for sorting Download PDFInfo
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- CN110328161A CN110328161A CN201910723891.6A CN201910723891A CN110328161A CN 110328161 A CN110328161 A CN 110328161A CN 201910723891 A CN201910723891 A CN 201910723891A CN 110328161 A CN110328161 A CN 110328161A
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- 238000012360 testing method Methods 0.000 title claims abstract description 226
- 238000001514 detection method Methods 0.000 claims abstract description 202
- 238000012937 correction Methods 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 claims abstract description 19
- 230000007246 mechanism Effects 0.000 claims description 158
- 238000012546 transfer Methods 0.000 claims description 73
- 238000007599 discharging Methods 0.000 claims description 58
- 238000005057 refrigeration Methods 0.000 claims description 57
- 238000010438 heat treatment Methods 0.000 claims description 52
- 238000000926 separation method Methods 0.000 claims description 27
- 230000001105 regulatory effect Effects 0.000 claims description 17
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 15
- 230000005611 electricity Effects 0.000 claims description 12
- 238000004806 packaging method and process Methods 0.000 claims description 11
- 230000008569 process Effects 0.000 claims description 11
- 238000009826 distribution Methods 0.000 claims description 10
- 238000009413 insulation Methods 0.000 claims description 8
- 238000001179 sorption measurement Methods 0.000 claims description 8
- 238000010521 absorption reaction Methods 0.000 claims description 7
- 238000007689 inspection Methods 0.000 claims description 7
- 238000005538 encapsulation Methods 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 4
- 230000001815 facial effect Effects 0.000 claims description 4
- 238000012806 monitoring device Methods 0.000 claims description 4
- 230000008030 elimination Effects 0.000 claims description 3
- 238000003379 elimination reaction Methods 0.000 claims description 3
- 230000032258 transport Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 abstract description 8
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 13
- 239000000463 material Substances 0.000 description 5
- 238000011056 performance test Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 3
- 239000012141 concentrate Substances 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000012536 packaging technology Methods 0.000 description 3
- 238000012216 screening Methods 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000007664 blowing Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000012163 sequencing technique Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/04—Sorting according to size
- B07C5/10—Sorting according to size measured by light-responsive means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of the high and low temperature test integrated machine for sorting, are related to semiconductor auto industrialization production field, delivery device；First room temperature detection device receives the component from delivery device, carries out first time room temperature electric parameter detecting to component；Low temperature detection device carries out low temperature electric parameter detecting to component；Transferring device receives the component from low temperature detection device, then component is transferred to next procedure；High-temperature detection device carries out high temperature electric parameter detecting to component；Second room temperature detection device receives the component from high-temperature detection device, carries out second of room temperature electric parameter detecting to component；Position correcting device handles the direction position correction of component, and the present invention passes through rational deployment, the test equipment of multiple temperature ranges is completely integrated on one device, place space is saved, reduces product handling time, cost has been saved, has been improved work efficiency.
Description
Technical field
The present invention relates to semiconductor auto industrialization production fields, and in particular to a kind of the high and low temperature test integrated machine for sorting.
Background technique
Due to the needs of modern social development, requirement that electronics product uses and performance it is higher and higher, it is desirable that electricity
Sub- component not only has superperformance and reliability, but also can adapt to room temperature (20 DEG C~30 DEG C), high temperature (80 DEG C~150
DEG C) or low temperature (0 DEG C~-50 DEG C) ambient condition under carry out all kinds of performance detections.
Usually under normal temperature environment, carry out semiconductor electronic component performance test and be relatively easy, in high temperature or
Relative difficult under low temperature state is difficult because Machine Design, material structure, technology etc. limit by semiconductor electronic member
Device is integrated in an equipment and carries out the high and low temperature test.Generally use independent room temperature test equipment, high temperature test equipment, low
The composition process flow such as warm test equipment will lead in this way to complete the requirement that this kind of electronic component needs the high and low temperature test
Equipment using area is big, higher cost.However, the high/low temperature integrated machine equipment of external import is expensive, before medium-sized and small enterprises
Phase investment is big, serious to constrain the development of medium-sized and small enterprises.
Summary of the invention
According to the above-mentioned deficiencies of the prior art, the technical problem to be solved by the present invention is to propose a kind of the high and low temperature test point
All-in-one machine is selected, by rational deployment, the test equipment of multiple temperature ranges is completely integrated on one device, field is saved
Ground space reduces product handling time, has saved cost, improved work efficiency.
A kind of the high and low temperature test integrated machine for sorting, comprising:
Delivery device carries out the conveying of component, and carries out separation sequence to the component；
First room temperature detection device receives the component after delivery device separation sequence, provides room temperature detection
Environment, the first time room temperature electric parameter detecting before low-temperature test is carried out to component, and record first time room temperature electricity
The information data of property parameter testing；
Low temperature detection device receives the component from the first room temperature monitoring device, provides the environment of low temperature detection,
Low temperature electric parameter detecting is carried out to component, and records the information data of the low temperature electric parameter detecting；
Transferring device receives the component from the low temperature detection device, and the component and room temperature under low-temperature condition are empty
Gas carries out temperature conduction, and component heat absorption is gradually restored to room temperature, then component is transferred to next procedure；
High-temperature detection device receives the component from the transferring device, the environment of high temperature detection is provided, to component
High temperature electric parameter detecting is carried out, and records the information data of the high temperature electric parameter detecting；
Second room temperature detection device receives the component from the high-temperature detection device, provides the environment of room temperature detection,
Second of room temperature electric parameter detecting after carrying out high temperature test to component, and record second of the room temperature electrical parameter and survey
The information data of examination；
Position correcting device, is arranged between delivery device and the first room temperature detection device and high-temperature detection device and institute
It states between the second room temperature detection device, the direction position correction of component is handled, each component direction position is kept
Unanimously.
Optionally, the delivery device includes vibration feeder, component detection bar, Air Ionizer, pneumatic feed
Track and high-speed separation mechanism, the vibration feeder have input terminal and output end, and the input terminal of vibration feeder is set as
Component stores disk, and the output end of vibration feeder is connected with the input terminal of the pneumatic feed track, the side of vibration feeder
Portion is equipped with the Air Ionizer of the component detection bar and elimination component electrostatic that are detected to component, pneumatically send
Expect that the output end of track is equipped with the high-speed separation mechanism, the side of high-speed separation mechanism is equipped with driving high-speed separation mechanism to member
The separation driving motor that device is separated.
Optionally, the first room temperature detection device includes the first test bench attachment base, the first test bench support plate, first
Test bench, the first locating clip, the first test pcb board and the first p-wire connecting hole, the upper end of the first test bench attachment base
Face is connect by the first test attachment base support plate with first test bench, and the first test bench upper surface is fixed with described
First tests pcb board, and first locating clip is fixed on the first test pcb board, and the end of first test pcb board one end is also electric
Property be connected with the first p-wire connecting hole, the lower end of the first test bench attachment base is equipped with the first Z axis adjustment plate, described first
The lower end of Z axis adjustment plate is equipped with the first X-axis adjustment plate, and the lower end of the first X-axis adjustment plate is equipped with the first Y-axis adjustment plate；
The second room temperature detection device include the second test bench attachment base, the second test bench support plate, the second test bench,
Second locating clip, the second test pcb board and the second p-wire connecting hole, the upper surface of the second test bench attachment base pass through institute
It states the second test attachment base support plate to connect with second test bench, the second test bench upper surface is fixed with second test
Pcb board is fixed with second locating clip on the second test pcb board, and the end at the second test two end of pcb board is also electrically connected with
The second p-wire connecting hole, the lower end of the second test bench attachment base are equipped with the second Z axis adjustment plate, the second Z axis adjustment
The lower end of plate is equipped with the second X-axis adjustment plate, and the lower end of the second X-axis adjustment plate is equipped with the second Y-axis adjustment plate.
