CN107534071A - 受光发光元件模块以及传感器装置 - Google Patents

受光发光元件模块以及传感器装置 Download PDF

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CN107534071A
CN107534071A CN201680024021.4A CN201680024021A CN107534071A CN 107534071 A CN107534071 A CN 107534071A CN 201680024021 A CN201680024021 A CN 201680024021A CN 107534071 A CN107534071 A CN 107534071A
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藤本直树
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Abstract

本发明提供受光发光元件模块以及传感器装置。本发明的一实施方式所涉及的受光发光元件模块(1)具备:配线基板(2);配置于配线基板(2)上的发光元件(3)以及受光元件(4);透镜构件(5),其具有对从发光元件(3)以及受光元件(4)分离而位于上方的透镜部(9)进行支承的支承部(10)、以及配设于支承部(10)的下表面且前端与配线基板(2)的上表面相接的支柱(11)。

Description

受光发光元件模块以及传感器装置
技术领域
本发明涉及受光发光元件模块以及传感器装置。
背景技术
以往,提出有如下所述的传感器装置:从发光元件向被照射物照射光,利用受光元件对来自被照射物的反射光进行受光,由此对被照射物的特性进行检测。
例如,在日本特开2006-203111号公报中,提出有如下所述的传感器装置:在基板上安装有受光元件以及发光元件,在该受光元件以及发光元件的上方配置有透镜。
发明内容
本发明的一实施方式所涉及的受光发光元件模块具备:配线基板;发光元件以及受光元件,它们配设于所述配线基板上;以及透镜构件,其具有支承部和支柱,所述支承部对从所述发光元件以及所述受光元件分离而位于上方的透镜部进行支承,所述支柱配设于所述支承部的下表面且前端与所述配线基板的上表面相接。
本发明的一实施方式所涉及的传感器装置具备:上述的受光发光元件模块;以及控制用电路,其与所述受光发光元件模块电连接,且对所述受光发光元件模块进行控制,从所述发光元件向被照射物照射光,根据与从该被照射物反射的反射光对应地输出的来自所述受光元件的输出值检测所述被照射物。
附图说明
图1的(a)是示出本发明的一实施方式所涉及的受光发光元件模块的概要剖视图。图1的(b)是示出本发明的一实施方式所涉及的受光发光元件模块的概要俯视图。需要说明的是,图1的(a)的剖视图是沿着图1的(b)所示的单点划线而将受光发光元件模块剖开时的剖视图。
图2的(a)是构成图1所示的受光发光元件模块的发光元件的剖视图。图2的(b)是构成图1所示的受光发光元件模块的受光元件的剖视图。
图3是按照构成要素将本发明的一实施方式所涉及的受光发光元件模块分解的立体图。
图4是示意性地示出本发明的一实施方式所涉及的传感器装置的剖视图。
具体实施方式
(受光发光元件模块)
以下,参照附图对本发明的受光发光元件模块的实施方式的一例进行说明。需要说明的是,本发明并不局限于以下的实施方式。
另外,在本发明的受光发光元件模块中,任意的方向均可以被用作为上方或者下方,但在本说明书中,为了便于理解,定义正交坐标系(X,Y,Z),并且将Z轴方向的正侧作为上方,使用上表面或者下表面等用语。
如图1所示,受光发光元件模块1具有配线基板2、配设于配线基板2上的发光元件3以及受光元件4。在受光发光元件模块1中,能够从发光元件3向被照射物照射光,并且利用受光元件4对从被照射物反射的反射光进行受光。其结果是,受光发光元件模块1能够检测被照射物的表面状态等。
受光发光元件模块1例如能够搭载于复印机或者打印机等图像形成装置,并对调色剂、介质等被照射物的位置信息、距离信息或者浓度信息等进行检测。另外,受光发光元件模块1例如也可以搭载于机床等,并对被工作物的表面状态进行检测。需要说明的是,受光发光元件模块1并不局限于上述的例子,考虑向各种装置的搭载。