Optionally, the low temperature detection device surrounding is coated with refrigeration thermal insulation board, and low temperature detection device includes low temperature pan feeding
Mechanism, refrigeration rail mechanism and low temperature discharging mechanism, the input terminal and the low temperature feeding mechanism of the refrigeration rail mechanism
Output end connection, the output end for the rail mechanism that freezes are connect with the input terminal of the low temperature discharging mechanism, low temperature feeding mechanism packet
Low temperature pan feeding detection sensor, low temperature feeding end boosting mechanism, low temperature pan feeding track, low temperature pan feeding track cover board, low temperature is included to enter
Expect orbit altitude regulating mechanism and low temperature pan feeding support plate, it is high that the low temperature pan feeding support plate is equipped with the low temperature pan feeding track
Regulating mechanism is spent, the upper surface of low temperature pan feeding track regulating mechanism is fixed with the low temperature pan feeding track, low temperature pan feeding track
Input terminal is equipped with the low temperature pan feeding detection sensor and the low temperature feeding end boosting mechanism, the covering of low temperature pan feeding track upper end
There is the low temperature pan feeding track cover board, refrigeration rail mechanism includes refrigeration track, refrigeration track cover board, refrigeration heat-conducting plate, refrigeration
Matchmaker's conduit, freeze internal thermal insulation board and low-temperature test mechanism, the input of the output end of low temperature pan feeding track and the refrigeration track
End connection, refrigeration track upper end are covered with the refrigeration track cover board, and the lower end for the track that freezes is fixed with the refrigeration heat-conducting plate,
Freeze heat-conducting plate at be equipped with refrigeration orbit connection the refrigeration matchmaker conduit, freeze track at be additionally provided with inside the refrigeration every
Hot plate, the low-temperature test mechanism include low-temperature test circuit board, low-temperature test pneumatic clamping mechanism, the pneumatic backgauge of low-temperature test
The output end of mechanism and low-temperature test position-limit mechanism, the track that freezes is fixed with the low-temperature test electricity by low-temperature test clamping plate
Road plate, low-temperature test circuit board upper end are equipped with the low-temperature test pneumatic clamping mechanism, are equipped with and state at low-temperature test hold-down mechanism
The pneumatic stock stop of low-temperature test and the low-temperature test that the pneumatic stock stop running track of low-temperature test is limited
Position-limit mechanism, low temperature discharging mechanism include low temperature discharging detection sensor and low temperature discharging track, the low temperature discharging track
Input terminal is connected to the output end of refrigeration track, and the output end of low temperature discharging track is equipped with low temperature discharging detection sensor；
The high-temperature detection device surrounding is coated with heat insulating plate, and high-temperature detection device includes high temperature feeding mechanism, adds
The output end of hot orbit mechanism and high temperature discharging mechanism, the input terminal of the heating track mechanism and the high temperature feeding mechanism connects
It connects, the output end of heating track mechanism is connect with the input terminal of the high temperature discharging mechanism, and high temperature feeding mechanism includes that high temperature enters
Expect that detection sensor, high temperature feeding end boosting mechanism, high temperature pan feeding track, high temperature pan feeding track cover board, high temperature pan feeding track are high
Regulating mechanism and high temperature pan feeding support plate are spent, the high temperature pan feeding support plate is equipped with the high temperature pan feeding orbit altitude and adjusts machine
Structure, the upper surface of high temperature pan feeding track regulating mechanism are fixed with the high temperature pan feeding track, and the input terminal of high temperature pan feeding track is set
There are the high temperature pan feeding detection sensor and the high temperature feeding end boosting mechanism, high temperature pan feeding track upper end is covered with the height
Warm pan feeding track cover board, heating track mechanism include heating track, heating track cover board, heating heat-conducting plate, heating rod and high temperature
The output end of mechanism for testing, high temperature pan feeding track is connected to the input terminal of the heating track, and heating track upper end covers
State heating track cover board, the lower end of heating track is fixed with the heating heat-conducting plate, heats and is equipped at heat-conducting plate and heating track
The heating rod of connection, the high temperature test mechanism includes high temperature test circuit board, high temperature test pneumatic clamping mechanism, high temperature
Pneumatic stock stop and high temperature test position-limit mechanism are tested, the output end of high temperature track is fixed by high temperature test clamping plate
High temperature test circuit board is stated, high temperature test circuit board upper end is equipped with the high temperature test pneumatic clamping mechanism, and high temperature test compresses
It is equipped at mechanism and states the pneumatic stock stop of high temperature test and the pneumatic stock stop running track of high temperature test is limited
The high temperature test position-limit mechanism, high temperature discharging mechanism include high temperature discharging detection sensor and high temperature discharging track, the height
The input terminal of warm discharging track is connected to the output end of refrigeration track, and the output end of high temperature discharging track is equipped with the high temperature discharging
Detection sensor.
Optionally, the transferring device includes high speed handling device and transfer thermally conductive, and the high speed handling device is used for
Component is transferred to from low temperature detection device the thermally conductive Tai Chu of the transfer and by component from special secondary school heat dissipation platform transfer it is supreme
At warm test device；
High speed handling device includes motor mount, driving motor, link assembly, electromagnetic absorption device, electromagnetism ferropexy
Part transports push rod, linear guide and transhipment suction nozzle, is equipped with the driving motor on the motor mount, driving motor
The output shaft transmission connection link assembly, link assembly are equipped with the linear guide, are slidably connected in linear guide
Transhipment push rod is stated, the transhipment push rod upper end end is fixed with the electromagnet fixing piece, and transhipment push rod lower end is fixed with
The transhipment suction nozzle, electromagnet fixing piece top are equipped with the electromagnetic absorption device；
Transfer thermally conductive includes transfer direct driving motor, transfer load plate, component guided mode, transfer vacuum distributor gear, transfer
Pan feeding detection sensor and transfer discharging detection sensor, the output shaft transmission connection middle reprinting of the transfer direct driving motor
Disk, circle distribution has several component guided modes on transfer load plate, and transfer load plate is equipped with the transfer vacuum distributor gear,
Transfer vacuum distributor gear is connect with component guided mode, and the side of transfer load plate is respectively equipped with the transfer pan feeding detection sensor
With transfer discharging detection sensor, the side of transfer discharging detection sensor is arranged in transfer pan feeding detection sensor.
Optionally, the position correcting device includes rotation correcting device and positioning correcting device；
The rotation correcting device is arranged between delivery device and the first room temperature detection device, packet rotation correction pedestal,
Rotation corrects component detection sensor, turns to servo motor and rotation correction seat, and the rotation is corrected installs on pedestal
Steering servo motor is stated, the output shaft for turning to servo motor corrects pedestal through rotation and is sequentially connected with the rotation and corrects
Seat, the side that seat is corrected in rotation are equipped with the rotation and correct component detection sensor, and the lower end that seat is corrected in rotation is equipped with rotation
Z axis adjustment plate is corrected, the lower end that Z axis adjustment plate is corrected in the rotation is equipped with rotation and corrects X-axis adjustment plate, and X is corrected in the rotation
The lower end of axial adjustment plate is equipped with rotation and corrects Y-axis adjustment plate；
The positioning correcting device is arranged between high-temperature detection device and the second room temperature detection device, and bottom is corrected in packet positioning
Seat positions and corrects component detection sensor and positioning correction seat, and the positioning, which is corrected, is fixed with the positioning correction on pedestal
Seat, the side that seat is corrected in positioning are equipped with the positioning and correct component detection sensor, and the lower end that seat is corrected in positioning is equipped with positioning
Z axis adjustment plate is corrected, the lower end that Z axis adjustment plate is corrected in the positioning is equipped with positioning and corrects X-axis adjustment plate, and X is corrected in the positioning
The lower end of axial adjustment plate is equipped with positioning and corrects Y-axis adjustment plate.
It optionally, further include for the braid packaging system to component progress braid encapsulation, the braid packaging system
Be arranged after the second room temperature detection device process, between braid packaging system and the second room temperature detection device by process sequence according to
It is secondary to be equipped with three-dimensional five facial vision detection devices and concentrate feeding-distribution device.
Optionally, it is additionally provided between the delivery device and the rotation correcting device and video inspection use is carried out to component
To judge the component video detection device in component direction and position.
It optionally, further include king-tower rotating-table apparatus for being shifted to component, the king-tower rotating-table apparatus includes
King-tower direct driving motor, king-tower load plate, vacuum air-guide rod, king-tower vacuum distributor gear, voice coil motor press mechanism and suction nozzle, it is described
The output shaft of king-tower direct driving motor is sequentially connected the king-tower load plate, and circle distribution has several suction nozzles on king-tower load plate, main
Tower load plate is equipped with the vacuum air-guide rod and the king-tower vacuum distributor gear, vacuum air-guide rod and king-tower vacuum distributor gear
Connection, king-tower vacuum distributor gear are connect with suction nozzle, and several voice coil motor press mechanisms are equipped with above suction nozzle.
The present invention has the advantages that machinery equipment is divided into device and launches region, room temperature test section by rational deployment
Domain, low-temperature test region, transfer thermal conductivity region, high temperature test region, appearance detection zone, braid and specification area etc. make half
Conducting electrons component picks and places transfer techniques on the same device, by mechanical high speed, realizes room temperature electrical testing, low
The production processes such as warm electrical testing, high temperature electrical testing, appearance detection, sorting classification, braid encapsulation will need a variety of only originally
Vertical room temperature, low temperature, high temperature test screening installation completely integrate on one device, and it is more to realize that it carries out electronic component
Electric performance test under kind of temperature environment state, result can satisfy semiconductor electronic component often, electricity under low and high temperature degree environment
The packaging technology requirement of performance measure, saves place space, reduces product handling time, saved cost, improved work
Efficiency.
Detailed description of the invention
Fig. 1 and Fig. 2 is the structural schematic diagram in the embodiment of the present invention under two kinds of different perspectivess；
Fig. 3 is the top view of the embodiment of the present invention；
Fig. 4 is the structural schematic diagram of delivery device in the embodiment of the present invention；
Fig. 5 is the structural schematic diagram of the first room temperature detection device in the embodiment of the present invention；
Fig. 6 is the structural schematic diagram of low temperature detection device in the embodiment of the present invention；
Fig. 7 is the structural schematic diagram in the embodiment of the present invention inside low temperature detection device；
Fig. 8 is the structural schematic diagram of high temperature of embodiment of the present invention detection device；
Fig. 9 is the structural schematic diagram inside high temperature of embodiment of the present invention detection device；
Figure 10 is the structural schematic diagram of high speed of embodiment of the present invention handling device；
The structural schematic diagram that Figure 11 is transfer thermally conductive in the embodiment of the present invention；
Figure 12 is the structural schematic diagram that correcting device is rotated in the embodiment of the present invention；
Figure 13 is the structural schematic diagram that correcting device is positioned in the embodiment of the present invention；
Figure 14 is the structural schematic diagram of king-tower rotating-table apparatus in the embodiment of the present invention；
Figure 15 is the front view of king-tower rotating-table apparatus in the embodiment of the present invention；
Figure 16 is the schematic diagram of the embodiment of the present invention；
Figure 17 is the flow chart of the embodiment of the present invention.
Specific embodiment
To be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, below with reference to
Specific embodiment, the present invention is further explained.
As one embodiment, the present invention proposes a kind of the high and low temperature test integrated machine for sorting, comprising:
Delivery device carries out the conveying of component, and carries out separation sequence to the component；
First room temperature detection device receives the component after delivery device separation sequence, provides room temperature detection
Environment, the first time room temperature electric parameter detecting before low-temperature test is carried out to component, and record first time room temperature electricity
The information data of property parameter testing；
Low temperature detection device receives the component from the first room temperature monitoring device, provides the environment of low temperature detection,
Low temperature electric parameter detecting is carried out to component, and records the information data of the low temperature electric parameter detecting；
Transferring device receives the component from the low temperature detection device, and the component and room temperature under low-temperature condition are empty
Gas carries out temperature conduction, and component heat absorption is gradually restored to room temperature；
High-temperature detection device receives the component from the transferring device, the environment of high temperature detection is provided, to component
High temperature electric parameter detecting is carried out, and records the information data of the high temperature electric parameter detecting；
Second room temperature detection device receives the component from the high-temperature detection device, provides the environment of room temperature detection,
Second of room temperature electric parameter detecting after carrying out high temperature test to component, and record second of the room temperature electrical parameter and survey
The information data of examination；
Position correcting device, is arranged between delivery device and the first room temperature detection device and high-temperature detection device and institute
It states between the second room temperature detection device, the direction position correction of component is handled, each component direction position is kept
Unanimously.
Machinery equipment is divided into device and launches region, room temperature test section by rational deployment by the design of the all-in-one machine
Domain, low-temperature test region, transfer thermal conductivity region, high temperature test region, appearance detection zone, braid and specification area etc. make half
Conducting electrons component picks and places transfer techniques on the same device, by mechanical high speed, realizes room temperature electrical testing, low
The production processes such as warm electrical testing, high temperature electrical testing, appearance detection, sorting classification, braid encapsulation will need a variety of only originally
Vertical room temperature, low temperature, high temperature test screening installation completely integrate on one device, and it is more to realize that it carries out electronic component
Electric performance test under kind of temperature environment state, result can satisfy semiconductor electronic component often, electricity under low and high temperature degree environment
The packaging technology requirement of performance measure, saves place space, reduces product handling time, saved cost, improved work
Efficiency.
Relatively good implementation of the present invention is described in detail below.
Fig. 1, Fig. 2 and Fig. 3 are please referred to, which includes:
Delivery device 2 carries out the conveying of component, and carries out separation sequence to component；
First room temperature detection device 3 receives the component after the separation sequence of delivery device 2, provides room temperature detection
Environment, the first time room temperature electric parameter detecting before low-temperature test is carried out to component, and record first time room temperature electrical parameter
The information data of test；
Low temperature detection device 4 receives the component from the first room temperature monitoring device 3, provides the environment of low temperature detection, right
Component carries out low temperature electric parameter detecting, and records the information data of low temperature electric parameter detecting；
Transferring device 5 receives the component from low temperature detection device 4, component and air at room temperature under low-temperature condition
Temperature conduction is carried out, component heat absorption is gradually restored to room temperature, then component is transferred at high-temperature detection device 6；
High-temperature detection device 6, receive the component from transferring device 5, provide high temperature detection environment, to component into
Row high temperature electric parameter detecting, and record the information data of high temperature electric parameter detecting；
Second room temperature detection device 7 receives the component from high-temperature detection device 6, provides the environment of room temperature detection, right
Component carries out second of room temperature electric parameter detecting after high temperature test, and records the letter of second of room temperature electric parameter detecting
Cease data；
Position correcting device 8 is arranged between delivery device 2 and the first room temperature detection device 3 and high-temperature detection device 6
And second between room temperature detection device 7, handles the direction position correction of component, keeps each component direction position
Unanimously；
King-tower rotating-table apparatus 1, is responsible for the transfer of component, such as component is transferred to the first room temperature from delivery device 2
Detection device 3, the first room temperature detection device 3 are transferred to low temperature detection device 4, are transferred to the second room temperature from high-temperature detection device 6
It detection device 7 and is transferred in subsequent process from the second room temperature detection device 7.