受光发光元件模块1还具有透镜构件5。透镜构件5能够对来自发光元件3的光进行聚光而向被照射物引导。另外,透镜构件5能够对从被照射物反射的反射光进行聚光而向受光元件4引导。另外,受光发光元件模块1还具有遮光体6。遮光体6能够减少预料外的光(杂光)被受光元件4受光的情况。
配线基板2能够安装发光元件3以及受光元件4且对发光元件3以及受光元件4进行支承。而且,配线基板2与外部装置电连接,例如对发光元件3以及受光元件4施加偏电压。
配线基板2例如只要是矩形等形状即可。配线基板2例如能够使用树脂基板或者陶瓷基板等。本公开的配线基板2为树脂基板。需要说明的是,在本说明书中,树脂基板是指配线基板2中的绝缘材料由树脂材料构成的基板。另外,陶瓷基板是指配线基板2中的绝缘材料由陶瓷材料构成的基板。需要说明的是,配线基板2可以通过以往公知的工法来形成。
本公开的发光元件3以及受光元件4具有相同的半导体基板7。换言之,以一个半导体基板7为基础而形成发光元件3以及受光元件4。其结果是,能够使发光元件3以及受光元件4接近地配置,从而能够提高受光发光元件模块1的检测性能。
需要说明的是,本公开的发光元件3以及受光元件4经由一个半导体基板7而一体地安装于配线基板2。另外,本公开的受光发光元件模块1具备一个发光元件3和一个受光元件4,但也可以具备多个发光元件3以及多个受光元件4。
半导体基板7具有一导电型的半导体材料。本公开的半导体基板7由一导电型的半导体材料构成。本公开的半导体基板7例如使用n型的Si(硅)基板。即,半导体基板7通过向Si基板掺杂n型的杂质而形成。相对于Si基板的n型的杂质例如使用P(磷)、N(氮)、As(砷)、Sb(锑)或者Bi(铋)等即可。需要说明的是,在本说明书中,将一导电型设为n型并将逆导电型设为p型。
如图2的(a)所示,发光元件3通过在半导体基板7的上表面层叠多个半导体层8而形成。多个半导体层8例如能够借助MOCVD(Metal-organic Chemical Vapor Deposition)装置使半导体基板7外延成长而形成。
多个半导体层8具有层叠于半导体基板7的上表面的缓冲层81。缓冲层81能够对在半导体基板7与多个半导体层8之间的界面的晶格常数之差进行缓冲。缓冲层81例如由GaAs(镓化砷)形成即可。
多个半导体层8具有层叠于缓冲层81的上表面的n型接触层82。n型接触层82在上表面形成有发光元件3的阴极电极。而且,n型接触层82能够减小与电极接触的接触电阻。n型接触层82例如能够向GaAs掺杂n型的杂质而形成。作为相对于GaAs的n型的杂质,例如使用Si或者Se(硒)等即可。
多个半导体层8具有层叠于n型接触层82的上表面的n型包覆层83。n型包覆层83能够向后面说明的活性层84封入空穴。n型包覆层83例如能够向AlGaAs(铝镓化砷)掺杂n型的杂质而形成。相对于AlGaAs的n型的杂质例如使用Si或者Se等即可。
多个半导体层8具有层叠于n型包覆层83的上表面的活性层84。活性层84能够使电子、空穴等载流子集中而通过复合来发光。即,活性层84能够作为发光层而发挥功能。活性层84例如由AlGaAs形成即可。
多个半导体层8具有层叠于活性层84的上表面的p型包覆层85。p型包覆层85能够向活性层84封入电子。p型包覆层84例如能够向AlGaAs掺杂p型的杂质而形成。相对于AlGaAs的p型的杂质例如使用Zn(锌)、Mg(镁)或者C(碳)等即可。
多个半导体层8具有层叠于p型包覆层85的上表面的p型接触层86。p型接触层86在上表面形成有发光元件3的阳极电极。而且,p型接触层86能够减小与电极接触的接触电阻。p型接触层86例如能够向AlGaAs掺杂p型的杂质而形成。需要说明的是,p型接触层86为了减小与电极接触的接触电阻而设定为载流子密度比p型包覆层85高即可。
如图2的(b)所示,在半导体基板7的上表面设置p型半导体区域41。其结果是,在n型的半导体基板7与p型半导体区域41之间的界面形成pn结,由此能够形成受光元件4。p型半导体区域41通过向半导体基板7掺杂p型的杂质而形成。本公开的半导体基板7为Si基板,因此作为p型的杂质,例如可举出Zn、Mg、C、B(硼)、In(铟)或者Se等。