Referring to Fig. 4, delivery device 2 includes vibration feeder 21, component detection bar 23, Air Ionizer 24, gas
Dynamic feeding track 25 and high-speed separation mechanism 26, vibration feeder 21 have input terminal and an output end, vibration feeder 21 it is defeated
Enter end and be set as component storage disk 22, the output end of vibration feeder 21 is connected with the input terminal of pneumatic feed track 25, shakes
The electrostatic that the side of dynamic feed appliance 21 is equipped with the component detection bar 23 and elimination component electrostatic that detect the presence of to component disappears
Except fan 24, component detection bar 23 is detected when not having component on component storage disk 22, can be reminded and be fed, really
It protects complete machine and carries out continuous production.It distributed several blowing grooves in pneumatic feed track 25 diagonally forward, when component is from vibration feeding
After the push of device 21 enters in pneumatic feed track 25, component is pushed since the effect of air-flow is in half suspended state by air-flow
To the high-speed separation mechanism 26 of 25 output end of pneumatic feed track, the side of high-speed separation mechanism 26 is equipped with driving high-speed separation
The separation driving motor 27 that mechanism 26 separates component, the separation principle of high-speed separation mechanism 26 are separation driving motor
The eccentric wheel mechanism and link mechanism of 27 output end transmission connection, make pneumatic feed track 25 output end front end first member
Part is separated with pneumatic feed track 25, while link mechanism is equipped with barrier sheet, and barrier sheet can stop second element, work as bias
Barrier sheet, which lifts, when wheel stroke returns makes second element reach 25 output end front end of pneumatic feed track, when eccentric wheel leaves
When, then stop next element, it so recycles, realizes each element of separation.
Referring to Fig. 5, the first room temperature detection device 3 is similar with 7 structure of the second room temperature detection device, here with the first room temperature
It is illustrated for detection device 3.First room temperature detection device 3 includes that the first test bench attachment base 31, first tests seat supports
Plate 32, the first test bench 33, the first locating clip 34, first test pcb board 35 and the first p-wire connecting hole 36, the first test bench
The upper surface of attachment base 31 is connect by the first test attachment base support plate 32 with the first test bench 33,33 upper end of the first test bench
Face is fixed with the first test pcb board 35, and the first locating clip 34, the first test pcb board 35 1 are fixed on the first test pcb board 35
The end at end is also electrically connected with the first p-wire connecting hole 36, and the lower end of the first test bench attachment base 31 is equipped with the first Z axis tune
Whole plate 37, the lower end of the first Z axis adjustment plate 37 are equipped with the first X-axis adjustment plate 38, and the lower end of the first X-axis adjustment plate 38 is equipped with first
Y-axis adjustment plate 3, by the first Z axis adjustment plate 37, the first X-axis adjustment plate 38 and the first Y-axis adjustment plate 39 to the first test PCB
The fine tuning of the progress of plate 35 position.
Second room temperature detection device 7 includes the second test bench attachment base, the second test bench support plate, the second test bench, the
The upper surface of two locating clips, the second test pcb board and the second p-wire connecting hole, the second test bench attachment base passes through the second test
Attachment base support plate is connect with the second test bench, and the second test bench upper surface is fixed with the second test pcb board, the second test PCB
It is fixed with the second locating clip on plate, the end at the second test two end of pcb board is also electrically connected with the second p-wire connecting hole, and second
The lower end of test bench attachment base is equipped with the second Z axis adjustment plate, and the lower end of the second Z axis adjustment plate is equipped with the second X-axis adjustment plate, and second
The lower end of X-axis adjustment plate is equipped with the second Y-axis adjustment plate.
Fig. 6 and Fig. 7 are please referred to, 4 surrounding of low temperature detection device is coated with refrigeration thermal insulation board 44, and low temperature detection device 4 includes
The input terminal of low temperature feeding mechanism 41, refrigeration rail mechanism 42 and low temperature discharging mechanism 43, refrigeration rail mechanism 42 enters with low temperature
Expect the output end connection of mechanism 41, the output end of refrigeration rail mechanism 42 is connect with the input terminal of low temperature discharging mechanism 43, low temperature
Feeding mechanism 41 includes low temperature pan feeding detection sensor 411, low temperature feeding end boosting mechanism 412, low temperature pan feeding track 413, low
Warm pan feeding track cover board 414, low temperature pan feeding orbit altitude regulating mechanism 415 and low temperature pan feeding support plate 416, the support of low temperature pan feeding
Plate 416 is equipped with low temperature pan feeding orbit altitude regulating mechanism 415, and the upper surface of low temperature pan feeding track regulating mechanism 415 is fixed with
The input terminal of low temperature pan feeding track 414, low temperature pan feeding track 414 is equipped with low temperature pan feeding detection sensor 411 and low temperature feeding end
Boosting mechanism 412,412 upper end of low temperature pan feeding track are covered with low temperature pan feeding track cover board 414, and refrigeration rail mechanism 42 includes system
Cold track, refrigeration track cover board 421, refrigeration heat-conducting plate 422, refrigeration matchmaker's conduit 423, the internal thermal insulation board 424 of refrigeration and low temperature are surveyed
The output end of test-run a machine structure, low temperature pan feeding track 413 is connected to the input terminal of refrigeration track, and refrigeration track upper end is covered with refrigeration rail
Road cover board 421, the lower end for the track that freezes are fixed with refrigeration heat-conducting plate 422, are equipped at the heat-conducting plate 422 that freezes and refrigeration orbit connection
Refrigeration matchmaker conduit 423, be additionally provided with the internal thermal insulation board 424 of refrigeration at the track that freezes, low-temperature test mechanism includes low-temperature test electricity
The pneumatic stock stop 427 of road plate 425, low-temperature test pneumatic clamping mechanism 426, low-temperature test and low-temperature test position-limit mechanism 428,
The output end of refrigeration track is fixed with low-temperature test circuit board 425, low-temperature test circuit board by low-temperature test clamping plate 429
425 upper ends are equipped with low-temperature test pneumatic clamping mechanism 426, are equipped at low-temperature test hold-down mechanism 426 and state low-temperature test and pneumatically keep off
Material mechanism 427 and the low-temperature test position-limit mechanism 428 that 427 running track of the pneumatic stock stop of low-temperature test is limited,
Low temperature discharging mechanism 43 include low temperature discharging detection sensor 431 and low temperature discharging track 432, low temperature discharging track 432 it is defeated
Enter end to be connected to the output end for the track that freezes, the output end of low temperature discharging track 432 is equipped with low temperature discharging detection sensor 431.
Fig. 8 and Fig. 9 are please referred to, 6 surrounding of high-temperature detection device is coated with heat insulating plate 64, and high-temperature detection device 6 includes
High temperature feeding mechanism 61, heating track mechanism 62 and high temperature discharging mechanism 63, input terminal and the high temperature of heating track mechanism 62 enter
Expect the output end connection of mechanism 61, the output end of heating track mechanism 62 is connect with the input terminal of high temperature discharging mechanism 63, high temperature
Feeding mechanism 61 includes high temperature pan feeding detection sensor 611, high temperature feeding end boosting mechanism 612, high temperature pan feeding track 613, height
Warm pan feeding track cover board 614, high temperature pan feeding orbit altitude regulating mechanism 615 and high temperature pan feeding support plate 616, the support of high temperature pan feeding
Plate 616 is equipped with high temperature pan feeding orbit altitude regulating mechanism 615, and the upper surface of high temperature pan feeding track regulating mechanism 615 is fixed with
The input terminal of high temperature pan feeding track 614, high temperature pan feeding track 614 is equipped with high temperature pan feeding detection sensor 611 and high temperature feeding end
Boosting mechanism 612,612 upper end of high temperature pan feeding track are covered with high temperature pan feeding track cover board 614, and heating track mechanism 62 includes adding
Hot orbit, heating track cover board 621, heating heat-conducting plate 622, heating rod 623 and high temperature test mechanism, high temperature pan feeding track 613
Output end be connected to the input terminal of heating track, heating track upper end is covered with heating track cover board 621, under heating track
End is fixed with heating heat-conducting plate 622, heats and is equipped with the heating rod 623 that is connected to heating track at heat-conducting plate 622, additionally can be with
The temperature-sensing probe tested temperature is set in heating track, and high temperature test mechanism includes high temperature test circuit board 625, height
Temperature test pneumatic clamping mechanism 626, the pneumatic stock stop 627 of high temperature test and high temperature test position-limit mechanism 628, high temperature track
Output end is fixed with high temperature test circuit board 625 by high temperature test clamping plate 629, and 625 upper end of high temperature test circuit board is equipped with
High temperature test pneumatic clamping mechanism 626, be equipped at high temperature test hold-down mechanism 626 state the pneumatic stock stop 627 of high temperature test with
And to the high temperature test position-limit mechanism 628 that 627 running track of the pneumatic stock stop of high temperature test is limited, high temperature discharging mechanism
63 include high temperature discharging detection sensor 621 and high temperature discharging track 622, the input terminal of high temperature discharging track 622 and refrigeration rail
The output end in road is connected to, and the output end of high temperature discharging track 622 is equipped with high temperature discharging detection sensor 621.
Refrigeration track and heating track upper surface are both provided with several hole slots.Corresponding refrigeration track and heating track side
Equipped with several component boosting mechanisms, which includes boosting motor, boosting bar and boosting head, the output of boosting motor
Axis be sequentially connected boosting bar, boosting bar be equipped with the vertically disposed boosting head of boosting bar, boosting motor work when, drive helps
Push rod cup rotation, stirs component and moves ahead in orbit, and refrigeration track and heating track can be obliquely installed, and is convenient for component
Advance.
Transferring device 5 includes high speed handling device 51 and transfer thermally conductive 52, and high speed handling device 51 is used for component
It is transferred to from low temperature detection device 4 at transfer thermally conductive 52, component is transferred to high temperature side trial assembly again by transfer thermally conductive 52
It sets at 6.
Referring to Fig. 10, high speed handling device 51 includes motor mount 511, driving motor 512, link assembly 513, electricity
Magnetic adsorption device 514, electromagnet fixing piece 515, transhipment push rod 516, linear guide 517 and transhipment suction nozzle 518, motor mount
Driving motor 512 is installed, the output shaft of driving motor 512 is sequentially connected link assembly 513, sets on link assembly 513 on 511
There is linear guide 517, transhipment push rod 516 is slidably connected in linear guide 517, transhipment 516 upper end end of push rod is fixed with electricity
Magnet fixing member 515, transhipment 516 lower end of push rod are fixed with transhipment suction nozzle 518, are equipped with electricity above electromagnet fixing piece 515
Magnetic adsorption device 514, driving motor 512 drive link assembly 513 to move, and realize that transhipment suction nozzle 518 is moved closer to component
Or the process being gradually distance from, after transhipment suction nozzle 518 touches component and is adsorbed onto component, air-powered electromagnetic absorption dress
514 are set, electromagnetic adsorption electromagnet fixing piece 515 moves upwards, and completes the operation for picking up component.
Please refer to Figure 11, transfer thermally conductive 52 include transfer direct driving motor 521, transfer load plate 522, component guided mode 523,
Transfer vacuum distributor gear 524, transfer pan feeding detection sensor 525 and transfer discharging detection sensor 526, transfer direct driving motor
521 output shaft is sequentially connected transfer load plate 522, and circle distribution has several component guided modes 523, transfer on transfer load plate 522
Load plate 522 is equipped with transfer vacuum distributor gear 524, and transfer vacuum distributor gear 524 is connect with component guided mode 523, transfer
The side of load plate 522 is respectively equipped with transfer pan feeding detection sensor 525 and transfer discharging detection sensor 526, the inspection of transfer pan feeding
Survey the side that transfer discharging detection sensor 526 is arranged in sensor 525.Transfer direct driving motor 521 drives 522 turns of transfer load plate
Dynamic, transfer load plate 522 is equipped with component guided mode in multiple responsible 523. the present embodiment of component guided mode for loading component
523 are set as 16, and transfer vacuum distributor gear 524 is connected to by pipeline with each component guided mode 523, negative-pressure adsorption member device
Part is placed so that component consolidates in component guided mode 523.
Position correcting device 8 includes rotation correcting device 81 and positioning correcting device 82.
Figure 12 is please referred to, rotation correcting device 81 is arranged between delivery device 2 and the first room temperature detection device 3, Bao Xuan
Turn correction pedestal 811, component detection sensor 812 is corrected in rotation, turns to servo motor 813 and rotation correction seat 814, rotation
Turn to correct to be equipped on pedestal 811 and turn to servo motor 813, the output shaft for turning to servo motor 813 corrects pedestal through rotation
811 and be sequentially connected with rotation correct seat 814, rotation correct seat 814 side be equipped with rotation correct component detection sensor
812, the lower end that seat 811 is corrected in rotation is equipped with rotation and corrects Z axis adjustment plate 815, and the lower end that Z axis adjustment plate 815 is corrected in rotation is set
There is rotation to correct X-axis adjustment plate 816, the lower end that X-axis adjustment plate 816 is corrected in rotation is equipped with rotation and corrects Y-axis adjustment plate 817.Turn
It drives rotation to correct seat 814 to servo motor 813 to rotate, rotation corrects seat 814 and matches with component, and then to component
Direction position correction processing, is consistent each component direction position.
Figure 13 is please referred to, positioning correcting device 82 is arranged between high-temperature detection device 6 and the second room temperature detection device 7,
Pedestal 821 is corrected in packet positioning, component detection sensor 822 is corrected in positioning and seat 823 is corrected in positioning, and pedestal 821 is corrected in positioning
On be fixed with positioning correct seat 823, positioning correct seat 823 side be equipped with positioning correct component detection sensor 822, positioning
The lower end for correcting seat 821 is equipped with positioning and corrects Z axis adjustment plate 824, and the lower end that Z axis adjustment plate 824 is corrected in positioning is equipped with positioning and entangles
Positive X-axis adjustment plate 825, the lower end that X-axis adjustment plate 825 is corrected in positioning are equipped with positioning and correct Y-axis adjustment plate 826.Seat is corrected in positioning
823 for being micro-adjusted the position of component, corrects Z axis adjustment plate 824 by positioning, X-axis adjustment plate 825 is corrected in positioning
The fine tuning on 826 pairs of the Y-axis adjustment plate positioning correction progress of pedestals 821 positions is corrected with positioning.
It further include the braid packaging system 12 for carrying out braid encapsulation to component, the setting of braid packaging system 12 is the
After two room temperature detection devices, 7 process, successively set between braid packaging system 12 and the second room temperature detection device 7 by process sequence
There is five facial vision detection device 10 of three-dimensional and concentrates feeding-distribution device 11.
It is additionally provided between delivery device 2 and rotation correcting device 81 and video inspection is carried out to component for judging component
The component video detection device 9 in direction and position.
Figure 14 and Figure 15 are please referred to, king-tower rotating-table apparatus 1 is led including king-tower direct driving motor 101, king-tower load plate 102, vacuum
Gas bar 103, king-tower vacuum distributor gear 104, voice coil motor press mechanism 105 and suction nozzle 106, king-tower direct driving motor 101 it is defeated
Shaft is sequentially connected king-tower load plate 102, and circle distribution has several suction nozzles 106 on king-tower load plate 102, and king-tower load plate 522 is equipped with
Vacuum air-guide rod 103 and king-tower vacuum distributor gear 104, vacuum air-guide rod 103 are connected to king-tower vacuum distributor gear 104, main
Tower vacuum distributor gear 104 is connect with suction nozzle 106, and several voice coil motor press mechanisms 105 are equipped with above suction nozzle 106.Voice coil electricity
Machine press mechanism 105 pushes suction nozzle 106, and the suction nozzle 106 for being is in contact with component, and king-tower vacuum distributor gear 104 then passes through
Pipeline is connected to each suction nozzle 106, and perhaps negative-pressure adsorption component or just is realized in ventilation by the pumping of vacuum air-guide rod 103
Pressure, which is blown away, uninstalls component.