透镜构件5具有透镜部9、支承部10以及支柱11。透镜部9是供光通过的部分,能够作为透镜而发挥功能。支承部10能够支承透镜部9。支柱11设于支承部10的下表面且能够对支承部10进行支承。
透镜构件5例如由透光性的材料形成即可。透镜构件5例如由硅酮树脂、聚氨酯树脂以及环氧基树脂等热固化性树脂、或者聚碳酸酯树脂以及丙烯酸树脂等热可塑性树脂等的塑料、或者蓝宝石以及无机玻璃等形成即可。透镜构件5例如通过注塑形成等而形成即可。需要说明的是,在透镜构件5中,仅透镜部9具有透光性即可,支承部10以及支柱11也可以不具有透光性。
透镜部9能够对发光元件3的射出光以及从被对象物反射的反射光进行聚光并进行引导。透镜部9具有对发光元件3的射出光进行聚光的第一透镜12和对从被对象物反射的反射光进行聚光的第二透镜13。本公开的第一透镜12以及第二透镜13分别是例如凸透镜、球面透镜或者非球面透镜等。
支承部10具有保持透镜部9的功能。支承部10例如是板状即可。支承部10可以通过与透镜部9一体形成而保持透镜部9,也可以通过向支承部10嵌入透镜部9的第一透镜12以及第二透镜13而保持透镜部9。需要说明的是,“一体”是指透镜部9与支承部10无接缝地连续。即,此时,透镜部9以及支承部10由相同的材料且通过一个工序同时形成。
支柱11对透镜部9以及支承部10进行支承,进而能够支承透镜构件5。透镜构件5的透镜部9以及支承部10从发光元件3以及受光元件4分离而位于上方。而且,支柱11设于支承部10的下表面,支柱11的前端与配线基板2的上表面相接。即,通过使支柱11与配线基板2抵接来配置透镜构件5。其结果是,通过使支柱11的长度恒定,能够将透镜部9与发光元件3以及受光元件4之间的距离设定为适当的距离。因此,能够减小透镜部9与发光元件3以及受光元件4在上下方向(Z轴方向)上的位置偏移,能够提高受光发光元件模块1的检测性能。
另外,利用柱状的构件即支柱11来进行透镜构件5的上下方向的定位。其结果是,与利用例如框状的构件等来进行上下方向的定位的情况相比,由于与配线基板2接触的面积小,因此能够减小配线基板2的上表面的形状的影响。因此,能够更有效地减小上下方向的位置偏移。需要说明的是,本实施方式的支柱11例如形成为圆柱状即可。
支柱11的前端面也可以为凸曲面。其结果是,由于能够使支柱11与配线基板2的接触接近于点接触,因此能够有效地减小配线基板2的上表面的形状的影响。因此,能够更有效地减小上下方向的位置偏移。另外,通过将前端面设为曲面,与前端尖锐的情况相比,能够减少支柱11的前端的碎片的产生。
第一透镜12、第二透镜13、支承部10以及支柱11也可以一体形成。即,构成透镜构件5的构件也可以一体形成。另外,换言之,第一透镜12、第二透镜13、支承部10以及支柱11也可以在各构成构件的接触位置处无边界而使各构成构件连续。其结果是,与例如在分别制作透镜构件5的各构成构件之后将这些构成构件粘结而形成透镜构件5的情况相比,能够减小各构成构件的位置关系的偏差。
透镜构件5具有多个支柱11,并且也可以是以隔着发光元件3以及受光元件4的方式配置。其结果是,能够利用支柱11来控制发光元件3与透镜部9的高度、以及受光元件4与透镜部9的高度。需要说明的是,在本实施方式中,多个支柱11也可以配设于矩形的配线基板2的对角线上。
另外,由于本公开的发光元件3以及受光元件4形成于一个半导体基板7上,因此与将发光元件3以及受光元件4分别安装于配线基板2的情况相比,能够减小发光元件3与受光元件4的位置关系的偏差。
遮光体6配设于透镜构件5与配线基板2之间,且以包围发光元件3以及受光元件4的方式配置。其结果是,遮光体6如上所述能够减少杂光被受光元件4受光的情况。
遮光体6例如由聚丙烯树脂(PP)、聚苯乙烯树脂(PS)、聚氯乙烯树脂(PVC)、聚对苯二甲酸乙二醇酯树脂(PET)、丙烯腈-丁二烯-苯乙烯树脂(ABS)等通用塑料、聚酰胺树脂(PA)、聚碳酸酯树脂(PC)等工程塑料、液晶聚合物等高级工程塑料、以及铝(A1)、钛(Ti)等金属材料等形成即可。遮光体6例如能够通过注塑形成等而形成。