Figure 16 and Figure 17 are please referred to, the workflow of the all-in-one machine are as follows:
S1) element device is placed on the component storage disk 22 of delivery device 2, vibrating feeder 21 carries out vibration and send
Material, and auto-sequencing separation is carried out from pneumatic feed track 25, it is delivered to 106 operating position of suction nozzle of king-tower rotating-table apparatus 1
Lower section；
S2 component) is extracted by the suction nozzle 106 of king-tower rotating-table apparatus 1, is sent to component video detection device 9, is led to
It crosses CCD high-speed industrial camera and video inspection is carried out to component, judge direction and position of the device on suction nozzle 106, be rear work
Data are collected in sequence processing, and whether component item detection device 9 is to deviate too big for detecting component, are abandoned if too big
The component, and for being non-symmetrical component direction polarity judgement to shape, but be nothing for the element of symmetrical shape
Method judges its direction polarity, it is possible that also need to use special polarity test device, its electrical judgment component direction pole of institute
Property, suction nozzle 106 drives component to be sent to polarity test device, and polarity test device carries out pole to the component on suction nozzle 106
Property test judgement, determine its direction on suction nozzle 106, recording information data；
S3) suction nozzle 106, which continues thereafter with, drives component to be sent to rotation correcting device 81, rotates correcting device 81 before
The information data that process is collected into handles the direction position correction of component, makes each device direction position on suction nozzle 106
Unanimously；
S4 after the completion of) correcting, suction nozzle 106 continues that component is driven to be sent to the first room temperature detection device 3, the inspection of the first room temperature
Device 3 is surveyed according to the test request of component product, electrical parameter is tested and collects recording information data；
S5) suction nozzle 106 continues the input terminal for driving component to be sent to low temperature detection device 4, low temperature pan feeding detection sensing
Device 411 detects after component that by pan feeding blow gun, pan feeding suction nozzle is single in low temperature detection device 4 and high-temperature detection device 4
Solely setting, airflow direction be it is horizontal, by the air-flow of blowout make component enter refrigeration track or heating track in,
106 negative-pressure adsorption component of suction nozzle, when accessing positive pressure only release component, airflow direction be it is vertical, blown by pan feeding
The air-flow of mouth separates component from suction nozzle 106, and into refrigeration track (0 DEG C~-50 DEG C), component is in refrigeration track
Sufficiently it is thermally conductive after, electrical testing is carried out in low temperature environment, and collect recording information data, after the completion of test, component is through helping
Pushing mechanism is sent to the output end of low temperature detection device 4；
S6 after) the low temperature discharging detection sensor 431 of low temperature detection device 4 detects component, high speed handling device 51
Component is transferred in transfer thermally conductive 52 component guided mode 523, component is transported to out by transfer thermally conductive 52 rotation
At material detection transfer discharging detection sensor 526, another group of high speed handling device 51 again therefrom transduces component the member of thermal station 2
The input terminal of supreme temperature detection device 6 is transferred in device guided mode 523；
S7 after) the high temperature pan feeding detection sensor 611 of 6 input terminal of high-temperature detection device detects component, by pan feeding
Blow gun, by component be sent into heating track in (80 DEG C~150 DEG C), component in heating track sufficiently it is thermally conductive after, in high temperature
Electrical testing is carried out in environment, and collects recording information data, and after the completion of test, component send supreme temperature detector to survey through boosting mechanism
The output end of device 6；
S8 after) the high temperature discharging detection sensor 631 of 6 output end of high-temperature detection device detects component, by king-tower
The suction nozzle 106 of rotating-table apparatus 1 extracts component, is sent to positioning correcting device 82, position of the positioning correcting device 82 to component
Correction processing is set, each device on suction nozzle 106 is made to correct position consistency；
S9) suction nozzle 106 drives component to be sent to the second room temperature detection device 7, and the second room temperature detection device 7 is according to device
The test request of product tests electrical parameter and collects recording information data；
S10) suction nozzle 106 drives component to be sent to the five facial vision detection device 10 of three-dimensional for appearance detection, passes through
The appearance that CCD high-speed industrial camera carries out five faces to the device adsorbed on suction nozzle 106 detects, recording information data；
S11) suction nozzle 106 continues that component is driven to be sent to concentration feeding-distribution device 11, and concentrating feeding-distribution device 11 is system root
The electrical parameter and visual appearance detection information being collected into according to processes such as the test of front room temperature, low-temperature test, high temperature tests,
Component on suction nozzle 106 is carried out to concentrate stepping classification processing；
S12) for some kinds of component, suction nozzle 106 also will drive component and be sent to braid packaging system 12, inhale
Component is put into braid carrier band by mouth 106, after encapsulated vision-based detection, packaging by hot pressing is carried out together with lid band, according to certain
Quantity carry out reel to collect being finished product output, be also provided with corresponding clear material recyclable device, it is clear to expect that recyclable device function is to work as
When the shutdown of equipment midway or device reset, the device of institute's band on capstan head suction nozzle is subjected to clearing and retrieving and avoids mixing.
In conclusion the present invention has the advantages that by rational deployment, machinery equipment is divided into device and launches region, often
Warm test zone, low-temperature test region, transfer thermal conductivity region, high temperature test region, appearance detection zone, braid and specification area
Deng making semiconductor electronic component on the same device, pick and place transfer techniques by mechanical high speed, realize room temperature electrical property
The production processes such as test, low temperature electrical testing, high temperature electrical testing, appearance detection, sorting classification, braid encapsulation, script is needed
It wants a variety of independent room temperature, low temperature, high temperature test screening installation completely to integrate on one device, realizes it to electronics member device
Part carry out various temperature ambient condition under electric performance test, result can satisfy semiconductor electronic component often, low and high temperature degree
The packaging technology requirement that electrical property is estimated under environment, saves place space, reduces product handling time, saved cost, mentioned
High working efficiency.
As known by the technical knowledge, the present invention can pass through the embodiment party of other essence without departing from its spirit or essential feature
Case is realized.Therefore, embodiment disclosed above, in all respects are merely illustrative, not the only.Institute
Have within the scope of the present invention or is included in the invention in the change being equal in the scope of the present invention.
Claims (9)
1. a kind of the high and low temperature test integrated machine for sorting, it is characterised in that: include:
Delivery device (2) carries out the conveying of component, and carries out separation sequence to the component；
First room temperature detection device (3) receives the component after the delivery device (2) separation sequence, provides room temperature inspection
The environment of survey, the first time room temperature electric parameter detecting before low-temperature test is carried out to component, and record the first time room temperature
The information data of electric parameter detecting；
Low temperature detection device (4) receives the component for coming from the first room temperature monitoring device (3), provides the ring of low temperature detection
Border carries out low temperature electric parameter detecting to component, and records the information data of the low temperature electric parameter detecting；
Transferring device (5) receives the component for coming from the low temperature detection device (4), component and room temperature under low-temperature condition
Air carries out temperature conduction, and component heat absorption is gradually restored to room temperature, then component is transferred to next procedure；
High-temperature detection device (6) receives the component for coming from the transferring device (5), the environment of high temperature detection is provided, to first device
Part carries out high temperature electric parameter detecting, and records the information data of the high temperature electric parameter detecting；
Second room temperature detection device (7) receives the component for coming from the high-temperature detection device (6), provides the ring of room temperature detection
Border, second of room temperature electric parameter detecting after high temperature test is carried out to component, and record second of the room temperature and electrically join
The information data of number test；
Position correcting device (8), is arranged between delivery device (2) and the first room temperature detection device (3) and high temperature detection fills
It sets between (6) and the second room temperature detection device (7), the direction position correction of component is handled, each component is made
Direction position is consistent.