遮光体6具有壁部14和盖部15。壁部14为包围发光元件3以及受光元件4的框状的构件即可。盖部15以设于壁部14的上端部附近的内表面且覆盖由壁部14包围的区域的方式配设即可。即,壁部14具有上表面,且以与壁部14一起构成遮光体6的上表面的方式设有盖部15。另外,盖部15具有位于从发光元件3到第一透镜12为止的光路上以及从第二透镜13到受光元件4为止的光路上的光通过部16。需要说明的是,本公开的光通过部16为多个孔。
壁部14具有上表面以及下表面,且具有一个贯通孔17,该一个贯通孔17具有配设于壁部14的上表面以及下表面的开口。而且,在贯通孔17内配设有透镜构件5的支柱11。换言之,向贯通孔17插入有支柱11。其结果是,由于支柱11被遮光体6覆盖,因此能够保护支柱11,例如能够减少因来自外部的冲击而将支柱11折断的情况。
另外,多个支柱11的前端部也可以是朝向前端变细的形状。其结果是,在受光发光元件模块1的制造时,容易将透镜构件5插入遮光体6,能够提高受光发光元件模块1的生产效率。
遮光体6的上表面也可以从透镜构件5的支承部10的下表面分离而位于下方。即,也可以在遮光体6的上表面与支承部10的下表面之间具有间隙。其结果是,例如能够减少因遮光体6的热膨胀等而将透镜构件5推起的情况。因此,能够容易保持透镜构件5与发光元件3以及受光元件4的距离,容易维持受光发光元件模块1的检测性能。
当俯视观察受光发光元件模块1时,遮光体6的外缘也可以位于相比透镜构件5的外缘靠外侧的位置。而且,也可以具有遮光体6的外缘部的上表面向上方突出而成的凸部18。其结果是,例如能够保护透镜构件5免受外部应力的伤害。需要说明的是,本公开的凸部18以包围支承部10的方式连续形成。
而且,透镜构件5也可以在遮光体6的凸部18的内表面和支承部10的侧面经由粘结剂而被固定。其结果是,能够减少进入到支承部10的下表面与遮光体15的盖部15的上表面之间的粘结剂的量,能够减少因粘结剂热膨胀而导致的透镜构件5的上下方向的位置偏移。
配线基板2也可以具有多个孔部19,该多个孔部19具有配设于配线基板2的上表面的开口。而且,透镜构件5除支柱11(以下,称作第一支柱11)以外,也可以还具有设于支承部10的下表面且前端插入到配线基板2的孔部19的多个第二支柱20。其结果是,在能够利用第一支柱11来进行上下方向的对位的基础上,能够利用多个第二支柱20来进行透镜部9与发光元件3以及受光元件4的平面方向(XY平面方向)的对位。需要说明的是,透镜构件5的包括多个第二支柱20在内的各构件的全部也可以一体形成。
需要说明的是,本公开的多个第二支柱20隔着发光元件3以及受光元件4而位于配线基板2的对角线上。另外,在本公开的配线基板2的一方的对角线上配置有两个第一支柱11,在另一方的对角线上配置有两个第二支柱20。另外,本公开的第一支柱11配设于相比第二支柱20靠配线基板2的中央部侧。
另外,多个第二支柱20也可以插入到遮光体6的贯通孔17。其结果是,也能够进行遮光体6的平面方向的对位。其结果是,通过将第二支柱20插入孔部19,将配线基板2的孔部19作为一个基准,能够进行发光元件3、受光元件4、透镜构件5以及遮光体6的对位。因此,与一边使带有多个基准的多个构件与各个相对位置一致一边分别安装的情况相比,由于基于绝对基准而将多个构成要素集中配置于一个结构体,因此能够提高检测性能。
另外,多个第二支柱20的前端部也可以是朝向前端变细的形状。其结果是,在制造受光发光元件模块1时,能够容易将透镜构件5插入遮光体6或者孔部19,提高受光发光元件模块1的生产效率。
插入有第一支柱11的遮光体6的贯通孔17的直径也可以大于第一支柱11的粗细度。其结果是,由于第一支柱11与遮光体6的平面方向上的定位无关,因此遮光体6的定位仅通过第二支柱20来进行。因此,由于第一支柱11不被遮光体5约束,因此能够减少因遮光体5对第一支柱11施加力而致使第一支柱11弯曲的情况。
配线基板的孔部19的形状可以全部相同,也可以不相同。即,也可以将多个孔部19中的一个形状设定为与其他孔部相比游隙变大那样的大小。由此,在使相同形状的第二支柱20插入时,组装变得容易。在此,设定为多个孔部19中的游隙变大那样的大小,并非在XY方向上均衡地带有游隙,优选仅在一方向上限定而增大游隙。例如,如图3所示,将两个孔部19中的一方设为仅在配线基板2的长度方向(图的X轴向)上带有游隙的椭圆形状即可。由此能够减小位置偏移。