2. a kind of the high and low temperature test integrated machine for sorting according to claim 1, it is characterised in that: the delivery device (2)
Including vibration feeder (21), component detection bar (23), Air Ionizer (24), pneumatic feed track (25) and high speed point
It disembarks structure (26), the vibration feeder (21) has input terminal and output end, and the input terminal of vibration feeder (21) is set as
Component stores disk (22), and the output end of vibration feeder (21) is connected with the input terminal of the pneumatic feed track (25), shakes
The side of dynamic feed appliance (21) is equipped with the component detection bar (23) detected to component and elimination component electrostatic
Air Ionizer (24), the output end of pneumatic feed track (25) is equipped with the high-speed separation mechanism (26), high-speed separation
The side of mechanism (26) is equipped with the separation driving motor (27) that driving high-speed separation mechanism (26) separates component.
3. a kind of the high and low temperature test integrated machine for sorting according to claim 2, it is characterised in that: the first room temperature detection
Device (3) includes the first test bench attachment base (31), the first test bench support plate (32), the first test bench (33), the first positioning
Press from both sides (34), the first test pcb board (35) and the first p-wire connecting hole (36), the upper end of the first test bench attachment base (31)
Face is connect by first test attachment base support plate (32) with first test bench (33), the first test bench (33) upper end
Face is fixed with first test pcb board (35), is fixed with first locating clip (34) in the first test pcb board (35), the
The end of one test pcb board (35) one end is also electrically connected with the first p-wire connecting hole (36), the connection of the first test bench
The lower end of seat (31) is equipped with the first Z axis adjustment plate (37), and the lower end of the first Z axis adjustment plate (37) is adjusted equipped with the first X-axis
The lower end of plate (38), the first X-axis adjustment plate (38) is equipped with the first Y-axis adjustment plate (39)；
The second room temperature detection device (7) include the second test bench attachment base, the second test bench support plate, the second test bench,
Second locating clip, the second test pcb board and the second p-wire connecting hole, the upper surface of the second test bench attachment base pass through institute
It states the second test attachment base support plate to connect with second test bench, the second test bench upper surface is fixed with second test
Pcb board is fixed with second locating clip on the second test pcb board, and the end at the second test two end of pcb board is also electrically connected with
The second p-wire connecting hole, the lower end of the second test bench attachment base are equipped with the second Z axis adjustment plate, the second Z axis adjustment
The lower end of plate is equipped with the second X-axis adjustment plate, and the lower end of the second X-axis adjustment plate is equipped with the second Y-axis adjustment plate.
4. a kind of the high and low temperature test integrated machine for sorting according to claim 3, it is characterised in that: the low temperature detection device
(4) surrounding is coated with refrigeration thermal insulation board (44), and low temperature detection device (4) includes low temperature feeding mechanism (41), refrigeration rail mechanism
(42) and low temperature discharging mechanism (43), the input terminal of refrigeration rail mechanism (42) and the low temperature feeding mechanism (41) is defeated
Outlet connection, the output end of refrigeration rail mechanism (42) are connect with the input terminal of the low temperature discharging mechanism (43), low temperature pan feeding
Mechanism (41) includes low temperature pan feeding detection sensor (411), low temperature feeding end boosting mechanism (412), low temperature pan feeding track
(413), low temperature pan feeding track cover board (414), low temperature pan feeding orbit altitude regulating mechanism (415) and low temperature pan feeding support plate
(416), the low temperature pan feeding support plate (416) is equipped with the low temperature pan feeding orbit altitude regulating mechanism (415), low temperature pan feeding
The upper surface of track regulating mechanism (415) is fixed with the low temperature pan feeding track (414), the input of low temperature pan feeding track (414)
End is equipped with the low temperature pan feeding detection sensor (411) and the low temperature feeding end boosting mechanism (412), low temperature pan feeding track
(412) upper end is covered with the low temperature pan feeding track cover board (414), and refrigeration rail mechanism (42) includes refrigeration track, refrigeration rail
Road cover board (421), refrigeration heat-conducting plate (422), refrigeration matchmaker's conduit (423) and low-temperature test mechanism, low temperature pan feeding track (413)
Output end is connected to the input terminal of the refrigeration track, and refrigeration track upper end is covered with the refrigeration track cover board (421), is freezed
The lower end of track is fixed with the refrigeration heat-conducting plate (422), is equipped with and freezes described in orbit connection at refrigeration heat-conducting plate (422)
Freeze matchmaker's conduit (423), the low-temperature test mechanism includes low-temperature test circuit board (425), low-temperature test pneumatic clamping mechanism
(426), the pneumatic stock stop of low-temperature test (427) and low-temperature test position-limit mechanism (428), the output end for the track that freezes pass through low
Temperature test clamping plate (429) is fixed with the low-temperature test circuit board (425), and low-temperature test circuit board (425) upper end is equipped with institute
It states low-temperature test pneumatic clamping mechanism (426), is equipped at low-temperature test hold-down mechanism (426) and states the pneumatic stock stop of low-temperature test
(427) and to the pneumatic stock stop of low-temperature test (427) running track the low-temperature test position-limit mechanism limited
(428), low temperature discharging mechanism (43) includes low temperature discharging detection sensor (431) and low temperature discharging track (432), the low temperature
The input terminal of discharging track (432) is connected to the output end of refrigeration track, and the output end of low temperature discharging track (432) is equipped with described
Low temperature discharges detection sensor (431)；
High-temperature detection device (6) surrounding is coated with heat insulating plate (64), and high-temperature detection device (6) includes high temperature pan feeding machine
Structure (61), heating track mechanism (62) and high temperature discharging mechanism (63), the input terminal of the heating track mechanism (62) with it is described
The output end of high temperature feeding mechanism (61) connects, the output end of heating track mechanism (62) and the high temperature discharging mechanism (63)
Input terminal connection, high temperature feeding mechanism (61) includes high temperature pan feeding detection sensor (611), high temperature feeding end boosting mechanism
(612), high temperature pan feeding track (613), high temperature pan feeding track cover board (614), high temperature pan feeding orbit altitude regulating mechanism (615) and
High temperature pan feeding support plate (616), the high temperature pan feeding support plate (616) are equipped with the high temperature pan feeding orbit altitude regulating mechanism
(615), the upper surface of high temperature pan feeding track regulating mechanism (615) is fixed with the high temperature pan feeding track (614), high temperature pan feeding rail
The input terminal in road (614) is equipped with the high temperature pan feeding detection sensor (611) and the high temperature feeding end boosting mechanism (612),
High temperature pan feeding track (612) upper end is covered with the high temperature pan feeding track cover board (614), and heating track mechanism (62) includes heating
Track, heating heat-conducting plate (622), heating rod (623), heats internal thermal insulation board (424) and high temperature at heating track cover board (621)
The output end of mechanism for testing, high temperature pan feeding track (613) is connected to the input terminal of the heating track, the covering of heating track upper end
There is the heating track cover board (621), the lower end of heating track is fixed with the heating heat-conducting plate (622), heats heat-conducting plate
(622) it is equipped with the heating rod (623) being connected to heating track at, thermal insulation board inside the heating is additionally provided at heating track
(624), the high temperature test mechanism includes high temperature test circuit board (625), high temperature test pneumatic clamping mechanism (626), high temperature
Pneumatic stock stop (627) and high temperature test position-limit mechanism (628) are tested, the output end of high temperature track is clamped by high temperature test
Plate (629) is fixed with the high temperature test circuit board (625), and high temperature test circuit board (625) upper end is equipped with the high temperature test
Pneumatic clamping mechanism (626), be equipped at high temperature test hold-down mechanism (626) state the pneumatic stock stop of high temperature test (627) and
To the high temperature test position-limit mechanism (628) that the pneumatic stock stop of high temperature test (627) running track is limited, high temperature goes out
Expect that mechanism (63) include high temperature discharging detection sensor (621) and high temperature discharging track (622), the high temperature discharging track
(622) input terminal is connected to the output end of refrigeration track, and the output end of high temperature discharging track (622) is equipped with the high temperature discharging
Detection sensor (621).