另外,多个孔部19也可以是以各自成为非对称的方式配置。其结果是,能够减少多个第二支柱20插入错误的孔部19的情况。
另外,遮光体6的对位在本实施方式中使用贯通孔17,但也可以是在遮光体6的上表面或者支承部10的下表面的任一者形成突起部以及凹陷部而进行遮光体6的对位。
(传感器装置)
接下来,对具备受光发光元件模块1的传感器装置100进行说明。如图4所示,本实施方式的传感器装置100具有受光发光元件模块1和与受光发光元件模块1电连接的控制用电路101。控制用电路101对受光发光元件模块1进行控制。控制用电路101例如包括用于驱动发光元件3的驱动电路、处理来自受光元件4的输出(电流或者电压等)的运算电路或者用于与外部装置进行通信的通信电路等。需要说明的是,图4所示的虚线的箭头例示出从发光元件3发出的光的路线。
附图标记说明:
1 受光发光元件模块;
2 配线基板;
3 发光元件;
4 受光元件;
5 透镜构件;
6 遮光体;
7 半导体基板;
8 多个半导体层;
9 透镜部;
10 支承部;
11 支柱;
12 第一透镜;
13 第二透镜;
14 壁部;
15 盖部;
16 光通过部;
17 贯通孔;
18 凸部;
19 孔部;
20 第二支柱;
100 传感器装置;
101 控制用电路。

Claims (11)

1.一种受光发光元件模块,其中,
所述受光发光元件模块具备:
配线基板;
发光元件以及受光元件,它们配设于所述配线基板上;以及
透镜构件,其具有支承部和支柱,所述支承部对从所述发光元件以及所述受光元件分离而位于上方的透镜部进行支承,所述支柱配设于所述支承部的下表面且前端与所述配线基板的上表面相接。
2.根据权利要求1所述的受光发光元件模块,其中,
在所述透镜构件中,所述透镜部、所述支承部以及所述支柱一体形成。
3.根据权利要求1或2所述的受光发光元件模块,其中,
所述透镜构件的所述支柱的前端面为凸曲面。
4.根据权利要求1至3中任一项所述的受光发光元件模块,其中,
所述受光发光元件模块还具备遮光体,该遮光体配设于所述透镜构件与所述配线基板之间并且包围所述发光元件以及所述受光元件,且具有包括上表面以及下表面的框状的壁部,
所述遮光体的所述壁部具有贯通孔,该贯通孔具有配设于所述壁部的上表面以及下表面的开口,
所述支柱配设于所述贯通孔内。
5.根据权利要求4所述的受光发光元件模块,其中,
所述遮光体的上表面从所述透镜构件的所述支承部的下表面分离而位于下方。
6.根据权利要求4或5所述的受光发光元件模块,其中,
当俯视观察所述受光发光元件模块时,所述遮光体的外缘位于相比所述透镜构件的外缘靠外侧的位置,
所述遮光体还具有所述遮光体的外缘部的上表面向上方突出而成的凸部,
所述透镜构件在所述透镜构件的支承部的侧面以及所述凸部的内表面经由粘结剂而固定于所述遮光体。
7.根据权利要求6所述的受光发光元件模块,其中,
所述凸部以包围所述透镜构件的所述支承部的方式连续地配设。
8.根据权利要求1至7中任一项所述的受光发光元件模块,其中,
所述配线基板具有多个孔部,所述多个孔部具有配设于所述配线基板的上表面的开口,
所述透镜构件在将所述支柱作为第一支柱时还具有多个第二支柱,所述多个第二支柱配设于所述支承部的下表面且前端配设于所述配线基板的所述多个孔部内。
9.根据权利要求8所述的受光发光元件模块,其中,
所述配线基板的平面形状为矩形,
所述多个孔部隔着所述发光元件以及所述受光元件而位于所述配线基板的对角线上。
10.根据权利要求9所述的受光发光元件模块,其中,
所述第二支柱在所述孔部的内表面经由粘结剂而被固定。
11.一种传感器装置,其中,
所述传感器装置具备:
权利要求1至10中任一项所述的受光发光元件模块;以及
控制用电路,其与所述受光发光元件模块电连接,且对所述受光发光元件模块进行控制,
从所述发光元件向被照射物照射光,根据与从该被照射物反射的反射光对应地输出的来自所述受光元件的输出值检测所述被照射物。
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