5. a kind of the high and low temperature test integrated machine for sorting according to claim 4, it is characterised in that: the transferring device (5)
Including high speed handling device (51) and transfer thermally conductive (52), the high speed handling device (51) is used to examine component from low temperature
It is transferred at the transfer thermally conductive (52) at survey device (4) and thermal station (52) that component is therefrom transduceed is transferred to high temperature test
At device (6)；
High speed handling device (51) includes motor mount (511), driving motor (512), link assembly (513), electromagnetic adsorption
Device (514), electromagnet fixing piece (515), transhipment push rod (516), linear guide (517) and transhipment suction nozzle (518), the electricity
It is equipped in machine mounting base (511) driving motor (512), the output shaft transmission connection connecting rod of driving motor (512)
Component (513), link assembly (513) are equipped with the linear guide (517), slidably connect in linear guide (517) described
It transports push rod (516), transhipment push rod (516) the upper end end is fixed with the electromagnet fixing piece (515), transports push rod
(516) lower end is fixed with the transhipment suction nozzle (518), is equipped with the electromagnetic adsorption above electromagnet fixing piece (515) and fills
Set (514)；
Transfer thermally conductive (52) includes that transfer direct driving motor (521), transfer load plate (522), component guided mode (523), transfer are true
Space division fitting mechanism (524), transfer pan feeding detection sensor (525) and transfer discharging detection sensor (526), the transfer are directly driven
The output shaft of motor (521) is sequentially connected the transfer load plate (522), and circle distribution has several described on transfer load plate (522)
Component guided mode (523), transfer load plate (522) are equipped with the transfer vacuum distributor gear (524), transfer vacuum distributor gear
(524) it is connect with component guided mode (523), the side of transfer load plate (522) is respectively equipped with the transfer pan feeding detection sensor
(525) it is detected with transfer discharging detection sensor (526), transfer pan feeding detection sensor (525) setting in transfer discharging
The side of sensor (526).
6. a kind of the high and low temperature test integrated machine for sorting according to claim 5, it is characterised in that: the position correcting device
It (8) include rotation correcting device (81) and positioning correcting device (82)；
The rotation correcting device (81) is arranged between delivery device (2) and the first room temperature detection device (3), and packet rotation is corrected
Pedestal (811), rotation correct component detection sensor (812), turn to servo motor (813) and rotation correction seat (814), institute
It states and the steering servo motor (813) is installed in rotation correction pedestal (811), the output shaft for turning to servo motor (813) passes through
It wears rotation to correct pedestal (811) and be sequentially connected with rotation correction seat (814), the side that seat (814) are corrected in rotation is equipped with
Component detection sensor (812) are corrected in the rotation, and the lower end that seat (811) are corrected in rotation is equipped with rotation and corrects Z axis adjustment plate
(815), the lower end that Z axis adjustment plate (815) are corrected in the rotation is equipped with rotation and corrects X-axis adjustment plate (816), and the rotation is corrected
The lower end of X-axis adjustment plate (816) is equipped with rotation and corrects Y-axis adjustment plate (817)；
The positioning correcting device (82) is arranged between high-temperature detection device (6) and the second room temperature detection device (7), Bao Dingwei
It corrects pedestal (821), positioning correction component detection sensor (822) and positioning and corrects seat (823), pedestal is corrected in the positioning
(821) it is fixed with the positioning on and corrects seat (823), the side that seat (823) are corrected in positioning is equipped with the positioning and corrects component
Detection sensor (822), the lower end that seat (821) are corrected in positioning are equipped with positioning and correct Z axis adjustment plate (824), and Z is corrected in the positioning
The lower end of axial adjustment plate (824) is equipped with positioning and corrects X-axis adjustment plate (825), and the positioning is corrected under X-axis adjustment plate (825)
End is equipped with positioning and corrects Y-axis adjustment plate (826).
7. a kind of the high and low temperature test integrated machine for sorting according to claim 6, it is characterised in that: further include for first device
Part carries out the braid packaging system (12) of braid encapsulation, and the braid packaging system (12) is arranged in the second room temperature detection device
(7) after process, three-dimensional five is successively arranged by process sequence between braid packaging system (12) and the second room temperature detection device (7)
Facial vision detection device (10) and concentration feeding-distribution device (11).
8. a kind of the high and low temperature test integrated machine for sorting according to claim 7, it is characterised in that: the delivery device (2)
It is additionally provided between the rotation correcting device (81) and video inspection is carried out to component for judging component direction and position
Component video detection device (9).
9. a kind of the high and low temperature test integrated machine for sorting according to claim 8, it is characterised in that: further include for first device
The king-tower rotating-table apparatus (1) that part is shifted, the king-tower rotating-table apparatus (1) include king-tower direct driving motor (101), king-tower load plate
(102), vacuum air-guide rod (103), king-tower vacuum distributor gear (104), voice coil motor press mechanism (105) and suction nozzle (106),
The output shaft of the king-tower direct driving motor (101) is sequentially connected the king-tower load plate (102), circumference point on king-tower load plate (102)
Several suction nozzles (106) are furnished with, king-tower load plate (522) is equipped with the vacuum air-guide rod (103) and the king-tower vacuum point
Fitting mechanism (104), vacuum air-guide rod (103) are connected to king-tower vacuum distributor gear (104), king-tower vacuum distributor gear (104)
It is connect with suction nozzle (106), several voice coil motor press mechanisms (105) is equipped with above suction nozzle (106).
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910723891.6A CN110328161A (en) | 2019-08-07 | 2019-08-07 | A kind of the high and low temperature test integrated machine for sorting |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910723891.6A CN110328161A (en) | 2019-08-07 | 2019-08-07 | A kind of the high and low temperature test integrated machine for sorting |
Publications (1)
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| CN110328161A true CN110328161A (en) | 2019-10-15 |
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|---|---|---|---|
| CN201910723891.6A Pending CN110328161A (en) | 2019-08-07 | 2019-08-07 | A kind of the high and low temperature test integrated machine for sorting |
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| CN111751713A (en) * | 2020-08-12 | 2020-10-09 | 深圳市诺泰芯装备有限公司 | Chip high-temperature testing device and method |
| CN113182198A (en) * | 2020-01-14 | 2021-07-30 | 鸿劲精密股份有限公司 | Testing device with temperature control unit and testing classification equipment applied by same |
| CN114152856A (en) * | 2021-12-01 | 2022-03-08 | 长电科技（滁州）有限公司 | High-low temperature test system and method for semiconductor device |
| CN114273268A (en) * | 2021-12-29 | 2022-04-05 | 中国振华(集团)新云电子元器件有限责任公司(国营第四三二六厂) | Test apparatus and method |
| CN116413581A (en) * | 2023-03-22 | 2023-07-11 | 南京宏泰半导体科技股份有限公司 | High-performance test system and method for high-temperature products |
| CN117347814A (en) * | 2023-11-22 | 2024-01-05 | 广东歌得智能装备有限公司 | High-temperature test structure of semiconductor device and gravity type normal temperature and high temperature tester |
| CN117388660A (en) * | 2023-10-23 | 2024-01-12 | 江苏盟星智能科技有限公司 | Multi-station detection device capable of marking defective products |
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| CN117347814A (en) * | 2023-11-22 | 2024-01-05 | 广东歌得智能装备有限公司 | High-temperature test structure of semiconductor device and gravity type normal temperature and high temperature tester |
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